JPH10123208A - Lsi test board - Google Patents

Abstract

PROBLEM TO BE SOLVED: To reduce the switching/creation time for an LSI test board by performing switching with a conversion contact pin board only, when switching a kind in the same package. SOLUTION: A test board is composed of a general purpose LSI test board upper part 1, a conversion contact pin board 2, and a general purpose LSI test board lower part 3. The LSI test board upper part 1 is connected to a semiconductor device 8 to be tested. The conversion contact pin board 2 is installed so that it can be electrically connected between the LSI test board upper part 1 and the LSI test board lower part 2 and is made for each kind. The LSI test board lower part 3 is connected to an LSI tester 7. In order to switch to a semiconductor device with different pin arrangement in the same package, the conversion contact pin board 2 and other conversion contact pin board have only to be exchanged, with each other.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an LSI test board.

[0002]

2. Description of the Related Art In a conventional test of electrical characteristics of an LSI semiconductor device, a semiconductor device 8 (pin wiring diagram is shown in FIG. 7) for testing is connected to an LSI test board 10 connected to an LSI tester 7 as shown in FIG. And test the electrical characteristics. Here, when testing a semiconductor device 9 having a different pin arrangement in the same package (the pin wiring diagram is shown in FIG. 7), an LSI test board 11 suitable for the type is created, and the test board itself is replaced when the type is switched. I have.

[0003]

However, in the above-mentioned method, it is necessary to replace the LSI test board or to newly create an LSI test board when switching the type to be tested or when a new type is generated.

[0004] For this reason, there is a drawback that it takes time to switch types and to create a test board. Above all,
In the case of a multi-pin type, it takes a particularly long time.

An object of the present invention is to solve the above-mentioned conventional problems and to reduce the time required to switch / create an LSI test board.

[0006]

In order to achieve this object, an LSI test board of the present invention uses a conversion contact pin board.

[0007]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to the drawings.

In FIG. 1, the LSI test board is composed of three parts: a general-purpose LSI test board upper part 1, a conversion contact pin board 2, and a general-purpose LSI test board lower part 3. The upper part 1 of the general-purpose LSI test board is connected to a semiconductor device 8 to be tested.

The conversion contact pin board 2 is a general-purpose LSI
A test board is provided between the upper part 1 of the test board and the lower part 3 of the general-purpose LSI test board so as to be electrically connected, and is prepared for each type. The lower part 3 of the general-purpose LSI test board is connected to an LSI tester 7.

The wiring of the upper part 1 of the general-purpose LSI test board is as shown in FIG.
Are arranged in a horizontal direction on the upper part 1 of the general-purpose LSI test board.

The wiring of the lower part 3 of the general-purpose LSI test board is as shown in FIG. 4, and each signal line of the LSI tester 7 is vertically arranged on the upper part 1 of the general-purpose LSI test board. That is, the general-purpose LSI test board upper part 1 and the general-purpose L
Each signal line of the lower part 3 of the SI test board is arranged so as to cross 90 degrees.

The conversion contact pin board 2 is as shown in FIG. 3 and has pinholes 5 from which pogo pins 6 can be extracted.
Pogo pin 6 where you want to connect in the lower part 3 of the I test board
To complete the wiring. When changing, it is only necessary to remove the pogo pin 6 and insert it into another pinhole 5.

FIG. 5 shows the wiring of each of the upper part 1 of the general-purpose LSI test board, the conversion contact pin board 2 and the lower part 3 of the general-purpose LSI test board.

In order to switch to the semiconductor device 9 having the same package but different pin arrangements, it is only necessary to exchange the conversion contact pin board 2 and the conversion contact pin board 4 as shown in FIG.

Although this embodiment has been described with respect to the test of the electrical characteristics, it is also applicable to a burn-in test board for quality assurance.

[0016]

As described above, according to the present invention, it is possible to easily switch between varieties and create new ones, so that the time can be reduced.

[Brief description of the drawings]

FIG. 1 is a diagram showing an entire LSI test board;

FIG. 2 is a diagram showing an upper part of a general-purpose LSI test board;

FIG. 3 is a diagram showing a conversion contact pin board;

FIG. 4 is a diagram showing a lower part of a general-purpose LSI test board;

FIG. 5 is a transparent view of an LSI test board.

FIG. 6 is a diagram showing an LSI test board type exchange;

FIG. 7 is a diagram showing pin wiring;

FIG. 8 is a diagram showing a conventional LSI test board.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 1 Upper part of general-purpose LSI test board 2 Conversion contact pin board 3 Lower part of general-purpose LSI test board 4 Conversion contact pin board (semiconductor device with the same package but different pin arrangement) 5 Pin hole 6 Pogo pin 7 LSI tester 8 Semiconductor device to be tested 9 Semiconductor device (semiconductor device with the same package but different pin arrangement) 10 LSI test board 11 LSI test board (semiconductor device with the same package but different pin arrangement)

Claims (2)

[Claims] 1. A test board for testing the electrical characteristics of a semiconductor device, wherein when the type is switched in the same package, the type can be switched only by replacing the conversion contact pin board alone. 2. A test board, which can be created and changed by simply inserting necessary pins into a contact pin hole of a conversion contact pin board which can be inserted and removed without using a tool when preparing and changing an LSI test board. .