JPS5476024A - Test device for semiconductor memory - Google Patents

Test device for semiconductor memory

Info

Publication number
JPS5476024A
JPS5476024A JP14412777A JP14412777A JPS5476024A JP S5476024 A JPS5476024 A JP S5476024A JP 14412777 A JP14412777 A JP 14412777A JP 14412777 A JP14412777 A JP 14412777A JP S5476024 A JPS5476024 A JP S5476024A
Authority
JP
Japan
Prior art keywords
address
test device
semiconductor memory
driver
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14412777A
Other languages
English (en)
Inventor
Osamu Matsuoka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP14412777A priority Critical patent/JPS5476024A/ja
Publication of JPS5476024A publication Critical patent/JPS5476024A/ja
Pending legal-status Critical Current

Links

Landscapes

  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Static Random-Access Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP14412777A 1977-11-30 1977-11-30 Test device for semiconductor memory Pending JPS5476024A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14412777A JPS5476024A (en) 1977-11-30 1977-11-30 Test device for semiconductor memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14412777A JPS5476024A (en) 1977-11-30 1977-11-30 Test device for semiconductor memory

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP60185142A Division JPS6164000A (ja) 1985-08-23 1985-08-23 半導体メモリの試験装置

Publications (1)

Publication Number Publication Date
JPS5476024A true JPS5476024A (en) 1979-06-18

Family

ID=15354819

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14412777A Pending JPS5476024A (en) 1977-11-30 1977-11-30 Test device for semiconductor memory

Country Status (1)

Country Link
JP (1) JPS5476024A (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5797641A (en) * 1980-12-10 1982-06-17 Ibm Integrated circuit chip capable of inspecting buried memory array
JPS593966A (ja) * 1982-06-29 1984-01-10 Toshiba Corp 半導体記憶装置試験方法
JPS59191197A (ja) * 1983-04-12 1984-10-30 Usac Electronics Ind Co Ltd メモリ・テスタ
JPS62263475A (ja) * 1986-05-10 1987-11-16 Agency Of Ind Science & Technol メモリ試験装置

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5797641A (en) * 1980-12-10 1982-06-17 Ibm Integrated circuit chip capable of inspecting buried memory array
JPS6231439B2 (ja) * 1980-12-10 1987-07-08 Intaanashonaru Bijinesu Mashiinzu Corp
JPS593966A (ja) * 1982-06-29 1984-01-10 Toshiba Corp 半導体記憶装置試験方法
JPS59191197A (ja) * 1983-04-12 1984-10-30 Usac Electronics Ind Co Ltd メモリ・テスタ
JPS62263475A (ja) * 1986-05-10 1987-11-16 Agency Of Ind Science & Technol メモリ試験装置
JP2520234B2 (ja) * 1986-05-10 1996-07-31 工業技術院長 メモリ試験装置

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