JPS56111194A - Semiconductor memory - Google Patents

Semiconductor memory

Info

Publication number
JPS56111194A
JPS56111194A JP494480A JP494480A JPS56111194A JP S56111194 A JPS56111194 A JP S56111194A JP 494480 A JP494480 A JP 494480A JP 494480 A JP494480 A JP 494480A JP S56111194 A JPS56111194 A JP S56111194A
Authority
JP
Japan
Prior art keywords
row
spare
decoder
column
providing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP494480A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6135636B2 (enrdf_load_stackoverflow
Inventor
Hiroshi Shinohara
Osamu Tomizawa
Kenji Anami
Masahiko Yoshimoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CHIYOU LSI GIJUTSU KENKYU KUMIAI
Original Assignee
CHIYOU LSI GIJUTSU KENKYU KUMIAI
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CHIYOU LSI GIJUTSU KENKYU KUMIAI filed Critical CHIYOU LSI GIJUTSU KENKYU KUMIAI
Priority to JP494480A priority Critical patent/JPS56111194A/ja
Publication of JPS56111194A publication Critical patent/JPS56111194A/ja
Publication of JPS6135636B2 publication Critical patent/JPS6135636B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP494480A 1980-01-18 1980-01-18 Semiconductor memory Granted JPS56111194A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP494480A JPS56111194A (en) 1980-01-18 1980-01-18 Semiconductor memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP494480A JPS56111194A (en) 1980-01-18 1980-01-18 Semiconductor memory

Publications (2)

Publication Number Publication Date
JPS56111194A true JPS56111194A (en) 1981-09-02
JPS6135636B2 JPS6135636B2 (enrdf_load_stackoverflow) 1986-08-14

Family

ID=11597675

Family Applications (1)

Application Number Title Priority Date Filing Date
JP494480A Granted JPS56111194A (en) 1980-01-18 1980-01-18 Semiconductor memory

Country Status (1)

Country Link
JP (1) JPS56111194A (enrdf_load_stackoverflow)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60109099A (ja) * 1983-11-18 1985-06-14 Nippon Telegr & Teleph Corp <Ntt> 半導体メモリ装置の欠陥検出切替方式
JPS60178552A (ja) * 1984-02-08 1985-09-12 インモス、リミテツド メモリアレイの列置換方法および列置換可能メモリ回路
JPS6161300A (ja) * 1984-09-03 1986-03-29 Hitachi Ltd 欠陥救済回路
JPS61264599A (ja) * 1985-05-16 1986-11-22 Fujitsu Ltd 半導体記憶装置
JPS63142599A (ja) * 1986-12-05 1988-06-14 Sony Corp メモリ装置における不良セルの置換方法
JPS6427099A (en) * 1987-07-22 1989-01-30 I O Data Kiki Kk Semiconductor memory device
US6819160B2 (en) 2002-11-13 2004-11-16 International Business Machines Corporation Self-timed and self-tested fuse blow
JP2015111486A (ja) * 2013-11-08 2015-06-18 株式会社半導体エネルギー研究所 情報処理装置およびその作製方法
WO2020095148A1 (ja) * 2018-11-08 2020-05-14 株式会社半導体エネルギー研究所 半導体装置、及び電子機器

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61194447U (enrdf_load_stackoverflow) * 1985-05-23 1986-12-03
JPS63103536U (enrdf_load_stackoverflow) * 1986-12-22 1988-07-05
JP2837433B2 (ja) 1989-06-05 1998-12-16 三菱電機株式会社 半導体記憶装置における不良ビット救済回路

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60109099A (ja) * 1983-11-18 1985-06-14 Nippon Telegr & Teleph Corp <Ntt> 半導体メモリ装置の欠陥検出切替方式
JPS60178552A (ja) * 1984-02-08 1985-09-12 インモス、リミテツド メモリアレイの列置換方法および列置換可能メモリ回路
JPS6161300A (ja) * 1984-09-03 1986-03-29 Hitachi Ltd 欠陥救済回路
JPS61264599A (ja) * 1985-05-16 1986-11-22 Fujitsu Ltd 半導体記憶装置
JPS63142599A (ja) * 1986-12-05 1988-06-14 Sony Corp メモリ装置における不良セルの置換方法
JPS6427099A (en) * 1987-07-22 1989-01-30 I O Data Kiki Kk Semiconductor memory device
US6819160B2 (en) 2002-11-13 2004-11-16 International Business Machines Corporation Self-timed and self-tested fuse blow
JP2015111486A (ja) * 2013-11-08 2015-06-18 株式会社半導体エネルギー研究所 情報処理装置およびその作製方法
WO2020095148A1 (ja) * 2018-11-08 2020-05-14 株式会社半導体エネルギー研究所 半導体装置、及び電子機器
JPWO2020095148A1 (ja) * 2018-11-08 2021-12-16 株式会社半導体エネルギー研究所 半導体装置、及び電子機器
US11568944B2 (en) 2018-11-08 2023-01-31 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device comprising memory cells

Also Published As

Publication number Publication date
JPS6135636B2 (enrdf_load_stackoverflow) 1986-08-14

Similar Documents

Publication Publication Date Title
HK2188A (en) Semiconductor memory device
JPS56111194A (en) Semiconductor memory
EP0083212A3 (en) Semiconductor memory device
JPS5570993A (en) Memory circuit
KR890007289A (ko) 파이프라인된 직렬 출력을 갖고 있는 이중-포트 메모리
JPS563499A (en) Semiconductor memory device
KR920008773A (ko) 반도체 기억장치
EP0376245A3 (en) Semiconductors memory device provided with an improved redundant decoder
GB1536374A (en) Programmable logic circuits
EP1288967A3 (en) Semiconductor memory
TW340219B (en) Semiconductor memory device having redundant memory cell array
JPS57179997A (en) Semiconductor memory
US4695981A (en) Integrated circuit memory cell array using a segmented word line
JPS5613584A (en) Setting circuit for data line potential
JPS6452300A (en) Semiconductor memory device
JPS5619584A (en) Semiconductor memory
JPS56137591A (en) Semiconductor memory device
JPS5668988A (en) Semiconductor memory
JPS6432496A (en) Read-only memory
JPS57105892A (en) Rewritable non-volatile semiconductor storage device
TW279987B (en) The word line driving circuit of mask ROM
JPS57197480A (en) Test circuit for integrated circuit
JPS5577091A (en) Read-only memory circuit
JPS5715533A (en) Logical array circuit possible for write-in
JPS5619595A (en) Semiconductor memory unit