JPS574540A - Method and apparatus for detecting defect of long flat object - Google Patents

Method and apparatus for detecting defect of long flat object

Info

Publication number
JPS574540A
JPS574540A JP7837580A JP7837580A JPS574540A JP S574540 A JPS574540 A JP S574540A JP 7837580 A JP7837580 A JP 7837580A JP 7837580 A JP7837580 A JP 7837580A JP S574540 A JPS574540 A JP S574540A
Authority
JP
Japan
Prior art keywords
defect
value
parts
measured values
values
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7837580A
Other languages
Japanese (ja)
Inventor
Toshiyuki Nakayama
Yuji Sakamoto
Toshifumi Takizawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Unitika Ltd
Original Assignee
Unitika Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Unitika Ltd filed Critical Unitika Ltd
Priority to JP7837580A priority Critical patent/JPS574540A/en
Publication of JPS574540A publication Critical patent/JPS574540A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PURPOSE:To enable a true defective part to be stably detected, by performing a defect detection on the basis of the difference between the average value of the received scanning light measurement values corresponding to the surface conditions of two or more continuous parts and the average value of the measured values of a plural parts, 10-100 times as many as the former. CONSTITUTION:The received scanning light measurement values, corresponding to the surface conditions of a moving long and flat object, obtained by a light-receiving part 7, are applied to a defect detecting part 84. In a signal averaging part 14, the measured values of continuous six parts or the like corresponding to one turn or the like of a rotating mirror are averaged to be a value independent of mechanical noises or the like. On the other hand, the measured values of a plural parts, 10-100 times as many as the former, are averaged in a signal averaging-standardizing part 15 to be a value changing slowly. When the difference between both the average values is calculated in a subtracting part 12, a value is obtained which corresponds to a true defective part including flaws, stain, thickness mottles and the like independently of the surface bending and the like in traveling, and outputted through a defect decision part 10 in which a defect reference value has been set. Accordingly a true defect can be stably detected.
JP7837580A 1980-06-12 1980-06-12 Method and apparatus for detecting defect of long flat object Pending JPS574540A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7837580A JPS574540A (en) 1980-06-12 1980-06-12 Method and apparatus for detecting defect of long flat object

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7837580A JPS574540A (en) 1980-06-12 1980-06-12 Method and apparatus for detecting defect of long flat object

Publications (1)

Publication Number Publication Date
JPS574540A true JPS574540A (en) 1982-01-11

Family

ID=13660261

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7837580A Pending JPS574540A (en) 1980-06-12 1980-06-12 Method and apparatus for detecting defect of long flat object

Country Status (1)

Country Link
JP (1) JPS574540A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6064589A (en) * 1983-09-19 1985-04-13 Matsushita Electric Ind Co Ltd Picture position detecting method
JPS62206793A (en) * 1986-03-05 1987-09-11 松下電工株式会社 Discharge lamp burner
JPH0658887A (en) * 1992-04-10 1994-03-04 Solis Srl Method for sensing fluctuation of coincidence of textile and apparatus for executing method thereof

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5520470A (en) * 1978-07-29 1980-02-13 Kobe Steel Ltd Signal processing method in surface defect detection of high-temperature tested material
JPS5569039A (en) * 1978-11-20 1980-05-24 Fujitsu Ltd Processing systen for flaw detection signal

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5520470A (en) * 1978-07-29 1980-02-13 Kobe Steel Ltd Signal processing method in surface defect detection of high-temperature tested material
JPS5569039A (en) * 1978-11-20 1980-05-24 Fujitsu Ltd Processing systen for flaw detection signal

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6064589A (en) * 1983-09-19 1985-04-13 Matsushita Electric Ind Co Ltd Picture position detecting method
JPH0446038B2 (en) * 1983-09-19 1992-07-28 Matsushita Electric Ind Co Ltd
JPS62206793A (en) * 1986-03-05 1987-09-11 松下電工株式会社 Discharge lamp burner
JPH0658887A (en) * 1992-04-10 1994-03-04 Solis Srl Method for sensing fluctuation of coincidence of textile and apparatus for executing method thereof

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