JPS5499657A - Micrograin size measuring apparatus by laser beam - Google Patents

Micrograin size measuring apparatus by laser beam

Info

Publication number
JPS5499657A
JPS5499657A JP575078A JP575078A JPS5499657A JP S5499657 A JPS5499657 A JP S5499657A JP 575078 A JP575078 A JP 575078A JP 575078 A JP575078 A JP 575078A JP S5499657 A JPS5499657 A JP S5499657A
Authority
JP
Japan
Prior art keywords
scanning
line
stored
registers
register
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP575078A
Other languages
English (en)
Inventor
Teruo Murakami
Kiyoshi Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP575078A priority Critical patent/JPS5499657A/ja
Publication of JPS5499657A publication Critical patent/JPS5499657A/ja
Pending legal-status Critical Current

Links

JP575078A 1978-01-24 1978-01-24 Micrograin size measuring apparatus by laser beam Pending JPS5499657A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP575078A JPS5499657A (en) 1978-01-24 1978-01-24 Micrograin size measuring apparatus by laser beam

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP575078A JPS5499657A (en) 1978-01-24 1978-01-24 Micrograin size measuring apparatus by laser beam

Publications (1)

Publication Number Publication Date
JPS5499657A true JPS5499657A (en) 1979-08-06

Family

ID=11619778

Family Applications (1)

Application Number Title Priority Date Filing Date
JP575078A Pending JPS5499657A (en) 1978-01-24 1978-01-24 Micrograin size measuring apparatus by laser beam

Country Status (1)

Country Link
JP (1) JPS5499657A (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6029643A (ja) * 1983-07-28 1985-02-15 Hitachi Electronics Eng Co Ltd 微粒子検出器
JPS60237345A (ja) * 1984-05-01 1985-11-26 オーソ・ダイアグノステイツク・システムズ・インコーポレイテツド 粒子の分析方法および装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6029643A (ja) * 1983-07-28 1985-02-15 Hitachi Electronics Eng Co Ltd 微粒子検出器
JPH0336176B2 (ja) * 1983-07-28 1991-05-30 Hitachi Electr Eng
JPS60237345A (ja) * 1984-05-01 1985-11-26 オーソ・ダイアグノステイツク・システムズ・インコーポレイテツド 粒子の分析方法および装置

Similar Documents

Publication Publication Date Title
JPS53110553A (en) Measurement apparatus of gradients of curved faces
JPS55142254A (en) Inspecting method for pattern of printed wiring board
JPS5433083A (en) Spectrophotometer
JPS5499657A (en) Micrograin size measuring apparatus by laser beam
JPS54134481A (en) Automatic rate analysis
JPS5533679A (en) Measuring method of distance
JPS548943A (en) Interface conversion sysetm for test unit
JPS5587431A (en) System for finding defect in repeated pattern
JPS55146573A (en) Binary circuit
JPS5630642A (en) Nondestructive inspection device
JPS5572811A (en) Pattern check unit
JPS52123646A (en) Scanning type length measuring apparatus
JPS5472924A (en) Semiconductor memory inspection equipment
JPS55164823A (en) Orthogonal projection image forming method of three-dimensional object
JPS55155206A (en) Position detector for moving object
JPS5526458A (en) Spot size measuring system of laser beam
JPS5658671A (en) Tester for logical circuit
JPS5544972A (en) Measuring range changing method and device for pen recorder
JPS52119183A (en) Electron beam exposure equipment
JPS5513555A (en) Half tone reproducing method dependent upon binary picture element
JPS53102066A (en) Length measuring method
JPS5572803A (en) Pattern check system
JPS53120588A (en) Ultrasonic inspection apparatus
JPS5582378A (en) Edge processing method in picture processing
JPS56162724A (en) Focusing detector