JPS56122938A - Flaw detecting method and defectoscope - Google Patents

Flaw detecting method and defectoscope

Info

Publication number
JPS56122938A
JPS56122938A JP2590480A JP2590480A JPS56122938A JP S56122938 A JPS56122938 A JP S56122938A JP 2590480 A JP2590480 A JP 2590480A JP 2590480 A JP2590480 A JP 2590480A JP S56122938 A JPS56122938 A JP S56122938A
Authority
JP
Japan
Prior art keywords
signal
flaw
detecting
oscillation
outputs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2590480A
Other languages
Japanese (ja)
Inventor
Eiichi Nakaoka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP2590480A priority Critical patent/JPS56122938A/en
Publication of JPS56122938A publication Critical patent/JPS56122938A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/904—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors

Abstract

PURPOSE:To improve S/N ratio of the flaw detection signal, by distributing and arranging plural detecting ends in a prescribed region of the material to be checked and by performing the signal processing where detection signal from them are coupled organically. CONSTITUTION:Bar-shaped material 1 to be checked is carried in the direction of the arrow by the carrying device, and outputs of detecting coils C1, C2 and C3 are inputted to differential amplifying circuits S1 and S2 to output (e2-e1) and (e2- e3). These outputs are added by adding amplifier 3 and are inputted to through- type eddy current defectoscope 4. Consequently, when flaw 2 passes through detecting coils C1, and C2 C3, the waveform of processing signal E2 concerning detecting coil C2 becomes double of the independent flaw signal of the detecting coil. Meanwhile, since outputs due to oscillation of detecting coils C1, C2 and C3 are generated simultaneously, the noise signal due to oscillation is cancelled. As a result, the influence of oscillation due to transportation or the like of material 1 is cancelled, and the signal due to flaw 2 is emphasized to improve S/N ratio.
JP2590480A 1980-02-29 1980-02-29 Flaw detecting method and defectoscope Pending JPS56122938A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2590480A JPS56122938A (en) 1980-02-29 1980-02-29 Flaw detecting method and defectoscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2590480A JPS56122938A (en) 1980-02-29 1980-02-29 Flaw detecting method and defectoscope

Publications (1)

Publication Number Publication Date
JPS56122938A true JPS56122938A (en) 1981-09-26

Family

ID=12178765

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2590480A Pending JPS56122938A (en) 1980-02-29 1980-02-29 Flaw detecting method and defectoscope

Country Status (1)

Country Link
JP (1) JPS56122938A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5849250U (en) * 1981-09-30 1983-04-02 株式会社島津製作所 Flaw detection equipment
JPS5888152U (en) * 1981-12-09 1983-06-15 原電子測器株式会社 Eddy current flaw detection equipment
US4639674A (en) * 1983-04-11 1987-01-27 Schonstedt Instrument Company Apparatus and method employing extraneous field compensation for locating current-carrying objects

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5849250U (en) * 1981-09-30 1983-04-02 株式会社島津製作所 Flaw detection equipment
JPS6311652Y2 (en) * 1981-09-30 1988-04-05
JPS5888152U (en) * 1981-12-09 1983-06-15 原電子測器株式会社 Eddy current flaw detection equipment
US4639674A (en) * 1983-04-11 1987-01-27 Schonstedt Instrument Company Apparatus and method employing extraneous field compensation for locating current-carrying objects

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