JP3297574B2 - Wiring board and method of manufacturing the same - Google Patents

Wiring board and method of manufacturing the same

Info

Publication number
JP3297574B2
JP3297574B2 JP33516995A JP33516995A JP3297574B2 JP 3297574 B2 JP3297574 B2 JP 3297574B2 JP 33516995 A JP33516995 A JP 33516995A JP 33516995 A JP33516995 A JP 33516995A JP 3297574 B2 JP3297574 B2 JP 3297574B2
Authority
JP
Japan
Prior art keywords
precursor
thermosetting resin
powder
wiring board
wiring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP33516995A
Other languages
Japanese (ja)
Other versions
JPH09181213A (en
Inventor
省吾 松尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP33516995A priority Critical patent/JP3297574B2/en
Priority to US08/717,119 priority patent/US5837356A/en
Publication of JPH09181213A publication Critical patent/JPH09181213A/en
Application granted granted Critical
Publication of JP3297574B2 publication Critical patent/JP3297574B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1515Shape
    • H01L2924/15153Shape the die mounting substrate comprising a recess for hosting the device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16195Flat cap [not enclosing an internal cavity]

Landscapes

  • Parts Printed On Printed Circuit Boards (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、半導体素子を収容
するための半導体素子収納用パッケージや混成集積回路
基板等に用いられる配線基板に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring board used for a package for housing a semiconductor element for housing a semiconductor element or a hybrid integrated circuit board.

【0002】[0002]

【従来の技術】従来、配線基板、例えば半導体素子を収
容する半導体素子収納用パッケージに使用される配線基
板は、酸化アルミニウム質焼結体等のセラミックスより
成り、その上面中央部に半導体素子を収容する凹部を有
する絶縁基体と、前記絶縁基体の凹部周辺から下面にか
けて導出されたタングステン、モリブデン等の高融点金
属粉末から成る配線導体とから構成されており、前記絶
縁基体の凹部底面に半導体素子をガラス、樹脂、ロウ材
等の接着剤を介して接着固定するとともに半導体素子の
各電極を例えばボンディングワイヤ等の電気的接続手段
を介して配線導体に電気的に接続し、しかる後、前記絶
縁基体の上面に、金属やセラミックス等から成る蓋体を
絶縁基体の凹部を塞ぐようにしてガラス、樹脂、ロウ材
等の封止材を介して接合させ、絶縁基体の凹部内に半導
体素子を気密に収容することによって製品としての半導
体装置となり、配線導体の絶縁基体凹部底面に導出した
部位を外部電気回路基板の配線導体に接続することによ
って半導体素子の各電極が外部電気回路基板に電気的に
接続されることとなる。
2. Description of the Related Art Conventionally, a wiring board, for example, a wiring board used for a semiconductor element housing package for housing a semiconductor element is made of ceramics such as an aluminum oxide sintered body, and a semiconductor element is housed in a central portion of an upper surface thereof. And a wiring conductor made of a refractory metal powder such as tungsten or molybdenum which is led out from the periphery of the recess to the lower surface of the insulating base, and a semiconductor element is formed on the bottom of the recess of the insulating base. The electrodes of the semiconductor element are electrically connected to wiring conductors via electrical connection means such as a bonding wire, and then the insulating base is adhered and fixed by an adhesive such as glass, resin, or brazing material. A lid made of metal, ceramics, or the like is placed on the top surface of the insulating base with a sealing material such as glass, resin, brazing material, etc. A semiconductor device as a product is obtained by joining the semiconductor elements in a concave portion of the insulating base in an airtight manner, and a portion of the wiring conductor led out to the bottom of the concave portion of the insulating base is connected to the wiring conductor of the external electric circuit board. Each electrode of the element is electrically connected to the external electric circuit board.

【0003】尚、前記配線基板は一般に、セラミックグ
リーンシート積層法によって製作されており、具体的に
は、酸化アルミニウム、酸化珪素、酸化マグネシウム、
酸化カルシウム等のセラミック原料粉末に適当な有機バ
インダー、溶剤等を添加混合して泥漿状となすとともに
これを従来周知のドクターブレード法を採用してシート
状とすることによって複数のセラミックグリーンシート
を得、しかる後、前記セラミックグリーンシートに適当
な打ち抜き加工を施すとともに配線導体となる金属ペー
ストを所定パターンに印刷塗布し、最後に前記セラミッ
クグリーンシートを所定の順に上下に積層して生セラミ
ック成形体となすとともに該セラミック生成形体を還元
雰囲気中約1600℃の高温で焼成することによって製
作される。
Incidentally, the wiring board is generally manufactured by a ceramic green sheet laminating method, and specifically, aluminum oxide, silicon oxide, magnesium oxide,
A ceramic raw material powder such as calcium oxide is mixed with an appropriate organic binder, a solvent, and the like to form a slurry, which is formed into a sheet by employing a conventionally known doctor blade method, thereby obtaining a plurality of ceramic green sheets. Thereafter, the ceramic green sheet is subjected to a suitable punching process and a metal paste to be a wiring conductor is printed and applied in a predetermined pattern, and finally, the ceramic green sheets are stacked up and down in a predetermined order to form a green ceramic molded body. It is manufactured by sintering and firing the ceramic forming body at a high temperature of about 1600 ° C. in a reducing atmosphere.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、この従
来の配線基板は、絶縁基体を構成する酸化アルミニウム
質焼結体等のセラミックスが硬くて脆い性質を有するた
め、搬送工程や半導体装置製作の自動ライン等において
配線基板同士が、あるいは配線基板と半導体装置製作自
動ラインの一部とが激しく衝突すると絶縁基体に欠けや
割れ、クラック等が発生し、その結果、半導体素子を気
密に収容することができず、半導体素子を長期間にわた
り正常、且つ安定に作動させることができなくなるとい
う欠点を有していた。
However, in this conventional wiring board, since the ceramics such as the aluminum oxide sintered body constituting the insulating base have a hard and brittle property, the automatic wiring of the transfer process and the semiconductor device manufacturing is difficult. When the wiring boards collide with each other or the wiring board and a part of the semiconductor device manufacturing automatic line violently collide with each other, chips, cracks, cracks, etc. occur in the insulating base, and as a result, the semiconductor element can be housed in an airtight manner. In addition, the semiconductor device cannot operate normally and stably for a long period of time.

