JPS5444592U - - Google Patents

Info

Publication number
JPS5444592U
JPS5444592U JP1978106673U JP10667378U JPS5444592U JP S5444592 U JPS5444592 U JP S5444592U JP 1978106673 U JP1978106673 U JP 1978106673U JP 10667378 U JP10667378 U JP 10667378U JP S5444592 U JPS5444592 U JP S5444592U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1978106673U
Other versions
JPS5440076Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5444592U publication Critical patent/JPS5444592U/ja
Application granted granted Critical
Publication of JPS5440076Y2 publication Critical patent/JPS5440076Y2/ja
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9018—Dirt detection in containers
    • G01N21/9027—Dirt detection in containers in containers after filling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0078—Testing material properties on manufactured objects
    • G01N33/0081—Containers; Packages; Bottles

Landscapes

  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP1978106673U 1972-01-26 1978-08-04 Expired JPS5440076Y2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US22100872A 1972-01-26 1972-01-26

Publications (2)

Publication Number Publication Date
JPS5444592U true JPS5444592U (ja) 1979-03-27
JPS5440076Y2 JPS5440076Y2 (ja) 1979-11-27

Family

ID=22825948

Family Applications (2)

Application Number Title Priority Date Filing Date
JP48010370A Pending JPS4887892A (ja) 1972-01-26 1973-01-26
JP1978106673U Expired JPS5440076Y2 (ja) 1972-01-26 1978-08-04

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP48010370A Pending JPS4887892A (ja) 1972-01-26 1973-01-26

Country Status (11)

Country Link
US (1) US3777169A (ja)
JP (2) JPS4887892A (ja)
AR (1) AR202528A1 (ja)
AU (1) AU446177B2 (ja)
BE (1) BE794504A (ja)
BR (1) BR7300600D0 (ja)
CA (1) CA993079A (ja)
CH (1) CH556536A (ja)
FR (1) FR2169659A5 (ja)
GB (1) GB1401941A (ja)
IT (1) IT977675B (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58176535A (ja) * 1982-02-01 1983-10-17 ソシエテ・ナシヨナル・アンデユストリエ−ル・アエロスパチア−ル 液体中の異物を検出する方法

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1437104A (en) * 1972-10-31 1976-05-26 Remy E Method and apparatus for testing transparent containers
US3958078A (en) * 1974-08-30 1976-05-18 Ithaco, Inc. X-ray inspection method and apparatus
US3966332A (en) * 1974-09-12 1976-06-29 Schering Corporation Method and apparatus for inspecting liquids in transparent containers
US4079416A (en) * 1975-12-01 1978-03-14 Barry-Wehmiller Company Electronic image analyzing method and apparatus
US4063823A (en) * 1976-12-14 1977-12-20 Rame-Hart, Inc. Workpiece, and container and contents, inspecting apparatus and method
DE2728717C2 (de) * 1977-06-25 1983-11-10 Pfister Gmbh, 8900 Augsburg Verfahren und Vorrichtung zur berührungsfreien Bestimmung von Qualitätsmerkmalen eines Prüfobjektes der Fleischwaren-Kategorie, insbesondere eines Schlachttierkörpers oder Teilen davon
JPS5546172A (en) * 1978-09-29 1980-03-31 Kirin Brewery Co Ltd Detector for foreign material
JPS55119049A (en) * 1979-03-08 1980-09-12 Eisai Co Ltd Method and apparatus for detecting extraneous matter in liquid
US4393466A (en) * 1980-09-12 1983-07-12 International Remote Imaging Systems Method of analyzing particles in a dilute fluid sample
US4488648A (en) * 1982-05-06 1984-12-18 Powers Manufacturing, Inc. Flaw detector
JPS58195144A (ja) * 1982-05-10 1983-11-14 Takeda Chem Ind Ltd 密封容器充填液体に含む微少異物の存在検査方法
US4549205A (en) * 1982-05-10 1985-10-22 Takeda Chemical Industries, Ltd. Ampoule inspecting method
JPS58195143A (ja) * 1982-05-10 1983-11-14 Takeda Chem Ind Ltd 密封容器充填液体に含む微少異物の存在検査方法
JPS58211636A (ja) * 1982-06-03 1983-12-09 Eisai Co Ltd 検査装置における判定方法およびその装置
JPS58211635A (ja) * 1982-06-03 1983-12-09 Eisai Co Ltd 三波長分光光度測定方法による不良品検査装置
US4528455A (en) * 1983-05-13 1985-07-09 Magnaflux Corporation Non-destructive testing system with dual scanning
JPH0196540A (ja) * 1987-10-08 1989-04-14 Lion Eng Kk 液体中の異物検出方法
JP2896140B2 (ja) * 1987-10-08 1999-05-31 ライオンエンジニアリング株式会社 液体中の異物検出方法
JPH0811396B2 (ja) * 1989-12-25 1996-02-07 日本ゼオン株式会社 自動シート切断集積袋詰め方法及び装置
JPH0736001B2 (ja) * 1990-10-31 1995-04-19 東洋ガラス株式会社 びんの欠陥検査方法
DK17791D0 (da) * 1991-02-01 1991-02-01 Novo Nordisk As Beholderinspektion
GB9521285D0 (en) * 1995-10-18 1995-12-20 Pa Consulting Services Improvements in or relating to detection of foreign objects in fluid
US5886737A (en) * 1996-12-11 1999-03-23 Komatsu Electronic Metals Co., Ltd. Method for detecting the optimal melt temperature in the single-crystal semiconductor manufacturing process and apparatus thereof
US6765675B2 (en) * 2000-02-14 2004-07-20 M. W. Technologies, Inc. Fluid inspection apparatus with vibrator
EP1630550A1 (en) * 2004-08-27 2006-03-01 Moller & Devicon A/S Methods and apparatuses of detecting foreign particles or faults in a plurality of filled containers
JP5636211B2 (ja) 2010-05-31 2014-12-03 株式会社 日立産業制御ソリューションズ 異物検査装置および異物検査方法
CN103922258B (zh) * 2014-04-24 2016-08-17 泸州品创科技有限公司 用不规则酒瓶包装白酒的灌装方法及灌装装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3120578A (en) * 1960-09-23 1964-02-04 Maxson Electronics Corp Orientation determining device
US3576442A (en) * 1966-11-26 1971-04-27 Hoshitaka Nakamura Ampul inspector using multiple line scan cathode-ray tube
US3598907A (en) * 1968-05-20 1971-08-10 Emhart Corp Article inspection by successively televised images

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58176535A (ja) * 1982-02-01 1983-10-17 ソシエテ・ナシヨナル・アンデユストリエ−ル・アエロスパチア−ル 液体中の異物を検出する方法

Also Published As

Publication number Publication date
FR2169659A5 (ja) 1973-09-07
DE2303201A1 (de) 1973-08-09
AU5076473A (en) 1974-03-14
JPS5440076Y2 (ja) 1979-11-27
JPS4887892A (ja) 1973-11-17
GB1401941A (en) 1975-08-06
AR202528A1 (es) 1975-06-24
CA993079A (en) 1976-07-13
DE2303201B2 (de) 1976-12-09
BE794504A (fr) 1973-05-16
BR7300600D0 (pt) 1973-10-25
AU446177B2 (en) 1974-03-14
IT977675B (it) 1974-09-20
US3777169A (en) 1973-12-04
CH556536A (de) 1974-11-29

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