JPS54145592A - X-ray analyzer - Google Patents

X-ray analyzer

Info

Publication number
JPS54145592A
JPS54145592A JP5354978A JP5354978A JPS54145592A JP S54145592 A JPS54145592 A JP S54145592A JP 5354978 A JP5354978 A JP 5354978A JP 5354978 A JP5354978 A JP 5354978A JP S54145592 A JPS54145592 A JP S54145592A
Authority
JP
Japan
Prior art keywords
specimen
ray
detector
characteristic
opening window
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5354978A
Other languages
English (en)
Inventor
Satoru Kawazu
Takayuki Matsukawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP5354978A priority Critical patent/JPS54145592A/ja
Publication of JPS54145592A publication Critical patent/JPS54145592A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP5354978A 1978-05-04 1978-05-04 X-ray analyzer Pending JPS54145592A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5354978A JPS54145592A (en) 1978-05-04 1978-05-04 X-ray analyzer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5354978A JPS54145592A (en) 1978-05-04 1978-05-04 X-ray analyzer

Publications (1)

Publication Number Publication Date
JPS54145592A true JPS54145592A (en) 1979-11-13

Family

ID=12945868

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5354978A Pending JPS54145592A (en) 1978-05-04 1978-05-04 X-ray analyzer

Country Status (1)

Country Link
JP (1) JPS54145592A (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6420434A (en) * 1987-07-15 1989-01-24 Shimadzu Corp Ion etching device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6420434A (en) * 1987-07-15 1989-01-24 Shimadzu Corp Ion etching device

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