JPS5739345A - Eddy current flaw detector - Google Patents

Eddy current flaw detector

Info

Publication number
JPS5739345A
JPS5739345A JP55114992A JP11499280A JPS5739345A JP S5739345 A JPS5739345 A JP S5739345A JP 55114992 A JP55114992 A JP 55114992A JP 11499280 A JP11499280 A JP 11499280A JP S5739345 A JPS5739345 A JP S5739345A
Authority
JP
Japan
Prior art keywords
coil
flaw
frequency
detector
flaw detection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP55114992A
Other languages
Japanese (ja)
Inventor
Yasuo Araki
Tomofumi Sakurai
Yoshio Egashira
Takashi Endo
Takeo Kamimura
Masaru Yanagida
Tatsuma Yasuda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP55114992A priority Critical patent/JPS5739345A/en
Publication of JPS5739345A publication Critical patent/JPS5739345A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9046—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents by analysing electrical signals

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

PURPOSE:To obtain simultaneity between flaw detection signals obtained from a differential system and an absolute system by using the coil of the former system as a detecting coil of the latter system, and making different the flaw detection frequencies of flaw detectors of both systems. CONSTITUTION:Since the frequency of a flaw detector 10 is set at f1, and the frequency of a flaw detector 11 at f2, the voltage of f1 is applied to a coil 2 and the voltages of f1 and f2 are applied to the coil 3. The selecting amplifier 45 of the detector 10 is set at the frequency f1, and the output thereof is applied to a phase detecting circuit 46, which outputs the results of the flaw detection of a differential system. A compensation circuit 43 is provided in order to make minute with the input voltage of the amplifier 45 of the detector 11. This amplifier 45 is so arranged as to amplify only the voltage of the frequency f2 and outputs the results of the flaw detection of an absolute system. Since one coil 3 of the coils 2, 3 of the differential system is used as a detection for the absolute system, the signals of both systems generate at the same time.
JP55114992A 1980-08-21 1980-08-21 Eddy current flaw detector Pending JPS5739345A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55114992A JPS5739345A (en) 1980-08-21 1980-08-21 Eddy current flaw detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55114992A JPS5739345A (en) 1980-08-21 1980-08-21 Eddy current flaw detector

Publications (1)

Publication Number Publication Date
JPS5739345A true JPS5739345A (en) 1982-03-04

Family

ID=14651634

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55114992A Pending JPS5739345A (en) 1980-08-21 1980-08-21 Eddy current flaw detector

Country Status (1)

Country Link
JP (1) JPS5739345A (en)

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