JPH08125291A - Wiring board and manufacture thereof - Google Patents

Wiring board and manufacture thereof

Info

Publication number
JPH08125291A
JPH08125291A JP26340794A JP26340794A JPH08125291A JP H08125291 A JPH08125291 A JP H08125291A JP 26340794 A JP26340794 A JP 26340794A JP 26340794 A JP26340794 A JP 26340794A JP H08125291 A JPH08125291 A JP H08125291A
Authority
JP
Japan
Prior art keywords
thermosetting resin
semiconductor element
wiring board
wiring
precursor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP26340794A
Other languages
Japanese (ja)
Other versions
JP3152852B2 (en
Inventor
Kiyoshi Tomita
清志 冨田
Masami Terasawa
正巳 寺澤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP26340794A priority Critical patent/JP3152852B2/en
Publication of JPH08125291A publication Critical patent/JPH08125291A/en
Application granted granted Critical
Publication of JP3152852B2 publication Critical patent/JP3152852B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Production Of Multi-Layered Print Wiring Board (AREA)

Abstract

PURPOSE: To provide a wiring board which is capable of normally and stably operating a semiconductor element housed therein for a long period of time without generating any break or crack, and electrically connecting the semiconductor element to a wiring layer with constant accuracy and security without having deformation like warping and dimensional unevenness. CONSTITUTION: On at least one insulation board 1a-1c which is made of 60-95% by weight of inorganic insulating material powder and 5-40% by weight of thermosetting resin, with the inorganic insulating material powder bonded by the thermosetting resin, a wiring conductor 2 made of metal powder bonded by thermosetting resin is deposited.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体素子を収容する
ための半導体素子収納用パッケージや混成集積回路基板
等に用いられる配線基板に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring board used for a semiconductor element housing package for housing semiconductor elements, a hybrid integrated circuit board and the like.

【0002】[0002]

【従来の技術】従来、配線基板、例えば半導体素子を収
容する半導体素子収納用パッケージに使用される配線基
板として比較的高密度の配線が可能な積層セラミックス
配線基板が多用されている。この配線基板は、酸化アル
ミニウム質焼結体等のセラミックスより成り、その上面
中央部に半導体素子を収容する凹部を有する絶縁基体
と、前記絶縁基体の凹部周辺から下面にかけて導出され
たタングステン、モリブデン等の高融点金属粉末から成
る配線導体とから構成されており、前記絶縁基体の凹部
底面に半導体素子をガラス、樹脂、ロウ材等の接着剤を
介して接着固定するとともに該半導体素子の各電極を例
えばボンディングワイヤ等の電気的接続手段を介して配
線導体に電気的に接続し、しかる後、前記絶縁基体の上
面に、金属やセラミックス等から成る蓋体を絶縁基体の
凹部を塞ぐようにしてガラス、樹脂、ロウ材等の封止材
を介して接合させ、絶縁基体の凹部内に半導体素子を気
密に収容することによって製品としての半導体装置とな
る。
2. Description of the Related Art Hitherto, as a wiring board, for example, a wiring board used in a semiconductor element housing package for housing a semiconductor element, a laminated ceramic wiring board capable of relatively high-density wiring has been widely used. This wiring board is made of ceramics such as aluminum oxide sintered body, has an insulating base body having a recessed portion for accommodating a semiconductor element in the center of its upper surface, and tungsten, molybdenum, etc. led out from the periphery of the recessed portion of the insulating base material to the lower surface. And a wiring conductor made of a refractory metal powder, the semiconductor element is adhered and fixed to the bottom surface of the recess of the insulating substrate via an adhesive such as glass, resin, or brazing material, and each electrode of the semiconductor element is fixed. For example, it is electrically connected to a wiring conductor through an electrical connection means such as a bonding wire, and then a glass cover is formed on the upper surface of the insulating base so as to cover the recess of the insulating base. , A resin, a brazing material, and the like are bonded together, and the semiconductor element is hermetically housed in the concave portion of the insulating substrate. To become.

