JP3393768B2 - Wiring board and method of manufacturing the same - Google Patents

Wiring board and method of manufacturing the same

Info

Publication number
JP3393768B2
JP3393768B2 JP30490596A JP30490596A JP3393768B2 JP 3393768 B2 JP3393768 B2 JP 3393768B2 JP 30490596 A JP30490596 A JP 30490596A JP 30490596 A JP30490596 A JP 30490596A JP 3393768 B2 JP3393768 B2 JP 3393768B2
Authority
JP
Japan
Prior art keywords
thermosetting resin
resin
precursor
insulating substrate
wiring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP30490596A
Other languages
Japanese (ja)
Other versions
JPH10150123A (en
Inventor
藤人 中川路
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP30490596A priority Critical patent/JP3393768B2/en
Publication of JPH10150123A publication Critical patent/JPH10150123A/en
Application granted granted Critical
Publication of JP3393768B2 publication Critical patent/JP3393768B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1515Shape
    • H01L2924/15153Shape the die mounting substrate comprising a recess for hosting the device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16195Flat cap [not enclosing an internal cavity]

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、配線基板に関し、
より詳細には半導体素子を収容するための半導体素子収
納用パッケージや混成集積回路装置等に用いられる配線
基板に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring board,
More specifically, the present invention relates to a semiconductor element housing package for housing a semiconductor element, a wiring board used in a hybrid integrated circuit device, and the like.

【0002】[0002]

【従来の技術】従来、配線基板、例えば半導体素子を収
容する半導体素子収納用パッケージに使用される配線基
板は、酸化アルミニウム質焼結体等のセラミックスより
成り、その上面中央部に半導体素子を収容する凹部を有
する絶縁基体と、前記絶縁基体の凹部周辺から下面にか
けて導出されたタングステン、モリブデン等の高融点金
属粉末から成る配線導体とから構成されており、前記絶
縁基体の凹部底面に半導体素子をガラス、樹脂、ロウ材
等の接着剤を介して接着固定するとともに該半導体素子
の各電極を、例えばボンディングワイヤ等の電気的接続
手段を介して配線導体に電気的に接続し、しかる後、前
記絶縁基体の上面に、金属やセラミックス等から成る蓋
体を絶縁基体の凹部を塞ぐようにしてガラス、樹脂、ロ
ウ材等の封止部材を介して接合させ、絶縁基体の凹部内
に半導体素子を気密に収容することによって製品として
の半導体装置となる。
2. Description of the Related Art Conventionally, a wiring board, for example, a wiring board used for a semiconductor element housing package for housing a semiconductor element, is made of ceramics such as an aluminum oxide sintered body, and the semiconductor element is housed in the center of its upper surface. And a wiring conductor made of a refractory metal powder such as tungsten or molybdenum, which is led out from the periphery of the recess of the insulating base to the lower surface, and a semiconductor element is formed on the bottom of the recess of the insulating base. The electrodes are bonded and fixed via an adhesive such as glass, resin, or a brazing material, and each electrode of the semiconductor element is electrically connected to a wiring conductor through an electrical connecting means such as a bonding wire. A sealing member made of glass, resin, brazing material, etc. is formed on the upper surface of the insulating base by covering the concave portion of the insulating base with a lid made of metal or ceramics. Through by joining a semiconductor device as a product by housing airtightly semiconductor element in the recess of the insulating substrate.

【0003】なお、この従来の配線基板は一般に、セラ
ミックグリーンシート積層法によって製作されており、
具体的には酸化アルミニウム、酸化珪素、酸化マグネシ
ウム、酸化カルシウム等のセラミック原料粉末に適当な
有機バインダー、溶剤等を添加混合して泥漿状となすと
ともにこれを従来周知のドクターブレード法を採用し、
シート状にすることによって複数枚のセラミックグリー
ンシートを得、しかる後、前記セラミックグリーンシー
トに適当な打ち抜き加工を施すとともに配線導体となる
金属ペーストを所定パターンに印刷塗布し、最後に前記
セラミックグリーンシートを所定の順に上下に積層して
生セラミック成形体となすとともに該生セラミック成形
体を還元雰囲気中、約1600℃の高温で焼成すること
によって製作される。
This conventional wiring board is generally manufactured by a ceramic green sheet laminating method,
Specifically, aluminum oxide, silicon oxide, magnesium oxide, calcium oxide, and other ceramic raw material powders are mixed with an appropriate organic binder, solvent, etc. to form a slurry, and this is adopted by the conventionally known doctor blade method.
A plurality of ceramic green sheets are obtained by forming a sheet, and thereafter, the ceramic green sheets are appropriately punched and a metal paste to be a wiring conductor is printed and applied in a predetermined pattern, and finally the ceramic green sheets are formed. Are laminated in a predetermined order to form a green ceramic compact, and the green ceramic compact is fired in a reducing atmosphere at a high temperature of about 1600 ° C.

【0004】しかしながら、この従来の配線基板は、絶
縁基体を構成する酸化アルミニウム質焼結体等のセラミ
ックスが硬くて脆い性質を有するため、搬送工程や半導
体装置製作の自動ライン等において配線基板同士が、あ
るいは配線基板と半導体装置製作自動ラインの一部とが
激しく衝突すると絶縁基体に欠けや割れ、クラック等が
発生し、その結果、半導体素子を気密に収容することが
できず、半導体素子を長期間にわたり正常、かつ安定に
作動させることができなくなるという欠点を有してい
た。
However, in this conventional wiring board, since the ceramics such as the aluminum oxide sintered body forming the insulating substrate has a hard and brittle property, the wiring boards may not be connected to each other in a carrying process or an automatic line for manufacturing a semiconductor device. Or, if the wiring board and a part of the automatic production line for semiconductor devices collide violently, the insulating substrate may be chipped, cracked, or cracked. As a result, the semiconductor element cannot be hermetically housed and the semiconductor element is long. It has a drawback that it cannot operate normally and stably over a period of time.

【0005】また、前記配線基板の製造方法によれば、
生セラミック成形体を焼成する際、生セラミック成形体
に不均一な焼成収縮が生じ、得られる配線基板に反り等
の変形や寸法のばらつきが発生して半導体素子の各電極
を所定の配線導体に、あるいは配線導体を所定の外部電
気回路に正確、かつ確実に電気的接続することができな
いという欠点を有していた。
According to the method of manufacturing the wiring board,
When firing the green ceramic compact, uneven firing shrinkage occurs in the raw ceramic compact, resulting in deformation such as warpage and dimensional variation in the obtained wiring board, and each electrode of the semiconductor element is used as a predetermined wiring conductor. Alternatively, there is a drawback that the wiring conductor cannot be electrically connected to a predetermined external electric circuit accurately and surely.

