JPS55164947A - Test system for logic circuit - Google Patents
Test system for logic circuitInfo
- Publication number
- JPS55164947A JPS55164947A JP6664779A JP6664779A JPS55164947A JP S55164947 A JPS55164947 A JP S55164947A JP 6664779 A JP6664779 A JP 6664779A JP 6664779 A JP6664779 A JP 6664779A JP S55164947 A JPS55164947 A JP S55164947A
- Authority
- JP
- Japan
- Prior art keywords
- output
- gate
- unstable
- period
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6664779A JPS55164947A (en) | 1979-05-29 | 1979-05-29 | Test system for logic circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6664779A JPS55164947A (en) | 1979-05-29 | 1979-05-29 | Test system for logic circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS55164947A true JPS55164947A (en) | 1980-12-23 |
Family
ID=13321889
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6664779A Pending JPS55164947A (en) | 1979-05-29 | 1979-05-29 | Test system for logic circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55164947A (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7549099B2 (en) * | 2004-03-26 | 2009-06-16 | Advantest Corporation | Testing apparatus and testing method |
-
1979
- 1979-05-29 JP JP6664779A patent/JPS55164947A/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7549099B2 (en) * | 2004-03-26 | 2009-06-16 | Advantest Corporation | Testing apparatus and testing method |
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