JPH1187240A5 - - Google Patents
Info
- Publication number
- JPH1187240A5 JPH1187240A5 JP1997237110A JP23711097A JPH1187240A5 JP H1187240 A5 JPH1187240 A5 JP H1187240A5 JP 1997237110 A JP1997237110 A JP 1997237110A JP 23711097 A JP23711097 A JP 23711097A JP H1187240 A5 JPH1187240 A5 JP H1187240A5
- Authority
- JP
- Japan
- Prior art keywords
- conductive layer
- contact conductive
- junction field
- effect transistor
- field effect
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23711097A JP3709668B2 (ja) | 1997-09-02 | 1997-09-02 | 半導体装置とその製造方法 |
| IDP981183A ID20785A (id) | 1997-09-02 | 1998-08-31 | Alat semi-konduktor serta tata cara pembuatannya |
| US09/145,431 US6278143B1 (en) | 1997-09-02 | 1998-09-01 | Semiconductor device with bipolar and J-FET transistors |
| CNB981188214A CN1155103C (zh) | 1997-09-02 | 1998-09-02 | 半导体器件及其制造方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23711097A JP3709668B2 (ja) | 1997-09-02 | 1997-09-02 | 半導体装置とその製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPH1187240A JPH1187240A (ja) | 1999-03-30 |
| JPH1187240A5 true JPH1187240A5 (enExample) | 2004-12-24 |
| JP3709668B2 JP3709668B2 (ja) | 2005-10-26 |
Family
ID=17010571
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP23711097A Expired - Lifetime JP3709668B2 (ja) | 1997-09-02 | 1997-09-02 | 半導体装置とその製造方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6278143B1 (enExample) |
| JP (1) | JP3709668B2 (enExample) |
| CN (1) | CN1155103C (enExample) |
| ID (1) | ID20785A (enExample) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003529937A (ja) * | 2000-03-30 | 2003-10-07 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 半導体装置及び半導体装置を製造する方法 |
| US7598521B2 (en) * | 2004-03-29 | 2009-10-06 | Sanyo Electric Co., Ltd. | Semiconductor device in which the emitter resistance is reduced |
| JP5114824B2 (ja) * | 2004-10-15 | 2013-01-09 | 富士通セミコンダクター株式会社 | 半導体装置およびその製造方法 |
| US7560755B2 (en) | 2006-06-09 | 2009-07-14 | Dsm Solutions, Inc. | Self aligned gate JFET structure and method |
| US7772060B2 (en) * | 2006-06-21 | 2010-08-10 | Texas Instruments Deutschland Gmbh | Integrated SiGe NMOS and PMOS transistors |
| JP4751308B2 (ja) * | 2006-12-18 | 2011-08-17 | 住友電気工業株式会社 | 横型接合型電界効果トランジスタ |
| AU2010262789A1 (en) * | 2009-06-19 | 2012-02-02 | Power Integrations, Inc. | Methods of making vertical junction field effect transistors and bipolar junction transistors without ion implantation and devices made therewith |
| SE535380C2 (sv) * | 2011-01-31 | 2012-07-17 | Fairchild Semiconductor | Bipolär transistor i kiselkarbid med övervuxen emitter |
| US9331097B2 (en) | 2014-03-03 | 2016-05-03 | International Business Machines Corporation | High speed bipolar junction transistor for high voltage applications |
| KR101716957B1 (ko) * | 2014-07-02 | 2017-03-15 | 타이완 세미콘덕터 매뉴팩쳐링 컴퍼니 리미티드 | 정션 게이트 전계효과 트랜지스터, 반도체 디바이스 및 제조 방법 |
| US9935628B2 (en) * | 2015-11-10 | 2018-04-03 | Analog Devices Global | FET—bipolar transistor combination, and a switch comprising such a FET—bipolar transistor combination |
| US9653455B1 (en) * | 2015-11-10 | 2017-05-16 | Analog Devices Global | FET—bipolar transistor combination |
