JPH10125579A5 - - Google Patents
Info
- Publication number
- JPH10125579A5 JPH10125579A5 JP1996277913A JP27791396A JPH10125579A5 JP H10125579 A5 JPH10125579 A5 JP H10125579A5 JP 1996277913 A JP1996277913 A JP 1996277913A JP 27791396 A JP27791396 A JP 27791396A JP H10125579 A5 JPH10125579 A5 JP H10125579A5
- Authority
- JP
- Japan
- Prior art keywords
- mask
- substrate
- scanning direction
- stage
- axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27791396A JP3809676B2 (ja) | 1996-10-21 | 1996-10-21 | 走査型露光装置 |
| KR1019970054077A KR100525521B1 (ko) | 1996-10-21 | 1997-10-21 | 노광장치및노광방법 |
| US09/347,572 US6700667B2 (en) | 1996-10-21 | 1999-07-06 | Exposure apparatus and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27791396A JP3809676B2 (ja) | 1996-10-21 | 1996-10-21 | 走査型露光装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPH10125579A JPH10125579A (ja) | 1998-05-15 |
| JPH10125579A5 true JPH10125579A5 (enExample) | 2004-10-21 |
| JP3809676B2 JP3809676B2 (ja) | 2006-08-16 |
Family
ID=17590049
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP27791396A Expired - Lifetime JP3809676B2 (ja) | 1996-10-21 | 1996-10-21 | 走査型露光装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3809676B2 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4511707B2 (ja) * | 2000-09-28 | 2010-07-28 | 株式会社アドバンテスト | 電子ビーム露光装置、露光方法、及び半導体素子製造方法 |
| EP1583934A1 (en) * | 2002-12-12 | 2005-10-12 | Zygo Corporation | In-process correction of stage mirror deformations during a photolithography exposure cycle |
| TWI433210B (zh) * | 2005-10-24 | 2014-04-01 | 尼康股份有限公司 | An exposure apparatus, an exposure method, and an element manufacturing method |
| CN112947005B (zh) * | 2019-11-26 | 2023-02-21 | 上海微电子装备(集团)股份有限公司 | 一种载物台位置的测量装置及光刻机 |
| CN112835271B (zh) * | 2021-01-19 | 2024-04-26 | 上海集成电路装备材料产业创新中心有限公司 | 具有旋转交换双工件台的光刻装置的曝光方法 |
| CN113441351A (zh) * | 2021-06-29 | 2021-09-28 | 珠海市华亚智能科技有限公司 | 一种激光雷达反射镜校准装配设备 |
-
1996
- 1996-10-21 JP JP27791396A patent/JP3809676B2/ja not_active Expired - Lifetime
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