JPH08502818A - 電弧検出器 - Google Patents
電弧検出器Info
- Publication number
- JPH08502818A JPH08502818A JP6505251A JP50525194A JPH08502818A JP H08502818 A JPH08502818 A JP H08502818A JP 6505251 A JP6505251 A JP 6505251A JP 50525194 A JP50525194 A JP 50525194A JP H08502818 A JPH08502818 A JP H08502818A
- Authority
- JP
- Japan
- Prior art keywords
- noise
- arc
- high frequency
- interval
- frequency noise
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/333—Testing of the switching capacity of high-voltage circuit-breakers ; Testing of breaking capacity or related variables, e.g. post arc current or transient recovery voltage
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H1/00—Details of emergency protective circuit arrangements
- H02H1/0007—Details of emergency protective circuit arrangements concerning the detecting means
- H02H1/0015—Using arc detectors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
- G01R31/1272—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation of cable, line or wire insulation, e.g. using partial discharge measurements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02H—EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
- H02H1/00—Details of emergency protective circuit arrangements
- H02H1/04—Arrangements for preventing response to transient abnormal conditions, e.g. to lightning or to short duration over voltage or oscillations; Damping the influence of dc component by short circuits in ac networks
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Relating To Insulation (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Discharge Heating (AREA)
- Gas-Insulated Switchgears (AREA)
- Emergency Protection Circuit Devices (AREA)
- Electron Sources, Ion Sources (AREA)
- Non-Insulated Conductors (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1.波形としてライン電圧又はライン電流を監視し、 周波数Fよりかなり高い高周波雑音の存在のために前記波形を監視し、 高周波雑音が殆ど存在しないT/4以下の存続期間tbの間隔のために波形を 監視し、 存続期間がT/2に等しい時間間隔中に存続期間tbのこのような一間隔を除 いて高周波雑音が連続的に略存在するならば、電弧が存在することを決定し、 この電弧が存在する決定に応答して出力を形成するステップを備えた周波数F 及び期間T=1/FのAC電力線に電弧の存在を検知する方法。 2.前記測定された波形はライン電圧の波形であり、 波形に関する存続期間tbの間隔の一時的位置を監視し、 この位置によってアークと直列になる負荷のリアクタンスを決定し、 この負荷のリアクタンスを指示する追加出力を形成するステップを更に備えた 請求の範囲第1項記載の方法。 3.前記存続期間tbの間隔の位置は、波形の各ゼロ交差に後続する45゜及び 波形の各ゼロ交差に先行する45゜間の間隔の中心となるならば、負荷がかなり 抵抗性であることを指示する 出力が形成される請求の範囲第2項記載の方法。 4.前記存続期間tbの間隔の位置は、波形の各ゼロ交差に後続する45゜及び 90゜間の間隔の中心となるならば、負荷が誘導的であることを指示する出力が 形成される請求の範囲第2項記載の方法。 5.