JPS54145485A - Gunn diode - Google Patents

Gunn diode

Info

Publication number
JPS54145485A
JPS54145485A JP5464578A JP5464578A JPS54145485A JP S54145485 A JPS54145485 A JP S54145485A JP 5464578 A JP5464578 A JP 5464578A JP 5464578 A JP5464578 A JP 5464578A JP S54145485 A JPS54145485 A JP S54145485A
Authority
JP
Japan
Prior art keywords
operation layer
carrier density
layer
contact layers
type semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5464578A
Other languages
Japanese (ja)
Inventor
Kenichi Kikuchi
Goji Yamaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sumitomo Electric Industries Ltd
Original Assignee
Sumitomo Electric Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Electric Industries Ltd filed Critical Sumitomo Electric Industries Ltd
Priority to JP5464578A priority Critical patent/JPS54145485A/en
Publication of JPS54145485A publication Critical patent/JPS54145485A/en
Pending legal-status Critical Current

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Abstract

PURPOSE: To improve characteristics by simplifying the connection of an operation layer by growing a N-type operation layer of low density on a N-type semiconductor substrate of high carrier density and by providing several contact layers onto it with an insulator sandwiched between.
CONSTITUTION: On N-type semiconductor substrate 1 of high carrier density, N- type operation layer 2 of low carrier density is formed by epitaxial growth via buffer layer 6 of high carrier density. Onto it. several N-type semiconductor contact layers 3a to 3c isolated mutually by an insulator or high-resistivity semiconductor layer 5 are provided and then connected together by ohmic electrode 4 vapor-deposited on the entire substrate surface. Next, ohmic electrode 4 is also adhered to the entire reverse surface of substrate 1. Operation layer 2 is divided finely without forming the mesa structure, and a voltage is applied to electrodes 4 to flow a current in the vertical direction right under contact layers 3a to 3c, where Gunn oscillations are caused. Consequently, operation layer 2 can be divided finely and gunn characteristics improve remarkably.
COPYRIGHT: (C)1979,JPO&Japio
JP5464578A 1978-05-08 1978-05-08 Gunn diode Pending JPS54145485A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5464578A JPS54145485A (en) 1978-05-08 1978-05-08 Gunn diode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5464578A JPS54145485A (en) 1978-05-08 1978-05-08 Gunn diode

Publications (1)

Publication Number Publication Date
JPS54145485A true JPS54145485A (en) 1979-11-13

Family

ID=12976503

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5464578A Pending JPS54145485A (en) 1978-05-08 1978-05-08 Gunn diode

Country Status (1)

Country Link
JP (1) JPS54145485A (en)

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