【0006】そこで、配線基板の絶縁基体を従来のセラ
ミックスに代えて無機絶縁物粉末を熱硬化性樹脂で結合
したものに、配線導体を従来の高融点金属粉末に代えて
金属粉末を熱硬化性樹脂で結合したものにした配線基板
が提案されている。この無機絶縁物粉末を熱硬化性樹脂
で結合して成る絶縁基体と金属粉末を熱硬化性樹脂で結
合して成る配線導体とから成る配線基板は、熱硬化性樹
脂と無機絶縁物粉末とを混合して成る半硬化状態の前駆
体シートを準備するとともに該前駆体シートに適当な打
ち抜き加工を施し、次にこれに熱硬化性樹脂と金属粉末
とを混合して成る金属ペーストを所定パターンに印刷塗
布し、最後に前記金属ペーストが印刷塗布された前駆体
シートを必要に応じて積層するとともにこれを約100
〜300℃の温度で熱硬化させることによって製作され
る。
Therefore, the insulating substrate of the wiring board is replaced with the conventional ceramics and the inorganic insulating powder is bonded with the thermosetting resin, and the wiring conductor is replaced with the conventional refractory metal powder, and the metal powder is thermoset. A wiring board made of resin is proposed. A wiring board composed of an insulating substrate formed by bonding the inorganic insulating powder with a thermosetting resin and a wiring conductor formed by bonding a metal powder with the thermosetting resin is composed of the thermosetting resin and the inorganic insulating powder. A semi-cured precursor sheet prepared by mixing is prepared, and the precursor sheet is subjected to an appropriate punching process, and then a metal paste formed by mixing a thermosetting resin and metal powder is formed into a predetermined pattern. If necessary, a precursor sheet on which the above-mentioned metal paste is printed and applied is laminated by printing and applied, and this is applied to about 100
It is manufactured by heat curing at a temperature of ~ 300 ° C.

【0007】[0007]

【発明が解決しようとする課題】しかしながら、この無
機絶縁物粉末を熱硬化性樹脂で結合して成る絶縁基体と
金属粉末を熱硬化性樹脂で結合して成る配線導体とから
成る配線基板は、絶縁基体に対する配線導体の接合強度
が若干弱く、配線導体に半導体素子の電極を接続する際
等において配線導体に大きな外力が印加されると該外力
によって配線導体が絶縁基体より剥離し、半導体素子等
の電極と配線導体との電気的接続の信頼性が若干劣ると
いう解決すべき課題を有していた。
However, a wiring board comprising an insulating substrate formed by bonding the inorganic insulating powder with a thermosetting resin and a wiring conductor formed by bonding a metal powder with the thermosetting resin is The bonding strength of the wiring conductor to the insulating base is slightly weak, and when a large external force is applied to the wiring conductor when connecting the electrodes of the semiconductor element to the wiring conductor, the wiring conductor is separated from the insulating base by the external force, and the semiconductor element, etc. There was a problem to be solved that the reliability of the electrical connection between the electrode and the wiring conductor was slightly inferior.

【0008】本発明は上記欠点に鑑み案出されたもの
で、その目的は絶縁基体と配線導体との接合を強固と
し、配線導体に半導体素子の電極等を強固に電気的接続
することができる配線基板を提供することにある。
The present invention has been devised in view of the above-mentioned drawbacks, and an object thereof is to strengthen the connection between the insulating substrate and the wiring conductor and to firmly electrically connect the electrode of the semiconductor element and the like to the wiring conductor. To provide a wiring board.

【0009】[0009]

【課題を解決するための手段】本発明の配線基板は、6
0重量%乃至95重量%の無機絶縁物粉末と5重量%乃
至40重量%の熱硬化性樹脂とからり、前記無機絶縁
物粉末を前記熱硬化性樹脂により結合して成る前駆体シ
ートを半硬化させて、前記無機絶縁物粉末を前記熱硬化
性樹脂により結合した複数の絶縁基板を積層して成る絶
縁基体の前記絶縁基板に、半硬化の前記前駆体シートと
ともに熱硬化させた、金属粉末を熱硬化性樹脂により結
合した配線導体を被着させて成る配線基板であって、前
記絶縁基と配線導体との間および該配線導体を被着さ
せる前記絶縁基板とこれに積層される前記絶縁基板との
に熱硬化性樹脂にシランカップリング剤を2乃至10
重量部含有させて成る中間層を介在させたことを特徴と
するものである。
A wiring board according to the present invention comprises 6
0 Ri and a wt% to 95 wt% of the inorganic insulator powder and 5 wt% to 40 wt% of a thermosetting resin formed, precursor sheet comprising the inorganic insulator powder bonded by the thermosetting resin
Semi-cured, the inorganic insulating powder is heat-cured.
A semi-cured precursor sheet on the insulating substrate of an insulating substrate formed by laminating a plurality of insulating substrates bonded together by a conductive resin.
Both thermally cured, the metal powder to a wiring substrate formed by depositing the wiring conductor joined by a thermosetting resin, is wearing the between and wiring conductors and said insulating base plate and the wiring conductor
Of the insulating substrate and the insulating substrate laminated on the insulating substrate
In between , a silane coupling agent is added to the thermosetting resin in an amount of 2 to 10
It is characterized in that an intermediate layer formed by including parts by weight is interposed.

【0010】また本発明の配線基板の製造方法は、熱硬
化性樹脂前駆体と無機絶縁物粉末とを混合して、硬
化後に絶縁基体と成る前駆体シートを準備する工程と、
該前駆体シートを半硬化させる工程と、該半硬化した
駆体シートの一面に熱硬化性樹脂前駆体にシランカップ
リング剤を添加した樹脂ペーストを塗布する工程と、前
記塗布された樹脂ペースト上に熱硬化性樹脂前駆体と金
属粉末とを混合して、硬化後に配線導体と成る金属
ペーストを所定パターンに塗布する工程と、前記前駆体
シート、樹脂ペースト及び金属ペーストを加熱処理し、
熱硬化させる工程と、から成ることを特徴とするもので
ある
[0010] method of manufacturing a wiring board of the present invention, Ru formed by mixing a thermosetting resin precursor and the inorganic insulating powder, hard
Of preparing a precursor sheet to be an insulating substrate after conversion ,
Semi-curing the precursor sheet; applying a resin paste obtained by adding a silane coupling agent to a thermosetting resin precursor to one surface of the semi-cured precursor sheet; a step of applying Ru on the resin paste by mixing a metal powder thermosetting resin precursor formed that is, a metal paste comprising a wiring conductor after curing a predetermined pattern, wherein the precursor sheet, resin paste and the metal paste Heat treatment,
It is characterized by comprising a heat curing step.

