JPS55135762A - Ic test unit - Google Patents

Ic test unit

Info

Publication number
JPS55135762A
JPS55135762A JP4377479A JP4377479A JPS55135762A JP S55135762 A JPS55135762 A JP S55135762A JP 4377479 A JP4377479 A JP 4377479A JP 4377479 A JP4377479 A JP 4377479A JP S55135762 A JPS55135762 A JP S55135762A
Authority
JP
Japan
Prior art keywords
pattern
read out
control data
input
expected value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4377479A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6228874B2 (enrdf_load_stackoverflow
Inventor
Junji Nishiura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Takeda Riken Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp, Takeda Riken Industries Co Ltd filed Critical Advantest Corp
Priority to JP4377479A priority Critical patent/JPS55135762A/ja
Priority to US06/069,345 priority patent/US4313200A/en
Publication of JPS55135762A publication Critical patent/JPS55135762A/ja
Publication of JPS6228874B2 publication Critical patent/JPS6228874B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP4377479A 1978-08-28 1979-04-11 Ic test unit Granted JPS55135762A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP4377479A JPS55135762A (en) 1979-04-11 1979-04-11 Ic test unit
US06/069,345 US4313200A (en) 1978-08-28 1979-08-24 Logic test system permitting test pattern changes without dummy cycles

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4377479A JPS55135762A (en) 1979-04-11 1979-04-11 Ic test unit

Publications (2)

Publication Number Publication Date
JPS55135762A true JPS55135762A (en) 1980-10-22
JPS6228874B2 JPS6228874B2 (enrdf_load_stackoverflow) 1987-06-23

Family

ID=12673091

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4377479A Granted JPS55135762A (en) 1978-08-28 1979-04-11 Ic test unit

Country Status (1)

Country Link
JP (1) JPS55135762A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58208859A (ja) * 1982-05-17 1983-12-05 フエアチアイルド・カメラ・アンド・インストルメント・コ−ポレ−シヨン テストシステムメモリ装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5585265A (en) * 1978-12-23 1980-06-27 Toshiba Corp Function test evaluation device for integrated circuit

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5585265A (en) * 1978-12-23 1980-06-27 Toshiba Corp Function test evaluation device for integrated circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58208859A (ja) * 1982-05-17 1983-12-05 フエアチアイルド・カメラ・アンド・インストルメント・コ−ポレ−シヨン テストシステムメモリ装置

Also Published As

Publication number Publication date
JPS6228874B2 (enrdf_load_stackoverflow) 1987-06-23

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