JPH103039A5 - - Google Patents

Info

Publication number
JPH103039A5
JPH103039A5 JP1996153770A JP15377096A JPH103039A5 JP H103039 A5 JPH103039 A5 JP H103039A5 JP 1996153770 A JP1996153770 A JP 1996153770A JP 15377096 A JP15377096 A JP 15377096A JP H103039 A5 JPH103039 A5 JP H103039A5
Authority
JP
Japan
Prior art keywords
optical system
imaging optical
catadioptric
lens group
refractive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1996153770A
Other languages
English (en)
Japanese (ja)
Other versions
JPH103039A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP8153770A priority Critical patent/JPH103039A/ja
Priority claimed from JP8153770A external-priority patent/JPH103039A/ja
Priority to KR1019970021291A priority patent/KR980005325A/ko
Priority to EP97110124A priority patent/EP0816892A3/en
Publication of JPH103039A publication Critical patent/JPH103039A/ja
Publication of JPH103039A5 publication Critical patent/JPH103039A5/ja
Pending legal-status Critical Current

Links

JP8153770A 1996-06-14 1996-06-14 反射屈折光学系 Pending JPH103039A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP8153770A JPH103039A (ja) 1996-06-14 1996-06-14 反射屈折光学系
KR1019970021291A KR980005325A (ko) 1996-06-14 1997-05-28 반사굴절 광학계
EP97110124A EP0816892A3 (en) 1996-06-14 1997-06-16 Catadioptric lens system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8153770A JPH103039A (ja) 1996-06-14 1996-06-14 反射屈折光学系

Publications (2)

Publication Number Publication Date
JPH103039A JPH103039A (ja) 1998-01-06
JPH103039A5 true JPH103039A5 (https=) 2004-10-21

Family

ID=15569767

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8153770A Pending JPH103039A (ja) 1996-06-14 1996-06-14 反射屈折光学系

Country Status (3)

Country Link
EP (1) EP0816892A3 (https=)
JP (1) JPH103039A (https=)
KR (1) KR980005325A (https=)

