JPH09159945A - ミラー角度検出装置及び検出方法 - Google Patents

ミラー角度検出装置及び検出方法

Info

Publication number
JPH09159945A
JPH09159945A JP7344629A JP34462995A JPH09159945A JP H09159945 A JPH09159945 A JP H09159945A JP 7344629 A JP7344629 A JP 7344629A JP 34462995 A JP34462995 A JP 34462995A JP H09159945 A JPH09159945 A JP H09159945A
Authority
JP
Japan
Prior art keywords
light
mirror
movable mirror
reflected
position sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7344629A
Other languages
English (en)
Japanese (ja)
Inventor
Teiichiro Chiba
貞一郎 千葉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Komatsu Ltd
Original Assignee
Komatsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Komatsu Ltd filed Critical Komatsu Ltd
Priority to JP7344629A priority Critical patent/JPH09159945A/ja
Priority to TW085113402A priority patent/TW318894B/zh
Priority to KR1019960058271A priority patent/KR970048691A/ko
Priority to PCT/JP1996/003538 priority patent/WO1997021132A1/ja
Priority to EP96939353A priority patent/EP0869384A4/en
Publication of JPH09159945A publication Critical patent/JPH09159945A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G02B26/105—Scanning systems with one or more pivoting mirrors or galvano-mirrors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G01D5/28—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with deflection of beams of light, e.g. for direct optical indication
    • G01D5/30—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with deflection of beams of light, e.g. for direct optical indication the beams of light being detected by photocells

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Laser Beam Processing (AREA)
  • Measurement Of Optical Distance (AREA)
  • Automatic Focus Adjustment (AREA)
JP7344629A 1995-12-04 1995-12-04 ミラー角度検出装置及び検出方法 Pending JPH09159945A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP7344629A JPH09159945A (ja) 1995-12-04 1995-12-04 ミラー角度検出装置及び検出方法
TW085113402A TW318894B (enExample) 1995-12-04 1996-10-30
KR1019960058271A KR970048691A (ko) 1995-12-04 1996-11-27 미러각도 검출장치 및 검출방법
PCT/JP1996/003538 WO1997021132A1 (en) 1995-12-04 1996-12-03 Mirror angle detector and detection method
EP96939353A EP0869384A4 (en) 1995-12-04 1996-12-03 ANGLE DETECTOR AND DETECTION METHOD WITH MIRROR

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7344629A JPH09159945A (ja) 1995-12-04 1995-12-04 ミラー角度検出装置及び検出方法

Publications (1)

Publication Number Publication Date
JPH09159945A true JPH09159945A (ja) 1997-06-20

Family

ID=18370746

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7344629A Pending JPH09159945A (ja) 1995-12-04 1995-12-04 ミラー角度検出装置及び検出方法

Country Status (5)

Country Link
EP (1) EP0869384A4 (enExample)
JP (1) JPH09159945A (enExample)
KR (1) KR970048691A (enExample)
TW (1) TW318894B (enExample)
WO (1) WO1997021132A1 (enExample)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008224408A (ja) * 2007-03-13 2008-09-25 Sanyo Electric Co Ltd ビーム照射装置
JP2010145313A (ja) * 2008-12-22 2010-07-01 Opcell Co Ltd オートコリメータ装置
JP2010182847A (ja) * 2009-02-05 2010-08-19 Toshiba Corp 光伝送装置
WO2018066286A1 (ja) * 2016-10-04 2018-04-12 株式会社ニコン ビーム走査装置およびパターン描画装置
WO2018066285A1 (ja) * 2016-10-04 2018-04-12 株式会社ニコン ビーム走査装置、パターン描画装置、およびパターン描画装置の精度検査方法
JP2020118623A (ja) * 2019-01-28 2020-08-06 株式会社日立製作所 レーザ変位計、超音波装置

