JPS54109896A - Background quantity assessing apparatus in x-ray microanalyzer or the like - Google Patents

Background quantity assessing apparatus in x-ray microanalyzer or the like

Info

Publication number
JPS54109896A
JPS54109896A JP1676878A JP1676878A JPS54109896A JP S54109896 A JPS54109896 A JP S54109896A JP 1676878 A JP1676878 A JP 1676878A JP 1676878 A JP1676878 A JP 1676878A JP S54109896 A JPS54109896 A JP S54109896A
Authority
JP
Japan
Prior art keywords
ray
intensity
specimen
ray intensity
continuous
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1676878A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6235055B2 (enrdf_load_stackoverflow
Inventor
Tadashi Watanabe
Jiyun Suzumi
Kiyoshi Harasawa
Yoshiaki Ono
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Priority to JP1676878A priority Critical patent/JPS54109896A/ja
Publication of JPS54109896A publication Critical patent/JPS54109896A/ja
Publication of JPS6235055B2 publication Critical patent/JPS6235055B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP1676878A 1978-02-16 1978-02-16 Background quantity assessing apparatus in x-ray microanalyzer or the like Granted JPS54109896A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1676878A JPS54109896A (en) 1978-02-16 1978-02-16 Background quantity assessing apparatus in x-ray microanalyzer or the like

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1676878A JPS54109896A (en) 1978-02-16 1978-02-16 Background quantity assessing apparatus in x-ray microanalyzer or the like

Publications (2)

Publication Number Publication Date
JPS54109896A true JPS54109896A (en) 1979-08-28
JPS6235055B2 JPS6235055B2 (enrdf_load_stackoverflow) 1987-07-30

Family

ID=11925389

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1676878A Granted JPS54109896A (en) 1978-02-16 1978-02-16 Background quantity assessing apparatus in x-ray microanalyzer or the like

Country Status (1)

Country Link
JP (1) JPS54109896A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008122267A (ja) * 2006-11-14 2008-05-29 Jeol Ltd 試料分析方法及び試料分析装置
CN108717065A (zh) * 2018-04-16 2018-10-30 中国地质大学（武汉） 一种利用多点拟合确定连续x射线背景强度的方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008122267A (ja) * 2006-11-14 2008-05-29 Jeol Ltd 試料分析方法及び試料分析装置
CN108717065A (zh) * 2018-04-16 2018-10-30 中国地质大学（武汉） 一种利用多点拟合确定连续x射线背景强度的方法

Also Published As

Publication number Publication date
JPS6235055B2 (enrdf_load_stackoverflow) 1987-07-30

Similar Documents

Publication Publication Date Title
JPS5756740A (en) Object inspecting device
JPS5949524B2 (ja) 測定システム
US4129778A (en) Method and apparatus for measuring the thickness of a non-metallic coating on a plated metal plate
US4016419A (en) Non-dispersive X-ray fluorescence analyzer
JPS54109896A (en) Background quantity assessing apparatus in x-ray microanalyzer or the like
JPS5759143A (en) Measuring method for grain size of granular material
JPS5582006A (en) Measuring method for thickness
JPS52127292A (en) Analyzer
US3253149A (en) Method and apparatus for hardness testing using backscattered beta radiation
JPS54118861A (en) Plate thickness measuring method
RU2234677C2 (ru) Рентгеновский способ измерения толщины листовых изделий
SU1082119A1 (ru) Способ контрол изделий методом вычислительной томографии
JPS5796207A (en) Measuring apparatus for pattern dimensions
JPS5529726A (en) Water content measuring method dependent upon infrared ray
JPS54109897A (en) Specimen analytical apparatus in scanning electron microscope or the like
SU1004831A1 (ru) Нейтронный влагомер
JPS6453144A (en) Method for evaluating thin film by fluorescent x-ray analysis
JPS6445047A (en) Measuring device for cathode luminesence
JPS55159143A (en) Metal surface flaw detector
CA2125578A1 (en) Sensor and method for measurement of select components of a material
JP2937598B2 (ja) 深さ方向元素濃度分布測定装置
SU616573A1 (ru) Устройство дл магнитошумовой структуроскопии
SU1046663A1 (ru) Анализатор состава веществ
JPS5624564A (en) Determination method of and apparatus for hydrogen in metal
JPS56153231A (en) Stress measuring method