JPS55143766A - Electron microscope - Google Patents

Electron microscope

Info

Publication number
JPS55143766A
JPS55143766A JP4751880A JP4751880A JPS55143766A JP S55143766 A JPS55143766 A JP S55143766A JP 4751880 A JP4751880 A JP 4751880A JP 4751880 A JP4751880 A JP 4751880A JP S55143766 A JPS55143766 A JP S55143766A
Authority
JP
Japan
Prior art keywords
electron microscope
microscope
electron
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4751880A
Other languages
English (en)
Japanese (ja)
Inventor
Rihitenetsugaa Jiigufuriito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Publication of JPS55143766A publication Critical patent/JPS55143766A/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/244—Detectors; Associated components or circuits therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2443—Scintillation detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2445—Photon detectors for X-rays, light, e.g. photomultipliers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2446—Position sensitive detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/24475—Scattered electron detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/244—Detection characterized by the detecting means
    • H01J2237/2448—Secondary particle detectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/245—Detection characterised by the variable being measured
    • H01J2237/24507—Intensity, dose or other characteristics of particle beams or electromagnetic radiation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Measurement Of Radiation (AREA)
JP4751880A 1979-04-13 1980-04-12 Electron microscope Pending JPS55143766A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL7902963A NL7902963A (nl) 1979-04-13 1979-04-13 Detektor voor elektronenmikroskoop.

Publications (1)

Publication Number Publication Date
JPS55143766A true JPS55143766A (en) 1980-11-10

Family

ID=19832986

Family Applications (2)

Application Number Title Priority Date Filing Date
JP4751880A Pending JPS55143766A (en) 1979-04-13 1980-04-12 Electron microscope
JP1984144374U Granted JPS60102868U (ja) 1979-04-13 1984-09-26 電子顕微鏡

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP1984144374U Granted JPS60102868U (ja) 1979-04-13 1984-09-26 電子顕微鏡

Country Status (7)

Country Link
US (1) US4438332A (cs)
EP (1) EP0018031B1 (cs)
JP (2) JPS55143766A (cs)
AU (1) AU535802B2 (cs)
CA (1) CA1139457A (cs)
DE (1) DE3060403D1 (cs)
NL (1) NL7902963A (cs)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013129209A1 (ja) * 2012-03-01 2013-09-06 株式会社日立ハイテクノロジーズ 荷電粒子線装置

