JPS5476024A - Test device for semiconductor memory - Google Patents
Test device for semiconductor memoryInfo
- Publication number
- JPS5476024A JPS5476024A JP14412777A JP14412777A JPS5476024A JP S5476024 A JPS5476024 A JP S5476024A JP 14412777 A JP14412777 A JP 14412777A JP 14412777 A JP14412777 A JP 14412777A JP S5476024 A JPS5476024 A JP S5476024A
- Authority
- JP
- Japan
- Prior art keywords
- address
- test device
- semiconductor memory
- driver
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Tests Of Electronic Circuits (AREA)
- Static Random-Access Memory (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14412777A JPS5476024A (en) | 1977-11-30 | 1977-11-30 | Test device for semiconductor memory |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14412777A JPS5476024A (en) | 1977-11-30 | 1977-11-30 | Test device for semiconductor memory |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60185142A Division JPS6164000A (ja) | 1985-08-23 | 1985-08-23 | 半導体メモリの試験装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5476024A true JPS5476024A (en) | 1979-06-18 |
Family
ID=15354819
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14412777A Pending JPS5476024A (en) | 1977-11-30 | 1977-11-30 | Test device for semiconductor memory |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5476024A (ja) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5797641A (en) * | 1980-12-10 | 1982-06-17 | Ibm | Integrated circuit chip capable of inspecting buried memory array |
JPS593966A (ja) * | 1982-06-29 | 1984-01-10 | Toshiba Corp | 半導体記憶装置試験方法 |
JPS59191197A (ja) * | 1983-04-12 | 1984-10-30 | Usac Electronics Ind Co Ltd | メモリ・テスタ |
JPS62263475A (ja) * | 1986-05-10 | 1987-11-16 | Agency Of Ind Science & Technol | メモリ試験装置 |
-
1977
- 1977-11-30 JP JP14412777A patent/JPS5476024A/ja active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5797641A (en) * | 1980-12-10 | 1982-06-17 | Ibm | Integrated circuit chip capable of inspecting buried memory array |
JPS6231439B2 (ja) * | 1980-12-10 | 1987-07-08 | Intaanashonaru Bijinesu Mashiinzu Corp | |
JPS593966A (ja) * | 1982-06-29 | 1984-01-10 | Toshiba Corp | 半導体記憶装置試験方法 |
JPS59191197A (ja) * | 1983-04-12 | 1984-10-30 | Usac Electronics Ind Co Ltd | メモリ・テスタ |
JPS62263475A (ja) * | 1986-05-10 | 1987-11-16 | Agency Of Ind Science & Technol | メモリ試験装置 |
JP2520234B2 (ja) * | 1986-05-10 | 1996-07-31 | 工業技術院長 | メモリ試験装置 |
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