【0003】またこの従来の配線基板は、一般にセラミ
ックグリーンシート積層法によって製作され、具体的に
は、酸化アルミニウム、酸化珪素、酸化マグネシウム、
酸化カルシウム等のセラミック原料粉末に適当な有機バ
インダー、溶剤等を添加混合して泥漿状となすとともに
これを従来周知のドクターブレード法を採用してシート
状とすることによって複数のセラミックグリーンシート
を得、しかる後、前記セラミックグリーンシートに適当
な打ち抜き加工を施すとともに配線導体となる金属ペー
ストを所定パターンに印刷塗布し、最後に前記セラミッ
クグリーンシートを所定の順に上下に積層してセラミッ
ク生成形体となすとともに該セラミック生成形体を還元
雰囲気中、約1600℃の高温で焼成することによって
製作される。
This conventional wiring board is generally manufactured by a ceramic green sheet laminating method. Specifically, aluminum oxide, silicon oxide, magnesium oxide,
A plurality of ceramic green sheets are obtained by adding and mixing an appropriate organic binder, solvent, etc. to the ceramic raw material powder such as calcium oxide to form a slurry and making this into a sheet shape by adopting the conventionally known doctor blade method. After that, the ceramic green sheet is appropriately punched and a metal paste to be a wiring conductor is printed and applied in a predetermined pattern, and finally, the ceramic green sheets are vertically laminated in a predetermined order to form a ceramic molded body. Along with this, the ceramic green body is manufactured by firing at a high temperature of about 1600 ° C. in a reducing atmosphere.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、この従
来の配線基板は、絶縁基体を構成する酸化アルミニウム
質焼結体等のセラミックスが硬くて脆い性質を有するた
め、搬送工程や半導体装置製作の自動ライン等において
配線基板同士が、あるいは配線基板と半導体装置製作自
動ラインの一部とが激しく衝突すると絶縁基体に欠けや
割れ、クラック等が発生し、その結果、半導体素子を気
密に収容することができず、半導体素子を長期間にわた
り正常、且つ安定に作動させることができなくなるとい
う欠点を有していた。
However, in this conventional wiring board, since the ceramics such as the aluminum oxide sintered body forming the insulating substrate have the property of being hard and brittle, an automatic line for the carrying process and the semiconductor device manufacturing is provided. Etc., when the wiring boards collide with each other or between the wiring boards and a part of the semiconductor device manufacturing automatic line, a crack, crack, crack or the like occurs in the insulating substrate, and as a result, the semiconductor element can be housed in an airtight manner. Therefore, there is a drawback that the semiconductor element cannot be operated normally and stably for a long period of time.

【0005】また、前記配線基板の製造方法によれば、
セラミック生成形体を焼成する際、セラミック生成形体
に不均一な焼成収縮が発生し、得られる配線基板に反り
等の変形や寸法のばらつきが発生し、その結果、半導体
素子と配線導体とを電気的に正確、且つ確実に接続する
ことが困難であるという欠点も有していた。
According to the method of manufacturing the wiring board,
When firing the ceramic green body, uneven firing shrinkage occurs in the ceramic green body, resulting in deformation such as warpage and dimensional variation in the obtained wiring board, and as a result, the semiconductor element and wiring conductor are electrically connected. In addition, it has a drawback that it is difficult to connect accurately and surely.

【0006】[0006]

【発明の目的】本発明は、上記欠点に鑑み案出されたも
ので、その目的は欠けや割れ等が発生することなく、内
部に収容する半導体素子を長期間にわたり正常、且つ安
定に作動させることができる配線基板を提供することに
ある。
SUMMARY OF THE INVENTION The present invention has been devised in view of the above-mentioned drawbacks, and an object of the present invention is to operate a semiconductor element housed therein normally and stably for a long period of time without causing cracks or cracks. It is to provide a wiring board that can be used.

【0007】また本発明の別の目的は、反り等の変形や
寸法のばらつきがなく、半導体素子を配線導体に容易に
正確、且つ確実に電気的に接続させることが可能な配線
基板の製造方法を提供することにある。
Another object of the present invention is a method of manufacturing a wiring board which is capable of electrically connecting a semiconductor element to a wiring conductor easily and accurately and surely without deformation such as warpage or variation in dimensions. To provide.