【0011】本発明の配線基板によれば、絶縁基体が無
機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合するこ
とによって形成されていることから配線基板同士あるい
は配線基板と半導体装置製作ラインの一部とが激しく衝
突したとしても絶縁基体に欠けや割れ、クラック等を発
生することはない。
According to the wiring board of the present invention, since the insulating substrate is formed by bonding the inorganic insulating powder with the thermosetting resin having excellent toughness, the wiring boards are connected to each other or between the wiring boards and the semiconductor device manufacturing line. Even if a part of the insulating base material violently collides with the insulating base material, the insulating base material will not be chipped, cracked, or cracked.

【0012】また本発明の配線基板によれば、絶縁基
と配線導体との間および配線導体を被着させる絶縁基板
とこれに積層される絶縁基板との間に両者に対し密着性
が良い熱硬化性樹脂にγグリシドキシプロピルトリメト
キシシラン等のシランカップリング剤を2乃至10重量
部含有させて成る中間層を介在させたことから絶縁基
に対する配線導体の接合強度が前記中間層によって極め
て強いものとなり、その結果、配線導体に半導体素子の
電極を接続する際等において配線導体に大きな外力が印
加されても配線導体が絶縁基より剥離することはな
く、半導体素子等の電極を配線導体に確実、強固に電気
的接続することが可能となる。
[0012] According to the wiring board of the present invention, an insulating substrate on which is deposited between and wiring conductors of the wiring conductor and the insulating board <br/>
An intermediate layer comprising a thermosetting resin having good adhesiveness between the insulating layer and the insulating substrate laminated thereon and a silane coupling agent such as γ-glycidoxypropyltrimethoxysilane in an amount of 2 to 10 parts by weight. bonding strength of the wiring conductor for insulating board <br/> since that is interposed becomes extremely strong by said intermediate layer, as a result, a large external force to the wiring conductor in such when connecting electrodes of the semiconductor element to the wiring conductor There never even wiring conductor is applied is peeled from the insulating base plate, ensuring an electrode of a semiconductor element or the like on the wiring conductors, it is possible to firmly electrically connected.

【0013】更に本発明の配線基板の製造方法によれ
、熱硬化性樹脂前駆体と無機絶縁物粉末とを混合して
、硬化後に絶縁基体と成る前駆体シートを準備する
工程と、該前駆体シートを半硬化させる工程と、該半硬
化した前駆体シートの一面に熱硬化性樹脂前駆体にシラ
ンカップリング剤を添加した樹脂ペーストを塗布する工
程と、前記塗布された樹脂ペースト上に熱硬化性樹脂前
駆体と金属粉末とを混合して、硬化後に配線導体と
成る金属ペーストを所定パターンに塗布する工程と、前
記前駆体シート、樹脂ペースト及び金属ペーストを加熱
処理し、熱硬化させる工程とで製作され、前駆体シー
ト、樹脂ペースト、金属ペーストの熱硬化性樹脂前駆体
は熱硬化時に殆ど収縮しないことから不均一な収縮によ
る変形や寸法のばらつきが発生することもない。
Further , according to the method for manufacturing a wiring board of the present invention,
For example , mix the thermosetting resin precursor with the inorganic insulating powder.
Ru formed, a step of preparing a precursor sheet comprising an insulating substrate after the curing, a step of semi-curing the precursor sheet, semi hard
A step of applying a resin paste obtained by adding a silane coupling agent to a thermosetting resin precursor on one surface of the precursor sheet that has been made into a mixture, and mixing the thermosetting resin precursor and metal powder on the applied resin paste forming Ru and a wiring conductor after curing
The precursor sheet, the resin paste, and the thermosetting resin of the metal paste are manufactured by a step of applying the metal paste in a predetermined pattern and a step of heat-treating the precursor sheet, the resin paste and the metal paste, and thermosetting the precursor sheet, the resin paste and the metal paste. Since the precursor hardly shrinks during thermosetting, deformation or dimensional variation due to uneven shrinkage does not occur.

【0014】[0014]

【発明の実施の形態】次に、本発明を添付図面に基づき
詳細に説明する。図1及び図2は、本発明の配線基板を
半導体素子を収容する半導体素子収納用パッケージに適
用した場合の一実施を示し、1は絶縁基体、2は配線
導体である。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, the present invention will be described in detail with reference to the accompanying drawings. 1 and 2 show an embodiment of the application of the wiring board to the semiconductor device housing package for housing a semiconductor device of the present invention, 1 denotes an insulating substrate, 2 denotes a wiring conductor.

【0015】前記絶縁基体1は3枚の絶縁基板1a、1
b、1cを積層することによって形成されており、その
上面の中央部に半導体素子を収容するための凹部1dを
有し、該凹部1d底面には半導体素子3が樹脂等の接着
材を介して接着固定される。
The insulating substrate 1 is composed of three insulating substrates 1a and 1a.
It is formed by laminating b and 1c, and has a concave portion 1d for accommodating a semiconductor element in the center of the upper surface thereof, and the semiconductor element 3 is provided on the bottom surface of the concave portion 1d via an adhesive such as resin. Adhesively fixed.

【0016】前記絶縁基体1を構成する3枚の絶縁基板
1a、1b、1cは、例えば酸化珪素、酸化アルミニウ
ム、窒化アルミニウム、炭化珪素、チタン酸バリウム、
ゼオライト等の無機絶縁物粉末をエポキシ樹脂、ポリイ
ミド樹脂等の熱硬化性樹脂で結合することによって形成
されており、絶縁基体1を構成する3枚の絶縁基板1
a、1b、1cはその各々が無機絶縁物粉末を靱性に優
れる熱硬化性樹脂で接合することによって形成されてい
ることから絶縁基体1に外力が印加されても、該外力に
よって絶縁基体1に欠けや割れ、クラック等が発生する
ことはない。
The three insulating substrates 1a, 1b and 1c constituting the insulating base 1 are, for example, silicon oxide, aluminum oxide, aluminum nitride, silicon carbide, barium titanate,
It is formed by bonding inorganic insulating powder such as zeolite with a thermosetting resin such as epoxy resin or polyimide resin, and three insulating substrates 1 constituting the insulating substrate 1 are formed.
Since each of a, 1b, and 1c is formed by joining inorganic insulating powders with a thermosetting resin having excellent toughness, even if an external force is applied to the insulating base 1, the insulating base 1 is applied to the insulating base 1 by the external force. No chipping, cracking, or cracking occurs.

