JPH11500949A - 補正ユニットを有する画像センサマトリックスを含むx線検査装置 - Google Patents
補正ユニットを有する画像センサマトリックスを含むx線検査装置Info
- Publication number
- JPH11500949A JPH11500949A JP9522619A JP52261997A JPH11500949A JP H11500949 A JPH11500949 A JP H11500949A JP 9522619 A JP9522619 A JP 9522619A JP 52261997 A JP52261997 A JP 52261997A JP H11500949 A JPH11500949 A JP H11500949A
- Authority
- JP
- Japan
- Prior art keywords
- ray
- image
- signal
- image sensor
- sensor matrix
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000011159 matrix material Substances 0.000 title claims abstract description 61
- 238000007689 inspection Methods 0.000 title claims abstract description 38
- 238000012937 correction Methods 0.000 title claims abstract description 36
- 230000005855 radiation Effects 0.000 claims description 44
- 230000003111 delayed effect Effects 0.000 abstract description 12
- 206010047571 Visual impairment Diseases 0.000 description 5
- 238000012545 processing Methods 0.000 description 4
- 230000005284 excitation Effects 0.000 description 3
- 238000003384 imaging method Methods 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 208000037265 diseases, disorders, signs and symptoms Diseases 0.000 description 2
- 238000013213 extrapolation Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- LFVLUOAHQIVABZ-UHFFFAOYSA-N Iodofenphos Chemical compound COP(=S)(OC)OC1=CC(Cl)=C(I)C=C1Cl LFVLUOAHQIVABZ-UHFFFAOYSA-N 0.000 description 1
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 1
- 238000000333 X-ray scattering Methods 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000002800 charge carrier Substances 0.000 description 1
- 230000002526 effect on cardiovascular system Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 229910000464 lead oxide Inorganic materials 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- YEXPOXQUZXUXJW-UHFFFAOYSA-N oxolead Chemical compound [Pb]=O YEXPOXQUZXUXJW-UHFFFAOYSA-N 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 229910052711 selenium Inorganic materials 0.000 description 1
- 239000011669 selenium Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 238000004876 x-ray fluorescence Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/30—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from X-rays
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
- H04N25/626—Reduction of noise due to residual charges remaining after image readout, e.g. to remove ghost images or afterimages
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
- H04N25/673—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources
- H04N25/674—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources based on the scene itself, e.g. defocusing
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/32—Transforming X-rays
