JPS5444592U - - Google Patents

Info

Publication number
JPS5444592U
JPS5444592U JP1978106673U JP10667378U JPS5444592U JP S5444592 U JPS5444592 U JP S5444592U JP 1978106673 U JP1978106673 U JP 1978106673U JP 10667378 U JP10667378 U JP 10667378U JP S5444592 U JPS5444592 U JP S5444592U
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1978106673U
Other languages
Japanese (ja)
Other versions
JPS5440076Y2 (US06826419-20041130-M00005.png
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS5444592U publication Critical patent/JPS5444592U/ja
Application granted granted Critical
Publication of JPS5440076Y2 publication Critical patent/JPS5440076Y2/ja
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/90Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9018Dirt detection in containers
    • G01N21/9027Dirt detection in containers in containers after filling
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/93Detection standards; Calibrating baseline adjustment, drift correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0078Testing material properties on manufactured objects
    • G01N33/0081Containers; Packages; Bottles

Landscapes

  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP1978106673U 1972-01-26 1978-08-04 Expired JPS5440076Y2 (US06826419-20041130-M00005.png)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US22100872A 1972-01-26 1972-01-26

Publications (2)

Publication Number Publication Date
JPS5444592U true JPS5444592U (US06826419-20041130-M00005.png) 1979-03-27
JPS5440076Y2 JPS5440076Y2 (US06826419-20041130-M00005.png) 1979-11-27

Family

ID=22825948

Family Applications (2)

Application Number Title Priority Date Filing Date
JP48010370A Pending JPS4887892A (US06826419-20041130-M00005.png) 1972-01-26 1973-01-26
JP1978106673U Expired JPS5440076Y2 (US06826419-20041130-M00005.png) 1972-01-26 1978-08-04

Family Applications Before (1)

Application Number Title Priority Date Filing Date
JP48010370A Pending JPS4887892A (US06826419-20041130-M00005.png) 1972-01-26 1973-01-26

Country Status (11)

Country Link
US (1) US3777169A (US06826419-20041130-M00005.png)
JP (2) JPS4887892A (US06826419-20041130-M00005.png)
AR (1) AR202528A1 (US06826419-20041130-M00005.png)
AU (1) AU446177B2 (US06826419-20041130-M00005.png)
BE (1) BE794504A (US06826419-20041130-M00005.png)
BR (1) BR7300600D0 (US06826419-20041130-M00005.png)
CA (1) CA993079A (US06826419-20041130-M00005.png)
CH (1) CH556536A (US06826419-20041130-M00005.png)
FR (1) FR2169659A5 (US06826419-20041130-M00005.png)
GB (1) GB1401941A (US06826419-20041130-M00005.png)
IT (1) IT977675B (US06826419-20041130-M00005.png)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58176535A (ja) * 1982-02-01 1983-10-17 ソシエテ・ナシヨナル・アンデユストリエ−ル・アエロスパチア−ル 液体中の異物を検出する方法