【0017】なお、前記無機絶縁物粉末を熱硬化性樹脂
で結合して成る絶縁基体1を構成する3枚の絶縁基板1
a、1b、1cは無機絶縁物粉末の含有量が60重量%
未満であると絶縁基体1の熱膨張係数が半導体素子3の
熱膨張係数に対して大きく相違し、半導体素子3が作動
時に熱を発し、該熱が半導体素子3と絶縁基体1の両者
に印加されると両者間に熱膨張係数の相違に起因する大
きな熱応力が発生し、この大きな熱応力によって半導体
素子3が絶縁基体1より剥離したり、半導体素子3に割
れや欠け等が発生してしまう。また95重量%を越える
と無機絶縁物粉末を熱硬化性樹脂で完全に結合させるこ
とができず、所定の絶縁基板1a、1b、1cを得るこ
とができなくなる。従って、前記絶縁基体1を構成する
絶縁基板1a、1b、1cはその各々の内部に含有され
る無機絶縁物粉末の量が60重量%乃至95重量%の範
囲に特定される。
In addition, three insulating substrates 1 constituting an insulating substrate 1 formed by bonding the inorganic insulating powders with a thermosetting resin.
a, 1b, and 1c have an inorganic insulating powder content of 60% by weight.
When it is less than the above, the coefficient of thermal expansion of the insulating substrate 1 greatly differs from the coefficient of thermal expansion of the semiconductor element 3, the semiconductor element 3 emits heat during operation, and the heat is applied to both the semiconductor element 3 and the insulating substrate 1. Then, a large thermal stress is generated between them due to the difference in thermal expansion coefficient, and the large thermal stress causes the semiconductor element 3 to be separated from the insulating substrate 1, or the semiconductor element 3 to be cracked or chipped. I will end up. On the other hand, if it exceeds 95% by weight, the inorganic insulating powder cannot be completely bonded with the thermosetting resin, and the predetermined insulating substrates 1a, 1b, 1c cannot be obtained. Therefore, the insulating substrates 1a, 1b, 1c constituting the insulating base 1 are specified such that the amount of the inorganic insulating powder contained therein is in the range of 60% by weight to 95% by weight.

【0018】また前記絶縁基体1はその凹部1dの周辺
から下面にかけて例えば、銅、銀、金等の金属粉末をエ
ポキシ樹脂等の熱硬化性樹脂より結合した配線導体2が
形成されている。
A wiring conductor 2 is formed from the periphery of the concave portion 1d to the lower surface of the insulating base 1 by binding a metal powder such as copper, silver or gold with a thermosetting resin such as an epoxy resin.

【0019】前記配線導体2は、内部に収容する半導体
素子3を外部電気回路に電気的に接続する作用をなし、
凹部1dの周辺部位には半導体素子3の各電極がボンデ
ィングワイヤ4を介して電気的に接続され、また絶縁基
体1の下面に導出する部位は外部電気回路基板に電気的
に接続される。
The wiring conductor 2 serves to electrically connect the semiconductor element 3 housed therein to an external electric circuit,
The electrodes of the semiconductor element 3 are electrically connected to the peripheral portion of the recess 1d through the bonding wires 4, and the portion leading to the lower surface of the insulating substrate 1 is electrically connected to the external electric circuit board.

【0020】前記配線導体2はそれに含有される金属粉
末の量が70重量%未満では配線導体2の導電性が悪く
なる傾向にあり、また95重量%を越えると金属粉末を
熱硬化性樹脂で強固に結合することが困難となる傾向に
ある。従って、前記金属粉末を熱硬化性樹脂で結合して
成る配線導体2は金属粉末の含有量を70重量%乃至9
5重量%の範囲としておくことが好ましい。
When the amount of the metal powder contained in the wiring conductor 2 is less than 70% by weight, the conductivity of the wiring conductor 2 tends to deteriorate, and when it exceeds 95% by weight, the metal powder is made of a thermosetting resin. A strong bond tends to be difficult. Therefore, the wiring conductor 2 formed by binding the metal powder with a thermosetting resin has a metal powder content of 70 to 9 wt%.
It is preferable to set it in the range of 5% by weight.

【0021】また前記配線導体2は、その露出する表面
にニッケル、金等の耐蝕性に優れ、かつ良導電性の金属
をめっき法により1μm乃至20μmの厚みに被着させ
ておくと、配線導体2の酸化腐食を有効に防止すること
ができるとともに配線導体2とボンディングワイヤ4と
を強固に電気的接続させることができる。従って、前記
配線導体2はその露出する表面にニッケルや金等の耐蝕
性に優れ、かつ良導電性である金属をめっき法により1
μm乃至20μm厚みに被着させておくことが好まし
い。
Further, the wiring conductor 2 is formed by depositing a metal having excellent corrosion resistance such as nickel or gold on the exposed surface by a plating method to a thickness of 1 μm to 20 μm. The oxidative corrosion of 2 can be effectively prevented, and the wiring conductor 2 and the bonding wire 4 can be firmly electrically connected. Therefore, the wiring conductor 2 is formed on the exposed surface by plating with a metal such as nickel or gold having excellent corrosion resistance and good conductivity.
It is preferable that the film is deposited to a thickness of μm to 20 μm.

【0022】前記配線導体2はまた絶縁基体1の下面に
導出する部位に、外部電気回路と電気的に接続されるバ
ンプ電極2aが形成されており、該バンプ電極2aを外
部電気回路基板の配線導体に半田等の導電性接着剤を介
して接合することにより内部に収容する半導体素子3は
外部電気回路に電気的に接続されることとなる。
The wiring conductor 2 has a bump electrode 2a electrically connected to an external electric circuit formed on the lower surface of the insulating substrate 1. The bump electrode 2a is connected to the wiring of the external electric circuit board. By joining the conductor to the conductor via a conductive adhesive such as solder, the semiconductor element 3 housed inside is electrically connected to an external electric circuit.