Families Citing this family (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5969882A (en) * 1997-04-01 1999-10-19 Nikon Corporation Catadioptric optical system
EP1079253A4 (en) 1998-04-07 2004-09-01 Nikon Corp DEVICE AND PROCESS FOR PROJECTION EXPOSURE, AND OPTICAL SYSTEM WITH REFLECTION AND REFRACTION
EP0964307A3 (en) 1998-06-08 2001-09-05 Nikon Corporation Projection exposure apparatus and method
DE69933973T2 (de) * 1998-07-29 2007-06-28 Carl Zeiss Smt Ag Katadioptrisches optisches system und damit ausgestattete belichtungsvorrichtung
US6451507B1 (en) 1998-08-18 2002-09-17 Nikon Corporation Exposure apparatus and method
US7151592B2 (en) 1999-02-15 2006-12-19 Carl Zeiss Smt Ag Projection system for EUV lithography
US6985210B2 (en) 1999-02-15 2006-01-10 Carl Zeiss Smt Ag Projection system for EUV lithography
USRE42118E1 (en) * 1999-02-15 2011-02-08 Carl-Zeiss-Smt Ag Projection system for EUV lithography
EP1094350A3 (en) 1999-10-21 2001-08-16 Carl Zeiss Optical projection lens system
JP2001160530A (ja) 1999-12-01 2001-06-12 Nikon Corp ステージ装置及び露光装置
KR100854052B1 (ko) 1999-12-29 2008-08-26 칼 짜이스 에스엠테 아게 인접한 비구면 렌즈 표면을 구비한 투사 대물 렌즈
WO2002044786A2 (en) 2000-11-28 2002-06-06 Carl Zeiss Smt Ag Catadioptric projection system for 157 nm lithography
TW538256B (en) 2000-01-14 2003-06-21 Zeiss Stiftung Microlithographic reduction projection catadioptric objective
JP2001257143A (ja) 2000-03-09 2001-09-21 Nikon Corp ステージ装置及び露光装置、並びにデバイス製造方法
JP2001267226A (ja) 2000-03-21 2001-09-28 Nikon Corp 駆動装置及び露光装置、並びにデバイス及びその製造方法
US20030155882A1 (en) 2002-02-19 2003-08-21 Nikon Corporation Anti-gravity mount with air and magnets
US7190527B2 (en) 2002-03-01 2007-03-13 Carl Zeiss Smt Ag Refractive projection objective
US7154676B2 (en) 2002-03-01 2006-12-26 Carl Zeiss Smt A.G. Very-high aperture projection objective
SG135052A1 (en) 2002-11-12 2007-09-28 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
EP2157480B1 (en) 2003-04-09 2015-05-27 Nikon Corporation Exposure method and apparatus, and device manufacturing method
SG141426A1 (en) 2003-04-10 2008-04-28 Nikon Corp Environmental system including vacuum scavange for an immersion lithography apparatus
KR101431938B1 (ko) 2003-04-10 2014-08-19 가부시키가이샤 니콘 액침 리소그래피 장치용 운반 영역을 포함하는 환경 시스템
SG139733A1 (en) 2003-04-11 2008-02-29 Nikon Corp Apparatus having an immersion fluid system configured to maintain immersion fluid in a gap adjacent an optical assembly
TWI295414B (en) 2003-05-13 2008-04-01 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
US6995833B2 (en) 2003-05-23 2006-02-07 Canon Kabushiki Kaisha Projection optical system, exposure apparatus, and device manufacturing method
KR101476087B1 (ko) 2003-06-19 2014-12-23 가부시키가이샤 니콘 노광 장치 및 디바이스 제조방법
EP2843472B1 (en) 2003-07-08 2016-12-07 Nikon Corporation Wafer table for immersion lithography
US8208198B2 (en) 2004-01-14 2012-06-26 Carl Zeiss Smt Gmbh Catadioptric projection objective
TWI360158B (en) 2003-10-28 2012-03-11 Nikon Corp Projection exposure device,exposure method and dev
TWI385414B (zh) 2003-11-20 2013-02-11 尼康股份有限公司 光學照明裝置、照明方法、曝光裝置、曝光方法以及元件製造方法
US20080151364A1 (en) 2004-01-14 2008-06-26 Carl Zeiss Smt Ag Catadioptric projection objective
US7589822B2 (en) 2004-02-02 2009-09-15 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
TWI609410B (zh) 2004-02-06 2017-12-21 尼康股份有限公司 光學照明裝置、曝光裝置、曝光方法以及元件製造方法
KR101250155B1 (ko) 2004-03-25 2013-04-05 가부시키가이샤 니콘 노광 장치 및 디바이스 제조 방법
KR20160085375A (ko) 2004-05-17 2016-07-15 칼 짜이스 에스엠티 게엠베하 중간이미지를 갖는 카타디옵트릭 투사 대물렌즈
US7324185B2 (en) 2005-03-04 2008-01-29 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US8248577B2 (en) 2005-05-03 2012-08-21 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
KR20140140648A (ko) 2005-05-12 2014-12-09 가부시키가이샤 니콘 투영 광학계, 노광 장치 및 노광 방법
US20080073563A1 (en) 2006-07-01 2008-03-27 Nikon Corporation Exposure apparatus that includes a phase change circulation system for movers
US7830046B2 (en) 2007-03-16 2010-11-09 Nikon Corporation Damper for a stage assembly
JP5267029B2 (ja) 2007-10-12 2013-08-21 株式会社ニコン 照明光学装置、露光装置及びデバイスの製造方法
US8379187B2 (en) 2007-10-24 2013-02-19 Nikon Corporation Optical unit, illumination optical apparatus, exposure apparatus, and device manufacturing method
US9116346B2 (en) 2007-11-06 2015-08-25 Nikon Corporation Illumination apparatus, illumination method, exposure apparatus, and device manufacturing method
EP2381310B1 (en) 2010-04-22 2015-05-06 ASML Netherlands BV Fluid handling structure and lithographic apparatus
US20130255414A1 (en) 2010-09-09 2013-10-03 Nikon Corporation Parallel Linkage and Actuator Motor Coil Designs for Tube Carrier
US8572518B2 (en) 2011-06-23 2013-10-29 Nikon Precision Inc. Predicting pattern critical dimensions in a lithographic exposure process
US9030057B2 (en) 2011-06-24 2015-05-12 Nikon Corporation Method and apparatus to allow a plurality of stages to operate in close proximity

Family Cites Families (6)

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Publication number Priority date Publication date Assignee Title
US5140459A (en) * 1989-08-29 1992-08-18 Texas Instruments Apparatus and method for optical relay and reimaging
JPH04367213A (ja) * 1991-06-13 1992-12-18 Orc Mfg Co Ltd 投影型露光装置
EP0527043B1 (en) * 1991-08-05 1997-01-22 Nikon Corporation Catadioptric reduction projection optical system
US5212593A (en) * 1992-02-06 1993-05-18 Svg Lithography Systems, Inc. Broad band optical reduction system using matched multiple refractive element materials
DE69315314T2 (de) * 1992-12-24 1998-03-19 Nippon Kogaku Kk Verkleinerndes katadioptrisches Projektionssystem
US5537260A (en) * 1993-01-26 1996-07-16 Svg Lithography Systems, Inc. Catadioptric optical reduction system with high numerical aperture

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