前記存続期間tbの間隔の位置は、波形の各ゼロ交差に先行する45゜及び 90゜の間の間隔の中心となるならば、負荷が容量性であることを指示する出力 が形成される請求の範囲第2項記載の方法。 6.波形としてライン電圧又は負荷電流を監視し、 周波数Fよりかなり高い高周波雑音の存在のために波形を監視し、 パターンの発生のために波形を監視するステップを備え、 前記パターンは、高周波雑音が略存在するT/2より短い存続期間taの第1 の間隔と、 直に後続する高周波雑音が殆ど不在であるT/2より短い存続期間tbの第2 の間隔と、 直に後続する高周波雑音が略存在する存続期間tcであって、これらのta+tb +tcがT/2以下である第3間隔とを含み、 存続期間がT/2に等しい間隔で1回のみパターンが発生す るならば、電弧が存在することを決定し、 電弧が存在する決定に応答して出力を形成するステップを備えた周波数F及び 期間T=1/FのAC電力線の電弧の存在を検知する方法。 7.波形に関する存続期間tbの間隔の開始の一時的位置を監視して、一時的位 置が所定の範囲外であるならば、出力を禁止する更なるステップを更に備えた請 求の範囲第1項又は第6項に記載の方法。 8.前記一時的位置は、波形のゼロ交差の近くにある請求の範囲第7項記載の方 法。 9.tcがゼロに等しく、合計ta+tbがT/2以下である請求の範囲第6項記 載の方法。 10. taがゼロに等しく、合計tb+tcがT/2以下である請求の範囲第6 項記載の方法。 11.ta+tb+tcは、T/2である請求の範囲第6項記載の方法。 12.各存続期間がT/2に等しい多重連続時間間隔に電弧が存在するか否かを 決定し、 もしそうであれば、存続期間tbの間隔が各連続間隔の同じ相対一時位置で略 始まるか否かを決定し、 もしそうでなければ、電弧が存在する決定に応答して出力を禁止するステップ を更に備えた請求の範囲第1項又は第6項に記載の方法。 13.連続した間隔の数は、10〜100の範囲である請求の範囲第12項記載 の方法。 14.ライン上の外来雑音の感度を制御するために存続期間tbの間隔の存続期 間を調節する更なるステップを備えた請求の範囲第1項及び第6項の1つに記載 の方法。 15.存続期間tbは、ライン周波数期間の60゜〜1゜の範囲であり、一全期 間が360゜である請求の範囲第1項又は第6項に記載の方法。 16.監視された高周波雑音の範囲は、約10KHzから約1MHzに及ぶ請求 の範囲第1項又は第6項に記載の方法。 17.高周波雑音がかなり任意であるか否かを決定するステツプを更に備えた請 求の範囲第1項又は第6項に記載の方法。 18.雑音がかなり任意であるか否かを決定するステップは、 波形から高周波雑音成分を濾過し、 高周波雑音の瞬間レベルを固定レベルと比較し、 波形の幾つかの同一間隔の各期間中に固定レベルを越える瞬間レベルの時間数 を計数し、 時間数が各間隔期間中にかなり異なるならば、雑音がかなり任意であることを 決定するステップを実行することによって実行される請求の範囲第17項記載の 方法。 19.高周波雑音が広帯域幅を示すか否かを決定する更なるステップを備えた請 求の範囲第1項又は第6項に記載の方法。 20.前記高周波雑音が広帯域幅を示すか否かを決定するには、 2個以上の非重複バンドパスフイルタに高周波雑音を濾過させ、 各バンドパスフィルタを通る雑音の振幅を測定し、 各バンドパスフィルタを通る雑音の振幅が略等しいならば、雑音が広帯域幅を 示すことを決定するステップが実行される請求の範囲第19項記載の方法。 21.ライン電圧及び負荷電流を監視し、これらから周波数Fよりかなり高い高 周波雑音を抽出する手段と、 雑音の振幅を測定し、この振幅を予め決定された値と比較して高周波雑音が存 在するか否かを決定する手段と、 存続期間がT/2に等しいどの間隔の雑音によってパターンが展示されるか否 かを決定し、前記パターンは高周波雑音が存在する少なくとも1つの間隔と、高 周波雑音が存在しない他の間隔とを備え、もしパターンが展示されるならば、電 弧が存在することを決定する手段と、 電弧が存在する決定に応答して出力信号の生成を活発化した手段とを備えた 周波数F及び期間T=1/FのAC電力線の電弧の存在を検知する装置。 22.高周波雑音が波形に関して存在しない間隔の開始の一時的位置を監視し、 一時的位置が波形の予め決定された部分外であるならば、出力信号を禁止する手 段を更に備えた請求の範囲第21項に記載の装置。 23.前記パターンは、高周波雑音が存在するT/2より短い存続期間taの第 1の間隔と、この間隔に直に後続して高周波雑音が不在である存続期間tbの第 2の間隔とを備え、これら合計ta+tbがT/2以下である請求の範囲第21項 に記載の装置。 24.前記パターンは、高周波雑音が存在しないT/2より短い存続期間tbの 第1の間隔と、この間隔に直に続いて高周波雑音が存在する存続期間tcの第2 の間隔とを備え、これら合計 tb+tcがT/2以下である請求の範囲第21項に記載の装置。 25.前記パターンは、高周波雑音が存在するT/2より短い存続期間taの第 1の間隔と、この間隔に直に続く高周波雑音が不在であるT/2より短い存続期 間tbの第2の間隔と、この間隔に直に続く高周波雑音が存在する存続期間tcの 第3の間隔とを備え、これらta+tb+tcがT/2以下である請求の範囲第2 1項に記載の装置。 26.各存続期間がT/2に等しい多重連続した時間間隔にパターンが存在する か否かを決定し、もしそうであれば、高周波雑音が存在しないパターンの間隔が 各連続した間隔で同じ相対一時位置で略始まるか否かを決定し、もしそうでなけ れば、電弧が存在する決定に応答して出力を禁止する手段を更に備えた請求の範 囲第21項に記載の装置。 