【0023】更に前記配線導体2と絶縁基体1を構成す
る絶縁基板1bの上面との間に図2に示すように、中間
層5が介在されており、該中間層5によって配線導体2
と絶縁基板1bとの密着性が大きく向上し、配線導体2
に半導体素子3の電極をボンディングワイヤ4を介して
接続させる際等において、配線導体2に大きな外力が印
加されたとしても該外力によって配線導体2が絶縁基体
1(絶縁基板1bの上面)より剥離することはなく、こ
れによって半導体素子3の各電極を配線導体2に確実、
強固に電気的接続することが可能となる。
Further, as shown in FIG. 2, an intermediate layer 5 is interposed between the wiring conductor 2 and the upper surface of the insulating substrate 1b constituting the insulating substrate 1, and the intermediate layer 5 allows the wiring conductor 2 to be formed.
The adhesion between the insulating substrate 1b and
Even when a large external force is applied to the wiring conductor 2 when the electrodes of the semiconductor element 3 are connected to the wiring conductor 2 via the bonding wire 4, the wiring conductor 2 is separated from the insulating base 1 (the upper surface of the insulating substrate 1b) by the external force. By so doing, each electrode of the semiconductor element 3 can be securely connected to the wiring conductor 2,
A strong electrical connection can be achieved.

【0024】前記中間層5はエポキシ樹脂、ポリイミド
樹脂等の熱硬化性樹脂にシランカップリング剤を2乃至
10重量部含有させて成り、該シランカップリング剤は
その官能基が絶縁基板1bの表面に露出する無機絶縁物
粉末及び配線導体2の金属粉末と水素結合し、同時に親
油基が中間層5の熱硬化性樹脂と結合することによって
配線導体2を絶縁基板1bの上面に極めて強固に接合さ
せる。
The intermediate layer 5 comprises a thermosetting resin such as an epoxy resin or a polyimide resin containing 2 to 10 parts by weight of a silane coupling agent, and the functional group of the silane coupling agent is the surface of the insulating substrate 1b. Hydrogen bonding with the inorganic insulating powder and the metal powder of the wiring conductor 2 exposed at the same time, and at the same time, the lipophilic group is bonded with the thermosetting resin of the intermediate layer 5 to make the wiring conductor 2 extremely strong on the upper surface of the insulating substrate 1b. Join.

【0025】前記中間層5に含有されるシランカップリ
ング剤としてはγグリシドキシプロピルトリメトキシシ
ラン、γグリシドキシプロピルメチルジエトキシシラ
ン、γ−メタクリロキシプロピルトリメトキシシラン、
β−(3,4エポキシシクロヘキシル)エチルトリメト
キシシラン、N−β(アミノエチル)γ−アミノプロピ
ルトリメトキシシラン、γ−アミノプロピルトリエトキ
シシラン等があるが、特にγグリシドキシプロピルトリ
メトキシシランは中間層5の熱硬化性樹脂と相溶性が良
く、膜表面も滑らかとなることから好適である。
As the silane coupling agent contained in the intermediate layer 5, γ-glycidoxypropyltrimethoxysilane, γ-glycidoxypropylmethyldiethoxysilane, γ-methacryloxypropyltrimethoxysilane,
There are β- (3,4 epoxycyclohexyl) ethyltrimethoxysilane, N-β (aminoethyl) γ-aminopropyltrimethoxysilane, γ-aminopropyltriethoxysilane and the like, but especially γglycidoxypropyltrimethoxysilane. Is preferable because it has good compatibility with the thermosetting resin of the intermediate layer 5 and the film surface is smooth.

【0026】また前記中間層5に含有されるシランカッ
プリング剤はその含有量が2重量部未満であると配線導
体2を絶縁基板1b上に強固に接合することができなく
なり、また10重量部を越えると中間層5の膜強度が低
下してしまう。従って、前記中間層5に含有されるシラ
ンカップリング剤はその含有量が2乃至10重量部の範
囲に特定される。
When the content of the silane coupling agent contained in the intermediate layer 5 is less than 2 parts by weight, the wiring conductor 2 cannot be firmly bonded onto the insulating substrate 1b, and 10 parts by weight. If it exceeds, the film strength of the intermediate layer 5 will be reduced. Therefore, the content of the silane coupling agent contained in the intermediate layer 5 is specified in the range of 2 to 10 parts by weight.

【0027】更に前記中間層5はその厚みが3μm未満
となると配線導体2を絶縁基板1b上に強固に接合する
のが困難となり、また20μmを越えると熱硬化性樹脂
に無機絶縁物粉末を含有させて成る絶縁基板1bと、熱
硬化性樹脂にシランカップリング剤を含有させて成る中
間層5の熱膨張係数の相異に起因して両者に熱が印加さ
れた場合に両者間に剥離が発生してしまう危険性があ
る。従って、前記中間層5はその厚みを3μm乃至20
μmの範囲としておくことが好ましい。
Further, when the thickness of the intermediate layer 5 is less than 3 μm, it becomes difficult to firmly bond the wiring conductor 2 onto the insulating substrate 1b, and when it exceeds 20 μm, the thermosetting resin contains an inorganic insulating powder. When heat is applied to the insulating substrate 1b thus formed and the intermediate layer 5 made of a thermosetting resin containing a silane coupling agent, a peeling occurs between the two. There is a risk that it will occur. Therefore, the intermediate layer 5 has a thickness of 3 μm to 20 μm.
It is preferable to set it in the range of μm.

【0028】かくして上述の配線基板よれば、絶縁基
体1の凹部1d底面に半導体素子3を接着剤を介して接
着固定するとともに半導体素子3の各電極をボンディン
グワイヤ4を介して配線導体2に電気的に接続し、しか
る後、前記絶縁基体1の上面に蓋体6を封止材を介して
接合させ、絶縁基体と蓋体6とから成る容器内部に半
導体素子3を気密に収容することによって製品としての
半導体装置となる。
Thus , according to the above-mentioned wiring board , the semiconductor element 3 is adhered and fixed to the bottom surface of the recess 1d of the insulating substrate 1 with an adhesive, and each electrode of the semiconductor element 3 is connected to the wiring conductor 2 with the bonding wire 4. After electrically connecting, the lid body 6 is bonded to the upper surface of the insulating base body 1 through a sealing material, and the semiconductor element 3 is hermetically housed in the container including the insulating base body 1 and the lid body 6. As a result, it becomes a semiconductor device as a product.

【0029】次に前記半導体素子収納用パッケージに使
用される配線基板の製造方法について図3に基づき説明
する。まず図3(a)に示すように、3枚の前駆体シー
ト11a、11b、11cを準備する。
Next, a method of manufacturing the wiring board used for the semiconductor element housing package will be described with reference to FIG. First, as shown in FIG. 3A, three precursor sheets 11a, 11b and 11c are prepared.

