JPS5497390A - Manufacture of semiconductor photo detector - Google Patents

Manufacture of semiconductor photo detector

Info

Publication number
JPS5497390A
JPS5497390A JP372378A JP372378A JPS5497390A JP S5497390 A JPS5497390 A JP S5497390A JP 372378 A JP372378 A JP 372378A JP 372378 A JP372378 A JP 372378A JP S5497390 A JPS5497390 A JP S5497390A
Authority
JP
Japan
Prior art keywords
region
photo
diffusion
thickness
thin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP372378A
Other languages
Japanese (ja)
Inventor
Mitsuo Yoshida
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP372378A priority Critical patent/JPS5497390A/en
Publication of JPS5497390A publication Critical patent/JPS5497390A/en
Pending legal-status Critical Current

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Abstract

PURPOSE: To obtain a photo detector of high photo-sensitivity by diffusion-forming a unidirectionally-conductive region on a reversely-conductive semiconductor substrate and by making the thickness of this area thin by etching it from the exposed surface.
CONSTITUTION: At the edge of the surface of N-type Si substrate 1, electrode- leading-out N+-type region 11 is diffusion-formed and after both edges are covered with SiO2 films 10, P-type region 12, a photo detection region, is diffusion-formed at the center of substrate 1, thereby producing PN junction 13. Next, the exposed surface of this region 12 is etched into thin region 12', which is covered with light- reflective layer 20 and after an opening is made in film 10, an electrode to be connected to region 11 is fitted. In this way, region 12 is between 0.7 to 1.0μm in thickness first and then etched to a thickness 0.3μm. Therefore, the process until the formation of PN junction 13 is simplified and the photo-sensitivity improves by 15 to 20% by making region 12 thin.
COPYRIGHT: (C)1979,JPO&Japio
JP372378A 1978-01-19 1978-01-19 Manufacture of semiconductor photo detector Pending JPS5497390A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP372378A JPS5497390A (en) 1978-01-19 1978-01-19 Manufacture of semiconductor photo detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP372378A JPS5497390A (en) 1978-01-19 1978-01-19 Manufacture of semiconductor photo detector

Publications (1)

Publication Number Publication Date
JPS5497390A true JPS5497390A (en) 1979-08-01

Family

ID=11565202

Family Applications (1)

Application Number Title Priority Date Filing Date
JP372378A Pending JPS5497390A (en) 1978-01-19 1978-01-19 Manufacture of semiconductor photo detector

Country Status (1)

Country Link
JP (1) JPS5497390A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6473774A (en) * 1987-09-16 1989-03-20 Sumitomo Electric Industries Pin photodiode of ingaas/inp

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6473774A (en) * 1987-09-16 1989-03-20 Sumitomo Electric Industries Pin photodiode of ingaas/inp

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