FR2266299B3 - - Google Patents

Info

Publication number
FR2266299B3
FR2266299B3 FR7509487A FR7509487A FR2266299B3 FR 2266299 B3 FR2266299 B3 FR 2266299B3 FR 7509487 A FR7509487 A FR 7509487A FR 7509487 A FR7509487 A FR 7509487A FR 2266299 B3 FR2266299 B3 FR 2266299B3
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7509487A
Other languages
French (fr)
Other versions
FR2266299A1 (de
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NOVEX FOREIGN TRADE CO Ltd
Original Assignee
NOVEX FOREIGN TRADE CO Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NOVEX FOREIGN TRADE CO Ltd filed Critical NOVEX FOREIGN TRADE CO Ltd
Publication of FR2266299A1 publication Critical patent/FR2266299A1/fr
Application granted granted Critical
Publication of FR2266299B3 publication Critical patent/FR2266299B3/fr
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/20Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2001Maintaining constant desired temperature
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2002Controlling environment of sample
    • H01J2237/2003Environmental cells

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Microscoopes, Condenser (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
FR7509487A 1974-03-28 1975-03-26 Expired FR2266299B3 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
HUMA002555 HU168264B (de) 1974-03-28 1974-03-28

Publications (2)

Publication Number Publication Date
FR2266299A1 FR2266299A1 (de) 1975-10-24
FR2266299B3 true FR2266299B3 (de) 1977-07-01

Family

ID=10998701

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7509487A Expired FR2266299B3 (de) 1974-03-28 1975-03-26

Country Status (6)

Country Link
JP (1) JPS50141968A (de)
DE (1) DE2513832C2 (de)
FR (1) FR2266299B3 (de)
GB (1) GB1504984A (de)
HU (1) HU168264B (de)
NL (1) NL7503645A (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2794471B2 (ja) * 1989-11-24 1998-09-03 日本電子テクニクス株式会社 電子顕微鏡
IL150056A0 (en) * 2002-06-05 2002-12-01 Yeda Res & Dev Low-pressure chamber for scanning electron microscopy in a wet environment
DE10256718B4 (de) * 2002-12-04 2004-10-28 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung zur Probenuntersuchung mittels eines atmosphärischen oder druckvariablen Rasterelektronenmikroskops
CN1862250A (zh) * 2005-05-09 2006-11-15 李炳寰 在真空或低压环境中操作液体且可供观测的方法及装置
JP6364167B2 (ja) * 2013-09-30 2018-07-25 株式会社日立ハイテクノロジーズ 環境制御型荷電粒子観察システム

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE911409C (de) * 1942-04-29 1954-05-13 Siemens Ag Korpuskularstrahlapparat, insbesondere Elektronenmikroskop

Also Published As

Publication number Publication date
DE2513832A1 (de) 1975-10-02
HU168264B (de) 1976-03-28
JPS50141968A (de) 1975-11-15
GB1504984A (en) 1978-03-22
DE2513832C2 (de) 1981-10-08
NL7503645A (nl) 1975-09-30
FR2266299A1 (de) 1975-10-24

Similar Documents

Publication Publication Date Title
FR2259091B1 (de)
FR2345931B1 (de)
FI751762A (de)
FR2266299B3 (de)
FR2272909A1 (de)
JPS50161645A (de)
JPS50161417A (de)
FR2289999B2 (de)
JPS50128051A (de)
JPS50133903A (de)
FR2299591B1 (de)
JPS50139534A (de)
JPS50127141A (de)
JPS50124700U (de)
JPS50133944U (de)
JPS50154605U (de)
JPS5110237U (de)
JPS5120663U (de)
JPS5122505U (de)
CH583746A5 (de)
CH578156A5 (de)
CH599250A5 (de)
CH573721A5 (de)
CH583607A5 (de)
CH583032A5 (de)