JPS56114747A - Surface inspection device - Google Patents

Surface inspection device

Info

Publication number
JPS56114747A
JPS56114747A JP1599280A JP1599280A JPS56114747A JP S56114747 A JPS56114747 A JP S56114747A JP 1599280 A JP1599280 A JP 1599280A JP 1599280 A JP1599280 A JP 1599280A JP S56114747 A JPS56114747 A JP S56114747A
Authority
JP
Japan
Prior art keywords
flaw
circuit
profile
degree
prescribed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1599280A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6321857B2 (enrdf_load_stackoverflow
Inventor
Akihiro Kamatani
Masayuki Goto
Takeshi Arita
Chiaki Fukazawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Nippon Steel Corp
Original Assignee
Toshiba Corp
Nippon Steel Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Nippon Steel Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP1599280A priority Critical patent/JPS56114747A/ja
Publication of JPS56114747A publication Critical patent/JPS56114747A/ja
Publication of JPS6321857B2 publication Critical patent/JPS6321857B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP1599280A 1980-02-14 1980-02-14 Surface inspection device Granted JPS56114747A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1599280A JPS56114747A (en) 1980-02-14 1980-02-14 Surface inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1599280A JPS56114747A (en) 1980-02-14 1980-02-14 Surface inspection device

Publications (2)

Publication Number Publication Date
JPS56114747A true JPS56114747A (en) 1981-09-09
JPS6321857B2 JPS6321857B2 (enrdf_load_stackoverflow) 1988-05-09

Family

ID=11904143

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1599280A Granted JPS56114747A (en) 1980-02-14 1980-02-14 Surface inspection device

Country Status (1)

Country Link
JP (1) JPS56114747A (enrdf_load_stackoverflow)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5999238A (ja) * 1982-11-29 1984-06-07 Toshiba Corp 表面検査装置
JPH04332856A (ja) * 1991-05-07 1992-11-19 Nippon Steel Corp ストリップの表面欠陥検査装置
JP2002257739A (ja) * 2001-03-06 2002-09-11 Nippon Steel Corp 画像処理方法、画像処理装置及びコンピュータ読み取り可能な記憶媒体

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111712577A (zh) * 2018-02-20 2020-09-25 三荣糖化株式会社 糖羧酸的制造方法
EP4223882A1 (en) 2022-02-02 2023-08-09 Vilnius University Process for producing aldonic acids

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5384793A (en) * 1976-12-29 1978-07-26 Ishikawajima Harima Heavy Ind Crack detecting method by television camera and apparatus for carrying out the method
JPS55132936A (en) * 1979-04-04 1980-10-16 Mitsubishi Electric Corp Surface inspection apparatus

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5384793A (en) * 1976-12-29 1978-07-26 Ishikawajima Harima Heavy Ind Crack detecting method by television camera and apparatus for carrying out the method
JPS55132936A (en) * 1979-04-04 1980-10-16 Mitsubishi Electric Corp Surface inspection apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5999238A (ja) * 1982-11-29 1984-06-07 Toshiba Corp 表面検査装置
JPH04332856A (ja) * 1991-05-07 1992-11-19 Nippon Steel Corp ストリップの表面欠陥検査装置
JP2002257739A (ja) * 2001-03-06 2002-09-11 Nippon Steel Corp 画像処理方法、画像処理装置及びコンピュータ読み取り可能な記憶媒体

Also Published As

Publication number Publication date
JPS6321857B2 (enrdf_load_stackoverflow) 1988-05-09

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