27.高周波雑音を抽出する手段は、ハイパスフィルタである請求の範囲第21 項に記載の装置。 28.前記抽出手段は、バンドパスフィルタである請求の範囲第21項に記載の 装置。 29.抽出された雑音を増幅する手段を更に備えた請求の範囲 第21項に記載の装置。 30.前記増幅手段は、同増幅手段のダイナミックな範囲を広げるリミッタ又は 自動利得制御手段を更に含む請求の範囲第29項に記載の装置。 31.電弧が存在することを決定する手段は、マイクロプロセッサである請求の 範囲第21項に記載の装置。 32.出力信号に応答して、1つ又は両方の音声又は目視警報信号を形成する表 示器を更に備えた請求の範囲第21項に記載の装置。 33.電弧が存在することを決定する手段に応答して、電弧が存在することを決 めたならば電流を切る手段を更に備えた請求の範囲第21項に記載の装置。 34.高周波雑音が存在するか否かを決定する手段は、雑音がもしあるならばか なり任意であるか否かを決定し、もしそうでなければ、高周波雑音がないと結諭 する手段を更に備えた請求の範囲第21項に記載の装置。 35.雑音がかなり任意であるか否かを決定する手段は、 高周波雑音の瞬間振幅を固定レベルと比較する手段と、 波形の連続したサイクル上の幾つかの同一間隔の各々の期間中に固定レベルを 越える瞬間レベルの時間数を計数する手段と、 時間数が各間隔でかなり異なるならば、雑音がかなり任意であることを決定す る手段とを備えた請求の範囲第34項に記載の装置。 36.高周波雑音が存在するか否かを決定する手段は、雑音が広帯域幅を示すか 否かを決定し、もしそうでなければ、高周波雑音がないと結論する手段を更に含 む請求の範囲第21項に記載の装置。 37.雑音が広帯域幅を示すか否かを決定する手段は、 2個以上の非重複バンドパスフィルタに高周波雑音を濾過させる手段と、 各バンドパスフィルタを通る雑音の相対振幅を比較し、各バンドパスフイルタ を通る雑音の振幅がかなり同一であるならば、雑音が広帯域幅を示すことを決定 する手段とを備える請求の範囲第36項に記載の装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/921,829 US5223795A (en) | 1992-07-30 | 1992-07-30 | Method and apparatus for detecting arcing in electrical connections by monitoring high frequency noise |
US07/921,829 | 1992-07-30 | ||
PCT/US1992/010091 WO1994003820A1 (en) | 1992-07-30 | 1992-11-30 | Electric arc detector |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH08502818A true JPH08502818A (ja) | 1996-03-26 |
JP3819020B2 JP3819020B2 (ja) | 2006-09-06 |
Family
ID=25446038
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP50525194A Expired - Lifetime JP3819020B2 (ja) | 1992-07-30 | 1992-11-30 | 電弧検出器 |
Country Status (10)
Country | Link |
---|---|
US (1) | US5223795A (ja) |
EP (1) | EP0653073B1 (ja) |
JP (1) | JP3819020B2 (ja) |
KR (1) | KR100292967B1 (ja) |
AU (1) | AU666158B2 (ja) |
BR (1) | BR9207075A (ja) |
CA (1) | CA2125026C (ja) |
DE (1) | DE69231066T2 (ja) |
NO (1) | NO313162B1 (ja) |
WO (1) | WO1994003820A1 (ja) |
Cited By (8)
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JP2003529306A (ja) * | 2000-03-16 | 2003-09-30 | マイケル サピール | 電気的アーク障害の検出及び早期警告を行う装置 |
CN100344981C (zh) * | 2001-08-24 | 2007-10-24 | 易通公司 | 在遭受循环干扰的dc电气系统中检测电弧和过电流的装置 |
JP2014509396A (ja) * | 2011-02-28 | 2014-04-17 | エスエムエー ソーラー テクノロジー アーゲー | 電力回路におけるアーク故障を検出するための方法およびシステム |
JP2015073237A (ja) * | 2013-10-04 | 2015-04-16 | 株式会社東芝 | 通信システム及び通信装置 |
JPWO2014168194A1 (ja) * | 2013-04-12 | 2017-02-16 | 旭東電気株式会社 | 開閉器 |
WO2019082564A1 (ja) * | 2017-10-27 | 2019-05-02 | パナソニックIpマネジメント株式会社 | アーク検出回路、ブレーカシステム、接続箱システム、パワーコンディショナ、マイクロインバータ、dcオプティマイザ及びアーク検出方法 |
