JPS55150279A - Infrared ray camera device - Google Patents
Infrared ray camera deviceInfo
- Publication number
- JPS55150279A JPS55150279A JP5772379A JP5772379A JPS55150279A JP S55150279 A JPS55150279 A JP S55150279A JP 5772379 A JP5772379 A JP 5772379A JP 5772379 A JP5772379 A JP 5772379A JP S55150279 A JPS55150279 A JP S55150279A
- Authority
- JP
- Japan
- Prior art keywords
- infrared ray
- input unit
- detector
- camera device
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000010410 layer Substances 0.000 abstract 2
- 239000000758 substrate Substances 0.000 abstract 2
- 108010053481 Antifreeze Proteins Proteins 0.000 abstract 1
- 239000004020 conductor Substances 0.000 abstract 1
- 230000006866 deterioration Effects 0.000 abstract 1
- 239000011241 protective layer Substances 0.000 abstract 1
- 239000004065 semiconductor Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/148—Charge coupled imagers
- H01L27/14875—Infrared CCD or CID imagers
- H01L27/14881—Infrared CCD or CID imagers of the hybrid type
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/1301—Shape
- H01L2224/13016—Shape in side view
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Wire Bonding (AREA)
- Solid State Image Pick-Up Elements (AREA)
Abstract
PURPOSE:To prevent deterioration of characteristics of an infrared ray camera device due to strain by forming an infrared ray detector and its input unit corresponding thereto asymmetrical in vertical direction and connecting therebetween with conductive material having bent buffer. CONSTITUTION:A CCD and its input unit 15, and a protective layer 18 are formed on a substrate 14, and a resist pattern 19 is formed on predetermined portion thereof. Then, an Au layer 17a is selectively evaporated, and a thick Au layer 17b is superimposed thereon. Subsequently, when the resist 19 is molten and removed, a connecting member 17 is completed in the input unit 15 at the CCD. The connecting member 17 is connected to a semiconductor substrate 10 having the detector 12 in predetermined positional relationship. According to this configuration, the mechanical strain at connecting time does not deteriorate the detector, nor disconnect the connector at the step of thermal hysteresis.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5772379A JPS55150279A (en) | 1979-05-10 | 1979-05-10 | Infrared ray camera device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5772379A JPS55150279A (en) | 1979-05-10 | 1979-05-10 | Infrared ray camera device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS55150279A true JPS55150279A (en) | 1980-11-22 |
JPS6142869B2 JPS6142869B2 (en) | 1986-09-24 |
Family
ID=13063853
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5772379A Granted JPS55150279A (en) | 1979-05-10 | 1979-05-10 | Infrared ray camera device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS55150279A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61229342A (en) * | 1985-04-03 | 1986-10-13 | Fujitsu Ltd | Connection for bump electrode |
JPS61256745A (en) * | 1985-05-10 | 1986-11-14 | Fujitsu Ltd | Semiconductor device |
EP0663696A3 (en) * | 1994-01-13 | 1995-08-16 | Texas Instruments Inc | |
JP2001225502A (en) * | 1999-12-21 | 2001-08-21 | Xerox Corp | Hybrid device having micro spring inner wiring for achieving high uniformity of integrated light emitting source |
JP2007214191A (en) * | 2006-02-07 | 2007-08-23 | Sumitomo Heavy Ind Ltd | Radiation detector and radiographic examination equipment |
JP2011129824A (en) * | 2009-12-21 | 2011-06-30 | Fujitsu Ltd | Method of manufacturing electronic device, and device for manufacturing electronic component |
-
1979
- 1979-05-10 JP JP5772379A patent/JPS55150279A/en active Granted
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61229342A (en) * | 1985-04-03 | 1986-10-13 | Fujitsu Ltd | Connection for bump electrode |
JPS61256745A (en) * | 1985-05-10 | 1986-11-14 | Fujitsu Ltd | Semiconductor device |
EP0663696A3 (en) * | 1994-01-13 | 1995-08-16 | Texas Instruments Inc | |
JP2001225502A (en) * | 1999-12-21 | 2001-08-21 | Xerox Corp | Hybrid device having micro spring inner wiring for achieving high uniformity of integrated light emitting source |
JP2007214191A (en) * | 2006-02-07 | 2007-08-23 | Sumitomo Heavy Ind Ltd | Radiation detector and radiographic examination equipment |
JP2011129824A (en) * | 2009-12-21 | 2011-06-30 | Fujitsu Ltd | Method of manufacturing electronic device, and device for manufacturing electronic component |
Also Published As
Publication number | Publication date |
---|---|
JPS6142869B2 (en) | 1986-09-24 |
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