【0030】前記3枚の前駆体シート11a、11b、
11cは酸化珪素、酸化アルミニウム、窒化アルミニウ
ム、炭化珪素、チタン酸バリウム、チタン酸ストロンチ
ウム、酸化チタン等の無機絶縁物粉末をエポキシ樹脂、
ポリイミド樹脂、ポリフェニレンエーテル樹脂等の熱硬
化性樹脂前駆体で結合することによって形成されてお
り、例えば粒径が0.1〜100μmの酸化珪素粉末
に、ビスフェノールA型エポキシ樹脂、ノボラック型エ
ポキシ樹脂、グリシジルエステル型エポキシ樹脂等のエ
ポキシ樹脂、及びアミン系硬化剤、イミダゾール系硬化
剤、酸無水物系硬化剤等の硬化剤を添加混合してペース
ト状となし、しかる後、このペーストをシート状になす
とともに約25〜100℃の温度で1〜60分間加熱
し、半硬化させことによって製作される。
The three precursor sheets 11a, 11b,
11c is an inorganic insulating powder such as silicon oxide, aluminum oxide, aluminum nitride, silicon carbide, barium titanate, strontium titanate, or titanium oxide, which is an epoxy resin,
It is formed by bonding with a thermosetting resin precursor such as a polyimide resin or a polyphenylene ether resin. For example, a silicon oxide powder having a particle size of 0.1 to 100 μm is added to a bisphenol A type epoxy resin, a novolac type epoxy resin, Epoxy resin such as glycidyl ester type epoxy resin, and amine type curing agent, imidazole type curing agent, curing agent such as acid anhydride type curing agent are added and mixed to form a paste, and then this paste is formed into a sheet. It is manufactured by heating at a temperature of about 25 to 100 ° C. for 1 to 60 minutes and half-curing.

【0031】次に図3(b)に示すように、前記前駆体
シート11bの上面に樹脂ペースト膜15を形成する。
Next, as shown in FIG. 3B, a resin paste film 15 is formed on the upper surface of the precursor sheet 11b.

【0032】前記樹脂ペースト膜15はエポキシ樹脂、
ポリイミド樹脂、ポリフェニレンエーテル樹脂等の熱硬
化性樹脂前駆体にγグリシドキシプロピルトリメトキシ
シラン等のシランカップリング剤を2乃至10重量部含
有させた樹脂ペーストをつくるとともにこれを前記前駆
体シート11bの上面に3μm〜20μmの厚みに被着
させることよって前駆体シート11bの上面に形成され
る。
The resin paste film 15 is an epoxy resin,
A thermosetting resin precursor such as a polyimide resin or a polyphenylene ether resin is mixed with a silane coupling agent such as γ-glycidoxypropyltrimethoxysilane in an amount of 2 to 10 parts by weight to prepare a resin paste, which is used as the precursor sheet 11b. To a thickness of 3 μm to 20 μm on the upper surface of the precursor sheet 11b to form it on the upper surface of the precursor sheet 11b.

【0033】前記樹脂ペースト膜15の前駆体シート1
1bの上面への形成は一旦、前駆体シート11bを形成
し、その後に前記前駆体シート11bの上面に熱硬化性
樹脂前駆体にシランカップリング剤を含有させた樹脂ペ
ーストを塗布するとともにこれを熱処理し、樹脂ペース
ト中の熱硬化性樹脂を半硬化させることによって、或い
は無機絶縁物粉末と熱硬化性樹脂前駆体とを混合したペ
ーストをシート状に成形し、このシートの上面に熱硬化
性樹脂前駆体にシランカップリング剤を含有させた樹脂
ペーストを所定厚みに被着させ、その後、これらを約2
5〜100℃の温度で1〜60分間熱処理し、シートの
熱硬化性樹脂及び樹脂ペースト中の熱硬化性樹脂各々
半硬化させることによって行なわれる。
Precursor sheet 1 of the resin paste film 15
To form 1b on the upper surface, a precursor sheet 11b is once formed, and then a resin paste containing a silane coupling agent in a thermosetting resin precursor is applied to the upper surface of the precursor sheet 11b, and Heat treatment is performed to semi-cure the thermosetting resin in the resin paste, or a paste obtained by mixing the inorganic insulating powder and the thermosetting resin precursor is formed into a sheet, and the thermosetting resin is applied to the upper surface of the sheet. A resin paste containing a silane coupling agent is applied to the resin precursor to a predetermined thickness, and then these are applied to about 2
Heat-treated for 1 to 60 minutes at a temperature of 5 to 100 ° C., is carried out by each semi-curing the thermosetting resin of the thermosetting sheet resin and the resin paste.

【0034】次に図3(c)に示すように、前記3枚の
前駆体シート11a、11b、11cのうち2枚の前駆
体シート11a、11bに半導体素子3を収容する凹部
1dとなる開口A、A’を、2枚の前駆体シート11
b、11cに配線導体2を引き回すための貫通孔B、
B’を各々形成する。
Next, as shown in FIG. 3 (c), two precursor sheets 11a, 11b, 11c among the three precursor sheets 11a, 11b, 11c have openings for forming recesses 1d for accommodating the semiconductor element 3 therein. A and A ′ are two precursor sheets 11
a through hole B for routing the wiring conductor 2 to b and 11c,
Form each B '.

【0035】前記開口A、A’及び貫通孔B、B’は前
駆体シート11a、11b、11cに従来周知のパンチ
ング加工法を施し、前駆体シート11a、11b、11
cの各々に所定形状の孔を穿孔することによって形成さ
れる。
The openings A, A'and the through-holes B, B'are formed by subjecting the precursor sheets 11a, 11b, 11c to a well-known punching process to obtain precursor sheets 11a, 11b, 11 '.
It is formed by drilling a hole of a predetermined shape in each of c.

【0036】次に図3(d)に示すように、前記前駆体
シート11b、11cの上下面及び貫通孔B、B’内に
配線導体2となる金属ペースト12を従来周知のスクリ
ーン印刷法により所定パターンに印刷塗布するとともに
これを約25〜100℃の温度で1〜60分間加熱し、
半硬化させる。
Next, as shown in FIG. 3 (d), a metal paste 12 to be the wiring conductor 2 is formed on the upper and lower surfaces of the precursor sheets 11b and 11c and in the through holes B and B'by a conventionally known screen printing method. While printing and applying in a predetermined pattern, this is heated at a temperature of about 25 to 100 ° C. for 1 to 60 minutes,
Semi-cure.

【0037】前記金属ペースト12としては、例えば、
粒径が0.1〜20μm程度の銅等の粉末にビスフェノ
ールA型エポキシ樹脂、ノボラック型エポキシ樹脂、グ
リシジルエステル型エポキシ樹脂等のエポキシ樹脂、及
びアミン系硬化剤、イミダゾール系硬化剤、酸無水物系
硬化剤等の硬化剤を添加混合しペースト状となしたもの
が使用される。
As the metal paste 12, for example,
Epoxy resin such as bisphenol A type epoxy resin, novolac type epoxy resin, glycidyl ester type epoxy resin, etc. in powder of copper or the like having a particle size of about 0.1 to 20 μm, and amine type curing agent, imidazole type curing agent, acid anhydride A paste in which a curing agent such as a system curing agent is added and mixed is used.

