JPH10186005A - 実装済み回路基板のガイド付きプローブ試験用取付具 - Google Patents

実装済み回路基板のガイド付きプローブ試験用取付具

Info

Publication number
JPH10186005A
JPH10186005A JP9296507A JP29650797A JPH10186005A JP H10186005 A JPH10186005 A JP H10186005A JP 9296507 A JP9296507 A JP 9296507A JP 29650797 A JP29650797 A JP 29650797A JP H10186005 A JPH10186005 A JP H10186005A
Authority
JP
Japan
Prior art keywords
probe
test
fixture
target
tester
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9296507A
Other languages
English (en)
Japanese (ja)
Other versions
JPH10186005A5 (enExample
Inventor
Tracy L Sayre
トレーシー・エル・セイアー
Robert A Slutz
ロバート・エイ・シュルツ
Kris J Kanack
クリス・ジェイ・カナック
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of JPH10186005A publication Critical patent/JPH10186005A/ja
Publication of JPH10186005A5 publication Critical patent/JPH10186005A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP9296507A 1996-10-29 1997-10-29 実装済み回路基板のガイド付きプローブ試験用取付具 Pending JPH10186005A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US739387 1996-10-29
US08/739,387 US5945836A (en) 1996-10-29 1996-10-29 Loaded-board, guided-probe test fixture

Publications (2)

Publication Number Publication Date
JPH10186005A true JPH10186005A (ja) 1998-07-14
JPH10186005A5 JPH10186005A5 (enExample) 2005-06-23

Family

ID=24972051

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9296507A Pending JPH10186005A (ja) 1996-10-29 1997-10-29 実装済み回路基板のガイド付きプローブ試験用取付具

Country Status (4)

Country Link
US (4) US5945836A (enExample)
EP (5) EP0840131B1 (enExample)
JP (1) JPH10186005A (enExample)
DE (1) DE69734866T2 (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6194908B1 (en) 1997-06-26 2001-02-27 Delaware Capital Formation, Inc. Test fixture for testing backplanes or populated circuit boards
JP2007271631A (ja) * 2007-06-04 2007-10-18 Mitsubishi Electric Corp ウエハテスト用プローブカード
KR102193447B1 (ko) * 2019-12-09 2020-12-21 (주)티에스이 테스트 소켓
KR20220041716A (ko) * 2020-09-25 2022-04-01 에세, 아이엔씨. 이중 각도 공동을 갖는 집적 회로 디바이스 테스트 툴링

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US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
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CN109975692A (zh) * 2019-04-01 2019-07-05 成都天创精密模具有限公司 一种基于机械手的pcb板取出方法及pcb板抓取治具
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JP2024030660A (ja) * 2022-08-24 2024-03-07 イビデン株式会社 導通検査用治具とプリント配線板の製造方法
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CN117434314B (zh) * 2023-09-11 2024-07-12 法特迪精密科技（苏州）有限公司 一种旋转探针与配套插座的适配装置及方法
CN117330801B (zh) * 2023-10-19 2024-02-20 深圳市兆兴博拓科技股份有限公司 电路板测试装置、调试方法及调试系统

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US6194908B1 (en) 1997-06-26 2001-02-27 Delaware Capital Formation, Inc. Test fixture for testing backplanes or populated circuit boards
JP2007271631A (ja) * 2007-06-04 2007-10-18 Mitsubishi Electric Corp ウエハテスト用プローブカード
KR102193447B1 (ko) * 2019-12-09 2020-12-21 (주)티에스이 테스트 소켓
KR20220041716A (ko) * 2020-09-25 2022-04-01 에세, 아이엔씨. 이중 각도 공동을 갖는 집적 회로 디바이스 테스트 툴링

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DE69734866T2 (de) 2006-08-03
EP1512979A3 (en) 2005-06-15
EP1512980A3 (en) 2005-06-15
US6225817B1 (en) 2001-05-01
EP0840131A2 (en) 1998-05-06
US6414502B1 (en) 2002-07-02
EP1512977A3 (en) 2005-06-15
EP0840131B1 (en) 2005-12-14
EP1512978A2 (en) 2005-03-09
EP1512979A2 (en) 2005-03-09
EP1512980A2 (en) 2005-03-09
EP0840131A3 (en) 1999-06-09
US6469531B1 (en) 2002-10-22
EP1512977A2 (en) 2005-03-09
DE69734866D1 (de) 2006-01-19
US5945836A (en) 1999-08-31
EP1512978A3 (en) 2005-06-15

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