JPS56141507A - Detector for metallic foil pattern in printed substrate - Google Patents

Detector for metallic foil pattern in printed substrate

Info

Publication number
JPS56141507A
JPS56141507A JP4527180A JP4527180A JPS56141507A JP S56141507 A JPS56141507 A JP S56141507A JP 4527180 A JP4527180 A JP 4527180A JP 4527180 A JP4527180 A JP 4527180A JP S56141507 A JPS56141507 A JP S56141507A
Authority
JP
Japan
Prior art keywords
pattern
light
printed substrate
reflected
transmitted light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4527180A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6310762B2 (OSRAM
Inventor
Moritoshi Ando
Katsumi Fujiwara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP4527180A priority Critical patent/JPS56141507A/ja
Publication of JPS56141507A publication Critical patent/JPS56141507A/ja
Publication of JPS6310762B2 publication Critical patent/JPS6310762B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP4527180A 1980-04-08 1980-04-08 Detector for metallic foil pattern in printed substrate Granted JPS56141507A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4527180A JPS56141507A (en) 1980-04-08 1980-04-08 Detector for metallic foil pattern in printed substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4527180A JPS56141507A (en) 1980-04-08 1980-04-08 Detector for metallic foil pattern in printed substrate

Publications (2)

Publication Number Publication Date
JPS56141507A true JPS56141507A (en) 1981-11-05
JPS6310762B2 JPS6310762B2 (OSRAM) 1988-03-09

Family

ID=12714642

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4527180A Granted JPS56141507A (en) 1980-04-08 1980-04-08 Detector for metallic foil pattern in printed substrate

Country Status (1)

Country Link
JP (1) JPS56141507A (OSRAM)

Also Published As

Publication number Publication date
JPS6310762B2 (OSRAM) 1988-03-09

Similar Documents

Publication Publication Date Title
ES8402931A1 (es) Aparato para la inspeccion optica de objetos presentes en un campo de observacion.
JPS56126747A (en) Inspecting method for flaw, alien substance and the like on surface of sample and device therefor
ES8606643A1 (es) Aparato para la determinacion de la capacidad de reflexion difusa de una superficie de muestra de pequenas dimensiones
JPS57142546A (en) Infrared multiple reflection type oil concentration measuring apparatus
JPS57104809A (en) Range finder
KR890014990A (ko) 광학식 측정장치
UST102104I4 (en) Scanning optical system adapted for linewidth measurement in semiconductor devices
JPS56141507A (en) Detector for metallic foil pattern in printed substrate
US4077723A (en) Method of measuring thickness
JPS55154402A (en) Shape measuring apparatus
JPS5761905A (en) Measuring device of surface coarseness
JPS5630724A (en) Inspecting device of substrate surface
JPS5337457A (en) Distance measuring device
JPS5582068A (en) Measuring unit for water depth using laser
JPS56130606A (en) Optical measuring device for thickness of transparent material
JPS5719608A (en) Device for measuring diameter
JPS5720603A (en) Detector for plate width using laser
JPS52153468A (en) Thickness measuring method of substrates
JPS5497469A (en) Laser speed measuring apparatus
JPS5669505A (en) Laser position detecting device
JPS52119293A (en) Measuring method and apparatus for liberate oil contents from oil-cont ained sludge
KR960035040A (ko) 전자부품의 단자 검사장치
JPS5735704A (en) Surface state measuring method of metallic plate and its device
JPS57113311A (en) Measuring device for surface coarseness of object
SU872955A1 (ru) Способ измерени толщины сло и устройство дл его осуществлени