【0038】そして最後に前記3枚の前駆体シート11
a、11b、11cを上下に積層するとともにこれを約
80〜300℃の温度で10秒〜24時間加熱し、前記
前駆体シート11a、11b、11c、樹脂ペースト膜
15及び所定パターンに印刷塗布された金属ペースト1
2を完全に熱硬化させることによって図1に示すような
絶縁基体1に配線導体2を被着させた配線基板が完成す
る。この場合、前記前駆体シート11a、11b、11
c、樹脂ペースト膜15及び金属ペースト12は熱硬化
時に収縮することは殆どなく、従って、得られる配線基
板に変形や寸法のばらつきが発生することはなく、これ
によって半導体素子と配線導体とを正確に接続すること
が可能となる。
Finally, the three precursor sheets 11
a, 11b and 11c are laminated on top of each other and heated at a temperature of about 80 to 300 ° C. for 10 seconds to 24 hours, and printed and applied to the precursor sheets 11a, 11b and 11c, the resin paste film 15 and a predetermined pattern. Metal paste 1
By completely thermosetting 2, the wiring substrate in which the wiring conductor 2 is attached to the insulating substrate 1 as shown in FIG. 1 is completed. In this case, the precursor sheets 11a, 11b, 11
c, the resin paste film 15 and the metal paste 12 hardly shrink during thermosetting, and therefore, the obtained wiring board is not deformed or the dimensions are not uniform, which allows the semiconductor element and the wiring conductor to be accurately arranged. It is possible to connect to.

【0039】なお、本発明は上述の実施例に限定される
ものではなく、本発明の要旨を逸脱しない範囲であれば
種々の変更は可能であり、例えば上述の実施例では、本
発明の配線基板を半導体素子を収容する半導体素子収納
用パッケージに適用した場合を例に採って説明したが、
これを成集積回路等に用いられる配線基板としても適
用できることはいうまでもない。
The present invention is not limited to the above-mentioned embodiments, and various modifications can be made without departing from the gist of the present invention. For example, in the above-mentioned embodiments, the wiring of the present invention is used. The case where the substrate is applied to a semiconductor element housing package that houses a semiconductor element has been described as an example.
This can of course be also applied as a wiring substrate used in the mixed forming an integrated circuit.

【0040】また上述の実施例では、3枚の前駆体シー
トを積層することによって配線基板を製作したが、一枚
や二枚、或いは四枚以上の絶縁基板を積層することによ
って形成してもよい。
In the above-mentioned embodiment, the wiring board is manufactured by stacking three precursor sheets, but it may be formed by stacking one, two, or four or more insulating boards. Good.

【0041】[0041]

【発明の効果】本発明の配線基板によれば、絶縁基体が
無機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合する
ことによって形成されていることから配線基板同士ある
いは配線基板と半導体装置製作ラインの一部とが激しく
衝突したとしても絶縁基体に欠けや割れ、クラック等を
発生することはない。
According to the wiring board of the present invention, since the insulating substrate is formed by bonding the inorganic insulating powder with the thermosetting resin having excellent toughness, the wiring boards are manufactured together or the wiring board and the semiconductor device are manufactured. Even if a part of the line violently collides, the insulating substrate will not be chipped, cracked, or cracked.

【0042】また本発明の配線基板によれば、絶縁基
と配線導体との間および該配線導体を被着させる前記絶
縁基板とこれに積層される前記絶縁基板との間に両者に
対し密着性が良い熱硬化性樹脂にγグリシドキシプロピ
ルトリメトキシシラン等のシランカップリング剤を2乃
至10重量部含有させて成る中間層を介在させたことか
ら絶縁基に対する配線導体の接合強度が前記中間層に
よって極めて強いものとなり、その結果、配線導体に半
導体素子の電極を接続する際等において配線導体に大き
な外力が印加されても配線導体が絶縁基より剥離する
ことはなく、半導体素子等の電極を配線導体に確実、強
固に電気的接続することが可能となる。
[0042] According to the wiring board of the present invention, the absolute of depositing and between the wiring conductors of the wiring conductor and the insulating board <br/>
Between the edge substrate and the insulating substrate laminated on the edge substrate, a thermosetting resin having good adhesion to both is added with 2 to 10 parts by weight of a silane coupling agent such as γ-glycidoxypropyltrimethoxysilane. comprising the bonding strength of the wiring conductor for insulating base plate since the intermediate layer is interposed becomes extremely strong by said intermediate layer, as a result, a large external force to the wiring conductor in such when connecting electrodes of the semiconductor element to the wiring conductor It is applied not the wiring conductor is peeled off from the insulating base plate, ensuring an electrode of a semiconductor element or the like on the wiring conductors, it is possible to firmly electrically connected.

【0043】更に本発明の配線基板の製造方法によれ
、熱硬化性樹脂前駆体と無機絶縁物粉末とを混合して
、硬化後に絶縁基体と成る前駆体シートを準備する
工程と、該前駆体シートを半硬化させる工程と、該半硬
化した前駆体シートの一面に熱硬化性樹脂前駆体にシラ
ンカップリング剤を添加した樹脂ペーストを塗布する工
程と、前記塗布された樹脂ペースト上に熱硬化性樹脂前
駆体と金属粉末とを混合して、硬化後に配線導体と
成る金属ペーストを所定パターンに塗布する工程と、前
記前駆体シート、樹脂ペースト及び金属ペーストを加熱
処理し、熱硬化させる工程とで製作され、前駆体シー
ト、樹脂ペースト、金属ペーストの熱硬化性樹脂前駆体
は熱硬化時に殆ど収縮しないことから不均一な収縮によ
る変形や寸法のばらつきが発生することもない。
Further , according to the method for manufacturing a wiring board of the present invention,
For example , mix the thermosetting resin precursor with the inorganic insulating powder.
Ru formed, a step of preparing a precursor sheet comprising an insulating substrate after the curing, a step of semi-curing the precursor sheet, semi hard
A step of applying a resin paste obtained by adding a silane coupling agent to a thermosetting resin precursor on one surface of the precursor sheet that has been made into a mixture, and mixing the thermosetting resin precursor and metal powder on the applied resin paste forming Ru and a wiring conductor after curing
The precursor sheet, the resin paste, and the metal paste are heat-cured, and the precursor sheet, the resin paste, and the metal paste are heat-cured. Since the precursor hardly shrinks during thermosetting, deformation or dimensional variation due to uneven shrinkage does not occur.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の配線基板を半導体素子収納用パッケー
ジに適用した場合の一実施例を示す断面図である。
FIG. 1 is a cross-sectional view showing an embodiment in which a wiring board of the present invention is applied to a semiconductor element housing package.

