JPS5888152U - Eddy current flaw detection equipment - Google Patents

Eddy current flaw detection equipment

Info

Publication number
JPS5888152U
JPS5888152U JP18338081U JP18338081U JPS5888152U JP S5888152 U JPS5888152 U JP S5888152U JP 18338081 U JP18338081 U JP 18338081U JP 18338081 U JP18338081 U JP 18338081U JP S5888152 U JPS5888152 U JP S5888152U
Authority
JP
Japan
Prior art keywords
eddy current
flaw detection
current flaw
detection equipment
mataha
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18338081U
Other languages
Japanese (ja)
Inventor
林部　昭治
Original Assignee
原電子測器株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 原電子測器株式会社 filed Critical 原電子測器株式会社
Priority to JP18338081U priority Critical patent/JPS5888152U/en
Publication of JPS5888152U publication Critical patent/JPS5888152U/en
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図ａ、　　ｂ、　　ｃは従来装置を説明する斜視図
および回路図、第２図ａ、　　ｂ、　　ｃは本考案の実
施　へ例を説明する斜視図および回路図、第３図ａ、　
　ｂは本考案の動作説明図、第４図は本考案の他の実施
例を示す回路図である。 図面で４．５は導電性被検体、１．２．　３゜１０は検
出゛コイルである。Figures 1 a, b, and c are perspective views and circuit diagrams illustrating a conventional device; Figures 2 a, b, and c are perspective views and circuit diagrams illustrating an example of implementing the present invention; Figures 3 a, 3;
b is an explanatory diagram of the operation of the present invention, and FIG. 4 is a circuit diagram showing another embodiment of the present invention. In the drawing, 4.5 is a conductive object, 1.2. 3.10 is a detection coil.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 導電性被検体に対向して配置され、相互は該被検体に平
行な一直線状に並並設される同形状、同インピーダンス
の３個または４個の検出コイルを有し、更に該被検体に
配設されたときの各コイルのインピーダンスをコイル配
列順にＺｌ、　Ｚ２．　Ｚ３まタハＺ１．ｚ２．Ｚ３．
Ｚ４トシテ、Ｚ２−（Ｚ１＋２３）Ｉ２マタハ（Ｚ２　
＋　２４）　　（Ｚｌ　＋２３）で表わされる出力を生
じる回路を備えることを特徴とする渦流探傷装置。It has three or four detection coils of the same shape and impedance arranged in parallel to each other in a straight line parallel to the conductive object, and further arranged to face the object. The impedance of each coil when arranged is Zl, Z2. Z3 mataha Z1. z2. Z3.
Z4 Toshite, Z2-(Z1+23) I2 Mataha (Z2
+24) An eddy current flaw detection device comprising a circuit that produces an output represented by (Zl +23).
JP18338081U 1981-12-09 1981-12-09 Eddy current flaw detection equipment Pending JPS5888152U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18338081U JPS5888152U (en) 1981-12-09 1981-12-09 Eddy current flaw detection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18338081U JPS5888152U (en) 1981-12-09 1981-12-09 Eddy current flaw detection equipment

Publications (1)

Publication Number Publication Date
JPS5888152U true JPS5888152U (en) 1983-06-15

Family

ID=29982588

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18338081U Pending JPS5888152U (en) 1981-12-09 1981-12-09 Eddy current flaw detection equipment

Country Status (1)

Country Link
JP (1) JPS5888152U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2021153245A1 (en) * 2020-01-28 2021-08-05

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56122938A (en) * 1980-02-29 1981-09-26 Shimadzu Corp Flaw detecting method and defectoscope

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56122938A (en) * 1980-02-29 1981-09-26 Shimadzu Corp Flaw detecting method and defectoscope

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2021153245A1 (en) * 2020-01-28 2021-08-05
WO2021153245A1 (en) * 2020-01-28 2021-08-05 テックス理研株式会社 Eddy-current flaw detection device

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