JPH11283551A5 - - Google Patents
Info
- Publication number
- JPH11283551A5 JPH11283551A5 JP1998082147A JP8214798A JPH11283551A5 JP H11283551 A5 JPH11283551 A5 JP H11283551A5 JP 1998082147 A JP1998082147 A JP 1998082147A JP 8214798 A JP8214798 A JP 8214798A JP H11283551 A5 JPH11283551 A5 JP H11283551A5
- Authority
- JP
- Japan
- Prior art keywords
- ion beam
- internal cavity
- substrate
- beamline
- electrostatic lens
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP08214798A JP3717301B2 (ja) | 1998-03-27 | 1998-03-27 | イオン注入装置及びイオン注入方法 |
| US09/143,101 US6191427B1 (en) | 1998-03-27 | 1998-08-28 | Ion implantation system and method suitable for low energy ion beam implantation |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP08214798A JP3717301B2 (ja) | 1998-03-27 | 1998-03-27 | イオン注入装置及びイオン注入方法 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005212133A Division JP4589838B2 (ja) | 2005-07-22 | 2005-07-22 | イオン注入方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPH11283551A JPH11283551A (ja) | 1999-10-15 |
| JPH11283551A5 true JPH11283551A5 (enExample) | 2004-12-02 |
| JP3717301B2 JP3717301B2 (ja) | 2005-11-16 |
Family
ID=13766335
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP08214798A Expired - Fee Related JP3717301B2 (ja) | 1998-03-27 | 1998-03-27 | イオン注入装置及びイオン注入方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US6191427B1 (enExample) |
| JP (1) | JP3717301B2 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3560154B2 (ja) * | 2001-03-15 | 2004-09-02 | 日新電機株式会社 | イオンビーム照射装置の運転方法 |
| US6903350B1 (en) | 2004-06-10 | 2005-06-07 | Axcelis Technologies, Inc. | Ion beam scanning systems and methods for improved ion implantation uniformity |
| US20080173828A1 (en) * | 2007-01-19 | 2008-07-24 | Denso Corporation | Ion implantation device and method for implanting ions |
| KR100918434B1 (ko) * | 2007-10-16 | 2009-09-24 | 주식회사 쎄크 | 주사전자현미경 |
| JP5500500B2 (ja) * | 2010-03-11 | 2014-05-21 | 日新イオン機器株式会社 | 非対称なアインツェルレンズを有するビーム偏向器を備えたイオン注入装置 |
| US9564297B2 (en) * | 2013-05-16 | 2017-02-07 | Applied Materials, Inc. | Electron beam plasma source with remote radical source |
| US9721760B2 (en) | 2013-05-16 | 2017-08-01 | Applied Materials, Inc. | Electron beam plasma source with reduced metal contamination |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0405855A3 (en) * | 1989-06-30 | 1991-10-16 | Hitachi, Ltd. | Ion implanting apparatus and process for fabricating semiconductor integrated circuit device by using the same apparatus |
| US5466929A (en) * | 1992-02-21 | 1995-11-14 | Hitachi, Ltd. | Apparatus and method for suppressing electrification of sample in charged beam irradiation apparatus |
| US5177366A (en) * | 1992-03-06 | 1993-01-05 | Eaton Corporation | Ion beam implanter for providing cross plane focusing |
| JP3054302B2 (ja) * | 1992-12-02 | 2000-06-19 | アプライド マテリアルズ インコーポレイテッド | イオン注入中の半導体ウェハにおける帯電を低減するプラズマ放出システム |
| JP2842344B2 (ja) * | 1995-11-14 | 1999-01-06 | 日本電気株式会社 | 中性粒子ビーム処理装置 |
| US5892236A (en) * | 1997-07-09 | 1999-04-06 | Bridgestone Corporation | Part for ion implantation device |
-
1998
- 1998-03-27 JP JP08214798A patent/JP3717301B2/ja not_active Expired - Fee Related
- 1998-08-28 US US09/143,101 patent/US6191427B1/en not_active Expired - Fee Related
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