JPH10223614A5 - - Google Patents
Info
- Publication number
- JPH10223614A5 JPH10223614A5 JP1997027382A JP2738297A JPH10223614A5 JP H10223614 A5 JPH10223614 A5 JP H10223614A5 JP 1997027382 A JP1997027382 A JP 1997027382A JP 2738297 A JP2738297 A JP 2738297A JP H10223614 A5 JPH10223614 A5 JP H10223614A5
- Authority
- JP
- Japan
- Prior art keywords
- gas
- group
- film
- etching
- chamber cleaning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9027382A JPH10223614A (ja) | 1997-02-12 | 1997-02-12 | エッチングガスおよびクリーニングガス |
| PCT/JP1998/000496 WO1998036449A1 (fr) | 1997-02-12 | 1998-02-05 | Gaz d'attaque et de nettoyage |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9027382A JPH10223614A (ja) | 1997-02-12 | 1997-02-12 | エッチングガスおよびクリーニングガス |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH10223614A JPH10223614A (ja) | 1998-08-21 |
| JPH10223614A5 true JPH10223614A5 (https=) | 2005-04-21 |
Family
ID=12219507
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9027382A Pending JPH10223614A (ja) | 1997-02-12 | 1997-02-12 | エッチングガスおよびクリーニングガス |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JPH10223614A (https=) |
| WO (1) | WO1998036449A1 (https=) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6120697A (en) * | 1997-12-31 | 2000-09-19 | Alliedsignal Inc | Method of etching using hydrofluorocarbon compounds |
| US6352081B1 (en) | 1999-07-09 | 2002-03-05 | Applied Materials, Inc. | Method of cleaning a semiconductor device processing chamber after a copper etch process |
| JP3865113B2 (ja) * | 2000-07-07 | 2007-01-10 | 三洋電機株式会社 | クリーニングガス及びエッチングガス |
| WO2002021586A1 (en) * | 2000-09-07 | 2002-03-14 | Daikin Industries, Ltd. | Dry etching gas and method for dry etching |
| JP4112198B2 (ja) * | 2000-09-11 | 2008-07-02 | 財団法人地球環境産業技術研究機構 | クリーニングガス及びエッチングガス、並びにチャンバークリーニング方法及びエッチング方法 |
| US6849194B2 (en) | 2000-11-17 | 2005-02-01 | Pcbu Services, Inc. | Methods for preparing ethers, ether compositions, fluoroether fire extinguishing systems, mixtures and methods |
| JP4754080B2 (ja) * | 2001-03-14 | 2011-08-24 | 東京エレクトロン株式会社 | 基板処理装置のクリーニング方法及び基板処理装置 |
| AU2013203627B2 (en) * | 2004-04-29 | 2014-07-03 | Honeywell International, Inc. | Compositions containing fluorine substituted olefins |
| CN101925983A (zh) | 2007-12-21 | 2010-12-22 | 苏威氟有限公司 | 用于生产微机电系统的方法 |
| US10453986B2 (en) * | 2008-01-23 | 2019-10-22 | Solvay Fluor Gmbh | Process for the manufacture of solar cells |
| JP4596287B2 (ja) * | 2008-09-19 | 2010-12-08 | カシオ計算機株式会社 | シリコンを含む膜のドライエッチング方法 |
| KR20120098751A (ko) * | 2009-10-26 | 2012-09-05 | 솔베이 플루오르 게엠베하 | Tft 매트릭스 제조를 위한 식각 공정 |
| WO2011093263A1 (ja) | 2010-02-01 | 2011-08-04 | セントラル硝子株式会社 | ドライエッチング剤及びそれを用いたドライエッチング方法 |
| JP5434970B2 (ja) | 2010-07-12 | 2014-03-05 | セントラル硝子株式会社 | ドライエッチング剤 |
| JP5454411B2 (ja) * | 2010-08-06 | 2014-03-26 | カシオ計算機株式会社 | シリコンを含む膜のドライエッチング方法 |
| JP2013030531A (ja) | 2011-07-27 | 2013-02-07 | Central Glass Co Ltd | ドライエッチング剤 |
| TWI670768B (zh) * | 2014-10-30 | 2019-09-01 | 日商日本瑞翁股份有限公司 | 電漿蝕刻方法 |
| US10607850B2 (en) | 2016-12-30 | 2020-03-31 | American Air Liquide, Inc. | Iodine-containing compounds for etching semiconductor structures |
| WO2018159368A1 (ja) | 2017-02-28 | 2018-09-07 | セントラル硝子株式会社 | ドライエッチング剤、ドライエッチング方法及び半導体装置の製造方法 |
| US20240290628A1 (en) * | 2023-02-24 | 2024-08-29 | American Air Liquide, Inc. | Etching method using oxygen-containing hydrofluorocarbon |
| US20240290627A1 (en) * | 2023-02-24 | 2024-08-29 | American Air Liquide, Inc. | Etching method using oxygen-containing hydrofluorocarbon |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04239723A (ja) * | 1991-01-23 | 1992-08-27 | Nec Corp | 半導体装置の製造方法 |
| JP3198538B2 (ja) * | 1991-05-24 | 2001-08-13 | ソニー株式会社 | ドライエッチング方法 |
| JP3115715B2 (ja) * | 1992-11-12 | 2000-12-11 | 三菱電機株式会社 | 高誘電率を有する多元系酸化物膜のエッチング方法、高融点金属含有膜のエッチング方法および薄膜キャパシタ素子の製造方法 |
-
1997
- 1997-02-12 JP JP9027382A patent/JPH10223614A/ja active Pending
-
1998
- 1998-02-05 WO PCT/JP1998/000496 patent/WO1998036449A1/ja not_active Ceased
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