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Measurement Of Radiation (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1. X線画像から1次画像信号(P1,P2)を得る画像センサマトリックス (4)と、 1次信号中の乱れを補正する補正ユニット(8)とを含むX線検査装置であっ て、 補正ユニット(8)は、1次画像信号(P1,P2)及び暗信号(D1,D2 )から補正された画像信号を得るよう配置されていることを特徴とするX線検査 装置。 2. 画像センサマトリックスによって暗信号を形成する制御回路(9)を含む ことを特徴とする請求項1記載のX線検査装置。 3. X線源(1)を含むX線検査装置であって、 制御回路(9)は、 X線源(1)によってX線パルスを放射し、 X線パルスよりも先に画像センサマトリックス(4)によって暗信号(D1, D2)を形成し、X線パルスの終了の後に1次画像信号(P1,P2)を形成す るよう配置されていることを特徴とする請求項2記載のX線検査装置。 4. X線源は一連のX線画像を形成するよう一連のX線パルスを放射するため に配置されているX線検査装置であって、 制御回路は、 個々のX線パルスよりも先に別々に暗信号を形成し、 個々のX線パルスが止んだ後に個々の1次画像信号を形成するよう画像セン サマトリックスを制御するために配置されており、 補正ユニットは、夫々の1次画像信号及び1つ以上の暗信号から連続する電子 画像信号を得るよう配置されていることを特徴とする 請求項2記載のX線検査装置。 5. 補正ユニットは2つ以上の暗信号を結合するよう配置されていることを特 徴とする請求項3記載のX線検査装置。 6. 対象のX線画像を形成するためにX線ビームを放射するX線源と、 X線画像を撮像する画像センサマトリックスとを含み、 該画像センサマトリックスは、 X線を電荷に変換する放射線感応素子と、 電荷から1次画像信号を得る読取り回路とを含むX線検査装置であって、 読取り回路は、夫々放射線感応素子の第1のグループ及び第2のグループに結 合された第1の読取り部及び第2の読取り部を含むことを特徴とする、特に請求 項1乃至6のうちいずれか1項記載の装置。 7. 対象の個々のX線画像を形成するよう異なる方向に別々のX線ビームを放 射する第1のX線源及び第2のX線源と、 個々のX線画像を撮像する第1の画像センサマトリックス及び第2の画像セン サマトリックスとを含み、 該第1の画像センサマトリックス及び第2の画像センサマトリックスは、 X線を電荷に変換する放射線感応素子を含むX線検査システムであって、 暗信号を形成するよう1つ又は両方の画像センサマトリックスを制御する制御 回路を含むことを特徴とするX線検査システム。 8. X線検査システムは画像センサマトリックスのうちの1つの 1次画像信号及び暗信号から電子画像信号を得る補正ユニットを含むことを特徴 とする請求項7記載のX線検査システム。 9. 少なくとも1つの読取り回路は、放射線感応素子の第1のグループ及び第 2のグループに夫々結合された第1の読取り部及び第2の読取り部を含むことを 特徴とする請求項8記載のX線検査システム。 10. X線源と、 X線画像から1次画像信号(P1,P2)を得る画像センサマトリックス(4 )とを含むX線検査装置であって、 X線源(1)によってX線パルスを放射し、 X線パルスよりも先に画像センサマトリックス(4)によって暗信号(D1, D2)を形成し、X線パルスの終了の後に1次画像信号(P1,P2)を形成す るよう配置されている制御回路(9)を含むことを特徴とするX線検査装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP95203532 | 1995-12-18 | ||
AT95203532.7 | 1995-12-18 | ||
PCT/IB1996/001308 WO1997023090A2 (en) | 1995-12-18 | 1996-11-27 | X-ray examination apparatus including an image sensor matrix with a correction unit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH11500949A true JPH11500949A (ja) | 1999-01-26 |
JP4173197B2 JP4173197B2 (ja) | 2008-10-29 |
Family
ID=8220965
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP52261997A Expired - Lifetime JP4173197B2 (ja) | 1995-12-18 | 1996-11-27 | 補正ユニットを有する画像センサマトリックスを含むx線検査装置 |
Country Status (5)
Country | Link |
---|---|
US (2) | US6028913A (ja) |
EP (1) | EP0809912B1 (ja) |
JP (1) | JP4173197B2 (ja) |
DE (1) | DE69616030T2 (ja) |
WO (1) | WO1997023090A2 (ja) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001527341A (ja) * | 1997-12-18 | 2001-12-25 | シメージ オーワイ | 放射線を画像化するためのデバイス |
JP2006516179A (ja) * | 2002-10-16 | 2006-06-22 | ヴァリアン メディカル システムズ テクノロジーズ インコーポレイテッド | 像形成装置における過剰信号補正方法及び装置 |
JP2006334085A (ja) * | 2005-06-01 | 2006-12-14 | Shimadzu Corp | 放射線撮像装置および放射線検出信号処理方法 |
KR100987158B1 (ko) * | 2008-05-06 | 2010-10-11 | 라드텍주식회사 | 디지털 방사선 촬영을 이용한 용접부 결함 검출 방법 |
WO2012032801A1 (ja) * | 2010-09-09 | 2012-03-15 | コニカミノルタエムジー株式会社 | 放射線画像撮影装置および放射線画像撮影システム |
Families Citing this family (31)
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WO1999048286A2 (en) * | 1998-03-19 | 1999-09-23 | Koninklijke Philips Electronics N.V. | Image pick-up apparatus including a correction unit |
US6430313B1 (en) * | 1998-09-10 | 2002-08-06 | Intel Corporation | Using a minimal number of parameters for correcting the response of color image sensors |
EP1111909A1 (de) * | 1999-12-23 | 2001-06-27 | Philips Patentverwaltung GmbH | Vorrichtung und Verfahren zur Darstellung eines aus mehreren Teilbereichen zusammengesetzten Bildes |
US6751289B2 (en) * | 2000-10-10 | 2004-06-15 | Kabushiki Kaisha Toshiba | X-ray diagnostic apparatus |
DE10106907C2 (de) * | 2001-02-13 | 2003-06-26 | Siemens Ag | Röntgendiagnostikeinrichtung mit Mitteln und Verfahren zur Korrektur von Kometenartefakten |
