JPS5526406A - Light source part of atomic absorption analyzer - Google Patents

Light source part of atomic absorption analyzer

Info

Publication number
JPS5526406A
JPS5526406A JP9818478A JP9818478A JPS5526406A JP S5526406 A JPS5526406 A JP S5526406A JP 9818478 A JP9818478 A JP 9818478A JP 9818478 A JP9818478 A JP 9818478A JP S5526406 A JPS5526406 A JP S5526406A
Authority
JP
Japan
Prior art keywords
cathode
follow
light source
source part
follow cathode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9818478A
Other languages
Japanese (ja)
Inventor
Yoji Arai
Shinji Mayama
Konosuke Oishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP9818478A priority Critical patent/JPS5526406A/en
Publication of JPS5526406A publication Critical patent/JPS5526406A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/3103—Atomic absorption analysis

Abstract

PURPOSE:To form a light source part by which a high-precision Zeeman atomic abosrption analysis is possible, by arranging a follow cathode lamp and a pair of pole pieces so that parallel magnetic force lines of a magnet may pass through most of metallic vapour which is generated from the follow cathode. CONSTITUTION:In the light source part which is formed by arranging pole pieces 27, which consist of permanent magnet 4 and pure iron, outside follow cathode lamp 1, where follow cathode 20 supported by cathode bar 22 and ring anode 21 supported by stem 23 are arranged, so that edge faces of pole pieces 27 may be opposite to each other through lamp 1, pole piece 27, which has the edge face width having a length up to the tip part where metallic vapour generated from the hole bottom of follow cathode 20 exists, is so arranged that the center line of the edge face may be between the aperture end of follow cathode 20 and anode 21. For example, when the aperture end of the follow cathode having hole depth 10 to 15mm and the anode are provided at interval 5 to 10mm, a pole piece having a edge face width of approximately 50mm is used.
JP9818478A 1978-08-14 1978-08-14 Light source part of atomic absorption analyzer Pending JPS5526406A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9818478A JPS5526406A (en) 1978-08-14 1978-08-14 Light source part of atomic absorption analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9818478A JPS5526406A (en) 1978-08-14 1978-08-14 Light source part of atomic absorption analyzer

Publications (1)

Publication Number Publication Date
JPS5526406A true JPS5526406A (en) 1980-02-25

Family

ID=14212927

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9818478A Pending JPS5526406A (en) 1978-08-14 1978-08-14 Light source part of atomic absorption analyzer

Country Status (1)

Country Link
JP (1) JPS5526406A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57154036A (en) * 1981-02-23 1982-09-22 Perkin Elmer Corp Atomic spectral absorption photometer capable of background correction by zeeman effect
CN110095491A (en) * 2019-05-09 2019-08-06 上海华力微电子有限公司 A kind of defect detecting system, detection method and electron beam scanning machine
CN111293032A (en) * 2020-03-10 2020-06-16 国家海洋环境监测中心 Magnetron sputtering hollow cathode lamp capable of enhancing emission line intensity

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5085167A (en) * 1973-11-30 1975-07-09

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5085167A (en) * 1973-11-30 1975-07-09

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57154036A (en) * 1981-02-23 1982-09-22 Perkin Elmer Corp Atomic spectral absorption photometer capable of background correction by zeeman effect
JPH0423211B2 (en) * 1981-02-23 1992-04-21 Perkin Elmer Corp
CN110095491A (en) * 2019-05-09 2019-08-06 上海华力微电子有限公司 A kind of defect detecting system, detection method and electron beam scanning machine
CN110095491B (en) * 2019-05-09 2021-08-20 上海华力微电子有限公司 Defect detection system, defect detection method and electron beam scanning machine
CN111293032A (en) * 2020-03-10 2020-06-16 国家海洋环境监测中心 Magnetron sputtering hollow cathode lamp capable of enhancing emission line intensity
CN111293032B (en) * 2020-03-10 2022-12-30 国家海洋环境监测中心 Magnetron sputtering hollow cathode lamp capable of enhancing emission line intensity

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