JPS5365276A - Rotary chemical evaporation apparatus for forming thin film - Google Patents
Rotary chemical evaporation apparatus for forming thin filmInfo
- Publication number
- JPS5365276A JPS5365276A JP14067076A JP14067076A JPS5365276A JP S5365276 A JPS5365276 A JP S5365276A JP 14067076 A JP14067076 A JP 14067076A JP 14067076 A JP14067076 A JP 14067076A JP S5365276 A JPS5365276 A JP S5365276A
- Authority
- JP
- Japan
- Prior art keywords
- thin film
- evaporation apparatus
- forming thin
- chemical evaporation
- rotary chemical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
PURPOSE:To provide an apparatus described in the title for forming multilayer thin film by detecting thin film thickness formed in the former step on a substratum surface placed on a swiveling table, by stopping the film formation when the thickness reached the set value, and by starting the latter formation of thin film.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14067076A JPS5365276A (en) | 1976-11-25 | 1976-11-25 | Rotary chemical evaporation apparatus for forming thin film |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14067076A JPS5365276A (en) | 1976-11-25 | 1976-11-25 | Rotary chemical evaporation apparatus for forming thin film |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5365276A true JPS5365276A (en) | 1978-06-10 |
Family
ID=15274019
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14067076A Pending JPS5365276A (en) | 1976-11-25 | 1976-11-25 | Rotary chemical evaporation apparatus for forming thin film |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5365276A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5665974A (en) * | 1979-11-02 | 1981-06-04 | Komatsu Ltd | Vapor deposition controlling method |
JPS58140605A (en) * | 1982-01-18 | 1983-08-20 | Koshin Kogaku:Kk | Controlling method of thickness of optical thin film |
JPS62165103A (en) * | 1986-01-17 | 1987-07-21 | Canon Inc | Method for measuring film thickness |
EP0233610A2 (en) * | 1986-02-15 | 1987-08-26 | Sony Corporation | Method and apparatus for vapor deposition |
US4878755A (en) * | 1986-03-29 | 1989-11-07 | Leybold Aktiengesellschaft | Process and device for measuring the optical properties of thin layers |
JPH0443906A (en) * | 1990-06-11 | 1992-02-13 | Matsushita Electric Ind Co Ltd | Optical film thickness monitor device |
-
1976
- 1976-11-25 JP JP14067076A patent/JPS5365276A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5665974A (en) * | 1979-11-02 | 1981-06-04 | Komatsu Ltd | Vapor deposition controlling method |
JPS58140605A (en) * | 1982-01-18 | 1983-08-20 | Koshin Kogaku:Kk | Controlling method of thickness of optical thin film |
JPS62165103A (en) * | 1986-01-17 | 1987-07-21 | Canon Inc | Method for measuring film thickness |
EP0233610A2 (en) * | 1986-02-15 | 1987-08-26 | Sony Corporation | Method and apparatus for vapor deposition |
US4878755A (en) * | 1986-03-29 | 1989-11-07 | Leybold Aktiengesellschaft | Process and device for measuring the optical properties of thin layers |
JPH0443906A (en) * | 1990-06-11 | 1992-02-13 | Matsushita Electric Ind Co Ltd | Optical film thickness monitor device |
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