DE10135427A1 (de) * | 2001-07-20 | 2003-02-13 | Siemens Ag | Flächenhafter Bilddetektor für elektromagnetische Strahlen, insbesondere Röntgenstrahlen |
US6888919B2 (en) * | 2001-11-02 | 2005-05-03 | Varian Medical Systems, Inc. | Radiotherapy apparatus equipped with an articulable gantry for positioning an imaging unit |
US7221733B1 (en) | 2002-01-02 | 2007-05-22 | Varian Medical Systems Technologies, Inc. | Method and apparatus for irradiating a target |
US7122804B2 (en) * | 2002-02-15 | 2006-10-17 | Varian Medical Systems Technologies, Inc. | X-ray imaging device |
US6718010B2 (en) * | 2002-06-11 | 2004-04-06 | Ge Medical Systems Global Technology Company, Llc | Method and apparatus for acquiring a series of images utilizing a solid state detector with alternating scan lines |
US7227925B1 (en) | 2002-10-02 | 2007-06-05 | Varian Medical Systems Technologies, Inc. | Gantry mounted stereoscopic imaging system |
US7657304B2 (en) | 2002-10-05 | 2010-02-02 | Varian Medical Systems, Inc. | Imaging device for radiation treatment applications |
US7065177B2 (en) * | 2002-11-14 | 2006-06-20 | General Electric Company | Method and apparatus for correcting a retained image artifact |
US7945021B2 (en) | 2002-12-18 | 2011-05-17 | Varian Medical Systems, Inc. | Multi-mode cone beam CT radiotherapy simulator and treatment machine with a flat panel imager |
US7123687B2 (en) * | 2003-04-10 | 2006-10-17 | Varian Medical Systems Technologies, Inc. | Method for displaying digital X-ray image data at high resolution |
EP1634441A1 (en) * | 2003-06-05 | 2006-03-15 | Philips Intellectual Property & Standards GmbH | Detector for the detection of x-radiation |
US7412029B2 (en) * | 2003-06-25 | 2008-08-12 | Varian Medical Systems Technologies, Inc. | Treatment planning, simulation, and verification system |
DE10343787B4 (de) * | 2003-09-22 | 2006-03-16 | Siemens Ag | Verfahren zur Kalibrierung eines digitalen Röntgendetektors und zugehörige Röntgenvorrichtung |
DE102004003881B4 (de) * | 2004-01-26 | 2013-06-06 | Siemens Aktiengesellschaft | Bildaufnahmevorrichtung |
US10004650B2 (en) | 2005-04-29 | 2018-06-26 | Varian Medical Systems, Inc. | Dynamic patient positioning system |
US20070003010A1 (en) | 2005-04-29 | 2007-01-04 | Varian Medical Systems Technologies, Inc. | Radiation systems with imaging capability |
US7880154B2 (en) | 2005-07-25 | 2011-02-01 | Karl Otto | Methods and apparatus for the planning and delivery of radiation treatments |
US7474731B2 (en) * | 2006-08-29 | 2009-01-06 | Siemens Medical Solutions Usa, Inc. | Systems and methods for adaptive image processing using acquisition data and calibration/model data |
US8290222B2 (en) * | 2006-08-29 | 2012-10-16 | Siemens Medical Solutions Usa, Inc. | Systems and methods of image processing utilizing resizing of data |
USRE46953E1 (en) | 2007-04-20 | 2018-07-17 | University Of Maryland, Baltimore | Single-arc dose painting for precision radiation therapy |
JP4947215B2 (ja) * | 2008-06-27 | 2012-06-06 | コニカミノルタエムジー株式会社 | 放射線画像生成システム |
JP4883222B2 (ja) | 2008-08-22 | 2012-02-22 | コニカミノルタエムジー株式会社 | 放射線画像検出器 |
DE102008059818A1 (de) * | 2008-12-01 | 2010-06-10 | Diehl Bgt Defence Gmbh & Co. Kg | Verfahren zur Reduktion des Übersprechens bei einem Sensorsystem mit mehreren Gesichtsfeldern |