【0008】[0008]

【課題を解決するための手段】本発明の配線基板は、6
0乃至95重量%の無機絶縁物粉末と5乃至40重量%
の熱硬化性樹脂とから成り、前記無機絶縁粉末を前記熱
硬化性樹脂により結合した少なくとも一枚の絶縁基板
に、金属粉末を熱硬化性樹脂により結合した配線導体を
被着させて成ることを特徴とするものである。
A wiring board according to the present invention comprises 6
0 to 95% by weight of inorganic insulating powder and 5 to 40% by weight
A thermosetting resin, and a wiring conductor formed by bonding metal powder with a thermosetting resin is attached to at least one insulating substrate obtained by bonding the inorganic insulating powder with the thermosetting resin. It is a feature.

【0009】また本発明の配線基板の製造方法は、熱硬
化性樹脂前駆体と無機絶縁物粉末とを混合して成る前駆
体シートを準備する工程と、前記前駆体シートに熱硬化
性樹脂前駆体と金属粉末とを混合して成る金属ペースト
を所定パターンに印刷する工程と、前記前駆体シート及
び金属ペーストを熱硬化させる工程と、から成ることを
特徴とするものである。
Further, the method for manufacturing a wiring board of the present invention comprises a step of preparing a precursor sheet formed by mixing a thermosetting resin precursor and an inorganic insulating powder, and the thermosetting resin precursor being added to the precursor sheet. The present invention is characterized by comprising a step of printing a metal paste formed by mixing a body and a metal powder in a predetermined pattern, and a step of thermally curing the precursor sheet and the metal paste.

【0010】[0010]

【作用】本発明によれば、絶縁基体となる無機絶縁物粉
末及び配線導体となる金属粉末を靭性に優れる熱硬化性
樹脂により結合して成ることから配線基板同士あるいは
配線基板と半導体装置製作自動ラインの一部とが激しく
衝突しても絶縁基体に欠けや割れ、クラック等が発生す
ることは一切ない。
According to the present invention, since the inorganic insulating material powder serving as the insulating substrate and the metal powder serving as the wiring conductor are bonded by the thermosetting resin having excellent toughness, the wiring boards or the wiring boards and the semiconductor device are automatically manufactured. Even if a part of the line collides violently, the insulating substrate will never be chipped, cracked, or cracked.

【0011】また本発明によれば、熱硬化性樹脂前駆体
と無機絶縁物粉末とを混合して成る前駆体シートを準備
する工程と、前記前駆体シートに熱硬化性樹脂前駆体と
金属粉末とを混合して成る金属ペーストを所定パターン
に印刷する工程と、前記前駆体シート及び金属ペースト
を熱硬化させる工程とにより配線基板を製作することか
ら、焼成に伴う不均一な収縮による変形や寸法のばらつ
きが発生することもない。
Further, according to the present invention, a step of preparing a precursor sheet formed by mixing a thermosetting resin precursor and an inorganic insulating powder, and the thermosetting resin precursor and the metal powder are added to the precursor sheet. Since a wiring board is manufactured by a step of printing a metal paste formed by mixing the above with a predetermined pattern and a step of thermally curing the precursor sheet and the metal paste, deformation and dimensions due to uneven shrinkage accompanying firing. Does not occur.

【0012】[0012]

【実施例】次に、本発明を添付図面に基づき詳細に説明
する。図1は、本発明の配線基板を半導体素子を収容す
る半導体素子収納用パッケージに適用した場合の一実施
例を示し、1は絶縁基体、2は配線導体である。
The present invention will now be described in detail with reference to the accompanying drawings. FIG. 1 shows an embodiment in which the wiring board of the present invention is applied to a semiconductor element housing package for housing a semiconductor element, wherein 1 is an insulating substrate and 2 is a wiring conductor.

【0013】前記絶縁基体1は、例えば酸化珪素、酸化
アルミニウム、窒化アルミニウム、炭化珪素、チタン酸
バリウム等の無機絶縁物粉末をエポキシ樹脂、ポリイミ
ド樹脂等の熱硬化性樹脂により結合した材料から成る3
枚の絶縁基板1a〜1cを積層して成り、その上面中央
部に半導体素子を収容するための凹部1aが形成されて
おり、該凹部1a底面には半導体素子3が樹脂等の接着
剤を介して接着固定される。
The insulating substrate 1 is made of a material obtained by bonding inorganic insulating powders such as silicon oxide, aluminum oxide, aluminum nitride, silicon carbide and barium titanate with a thermosetting resin such as epoxy resin or polyimide resin.
A plurality of insulating substrates 1a to 1c are laminated, and a concave portion 1a for accommodating a semiconductor element is formed in the center of the upper surface of the insulating substrate 1a to 1c. The semiconductor element 3 is formed on the bottom surface of the concave portion 1a via an adhesive such as resin. And glued and fixed.

