JPS56118356A - Preparation of semiconductor device - Google Patents
Preparation of semiconductor deviceInfo
- Publication number
- JPS56118356A JPS56118356A JP2143280A JP2143280A JPS56118356A JP S56118356 A JPS56118356 A JP S56118356A JP 2143280 A JP2143280 A JP 2143280A JP 2143280 A JP2143280 A JP 2143280A JP S56118356 A JPS56118356 A JP S56118356A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- film
- psg
- sio
- diffusion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76897—Formation of self-aligned vias or contact plugs, i.e. involving a lithographically uncritical step
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electrodes Of Semiconductors (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
PURPOSE:To make it possible to prevent the P diffusion into the P type diffusion layer, by forming a penetrating hole through the PSG film on the substrate and evaporating an insulating film prior to glass flow. CONSTITUTION:According to the normal method, a channel stopper 5, a field oxidized film 6, a P type diffusion layer 9, a gate oxidized film 7 and a polycrystalline Si gate 8 are formed and after an SiO2 10 and a PSG11 are stacked, a resist-mask 8 is formed and a window is opened. Then an SiO 13 is evaporated. Thereafter at the temperature of 1,050-1,100 deg.C the PSG is flowed to make the opening part smoother. At this time, the SiO film prevents the P diffusion into the N layer 9. Then the SiO is etched by HF solution and Al electrode 14 is formed. With such an arrangement, no breakdown of Al wirings occurs and the P diffusion from the PSG is prevented, resulting in a device of high reliability. Using BSG on the N layer can likewise be performed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2143280A JPS56118356A (en) | 1980-02-22 | 1980-02-22 | Preparation of semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2143280A JPS56118356A (en) | 1980-02-22 | 1980-02-22 | Preparation of semiconductor device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS56118356A true JPS56118356A (en) | 1981-09-17 |
Family
ID=12054814
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2143280A Pending JPS56118356A (en) | 1980-02-22 | 1980-02-22 | Preparation of semiconductor device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS56118356A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61251054A (en) * | 1985-04-27 | 1986-11-08 | Pioneer Electronic Corp | Manufacture of semiconductor device |
JPH01191468A (en) * | 1988-01-27 | 1989-08-01 | Nec Corp | Manufacture of cmos type semiconductor device |
US5284800A (en) * | 1992-02-19 | 1994-02-08 | Integrated Device Technology, Inc. | Method for preventing the exposure of borophosphosilicate glass to the ambient and stopping phosphorus ions from infiltrating silicon in a semiconductor process |
-
1980
- 1980-02-22 JP JP2143280A patent/JPS56118356A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61251054A (en) * | 1985-04-27 | 1986-11-08 | Pioneer Electronic Corp | Manufacture of semiconductor device |
JPH01191468A (en) * | 1988-01-27 | 1989-08-01 | Nec Corp | Manufacture of cmos type semiconductor device |
US5284800A (en) * | 1992-02-19 | 1994-02-08 | Integrated Device Technology, Inc. | Method for preventing the exposure of borophosphosilicate glass to the ambient and stopping phosphorus ions from infiltrating silicon in a semiconductor process |
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