| US10218350B2 (en) | 2016-07-20 | 2019-02-26 | Semiconductor Components Industries, Llc | Circuit with transistors having coupled gates |
| US9947654B2 (en) | 2016-09-08 | 2018-04-17 | Semiconductor Components Industries, Llc | Electronic device including a transistor and a field electrode |
| CN108878513B (zh) * | 2017-05-09 | 2021-09-03 | 世界先进积体电路股份有限公司 | 半导体装置及其制造方法 |
| CN113823678A (zh) * | 2021-09-03 | 2021-12-21 | 无锡市晶源微电子有限公司 | 一种高压npn器件 |
| CN114709268B (zh) * | 2022-03-25 | 2025-09-12 | 上海积塔半导体有限公司 | 结型场效应晶体管及其制备方法 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4485392A (en) * | 1981-12-28 | 1984-11-27 | North American Philips Corporation | Lateral junction field effect transistor device |
| US4600932A (en) * | 1984-10-12 | 1986-07-15 | Gte Laboratories Incorporated | Enhanced mobility buried channel transistor structure |
| JPS62289544A (ja) * | 1986-06-09 | 1987-12-16 | Daikin Ind Ltd | 含フツ素化合物 |
| JPH04291952A (ja) * | 1991-03-20 | 1992-10-16 | Sony Corp | 半導体装置 |
| SE500814C2 (sv) * | 1993-01-25 | 1994-09-12 | Ericsson Telefon Ab L M | Halvledaranordning i ett tunt aktivt skikt med hög genombrottsspänning |
| FR2708144A1 (fr) * | 1993-07-22 | 1995-01-27 | Philips Composants | Dispositif intégré associant un transistor bipolaire à un transistor à effet de champ. |
-
1997
- 1997-09-02 JP JP23711097A patent/JP3709668B2/ja not_active Expired - Lifetime
-
1998
- 1998-08-31 ID IDP981183A patent/ID20785A/id unknown
- 1998-09-01 US US09/145,431 patent/US6278143B1/en not_active Expired - Lifetime
- 1998-09-02 CN CNB981188214A patent/CN1155103C/zh not_active Expired - Lifetime
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6392275B1 (en) | Semiconductor device with DMOS, BJT and CMOS structures | |
| US5930642A (en) | Transistor with buried insulative layer beneath the channel region | |
| US5185280A (en) | Method of fabricating a soi transistor with pocket implant and body-to-source (bts) contact | |
| US20020182813A1 (en) | Graded LDD implant process for sub-half-micron MOS devices | |
| JPH1187240A5 (enExample) | ||
| US5895766A (en) | Method of forming a field effect transistor | |
| US5244823A (en) | Process for fabricating a semiconductor device | |
| JPH0620132B2 (ja) | 電界効果トランジスタ | |
| US6146934A (en) | Semiconductor device with asymmetric PMOS source/drain implant and method of manufacture thereof | |
| JPS61156882A (ja) | 二重拡散形絶縁ゲ−ト電界効果トランジスタ及びその製造方法 | |
| US6963109B2 (en) | Semiconductor device and method for manufacturing the same | |
| CN1155103C (zh) | 半导体器件及其制造方法 | |
| JP3307112B2 (ja) | 半導体装置の製造方法 | |
| JPH1197709A (ja) | Mosトランジスタおよびその製造方法 | |
| JPS58147074A (ja) | 金属酸化物半導体トランジスタデバイス及びその製法 | |
| US5291049A (en) | Mosfet with buried element isolation regions | |
| US6576521B1 (en) | Method of forming semiconductor device with LDD structure | |
| US5877058A (en) | Method of forming an insulated-gate field-effect transistor with metal spacers | |
| US7119435B2 (en) | Semiconductor device with source/drain extension layer | |
| KR100518506B1 (ko) | 트랜치 게이트형 전력용 모스 소자 및 그 제조방법 | |
| RU96109062A (ru) | Бикмоп-прибор и способ его изготовления | |
| JP3192857B2 (ja) | 縦型mos半導体装置及びその製造方法 | |
| JPH11121757A (ja) | 半導体装置およびその製造方法 | |
| JP2004063918A (ja) | 横型mosトランジスタ | |
| JPS63227059A (ja) | 半導体装置およびその製造方法 |