【0014】前記絶縁基板1a〜1cは、無機絶縁物粉
末を靭性に優れる熱硬化性樹脂により結合して成ること
から、配線基板同士が衝突した際等に絶縁基体1に欠け
や割れ、クラック等が発生することは一切ない。
Since the insulating substrates 1a to 1c are formed by bonding inorganic insulating powders with a thermosetting resin having excellent toughness, the insulating substrate 1 is chipped, cracked, or cracked when the wiring substrates collide with each other. Will never occur.

【0015】また、前記絶縁基板1a〜1c中に含有さ
れる無機絶縁物粉末は、その含有量が60重量%未満で
あると絶縁基体1の熱膨張係数が半導体素子3の熱膨張
係数と比較して極めて大きなものとなり半導体素子3が
作動時に発生する熱が印加されると両者の熱膨張係数の
相違に起因して大きな熱応力が発生し、半導体素子3が
絶縁基体1から剥離したり、半導体素子3に割れを発生
させ易い傾向にあり、また95重量%を越えると無機絶
縁物粉末を熱硬化樹脂で強固に結合することが困難とな
る傾向にある。従って、前記絶縁基板1a〜1cに含有
される無機絶縁物粉末はその含有量が60乃至95重量
%の範囲に特定される。
When the content of the inorganic insulating powder contained in the insulating substrates 1a to 1c is less than 60% by weight, the thermal expansion coefficient of the insulating base 1 is compared with that of the semiconductor element 3. Then, when the semiconductor element 3 becomes extremely large and heat generated when the semiconductor element 3 is operated is applied, a large thermal stress is generated due to the difference in thermal expansion coefficient between the two, and the semiconductor element 3 is separated from the insulating substrate 1, The semiconductor element 3 tends to be cracked, and if it exceeds 95% by weight, it tends to be difficult to firmly bond the inorganic insulating powder with the thermosetting resin. Therefore, the content of the inorganic insulating powder contained in the insulating substrates 1a to 1c is specified in the range of 60 to 95% by weight.

【0016】前記絶縁基体1は、またその凹部1a周辺
から下面にかけて例えば銅、銀、金等の金属粉末をエポ
キシ樹脂等の熱硬化性樹脂により結合した配線導体2が
被着形成されている。
A wiring conductor 2 is formed by depositing a metal powder of copper, silver, gold or the like with a thermosetting resin such as an epoxy resin from the periphery of the recess 1a to the lower surface of the insulating substrate 1.

【0017】前記配線導体2は、内部に収容する半導体
素子3を外部電気回路に電気的に接続する作用を為し、
その凹部1a周辺部位には半導体素子3の各電極がボン
ディングワイヤ4を介して電気的に接続される。
The wiring conductor 2 serves to electrically connect the semiconductor element 3 housed therein to an external electric circuit,
Each electrode of the semiconductor element 3 is electrically connected to the peripheral portion of the recess 1a through a bonding wire 4.

【0018】尚、前記配線導体2に含有される金属粉末
はその含有量が70重量%未満では配線導体の導電性が
悪くなる傾向にあり、また95重量%を越えると金属粉
末を樹脂で強固に結合することが困難となる傾向にあ
る。従って、前記配線導体2に含有される金属粉末はそ
の含有量が70乃至95重量%の範囲が好ましい。
When the content of the metal powder contained in the wiring conductor 2 is less than 70% by weight, the conductivity of the wiring conductor tends to deteriorate, and when it exceeds 95% by weight, the metal powder is hardened with resin. It tends to be difficult to combine with. Therefore, the content of the metal powder contained in the wiring conductor 2 is preferably in the range of 70 to 95% by weight.

