JPS54130188A - Electronic probe device - Google Patents

Electronic probe device

Info

Publication number
JPS54130188A
JPS54130188A JP3788678A JP3788678A JPS54130188A JP S54130188 A JPS54130188 A JP S54130188A JP 3788678 A JP3788678 A JP 3788678A JP 3788678 A JP3788678 A JP 3788678A JP S54130188 A JPS54130188 A JP S54130188A
Authority
JP
Japan
Prior art keywords
signal
circuit
scanning
time
sent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3788678A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6235056B2 (enExample
Inventor
Yoshihiro Hirata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP3788678A priority Critical patent/JPS54130188A/ja
Publication of JPS54130188A publication Critical patent/JPS54130188A/ja
Publication of JPS6235056B2 publication Critical patent/JPS6235056B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP3788678A 1978-03-31 1978-03-31 Electronic probe device Granted JPS54130188A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3788678A JPS54130188A (en) 1978-03-31 1978-03-31 Electronic probe device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3788678A JPS54130188A (en) 1978-03-31 1978-03-31 Electronic probe device

Publications (2)

Publication Number Publication Date
JPS54130188A true JPS54130188A (en) 1979-10-09
JPS6235056B2 JPS6235056B2 (enExample) 1987-07-30

Family

ID=12510012

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3788678A Granted JPS54130188A (en) 1978-03-31 1978-03-31 Electronic probe device

Country Status (1)

Country Link
JP (1) JPS54130188A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002031182A (ja) * 2000-06-14 2002-01-31 Weforma Gmbh ショックアブソーバ

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002031182A (ja) * 2000-06-14 2002-01-31 Weforma Gmbh ショックアブソーバ

Also Published As

Publication number Publication date
JPS6235056B2 (enExample) 1987-07-30

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