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1437104A (en) * 1972-10-31 1976-05-26 Remy E Method and apparatus for testing transparent containers
US3958078A (en) * 1974-08-30 1976-05-18 Ithaco, Inc. X-ray inspection method and apparatus
US3966332A (en) * 1974-09-12 1976-06-29 Schering Corporation Method and apparatus for inspecting liquids in transparent containers
US4079416A (en) * 1975-12-01 1978-03-14 Barry-Wehmiller Company Electronic image analyzing method and apparatus
US4063823A (en) * 1976-12-14 1977-12-20 Rame-Hart, Inc. Workpiece, and container and contents, inspecting apparatus and method
DE2728717C2 (de) * 1977-06-25 1983-11-10 Pfister Gmbh, 8900 Augsburg Verfahren und Vorrichtung zur berührungsfreien Bestimmung von Qualitätsmerkmalen eines Prüfobjektes der Fleischwaren-Kategorie, insbesondere eines Schlachttierkörpers oder Teilen davon
JPS5546172A (en) * 1978-09-29 1980-03-31 Kirin Brewery Co Ltd Detector for foreign material
JPS55119049A (en) * 1979-03-08 1980-09-12 Eisai Co Ltd Method and apparatus for detecting extraneous matter in liquid
US4393466A (en) * 1980-09-12 1983-07-12 International Remote Imaging Systems Method of analyzing particles in a dilute fluid sample
US4488648A (en) * 1982-05-06 1984-12-18 Powers Manufacturing, Inc. Flaw detector
JPS58195144A (ja) * 1982-05-10 1983-11-14 Takeda Chem Ind Ltd 密封容器充填液体に含む微少異物の存在検査方法
US4549205A (en) * 1982-05-10 1985-10-22 Takeda Chemical Industries, Ltd. Ampoule inspecting method
JPS58195143A (ja) * 1982-05-10 1983-11-14 Takeda Chem Ind Ltd 密封容器充填液体に含む微少異物の存在検査方法
JPS58211636A (ja) * 1982-06-03 1983-12-09 Eisai Co Ltd 検査装置における判定方法およびその装置
JPS58211635A (ja) * 1982-06-03 1983-12-09 Eisai Co Ltd 三波長分光光度測定方法による不良品検査装置
US4528455A (en) * 1983-05-13 1985-07-09 Magnaflux Corporation Non-destructive testing system with dual scanning
JPH0196540A (ja) * 1987-10-08 1989-04-14 Lion Eng Kk 液体中の異物検出方法
JP2896140B2 (ja) * 1987-10-08 1999-05-31 ライオンエンジニアリング株式会社 液体中の異物検出方法
JPH0811396B2 (ja) * 1989-12-25 1996-02-07 日本ゼオン株式会社 自動シート切断集積袋詰め方法及び装置
JPH0736001B2 (ja) * 1990-10-31 1995-04-19 東洋ガラス株式会社 びんの欠陥検査方法
DK17791D0 (da) * 1991-02-01 1991-02-01 Novo Nordisk As Beholderinspektion
GB9521285D0 (en) * 1995-10-18 1995-12-20 Pa Consulting Services Improvements in or relating to detection of foreign objects in fluid
US5886737A (en) * 1996-12-11 1999-03-23 Komatsu Electronic Metals Co., Ltd. Method for detecting the optimal melt temperature in the single-crystal semiconductor manufacturing process and apparatus thereof
US6765675B2 (en) * 2000-02-14 2004-07-20 M. W. Technologies, Inc. Fluid inspection apparatus with vibrator
EP1630550A1 (en) * 2004-08-27 2006-03-01 Moller & Devicon A/S Methods and apparatuses of detecting foreign particles or faults in a plurality of filled containers
JP5636211B2 (ja) 2010-05-31 2014-12-03 株式会社 日立産業制御ソリューションズ 異物検査装置および異物検査方法
CN103922258B (zh) * 2014-04-24 2016-08-17 泸州品创科技有限公司 用不规则酒瓶包装白酒的灌装方法及灌装装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3120578A (en) * 1960-09-23 1964-02-04 Maxson Electronics Corp Orientation determining device
US3576442A (en) * 1966-11-26 1971-04-27 Hoshitaka Nakamura Ampul inspector using multiple line scan cathode-ray tube
US3598907A (en) * 1968-05-20 1971-08-10 Emhart Corp Article inspection by successively televised images

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58176535A (ja) * 1982-02-01 1983-10-17 ソシエテ・ナシヨナル・アンデユストリエ−ル・アエロスパチア−ル 液体中の異物を検出する方法

Also Published As

Publication number Publication date
FR2169659A5 (US06826419-20041130-M00005.png) 1973-09-07
DE2303201A1 (de) 1973-08-09
AU5076473A (en) 1974-03-14
JPS5440076Y2 (US06826419-20041130-M00005.png) 1979-11-27
JPS4887892A (US06826419-20041130-M00005.png) 1973-11-17
GB1401941A (en) 1975-08-06
AR202528A1 (es) 1975-06-24
CA993079A (en) 1976-07-13
DE2303201B2 (de) 1976-12-09
BE794504A (fr) 1973-05-16
BR7300600D0 (pt) 1973-10-25
AU446177B2 (en) 1974-03-14
IT977675B (it) 1974-09-20
US3777169A (en) 1973-12-04
CH556536A (de) 1974-11-29

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