【0019】また前記配線導体2は、その露出する表面
にニッケル、金等の耐食性に優れ、且つ良導電性の金属
をメッキ法により1.0乃至20.0μmの厚みに層着
させておくと配線導体2の酸化腐食を有効に防止するこ
とができるとともに配線導体2とボンディングワイヤ4
とを強固に電気的に接続させることができる。従って、
通常、前記配線導体2の露出する表面には、必要に応じ
てニッケルや金等の耐食性に優れ、且つ良導電性の金属
がメッキ法により1.0乃至20.0μmの厚みに層着
される。
Further, the wiring conductor 2 may be formed by depositing a metal having excellent corrosion resistance such as nickel and gold on the exposed surface by a plating method to a thickness of 1.0 to 20.0 μm. It is possible to effectively prevent oxidative corrosion of the wiring conductor 2 and the wiring conductor 2 and the bonding wire 4
Can be firmly and electrically connected. Therefore,
Usually, on the exposed surface of the wiring conductor 2, a metal such as nickel or gold having excellent corrosion resistance and good conductivity is layered to a thickness of 1.0 to 20.0 μm by a plating method, if necessary. .

【0020】前記配線導体2はまた絶縁基体1の下面に
導出する部位に、外部電気回路と電気的に接続されるバ
ンプ電極2aが形成されており、該バンプ電極2aを外
部電気回路基板の配線導体に半田等の導電性接合材を介
して接合することにより内部に収容する半導体素子3が
外部電気回路に電気的に接続されることとなる。
The wiring conductor 2 also has a bump electrode 2a which is electrically connected to an external electric circuit formed at a portion led out to the lower surface of the insulating substrate 1. The bump electrode 2a is connected to the wiring of the external electric circuit board. By joining the conductor to the conductor via a conductive joining material such as solder, the semiconductor element 3 housed inside is electrically connected to the external electric circuit.

【0021】かくして本発明の配線基板によれば、絶縁
基体1の凹部1a底面に半導体素子3を接着固定すると
ともに半導体素子3の各電極をボンディングワイヤ4を
介して配線導体2に電気的に接続し、最後に前記絶縁基
体1の上面に蓋体5を封止材を介して接合させることに
より製品としての半導体装置となる。
Thus, according to the wiring board of the present invention, the semiconductor element 3 is adhered and fixed to the bottom surface of the recess 1a of the insulating substrate 1, and each electrode of the semiconductor element 3 is electrically connected to the wiring conductor 2 via the bonding wire 4. Then, finally, the lid 5 is bonded to the upper surface of the insulating substrate 1 through a sealing material to obtain a semiconductor device as a product.

【0022】次に前記半導体素子収納用パッケージに適
用された配線基板の製造方法について詳細に説明する。
先ず、図2(a)に示すように無機絶縁物粉末を熱硬化
性樹脂前駆体で結合して成る前駆体シート11a〜11
cを準備する。
Next, a method of manufacturing the wiring board applied to the semiconductor element housing package will be described in detail.
First, as shown in FIG. 2A, precursor sheets 11a to 11 formed by bonding inorganic insulating powders with a thermosetting resin precursor.
Prepare c.

【0023】前記前駆体シート11a〜11cは、例え
ば絶縁基板1a〜1cに含有される無機絶縁物粉末が酸
化珪素から成り、これを結合する熱硬化性樹脂がエポキ
シ樹脂から成る場合、粒径が0.1〜100μm程度の
酸化珪素粉末に例えばビスフェノールA型エポキシ樹
脂、ノボラック型エポキシ樹脂、グリシジルエステル型
エポキシ樹脂等のエポキシ樹脂及びアミン系硬化剤、イ
ミダゾール系硬化剤、酸無水物系硬化剤等の硬化剤等を
添加混合して得たペーストをシート状となすとともにこ
れを約25〜100℃の温度で1〜60分間加熱し半硬
化させることによって製作される。
The precursor sheets 11a to 11c have a particle size of, for example, when the inorganic insulating powder contained in the insulating substrates 1a to 1c is made of silicon oxide and the thermosetting resin for binding the same is made of an epoxy resin. Epoxy resin such as bisphenol A type epoxy resin, novolac type epoxy resin, glycidyl ester type epoxy resin, etc. and silicon oxide powder of about 0.1 to 100 μm and amine type curing agent, imidazole type curing agent, acid anhydride type curing agent, etc. The paste obtained by adding and mixing the curing agent and the like is formed into a sheet and is heated at a temperature of about 25 to 100 ° C. for 1 to 60 minutes to be semi-cured.

