JPS5335472A - Production of semiconductor unit - Google Patents
Production of semiconductor unitInfo
- Publication number
- JPS5335472A JPS5335472A JP11028476A JP11028476A JPS5335472A JP S5335472 A JPS5335472 A JP S5335472A JP 11028476 A JP11028476 A JP 11028476A JP 11028476 A JP11028476 A JP 11028476A JP S5335472 A JPS5335472 A JP S5335472A
- Authority
- JP
- Japan
- Prior art keywords
- elements
- production
- semiconductor unit
- axis
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/93—Batch processes
- H01L24/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L24/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L2224/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01039—Yttrium [Y]
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Wire Bonding (AREA)
- Dicing (AREA)
Abstract
PURPOSE: A semiconductor wafer is scribed in one direction of X axis or Y axis, and obtained freezing elements rows are fixed on an insulating plate. Then, after the electrode of elements and the wiring on the substrate are connected electrically, they are divided into individual elements, so that assembly of elements where the electrode pad arrangement shapes like dual inline can be easy.
COPYRIGHT: (C)1978,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11028476A JPS5335472A (en) | 1976-09-14 | 1976-09-14 | Production of semiconductor unit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11028476A JPS5335472A (en) | 1976-09-14 | 1976-09-14 | Production of semiconductor unit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5335472A true JPS5335472A (en) | 1978-04-01 |
Family
ID=14531781
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11028476A Pending JPS5335472A (en) | 1976-09-14 | 1976-09-14 | Production of semiconductor unit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5335472A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5872650U (en) * | 1981-11-11 | 1983-05-17 | 株式会社東洋精機製作所 | Initial adhesion measurement test device |
JPS62267646A (en) * | 1986-05-16 | 1987-11-20 | Asahi Seiko Kk | Method and device for measuring rolling type adhesive strength |
-
1976
- 1976-09-14 JP JP11028476A patent/JPS5335472A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5872650U (en) * | 1981-11-11 | 1983-05-17 | 株式会社東洋精機製作所 | Initial adhesion measurement test device |
JPS62267646A (en) * | 1986-05-16 | 1987-11-20 | Asahi Seiko Kk | Method and device for measuring rolling type adhesive strength |
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