【図2】図1に示す配線基板の要部拡大断面図である。FIG. 2 is an enlarged cross-sectional view of a main part of the wiring board shown in FIG.

【図3】(a)乃至(d)は本発明の配線基板の製造方
法を説明するための工程毎の断面図である。
3 (a) to 3 (d) are cross-sectional views for each step for explaining the method for manufacturing a wiring board of the present invention.

【符号の説明】[Explanation of symbols]

1・・・・・・・・・・絶縁基体 1a、1b、1c・・・絶縁基板 2・・・・・・・・・・配線導体 5・・・・・・・・・・中間層 11a、11b、11c・・前駆体シート 12・・・・・・・・・・・金属ペースト 15・・・・・・・・・・・樹脂ペースト膜 1 ... Insulating substrate 1a, 1b, 1c ... Insulating substrate 2 ... Wiring conductor 5: Middle layer 11a, 11b, 11c ... Precursor sheet 12: Metal paste 15: Resin paste film

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI H05K 3/46 H05K 3/46 T H01L 23/14 R 23/12 N (58)調査した分野(Int.Cl.7,DB名) H05K 1/02 H05K 1/03 H05K 1/09 H05K 3/12 H05K 3/46 H01L 23/12 - 23/15 H01B 1/00 - 1/24 ─────────────────────────────────────────────────── ─── Continuation of front page (51) Int.Cl. 7 Identification code FI H05K 3/46 H05K 3/46 T H01L 23/14 R 23/12 N (58) Fields investigated (Int.Cl. 7 , DB Name) H05K 1/02 H05K 1/03 H05K 1/09 H05K 3/12 H05K 3/46 H01L 23/12-23/15 H01B 1/00-1/24

Claims (4)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】60重量%乃至95重量%の無機絶縁物粉
末と5重量%乃至40重量%の熱硬化性樹脂とから
り、前記無機絶縁物粉末を前記熱硬化性樹脂により結合
て成る前駆体シートを半硬化させて、前記無機絶縁物
粉末を前記熱硬化性樹脂により結合した複数の絶縁基板
を積層して成る絶縁基体の前記絶縁基板に、半硬化の前
記前駆体シートとともに熱硬化させた、金属粉末を熱硬
化性樹脂により結合した配線導体を被着させて成る配線
基板であって、前記絶縁基と配線導体との間および該
配線導体を被着させる前記絶縁基板とこれに積層される
前記絶縁基板との間に熱硬化性樹脂にシランカップリン
グ剤を2乃至10重量部含有させて成る中間層を介在さ
せたことを特徴とする配線基板。
1. 60% by weight to 95% by weight of inorganic insulating powder
From powder and 5% to 40% by weight of thermosetting resinSuccess
Bond the inorganic insulating powder with the thermosetting resin.
ShiThe semi-cured precursor sheet consisting of
A plurality of powders bonded by the thermosetting resinInsulation board
StackingInsulating base consistingOf the insulating substrateToBefore semi-curing
Heat cured together with the precursor sheet,Thermosetting metal powder
Wiring formed by depositing wiring conductors bonded with a chemical resin
A substrate, the insulating substrateBoardBetween the wiring conductor andAnd the
The insulating substrate on which the wiring conductor is adhered and laminated on the insulating substrate
Between the insulating substrateThermosetting resin with silane coupling
And an intermediate layer containing 2 to 10 parts by weight of a coating agent is interposed.
A wiring board characterized by being made.
【請求項2】前記中間層の厚みが3μm乃至20μmで
あることを特徴とする請求項1に記載の配線基板。
2. The wiring board according to claim 1, wherein the intermediate layer has a thickness of 3 μm to 20 μm.
【請求項3】前記シランカップリング剤がγグリシドキ
シプロピルトリメトキシシランであることを特徴とする
請求項1に記載の配線基板。
3. The wiring board according to claim 1, wherein the silane coupling agent is γ-glycidoxypropyltrimethoxysilane.
【請求項4】熱硬化性樹脂前駆体と無機絶縁物粉末とを
混合して、硬化後に絶縁基体と成る前駆体シートを
準備する工程と、該前駆体シートを半硬化させる工程
と、該半硬化した前駆体シートの一面に熱硬化性樹脂前
駆体にシランカップリング剤を添加した樹脂ペーストを
塗布する工程と、前記塗布された樹脂ペースト上に熱硬
化性樹脂前駆体と金属粉末とを混合して、硬化後に
配線導体と成る金属ペーストを所定パターンに塗布する
工程と、前記前駆体シート、樹脂ペースト及び金属ペー
ストを加熱処理し、熱硬化させる工程と、から成ること
を特徴とする配線基板の製造方法。
4. Ru formed by mixing a thermosetting resin precursor and the inorganic insulator powder, a step of preparing a precursor sheet comprising an insulating substrate after curing, step of semi-curing the precursor sheet
And a step of applying a resin paste obtained by adding a silane coupling agent to a thermosetting resin precursor on one surface of the semi-cured precursor sheet, and a thermosetting resin precursor and a metal on the applied resin paste. formed Ru by mixing a powder, after curing
And a step of applying a metal paste to be a wiring conductor in a predetermined pattern, and a step of heat-treating the precursor sheet, the resin paste and the metal paste to heat-cure them.
And a method for manufacturing a wiring board.
JP30490596A 1996-11-15 1996-11-15 Wiring board and method of manufacturing the same Expired - Fee Related JP3393768B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30490596A JP3393768B2 (en) 1996-11-15 1996-11-15 Wiring board and method of manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30490596A JP3393768B2 (en) 1996-11-15 1996-11-15 Wiring board and method of manufacturing the same

Publications (2)

Publication Number Publication Date
JPH10150123A JPH10150123A (en) 1998-06-02
JP3393768B2 true JP3393768B2 (en) 2003-04-07

Family

ID=17938713

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30490596A Expired - Fee Related JP3393768B2 (en) 1996-11-15 1996-11-15 Wiring board and method of manufacturing the same

Country Status (1)

Country Link
JP (1) JP3393768B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4845274B2 (en) * 2001-02-27 2011-12-28 京セラ株式会社 Wiring board and manufacturing method thereof

Also Published As

Publication number Publication date
JPH10150123A (en) 1998-06-02

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