【0024】次に図2(b)に示すように前記前駆体シ
ート11a〜11cに凹部1aとなる開口A、A’及び
配線導体を絶縁基体1の凹部1a周辺から下面に導出さ
せる際の導出路となる貫通孔B、B’を従来周知のパン
チング法を採用して穿孔する。
Next, as shown in FIG. 2B, the precursor sheets 11a to 11c are led out when the openings A and A'to be the recesses 1a and the wiring conductor are led out from the periphery of the recesses 1a of the insulating substrate 1 to the lower surface. The through-holes B and B'which serve as passages are formed by using a conventionally known punching method.

【0025】次に図2(c)に示すように、前記前駆体
シート11a〜11cの上下面及び貫通孔B、B’内に
配線導体2となる金属ペースト12を従来周知のスクリ
ーン印刷法及び充填法を採用して所定パターンに印刷塗
布するとともにこれを約25〜100℃の温度で1〜6
0分間加熱し半硬化させる。
Next, as shown in FIG. 2 (c), the metal paste 12 to be the wiring conductor 2 is formed on the upper and lower surfaces of the precursor sheets 11a to 11c and in the through holes B and B'by the conventional screen printing method and the well-known method. The filling method is applied to form a predetermined pattern by printing, and at a temperature of about 25 to 100 ° C., 1 to 6
Heat for 0 minutes to semi-cure.

【0026】尚、前記配線導体2となる金属ペースト1
2は、例えば配線導体2に含有される金属粉末が銅から
成り、これを結合する熱硬化性樹脂がエポキシ樹脂から
成る場合、粒径が0.1〜20μm程度の銅等粉末にビ
スフェノールA型エポキシ樹脂、ノボラック型エポキシ
樹脂、グリシジルエステル型エポキシ樹脂等のエポキシ
樹脂及びアミン系硬化剤、イミダゾール系硬化剤、酸無
水物系硬化剤等の硬化剤等を添加混合することによって
製作される。
The metal paste 1 to be the wiring conductor 2
2 is, for example, when the metal powder contained in the wiring conductor 2 is made of copper and the thermosetting resin that binds it is made of an epoxy resin, bisphenol A type powder is added to copper powder having a particle size of about 0.1 to 20 μm. It is manufactured by adding and mixing an epoxy resin such as an epoxy resin, a novolac type epoxy resin, and a glycidyl ester type epoxy resin, and an amine curing agent, an imidazole curing agent, an acid anhydride curing agent, and the like.

【0027】最後に前記金属ペースト12が所定パター
ンに印刷塗布された前駆体シート11a〜11cを上下
に積層するとともにこれを約80〜300℃の温度で約
10秒〜24時間加熱し前記前駆体シート11a〜11
c及び金属ペースト12を完全に熱硬化させることによ
って図1に示す配線基板が製作される。この前駆体シー
ト11a〜11c及び金属ペースト12を熱硬化させて
絶縁基体1を製作する際、前記絶縁基体1となる前駆体
シート11a〜11c及び配線導体2となる金属ペース
ト12は、熱硬化時に収縮することは殆どなく、従っ
て、絶縁基体1に変形や寸法のばらつきを発生させるこ
とも殆どない。
Finally, the precursor sheets 11a to 11c, on which the metal paste 12 is printed and applied in a predetermined pattern, are vertically laminated and heated at a temperature of about 80 to 300 ° C. for about 10 seconds to 24 hours. Sheets 11a-11
The wiring board shown in FIG. 1 is manufactured by completely thermosetting c and the metal paste 12. When the insulating base 1 is manufactured by thermosetting the precursor sheets 11a to 11c and the metal paste 12, the precursor paste sheets 11a to 11c to be the insulating base 1 and the metal paste 12 to be the wiring conductor 2 are thermoset. There is almost no contraction, and therefore, there is almost no occurrence of deformation or dimensional variation in the insulating substrate 1.

【0028】かくして、本発明の製造方法によれば絶縁
基体1に変形や寸法のばらつきのない配線基板を提供す
ることができる。
Thus, according to the manufacturing method of the present invention, it is possible to provide the wiring substrate in which the insulating substrate 1 does not have deformation or variation in dimensions.

