JPS50141968A - - Google Patents

Info

Publication number
JPS50141968A
JPS50141968A JP3771775A JP3771775A JPS50141968A JP S50141968 A JPS50141968 A JP S50141968A JP 3771775 A JP3771775 A JP 3771775A JP 3771775 A JP3771775 A JP 3771775A JP S50141968 A JPS50141968 A JP S50141968A
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3771775A
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of JPS50141968A publication Critical patent/JPS50141968A/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/20Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2001Maintaining constant desired temperature
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2002Controlling environment of sample
    • H01J2237/2003Environmental cells

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Microscoopes, Condenser (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
JP3771775A 1974-03-28 1975-03-28 Pending JPS50141968A (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
HUMA002555 HU168264B (de) 1974-03-28 1974-03-28

Publications (1)

Publication Number Publication Date
JPS50141968A true JPS50141968A (de) 1975-11-15

Family

ID=10998701

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3771775A Pending JPS50141968A (de) 1974-03-28 1975-03-28

Country Status (6)

Country Link
JP (1) JPS50141968A (de)
DE (1) DE2513832C2 (de)
FR (1) FR2266299B3 (de)
GB (1) GB1504984A (de)
HU (1) HU168264B (de)
NL (1) NL7503645A (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03165435A (ja) * 1989-11-24 1991-07-17 Nippon Denshi Tekunikusu Kk 電子顕微鏡

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL150056A0 (en) * 2002-06-05 2002-12-01 Yeda Res & Dev Low-pressure chamber for scanning electron microscopy in a wet environment
DE10256718B4 (de) * 2002-12-04 2004-10-28 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung zur Probenuntersuchung mittels eines atmosphärischen oder druckvariablen Rasterelektronenmikroskops
CN1862250A (zh) * 2005-05-09 2006-11-15 李炳寰 在真空或低压环境中操作液体且可供观测的方法及装置
JP6364167B2 (ja) * 2013-09-30 2018-07-25 株式会社日立ハイテクノロジーズ 環境制御型荷電粒子観察システム

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE911409C (de) * 1942-04-29 1954-05-13 Siemens Ag Korpuskularstrahlapparat, insbesondere Elektronenmikroskop

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03165435A (ja) * 1989-11-24 1991-07-17 Nippon Denshi Tekunikusu Kk 電子顕微鏡

Also Published As

Publication number Publication date
FR2266299B3 (de) 1977-07-01
DE2513832A1 (de) 1975-10-02
HU168264B (de) 1976-03-28
GB1504984A (en) 1978-03-22
DE2513832C2 (de) 1981-10-08
NL7503645A (nl) 1975-09-30
FR2266299A1 (de) 1975-10-24

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