WO2011160235A1 (en) | 2010-06-22 | 2011-12-29 | Karl Otto | System and method for estimating and manipulating estimated radiation dose |
US8894280B2 (en) | 2011-12-31 | 2014-11-25 | Carestream Health, Inc. | Calibration and correction procedures for digital radiography detectors supporting multiple capture modes, methods and systems for same |
US10806409B2 (en) | 2016-09-23 | 2020-10-20 | Varian Medical Systems International Ag | Medical systems with patient supports |
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FR2593343B1 (fr) * | 1986-01-20 | 1988-03-25 | Thomson Csf | Matrice d'elements photosensibles et son procede de fabrication, procede de lecture associe, et application de cette matrice a la prise de vue d'images |
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DE69429142T2 (de) * | 1993-09-03 | 2002-08-22 | Koninkl Philips Electronics Nv | Roentgenbildaufnehmer |
EP0642264B1 (en) * | 1993-09-03 | 2001-11-21 | Koninklijke Philips Electronics N.V. | Image detection device |
US5572566A (en) * | 1993-11-30 | 1996-11-05 | J. Morita Manufacturing Corporation | X-ray imaging apparatus and X-ray generation detector for activating the same |
US5471244A (en) * | 1994-05-31 | 1995-11-28 | 3M Company | Automatic dark level zeroing for an analog video signal |
US5452338A (en) * | 1994-07-07 | 1995-09-19 | General Electric Company | Method and system for real time offset correction in a large area solid state x-ray detector |
US5693948A (en) * | 1995-11-21 | 1997-12-02 | Loral Fairchild Corporation | Advanced CCD-based x-ray image sensor system |
-
1996
- 1996-11-27 EP EP96937474A patent/EP0809912B1/en not_active Expired - Lifetime
- 1996-11-27 JP JP52261997A patent/JP4173197B2/ja not_active Expired - Lifetime
- 1996-11-27 WO PCT/IB1996/001308 patent/WO1997023090A2/en active IP Right Grant
- 1996-11-27 DE DE69616030T patent/DE69616030T2/de not_active Expired - Lifetime
- 1996-12-10 US US08/762,894 patent/US6028913A/en not_active Expired - Lifetime
-
1999
- 1999-03-12 US US09/488,722 patent/US6222901B1/en not_active Expired - Lifetime
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001527341A (ja) * | 1997-12-18 | 2001-12-25 | シメージ オーワイ | 放射線を画像化するためのデバイス |
JP2006516179A (ja) * | 2002-10-16 | 2006-06-22 | ヴァリアン メディカル システムズ テクノロジーズ インコーポレイテッド | 像形成装置における過剰信号補正方法及び装置 |
JP2006334085A (ja) * | 2005-06-01 | 2006-12-14 | Shimadzu Corp | 放射線撮像装置および放射線検出信号処理方法 |
KR100987158B1 (ko) * | 2008-05-06 | 2010-10-11 | 라드텍주식회사 | 디지털 방사선 촬영을 이용한 용접부 결함 검출 방법 |
WO2012032801A1 (ja) * | 2010-09-09 | 2012-03-15 | コニカミノルタエムジー株式会社 | 放射線画像撮影装置および放射線画像撮影システム |
US9128368B2 (en) | 2010-09-09 | 2015-09-08 | Konica Minolta, Inc. | Radiation image capturing apparatus and radiation image capturing system |
JP5776693B2 (ja) * | 2010-09-09 | 2015-09-09 | コニカミノルタ株式会社 | 放射線画像撮影装置および放射線画像撮影システム |
Also Published As
Publication number | Publication date |
---|---|
EP0809912B1 (en) | 2001-10-17 |
WO1997023090A2 (en) | 1997-06-26 |
US6028913A (en) | 2000-02-22 |
US6222901B1 (en) | 2001-04-24 |
EP0809912A2 (en) | 1997-12-03 |
DE69616030T2 (de) | 2002-06-20 |
JP4173197B2 (ja) | 2008-10-29 |
DE69616030D1 (de) | 2001-11-22 |
WO1997023090A3 (en) | 1997-08-21 |
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