【0029】尚、本発明は、上述の実施例に限定される
ものではなく、例えば上述の実施例では、本発明の配線
基板を半導体素子を収容する半導体素子収納用パッケー
ジに適用した場合について説明したが、本発明の配線基
板は、例えば混成集積回路等に用いられる配線基板とし
ても適用できることはいうまでもない。
The present invention is not limited to the above-described embodiments. For example, in the above-mentioned embodiments, the case where the wiring board of the present invention is applied to a semiconductor element housing package for housing semiconductor elements will be described. However, it goes without saying that the wiring board of the present invention can be applied as a wiring board used in, for example, a hybrid integrated circuit.

【0030】また、上述の実施例では、3枚の前駆体シ
ートを積層することによって配線基板を製作したが、配
線基板は1枚や2枚あるいは4枚以上の前駆体シートを
積層することによって製作されても良い。
Further, in the above-mentioned embodiment, the wiring board is manufactured by laminating the three precursor sheets, but the wiring board is formed by laminating one, two or four or more precursor sheets. May be made.

【0031】更に上述の実施例では、配線基板は各絶縁
基板が同じ無機絶縁物粉末を含む絶縁基板で形成されて
いたが、配線基板を構成する各絶縁基板はそれぞれ異な
る無機物粉末を含むものであっても良い。
Further, in the above-mentioned embodiment, the wiring substrate is formed of the insulating substrates containing the same inorganic insulating powder, but the insulating substrates constituting the wiring substrate contain different inorganic powders. It may be.

【0032】[0032]

【発明の効果】本発明の配線基板によれば、絶縁基板と
なる無機絶縁物粉末及び配線導体となる金属粉末を靭性
に優れる熱硬化性樹脂により結合して成ることから配線
基板同士あるいは配線基板と半導体装置製作ラインの一
部とが激しく衝突しても絶縁基体に欠けや割れ、クラッ
クが発生することはいっさいなく、従って半導体素子を
長期間にわたり正常、且つ安定に作動させることができ
る。
EFFECTS OF THE INVENTION According to the wiring board of the present invention, since the inorganic insulating material powder to be the insulating board and the metal powder to be the wiring conductor are combined by the thermosetting resin having excellent toughness, the wiring boards are interconnected or the wiring boards are Even if a part of the semiconductor device manufacturing line violently collides with each other, the insulating substrate is never chipped, cracked, or cracked, so that the semiconductor element can be operated normally and stably for a long period of time.

【0033】また本発明によれば、熱硬化性樹脂前駆体
と無機絶縁物粉末とを混合して成る前駆体シートを準備
する工程と、前記前駆体シートに熱硬化性樹脂前駆体と
金属粉末とを混合して成る金属ペーストを所定パターン
に印刷する工程と、前記前駆体シート及び金属ペースト
を熱硬化させる工程とにより配線基板を製作することか
ら、焼成に伴う不均一な収縮による変形や寸法のばらつ
きが発生することはなく、従って、半導体素子を配線導
体に正確、且つ確実に電気的接続させることが可能とな
る。
Further, according to the present invention, a step of preparing a precursor sheet formed by mixing a thermosetting resin precursor and an inorganic insulating powder, and the thermosetting resin precursor and the metal powder are added to the precursor sheet. Since a wiring board is manufactured by a step of printing a metal paste formed by mixing the above with a predetermined pattern and a step of thermally curing the precursor sheet and the metal paste, deformation and dimensions due to uneven shrinkage accompanying firing. Therefore, the semiconductor element can be accurately and surely electrically connected to the wiring conductor.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の配線基板を半導体素子収納用パッケー
ジに適用した場合の一実施例を示す断面図である。
FIG. 1 is a cross-sectional view showing an embodiment in which a wiring board of the present invention is applied to a semiconductor element housing package.

【図2】(a)〜(c)は本発明の配線基板の製造方法
を説明するための工程毎の断面図である。
2A to 2C are cross-sectional views for each step for explaining the method for manufacturing a wiring board according to the present invention.