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100425770B1 (ko) * 2002-04-23 2004-04-01 전자부품연구원 미소 반사체의 회전각도 측정장치
KR100589592B1 (ko) * 2004-05-10 2006-06-19 주식회사 대우일렉트로닉스 홀로그래픽 디지털 데이터 시스템의 미러 각도 측정 및서보 장치
CN101852596B (zh) * 2010-04-09 2012-03-14 哈尔滨工程大学 直升机旋翼共锥度测量光路的快速产生装置
CN102288135A (zh) * 2011-06-30 2011-12-21 亚威朗光电(中国)有限公司 测量极小旋转角度的光学系统
JP6405368B2 (ja) * 2014-04-25 2018-10-17 浜松ホトニクス株式会社 光学式センサ
CN105091791B (zh) * 2015-05-09 2017-11-24 国家电网公司 光学镜头光轴与机械轴夹角的检测方法
DE102016111615B3 (de) * 2016-06-24 2017-04-13 Sick Ag Optoelektronischer Sensor und Verfahren zur Erfassung von Objekten
CN112014362B (zh) * 2019-05-30 2024-04-09 中国科学院大连化学物理研究所 显微成像全谱段高压模块时间分辨荧光测量系统

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4121883A (en) * 1974-04-22 1978-10-24 Canon Kabushiki Kaisha Scanning device for radiation beams
JPS5911083B2 (ja) * 1976-03-19 1984-03-13 キヤノン株式会社 情報用ビ−ム検出光学系を有する走査光学系
JPS5973707A (ja) * 1982-10-20 1984-04-26 Hitachi Ltd 光学的位置検出方式
JPH0799410B2 (ja) * 1987-04-06 1995-10-25 旭光学工業株式会社 偏向走査光学系
JP2524140Y2 (ja) * 1989-09-21 1997-01-29 日本電気株式会社 レーザ光走査装置
NL9001253A (nl) * 1990-06-01 1992-01-02 Philips Nv Inrichting voor het optisch bepalen van de positie en stand van een voorwerp en optisch inschrijf- en/of weergaveapparaat voorzien van een dergelijke inrichting.
US5322999A (en) * 1992-10-13 1994-06-21 Merryman Jerry D Method and apparatus for precision control of galvanometer patterning system
JPH06289305A (ja) * 1993-04-01 1994-10-18 Olympus Optical Co Ltd 走査ユニット

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008224408A (ja) * 2007-03-13 2008-09-25 Sanyo Electric Co Ltd ビーム照射装置
JP2010145313A (ja) * 2008-12-22 2010-07-01 Opcell Co Ltd オートコリメータ装置
JP2010182847A (ja) * 2009-02-05 2010-08-19 Toshiba Corp 光伝送装置
WO2018066286A1 (ja) * 2016-10-04 2018-04-12 株式会社ニコン ビーム走査装置およびパターン描画装置
WO2018066285A1 (ja) * 2016-10-04 2018-04-12 株式会社ニコン ビーム走査装置、パターン描画装置、およびパターン描画装置の精度検査方法
KR20190057372A (ko) * 2016-10-04 2019-05-28 가부시키가이샤 니콘 빔 주사 장치 및 패턴 묘화 장치
KR20190057371A (ko) * 2016-10-04 2019-05-28 가부시키가이샤 니콘 빔 주사 장치, 패턴 묘화 장치 및 패턴 묘화 장치의 정밀도 검사 방법
JPWO2018066285A1 (ja) * 2016-10-04 2019-07-18 株式会社ニコン ビーム走査装置、パターン描画装置、およびパターン描画装置の精度検査方法
JPWO2018066286A1 (ja) * 2016-10-04 2019-07-18 株式会社ニコン ビーム走査装置およびパターン描画装置
JP2020118623A (ja) * 2019-01-28 2020-08-06 株式会社日立製作所 レーザ変位計、超音波装置

Also Published As

Publication number Publication date
TW318894B (enExample) 1997-11-01
EP0869384A1 (en) 1998-10-07
WO1997021132A1 (en) 1997-06-12
EP0869384A4 (en) 1999-04-21
KR970048691A (ko) 1997-07-29

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