JP2020118521A (ja) * | 2019-01-23 | 2020-08-06 | サンケン電気株式会社 | アーク検出装置 |
JP2021032732A (ja) * | 2019-08-26 | 2021-03-01 | 日東工業株式会社 | 放電検出装置 |
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US6532424B1 (en) | 1995-03-13 | 2003-03-11 | Square D Company | Electrical fault detection circuit with dual-mode power supply |
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US6246556B1 (en) | 1995-03-13 | 2001-06-12 | Square D Company | Electrical fault detection system |
US6377427B1 (en) * | 1995-03-13 | 2002-04-23 | Square D Company | Arc fault protected electrical receptacle |
US5682101A (en) | 1995-03-13 | 1997-10-28 | Square D Company | Arcing fault detection system |
US6242993B1 (en) | 1995-03-13 | 2001-06-05 | Square D Company | Apparatus for use in arcing fault detection systems |
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JP2003529306A (ja) * | 2000-03-16 | 2003-09-30 | マイケル サピール | 電気的アーク障害の検出及び早期警告を行う装置 |
CN100344981C (zh) * | 2001-08-24 | 2007-10-24 | 易通公司 | 在遭受循环干扰的dc电气系统中检测电弧和过电流的装置 |
JP2014509396A (ja) * | 2011-02-28 | 2014-04-17 | エスエムエー ソーラー テクノロジー アーゲー | 電力回路におけるアーク故障を検出するための方法およびシステム |
JPWO2014168194A1 (ja) * | 2013-04-12 | 2017-02-16 | 旭東電気株式会社 | 開閉器 |
JP2015073237A (ja) * | 2013-10-04 | 2015-04-16 | 株式会社東芝 | 通信システム及び通信装置 |
WO2019082564A1 (ja) * | 2017-10-27 | 2019-05-02 | パナソニックIpマネジメント株式会社 | アーク検出回路、ブレーカシステム、接続箱システム、パワーコンディショナ、マイクロインバータ、dcオプティマイザ及びアーク検出方法 |
JPWO2019082564A1 (ja) * | 2017-10-27 | 2020-09-24 | パナソニックIpマネジメント株式会社 | アーク検出回路、ブレーカシステム、接続箱システム、パワーコンディショナ、マイクロインバータ、dcオプティマイザ及びアーク検出方法 |
JP2020118521A (ja) * | 2019-01-23 | 2020-08-06 | サンケン電気株式会社 | アーク検出装置 |
JP2021032732A (ja) * | 2019-08-26 | 2021-03-01 | 日東工業株式会社 | 放電検出装置 |
Also Published As
Publication number | Publication date |
---|---|
EP0653073B1 (en) | 2000-05-17 |
NO943199L (no) | 1994-08-29 |
WO1994003820A1 (en) | 1994-02-17 |
EP0653073A4 (en) | 1995-11-08 |
CA2125026C (en) | 1998-06-30 |
EP0653073A1 (en) | 1995-05-17 |
CA2125026A1 (en) | 1994-02-17 |
AU666158B2 (en) | 1996-02-01 |
KR100292967B1 (ko) | 2001-06-15 |
DE69231066D1 (de) | 2000-06-21 |
BR9207075A (pt) | 1995-12-26 |
NO313162B1 (no) | 2002-08-19 |
US5223795A (en) | 1993-06-29 |
KR950702709A (ko) | 1995-07-29 |
AU3222193A (en) | 1994-03-03 |
JP3819020B2 (ja) | 2006-09-06 |
DE69231066T2 (de) | 2000-11-02 |
NO943199D0 (no) | 1994-08-29 |
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