【符号の説明】[Explanation of symbols]

1・・・・・・・絶縁基体 1a〜1c・・・絶縁基板 2・・・・・・・配線導体 11・・・・・・・前駆体シート 12・・・・・・・金属ペースト 1 ... Insulating substrate 1a to 1c ... Insulating substrate 2 ... Wiring conductor 11 ... Precursor sheet 12 ... Metal paste

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】60乃至95重量%の無機絶縁物粉末と5
乃至40重量%の熱硬化性樹脂とから成り、前記無機絶
縁物粉末を前記熱硬化性樹脂により結合した少なくとも
一枚の絶縁基板に、金属粉末を熱硬化性樹脂により結合
した配線導体を被着させて成る配線基板。
1. An inorganic insulating powder of 60 to 95% by weight and 5
To 40% by weight of a thermosetting resin, and at least one insulating substrate having the inorganic insulating powder bonded with the thermosetting resin is coated with a wiring conductor having metal powder bonded with the thermosetting resin. A wiring board made up of:
【請求項2】熱硬化性樹脂前駆体と無機絶縁物粉末とを
混合して成る前駆体シートを準備する工程と、前記前駆
体シートに熱硬化性樹脂前駆体と金属粉末とを混合して
成る金属ペーストを所定パターンに印刷する工程と、前
記前駆体シート及び金属ペーストを熱硬化させる工程
と、から成ることを特徴とする配線基板の製造方法。
2. A step of preparing a precursor sheet formed by mixing a thermosetting resin precursor and an inorganic insulating powder, and mixing the thermosetting resin precursor and a metal powder in the precursor sheet. A method of manufacturing a wiring board, comprising: a step of printing the formed metal paste in a predetermined pattern; and a step of thermally curing the precursor sheet and the metal paste.
JP26340794A 1994-10-27 1994-10-27 Wiring board and manufacturing method thereof Expired - Fee Related JP3152852B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26340794A JP3152852B2 (en) 1994-10-27 1994-10-27 Wiring board and manufacturing method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26340794A JP3152852B2 (en) 1994-10-27 1994-10-27 Wiring board and manufacturing method thereof

Publications (2)

Publication Number Publication Date
JPH08125291A true JPH08125291A (en) 1996-05-17
JP3152852B2 JP3152852B2 (en) 2001-04-03

Family

ID=17389076

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26340794A Expired - Fee Related JP3152852B2 (en) 1994-10-27 1994-10-27 Wiring board and manufacturing method thereof

Country Status (1)

Country Link
JP (1) JP3152852B2 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10163364A (en) * 1996-11-28 1998-06-19 Kyocera Corp Wiring board
JPH10163583A (en) * 1996-11-27 1998-06-19 Kyocera Corp Wiring board
US6863962B2 (en) 1996-10-09 2005-03-08 Matsushita Electric Industrial Co., Ltd. Sheet for a thermal conductive substrate, a method for manufacturing the same, a thermal conductive substrate using the sheet and a method for manufacturing the same
US6871396B2 (en) 2000-02-09 2005-03-29 Matsushita Electric Industrial Co., Ltd. Transfer material for wiring substrate

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101628368B1 (en) * 2009-08-19 2016-06-09 엘지이노텍 주식회사 Lighting device

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6863962B2 (en) 1996-10-09 2005-03-08 Matsushita Electric Industrial Co., Ltd. Sheet for a thermal conductive substrate, a method for manufacturing the same, a thermal conductive substrate using the sheet and a method for manufacturing the same
JPH10163583A (en) * 1996-11-27 1998-06-19 Kyocera Corp Wiring board
JPH10163364A (en) * 1996-11-28 1998-06-19 Kyocera Corp Wiring board
US6871396B2 (en) 2000-02-09 2005-03-29 Matsushita Electric Industrial Co., Ltd. Transfer material for wiring substrate
US6936774B2 (en) 2000-02-09 2005-08-30 Matsushita Electric Industrial Co., Ltd. Wiring substrate produced by transfer material method
EP1933376A2 (en) 2000-02-09 2008-06-18 Matsushita Electric Industrial Co., Ltd. Transfer material, method for producing the same and wiring substrate produced by using the same
US7888789B2 (en) 2000-02-09 2011-02-15 Panasonic Corporation Transfer material used for producing a wiring substrate

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