KR100918434B1 - 주사전자현미경 - Google Patents
주사전자현미경 Download PDFInfo
- Publication number
- KR100918434B1 KR100918434B1 KR1020070104243A KR20070104243A KR100918434B1 KR 100918434 B1 KR100918434 B1 KR 100918434B1 KR 1020070104243 A KR1020070104243 A KR 1020070104243A KR 20070104243 A KR20070104243 A KR 20070104243A KR 100918434 B1 KR100918434 B1 KR 100918434B1
- Authority
- KR
- South Korea
- Prior art keywords
- scanning
- electron microscope
- electron
- scanning electron
- optical unit
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 claims abstract description 28
- 238000010894 electron beam technology Methods 0.000 claims description 16
- 238000010586 diagram Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000010276 construction Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/18—Vacuum locks ; Means for obtaining or maintaining the desired pressure within the vessel
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/06—Electron sources; Electron guns
- H01J37/065—Construction of guns or parts thereof
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/06—Sources
- H01J2237/063—Electron sources
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/18—Vacuum control means
- H01J2237/182—Obtaining or maintaining desired pressure
- H01J2237/1825—Evacuating means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/26—Electron or ion microscopes
- H01J2237/28—Scanning microscopes
- H01J2237/2801—Details
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Description
Claims (8)
- 삭제
- 시료홀더를 구비하는 주사전자현미경 본체;상기 주사전자현미경 본체에 상기 시료홀더에 대해 수직하게 설치되어 상기 시료홀더와 마주하며, 전자선을 가속 방출하는 전자총부와 상기 전자선을 상기 시료홀더로 안내하여 주사하는 경통부를 가지는 전자광학유닛;상기 전자광학유닛과 나란하게 상기 주사전자현미경 본체 내부에 설치되어 상기 전자총부와 수평하게 직접 연결되는 진공펌프; 및상기 주사전자현미경 본체의 내부에 설치되어 상기 전자광학유닛을 제어하는 제어부;를 포함하며,상기 시료홀더는 상기 주사전자현미경 본체의 전면 하부에 외부로 개방 가능하게 설치되고,상기 제어부는 상기 전자광학유닛과 진공펌프를 사이에 두고 상기 전면과 마주하는 상기 주사전자현미경 본체의 후면에 설치되는 것을 특징으로 하는 주사전자현미경.
- 삭제
- 삭제
- 삭제
- 삭제
- 삭제
- 삭제
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070104243A KR100918434B1 (ko) | 2007-10-16 | 2007-10-16 | 주사전자현미경 |
PCT/KR2008/004774 WO2009051333A1 (en) | 2007-10-16 | 2008-08-18 | A scanning electron microscope |
CN200880107098A CN101802965A (zh) | 2007-10-16 | 2008-08-18 | 扫描电子显微镜 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070104243A KR100918434B1 (ko) | 2007-10-16 | 2007-10-16 | 주사전자현미경 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20090038769A KR20090038769A (ko) | 2009-04-21 |
KR100918434B1 true KR100918434B1 (ko) | 2009-09-24 |
Family
ID=40567554
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020070104243A KR100918434B1 (ko) | 2007-10-16 | 2007-10-16 | 주사전자현미경 |
Country Status (3)
Country | Link |
---|---|
KR (1) | KR100918434B1 (ko) |
CN (1) | CN101802965A (ko) |
WO (1) | WO2009051333A1 (ko) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104897700B (zh) * | 2015-06-10 | 2017-09-22 | 北京工业大学 | 在扫描电镜中对纳米液体样品的透射散射成像装置及方法 |
KR102198707B1 (ko) * | 2019-03-25 | 2021-01-05 | (주)코셈 | 착탈 가능한 컬럼을 구비하는 주사 전자 현미경 및, 이를 이용한 영상 획득 방법 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0689686A (ja) * | 1992-04-06 | 1994-03-29 | Topcon Corp | 走査型電子顕微鏡 |
JPH08287860A (ja) * | 1995-04-10 | 1996-11-01 | Hitachi Ltd | 走査電子顕微鏡 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3717301B2 (ja) * | 1998-03-27 | 2005-11-16 | 富士通株式会社 | イオン注入装置及びイオン注入方法 |
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2007
- 2007-10-16 KR KR1020070104243A patent/KR100918434B1/ko active IP Right Grant
-
2008
- 2008-08-18 WO PCT/KR2008/004774 patent/WO2009051333A1/en active Application Filing
- 2008-08-18 CN CN200880107098A patent/CN101802965A/zh active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0689686A (ja) * | 1992-04-06 | 1994-03-29 | Topcon Corp | 走査型電子顕微鏡 |
JPH08287860A (ja) * | 1995-04-10 | 1996-11-01 | Hitachi Ltd | 走査電子顕微鏡 |
Also Published As
Publication number | Publication date |
---|---|
WO2009051333A1 (en) | 2009-04-23 |
KR20090038769A (ko) | 2009-04-21 |
CN101802965A (zh) | 2010-08-11 |
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