JPS56141507A - Detector for metallic foil pattern in printed substrate - Google Patents
Detector for metallic foil pattern in printed substrateInfo
- Publication number
- JPS56141507A JPS56141507A JP4527180A JP4527180A JPS56141507A JP S56141507 A JPS56141507 A JP S56141507A JP 4527180 A JP4527180 A JP 4527180A JP 4527180 A JP4527180 A JP 4527180A JP S56141507 A JPS56141507 A JP S56141507A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- light
- printed substrate
- reflected
- transmitted light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
PURPOSE:To accomplish pattern detection accurately by such constitution that when the operation of a photometric device by the transmitted light of a printed substrate is insufficient a photometric device by reflected light is used. CONSTITUTION:A surface pattern 2-1 and back pattern 2-2 which are copper foils to be inspected are formed on a printed substrate 1. Light 4 emitted from a laser 3 is made into a condensed beam 8 by way of a half mirror 5, a scanning mirror 6, and a scanning lens 7, and the transmitted light thereof is detected in a transmitted quantity measuring device 9, whereby the length of the pattern of the copper foils is measured. On the other hand, the light reflected by the pattern 2-1 enters a reflection measuring device 10. Slice levels are provided to the device 9 and the device 10, and when the transmitted light input T is above the slice level, the pattern is measured by T. On the other hand, when T is below the level and the reflected input R is not detected, the measurement is changed over to that by R, and the pattern detection thereafter is accomplished by the R signal. Thereby, the accurate pattern detection is accomplished.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4527180A JPS56141507A (en) | 1980-04-08 | 1980-04-08 | Detector for metallic foil pattern in printed substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4527180A JPS56141507A (en) | 1980-04-08 | 1980-04-08 | Detector for metallic foil pattern in printed substrate |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS56141507A true JPS56141507A (en) | 1981-11-05 |
JPS6310762B2 JPS6310762B2 (en) | 1988-03-09 |
Family
ID=12714642
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4527180A Granted JPS56141507A (en) | 1980-04-08 | 1980-04-08 | Detector for metallic foil pattern in printed substrate |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56141507A (en) |
-
1980
- 1980-04-08 JP JP4527180A patent/JPS56141507A/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6310762B2 (en) | 1988-03-09 |
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