HU168264B - - Google Patents

Info

Publication number
HU168264B
HU168264B HUMA002555A HU168264B HU 168264 B HU168264 B HU 168264B HU MA002555 A HUMA002555 A HU MA002555A HU 168264 B HU168264 B HU 168264B
Authority
HU
Hungary
Application number
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to HUMA002555 priority Critical patent/HU168264B/hu
Priority to GB1101575A priority patent/GB1504984A/en
Priority to NL7503645A priority patent/NL7503645A/xx
Priority to FR7509487A priority patent/FR2266299B3/fr
Priority to DE19752513832 priority patent/DE2513832C2/de
Priority to JP3771775A priority patent/JPS50141968A/ja
Publication of HU168264B publication Critical patent/HU168264B/hu
Priority to US05/683,832 priority patent/US4071766A/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/20Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2001Maintaining constant desired temperature
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2002Controlling environment of sample
    • H01J2237/2003Environmental cells
HUMA002555 1974-03-28 1974-03-28 HU168264B (hu)

Priority Applications (7)

Application Number Priority Date Filing Date Title
HUMA002555 HU168264B (hu) 1974-03-28 1974-03-28
GB1101575A GB1504984A (en) 1974-03-28 1975-03-17 Micro-chamber for electron optical examinations
NL7503645A NL7503645A (nl) 1974-03-28 1975-03-26 Micro-kamer voor elektronen-optische onderzoe- kingen, meer in het bijzonder voor het elektro- nenmicroscopisch onderzoek van biologische objecten.
FR7509487A FR2266299B3 (hu) 1974-03-28 1975-03-26
DE19752513832 DE2513832C2 (de) 1974-03-28 1975-03-27 Anordnung zur elektronenoptischen Untersuchung von Proben
JP3771775A JPS50141968A (hu) 1974-03-28 1975-03-28
US05/683,832 US4071766A (en) 1974-03-28 1976-05-06 Micro-chamber for electron optical examinations particularly for the electron microscopic examination of biological objects

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
HUMA002555 HU168264B (hu) 1974-03-28 1974-03-28

Publications (1)

Publication Number Publication Date
HU168264B true HU168264B (hu) 1976-03-28

Family

ID=10998701

Family Applications (1)

Application Number Title Priority Date Filing Date
HUMA002555 HU168264B (hu) 1974-03-28 1974-03-28

Country Status (6)

Country Link
JP (1) JPS50141968A (hu)
DE (1) DE2513832C2 (hu)
FR (1) FR2266299B3 (hu)
GB (1) GB1504984A (hu)
HU (1) HU168264B (hu)
NL (1) NL7503645A (hu)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2794471B2 (ja) * 1989-11-24 1998-09-03 日本電子テクニクス株式会社 電子顕微鏡
IL150056A0 (en) * 2002-06-05 2002-12-01 Yeda Res & Dev Low-pressure chamber for scanning electron microscopy in a wet environment
DE10256718B4 (de) * 2002-12-04 2004-10-28 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung zur Probenuntersuchung mittels eines atmosphärischen oder druckvariablen Rasterelektronenmikroskops
CN1862250A (zh) * 2005-05-09 2006-11-15 李炳寰 在真空或低压环境中操作液体且可供观测的方法及装置
JP6364167B2 (ja) * 2013-09-30 2018-07-25 株式会社日立ハイテクノロジーズ 環境制御型荷電粒子観察システム

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE911409C (de) * 1942-04-29 1954-05-13 Siemens Ag Korpuskularstrahlapparat, insbesondere Elektronenmikroskop

Also Published As

Publication number Publication date
FR2266299B3 (hu) 1977-07-01
DE2513832A1 (de) 1975-10-02
JPS50141968A (hu) 1975-11-15
GB1504984A (en) 1978-03-22
DE2513832C2 (de) 1981-10-08
NL7503645A (nl) 1975-09-30
FR2266299A1 (hu) 1975-10-24

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