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3375251D1 (en) * 1982-07-16 1988-02-11 Lintech Instr Ltd An elektrode system of a retarding-field spectrometer for a voltage measuring electron beam apparatus
DE3500903A1 (de) * 1985-01-12 1986-07-17 Fa. Carl Zeiss, 7920 Heidenheim Detektor fuer rueckstreuelektronen
DE3602366A1 (de) * 1986-01-27 1987-07-30 Siemens Ag Verfahren und anordnung zum nachweis der auf einer probe von einem primaeren korpuskularstrahl ausgeloesten sekundaerkorpuskeln
US4785182A (en) * 1987-05-21 1988-11-15 Electroscan Corporation Secondary electron detector for use in a gaseous atmosphere
JPS6417369A (en) * 1987-07-10 1989-01-20 Jeol Ltd Spectrum display unit in x-ray microanalyzer and the like
AT392857B (de) * 1987-07-13 1991-06-25 Ims Ionen Mikrofab Syst Vorrichtung und verfahren zur inspektion einer maske
US4929041A (en) * 1989-01-09 1990-05-29 Johnston Pump/General Valve, Inc. Cathodoluminescence system for use in a scanning electron microscope including means for controlling optical fiber aperture
JP2683951B2 (ja) * 1989-11-02 1997-12-03 三菱電機株式会社 断面観察用走査型電子顕微鏡およびそれを用いた断面観察方法
EP0460305B1 (en) * 1990-06-04 1995-12-27 Nobuo Mikoshiba Method for observing microscopic surface structure
NL9001512A (nl) * 1990-07-03 1992-02-03 Philips Nv Elektronenbundelapparaat voor topografische detectie.
GB2247345B (en) * 1990-07-05 1995-04-05 Haroon Ahmed Integrated circuit structure analysis
JP3148353B2 (ja) * 1991-05-30 2001-03-19 ケーエルエー・インストルメンツ・コーポレーション 電子ビーム検査方法とそのシステム
JP3730263B2 (ja) * 1992-05-27 2005-12-21 ケーエルエー・インストルメンツ・コーポレーション 荷電粒子ビームを用いた自動基板検査の装置及び方法
JP3719794B2 (ja) * 1996-11-11 2005-11-24 株式会社トプコン 反射電子検出装置及びそれを有する走査型電子顕微鏡装置
GB9623768D0 (en) * 1996-11-15 1997-01-08 Leo Electron Microscopy Limite Scanning electron microscope
JP3266814B2 (ja) * 1996-11-26 2002-03-18 シャープ株式会社 微小部分析装置
DE19802848B4 (de) * 1998-01-26 2012-02-02 Display Products Group,Inc. Verfahren und Vorrichtung zum Testen eines Substrats
JP5143990B2 (ja) * 2000-07-07 2013-02-13 カール・ツァイス・エヌティーエス・ゲーエムベーハー 変化する圧力領域のための検出器、およびこのような検出器を備える電子顕微鏡
US7705301B2 (en) * 2006-07-07 2010-04-27 Hermes Microvision, Inc. Electron beam apparatus to collect side-view and/or plane-view image with in-lens sectional detector
WO2010021012A1 (en) * 2008-08-20 2010-02-25 Advantest Corporation Electron detection device and scanning electron microscope
JP5352262B2 (ja) 2009-02-06 2013-11-27 株式会社日立ハイテクノロジーズ 荷電粒子線装置
JP5529573B2 (ja) * 2009-02-10 2014-06-25 国立大学法人 東京大学 透過型電子顕微鏡
US20130140459A1 (en) * 2011-12-01 2013-06-06 Gatan, Inc. System and method for sample analysis by three dimensional cathodoluminescence
WO2015118605A1 (ja) * 2014-02-04 2015-08-13 富士通株式会社 材料評価装置及び方法
CN110779941A (zh) * 2019-11-01 2020-02-11 中国科学院地质与地球物理研究所 电镜样品制作方法及电镜样品制作装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3351755A (en) 1964-09-25 1967-11-07 Applied Res Lab Inc Method of and apparatus for spectroscopic analysis having compensating means for uncontrollable variables
US3629579A (en) * 1970-01-16 1971-12-21 Hitachi Ltd Electron probe specimen stage with a scattered electron detector mounted thereon
AT306804B (de) * 1971-10-05 1973-04-25 Oesterr Studien Atomenergie Kathodolumineszenzeinrichtung für Rasterelektronenmikroskope
NL151034B (nl) * 1972-04-10 1976-10-15 Haak Rob Van Den Anker.
US3922546A (en) 1972-04-14 1975-11-25 Radiant Energy Systems Electron beam pattern generator
US3842271A (en) * 1973-04-24 1974-10-15 American Optical Corp Scanning electron microscope
DE2542355A1 (de) 1975-09-19 1977-03-24 Siemens Ag Durchstrahlungs-raster-elektronenmikroskop mit ringscheibenfoermigem detektor
JPS5248964A (en) * 1975-10-17 1977-04-19 Hitachi Ltd Transmission-type scanning electronic microscope
JPS5317381A (en) * 1976-07-30 1978-02-17 Hitachi Ltd Scintillation counter
US4211924A (en) 1976-09-03 1980-07-08 Siemens Aktiengesellschaft Transmission-type scanning charged-particle beam microscope

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013129209A1 (ja) * 2012-03-01 2013-09-06 株式会社日立ハイテクノロジーズ 荷電粒子線装置
JP2013182760A (ja) * 2012-03-01 2013-09-12 Hitachi High-Technologies Corp 荷電粒子線装置
US9330883B2 (en) 2012-03-01 2016-05-03 Hitachi High-Technologies Corporation Charged particle beam device

Also Published As

Publication number Publication date
EP0018031A3 (en) 1980-11-12
JPS60102868U (ja) 1985-07-13
AU5736180A (en) 1980-10-16
JPS6327419Y2 (cs) 1988-07-25
EP0018031B1 (en) 1982-05-12
NL7902963A (nl) 1980-10-15
AU535802B2 (en) 1984-04-05
DE3060403D1 (en) 1982-07-01
US4438332A (en) 1984-03-20
CA1139457A (en) 1983-01-11
EP0018031A2 (en) 1980-10-29

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