JPS55132936A - Surface inspection apparatus - Google Patents

Surface inspection apparatus

Info

Publication number
JPS55132936A
JPS55132936A JP4128579A JP4128579A JPS55132936A JP S55132936 A JPS55132936 A JP S55132936A JP 4128579 A JP4128579 A JP 4128579A JP 4128579 A JP4128579 A JP 4128579A JP S55132936 A JPS55132936 A JP S55132936A
Authority
JP
Japan
Prior art keywords
defects
defect
number
supplied
shapers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4128579A
Other versions
JPH028257B2 (en
Inventor
Mitsuhito Kamei
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP54041285A priority Critical patent/JPH028257B2/ja
Publication of JPS55132936A publication Critical patent/JPS55132936A/en
Publication of JPH028257B2 publication Critical patent/JPH028257B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Abstract

PURPOSE:To statically process the symptoms of defects and make possible the evaluation close to visual evaluation by weighting one entire defect for every scanning line in a sheet material and dividing the cumulated value thereof by the defect length. CONSTITUTION:The defect signals 9 generated in the inspecting machine have crest values V1-V5 for respective scanning lines and are supplied to the waveform shapers 10, 11, 12 for detecting heavy defects, medium defects, light defects respectively. When they exceed reference voltages v1-v3 in the respective shapers, pulses are outputted from the shapers and are counted in corresponding counters 13-15. The outputs of the respective counters are supplied to an arithmetic circuit 16, where the operations of (number of heavy defects X weight N1)+(number of medium defects X weight N2)+(number of light defects X weight N3) are accomplished. The outputs of the operations are divided 17 by the defect generating scanning number input 19. The divided values are supplied to a ranking circuit 18, where they are decided as heavy defect signal 20, medium defect signal 21, light defect signal 22 by the set values v4, v5 and are outputted therefrom.
JP54041285A 1979-04-04 1979-04-04 Expired - Lifetime JPH028257B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP54041285A JPH028257B2 (en) 1979-04-04 1979-04-04

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP54041285A JPH028257B2 (en) 1979-04-04 1979-04-04

Publications (2)

Publication Number Publication Date
JPS55132936A true JPS55132936A (en) 1980-10-16
JPH028257B2 JPH028257B2 (en) 1990-02-23

Family

ID=12604165

Family Applications (1)

Application Number Title Priority Date Filing Date
JP54041285A Expired - Lifetime JPH028257B2 (en) 1979-04-04 1979-04-04

Country Status (1)

Country Link
JP (1) JPH028257B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56114747A (en) * 1980-02-14 1981-09-09 Nippon Steel Corp Surface inspection device
JPH01206241A (en) * 1988-02-12 1989-08-18 Fuji Photo Film Co Ltd Defect detecting method

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0711050U (en) * 1993-07-20 1995-02-14 村田機械株式会社 Original carrier sheet

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5384793A (en) * 1976-12-29 1978-07-26 Ishikawajima Harima Heavy Ind Crack detecting method by television camera and apparatus for carrying out the method

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5384793A (en) * 1976-12-29 1978-07-26 Ishikawajima Harima Heavy Ind Crack detecting method by television camera and apparatus for carrying out the method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56114747A (en) * 1980-02-14 1981-09-09 Nippon Steel Corp Surface inspection device
JPS6321857B2 (en) * 1980-02-14 1988-05-09 Shinnippon Seitetsu Kk
JPH01206241A (en) * 1988-02-12 1989-08-18 Fuji Photo Film Co Ltd Defect detecting method

Also Published As

Publication number Publication date
JPH028257B2 (en) 1990-02-23

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