JPS5240981A - Insulation gate type field effect transistor circuit - Google Patents
Insulation gate type field effect transistor circuitInfo
- Publication number
- JPS5240981A JPS5240981A JP50115974A JP11597475A JPS5240981A JP S5240981 A JPS5240981 A JP S5240981A JP 50115974 A JP50115974 A JP 50115974A JP 11597475 A JP11597475 A JP 11597475A JP S5240981 A JPS5240981 A JP S5240981A
- Authority
- JP
- Japan
- Prior art keywords
- field effect
- effect transistor
- type field
- gate type
- transistor circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005669 field effect Effects 0.000 title 1
- 238000009413 insulation Methods 0.000 title 1
- 230000015556 catabolic process Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
- H01L27/0248—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection
- H01L27/0251—Particular design considerations for integrated circuits for electrical or thermal protection, e.g. electrostatic discharge [ESD] protection for MOS devices
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Amplifiers (AREA)
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Abstract
PURPOSE:A protection diode is built between gate and source electrodes or between drain and source electrodes, whereby an IGFET which prevents breakdown of junction is obtained.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50115974A JPS5240981A (en) | 1975-09-27 | 1975-09-27 | Insulation gate type field effect transistor circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP50115974A JPS5240981A (en) | 1975-09-27 | 1975-09-27 | Insulation gate type field effect transistor circuit |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5240981A true JPS5240981A (en) | 1977-03-30 |
Family
ID=14675725
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP50115974A Pending JPS5240981A (en) | 1975-09-27 | 1975-09-27 | Insulation gate type field effect transistor circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5240981A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54124458U (en) * | 1978-02-21 | 1979-08-31 | ||
JPS5712556A (en) * | 1980-06-27 | 1982-01-22 | Hitachi Ltd | Mos semiconductor device |
JPS63151090A (en) * | 1986-12-16 | 1988-06-23 | Matsushita Electronics Corp | Hall effect semiconductor device |
-
1975
- 1975-09-27 JP JP50115974A patent/JPS5240981A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS54124458U (en) * | 1978-02-21 | 1979-08-31 | ||
JPS5712556A (en) * | 1980-06-27 | 1982-01-22 | Hitachi Ltd | Mos semiconductor device |
JPS63151090A (en) * | 1986-12-16 | 1988-06-23 | Matsushita Electronics Corp | Hall effect semiconductor device |
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