JPS5469382A - Production of semiconductor device - Google Patents

Production of semiconductor device

Info

Publication number
JPS5469382A
JPS5469382A JP13705577A JP13705577A JPS5469382A JP S5469382 A JPS5469382 A JP S5469382A JP 13705577 A JP13705577 A JP 13705577A JP 13705577 A JP13705577 A JP 13705577A JP S5469382 A JPS5469382 A JP S5469382A
Authority
JP
Japan
Prior art keywords
film
plating
evaporation
films
bump
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP13705577A
Other languages
Japanese (ja)
Other versions
JPS6059742B2 (en
Inventor
Tatsuo Yoshino
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP52137055A priority Critical patent/JPS6059742B2/en
Publication of JPS5469382A publication Critical patent/JPS5469382A/en
Publication of JPS6059742B2 publication Critical patent/JPS6059742B2/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/11Manufacturing methods

Landscapes

  • Weting (AREA)

Abstract

PURPOSE: To make Ti and Pt films in an oxide film step good and restore the interface damage between the substrate and the insulating film generated at an Al evaporation time by performing the Al evaporation for plating electrodes in the process before the Ti and Pt sputter evaporation process in the bump forming process.
CONSTITUTION: Al electrode 12 and SiO2 film 13 dependent upon CVD method are grown on field oxide film 11 provided on the semiconductor substrate, and a through- hole is opened in film 13. Next, Al film 17 is evaporated as a plating electrode throughout the surface, and damages are restored beforehand by heat treatment when there are no Ti and Pt. After that, mask 14 of a photo resistor film is provided to cause Ti film 15 and Pt film 16 to adhere onto film 17 by continuous sputtering. Next, films 15 and 16 in the part other than bump forming positions are removed by the lift-off method, and the surface is covered with resistor film 18 to form Au bump 19 by plating. After that, film 18 is removed, and protruded surplus of film 17 is removed by etching.
COPYRIGHT: (C)1979,JPO&Japio
JP52137055A 1977-11-14 1977-11-14 Semiconductor device and its manufacturing method Expired JPS6059742B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP52137055A JPS6059742B2 (en) 1977-11-14 1977-11-14 Semiconductor device and its manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP52137055A JPS6059742B2 (en) 1977-11-14 1977-11-14 Semiconductor device and its manufacturing method

Publications (2)

Publication Number Publication Date
JPS5469382A true JPS5469382A (en) 1979-06-04
JPS6059742B2 JPS6059742B2 (en) 1985-12-26

Family

ID=15189818

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52137055A Expired JPS6059742B2 (en) 1977-11-14 1977-11-14 Semiconductor device and its manufacturing method

Country Status (1)

Country Link
JP (1) JPS6059742B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5932154A (en) * 1982-08-18 1984-02-21 Seiko Instr & Electronics Ltd Forming method for solder bump
JPS6396943A (en) * 1986-10-13 1988-04-27 Sanyo Electric Co Ltd Manufacture of semiconductor device
JPH0290622A (en) * 1988-09-28 1990-03-30 Seiko Instr Inc Gold bump forming method

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5932154A (en) * 1982-08-18 1984-02-21 Seiko Instr & Electronics Ltd Forming method for solder bump
JPH0226780B2 (en) * 1982-08-18 1990-06-12 Seiko Instr & Electronics
JPS6396943A (en) * 1986-10-13 1988-04-27 Sanyo Electric Co Ltd Manufacture of semiconductor device
JPH0290622A (en) * 1988-09-28 1990-03-30 Seiko Instr Inc Gold bump forming method

Also Published As

Publication number Publication date
JPS6059742B2 (en) 1985-12-26

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