【0005】また、前記配線基板の製造方法によれば、
セラミック生成形体を焼成する際、セラミック生成形体
に不均一な焼成収縮が発生し、得られる配線基板に反り
等の変形や寸法のばらつきが発生し、その結果、半導体
素子の各電極と配線導体とを、或いは配線導体と外部電
気回路基板の配線導体とを正確、且つ確実に電気的に接
続することが困難であるという欠点を有していた。
According to the method of manufacturing a wiring board,
When firing the ceramic forming body, uneven firing shrinkage occurs in the ceramic forming body, resulting in deformation and dimensional variation such as warpage of the obtained wiring board, and as a result, each electrode of the semiconductor element and the wiring conductor Or the wiring conductor and the wiring conductor of the external electric circuit board are difficult to accurately and reliably electrically connect.

【0006】[0006]

【課題を解決するための手段】本発明の配線基板は、無
機絶縁物粉末を熱硬化性樹脂により結合して成り、前記
無機絶縁物粉末を前記熱硬化性樹脂の前駆体で結合して
成る前駆体シートを半硬化させてその複数枚を積層して
熱硬化させた、前記無機絶縁物粉末を前記熱硬化性樹脂
により結合した複数枚の絶縁基板を積層して成る絶縁基
の前記絶縁基板に、半硬化の前記前駆体シートととも
に熱硬化させた、表面がアルミニウムもしくはニッケル
で被覆された銅粉末を熱硬化性樹脂で結合して成る配線
導体を被着させたことを特徴とするものである。
Wiring board of the present invention, in order to solve the problem] is composed by an inorganic insulator powder bonded with a thermosetting resin, wherein
Combine inorganic insulator powder with the precursor of the thermosetting resin
Precursor sheet is semi-cured and multiple sheets are laminated
The thermosetting resin obtained by thermosetting the inorganic insulating powder
The insulating substrate an insulating substrate formed by laminating a plurality of insulating substrates joined by the precursor sheet together with the semi-cured
A wiring conductor formed by bonding a thermosetting resin to a copper powder whose surface is coated with aluminum or nickel.

【0007】また本発明の配線基板は、前記絶縁基体に
含有される無機絶縁物粉末の量を絶縁基体の全重量に対
し60重量%乃至95重量%としたことを特徴とするも
のである。
Further, the wiring board of the present invention is characterized in that the amount of the inorganic insulating powder contained in the insulating base is 60% by weight to 95% by weight based on the total weight of the insulating base.

【0008】更に本発明の配線基板は、前記表面がアル
ミニウムもしくはニッケルで被覆された銅粉末の粒径を
0.1μm乃至50μmとしたことを特徴とするもので
ある。
Wiring board [0008] The present invention is characterized in that the surface was coated copper powder particle size of 0.1μm or 50μm of aluminum or nickel.

【0009】また更に本発明の配線基板は、前記配線導
体の銅粉末の表面を被覆するアルミニウムもしくはニッ
ケルの厚みを0.1μm乃至10μmとしたことを特徴
とするものである。
Further, the wiring board of the present invention is characterized in that the thickness of aluminum or nickel covering the surface of the copper powder of the wiring conductor is 0.1 μm to 10 μm.

【0010】更にまた本発明の配線基板の製造方法は、
熱硬化性樹脂前駆体と無機絶縁物粉末とを混合した絶縁
基体と成る前駆体シートを準備する工程と、前記前駆体
シートに、表面がアルミニウムもしくはニッケルで被覆
された銅粉末と熱硬化性樹脂前駆体とを混合した配線導
体となる金属ペーストを所定パターンに印刷する工程
と、前記前駆体シートを加熱して半硬化させる工程と、
前記金属ペーストが印刷された半硬化の前記前駆体シー
トを複数枚上下に積層するとともにこれを加熱して前記
前駆体シートの熱硬化性樹脂前駆体及び前記金属ペース
トの熱硬化性樹脂前駆体を熱硬化させる工程と、から成
ることを特徴とするものである。
Further, the method for manufacturing a wiring board according to the present invention comprises:
A step of preparing a precursor sheet serving as an insulating substrate in which a thermosetting resin precursor and an inorganic insulating powder are mixed; and a step of preparing a copper sheet having a surface coated with aluminum or nickel on the precursor sheet and a thermosetting resin. A step of printing a metal paste to be a wiring conductor mixed with a precursor in a predetermined pattern, and a step of heating and curing the precursor sheet to be semi-cured,
The semi-cured precursor sheet on which the metal paste is printed
Characterized in that it consists a step of thermally curing the thermosetting resin precursor is heated to the precursor sheet of a thermosetting resin precursor and the metal paste which, together with the laminated bets on a plurality vertically Things.

【0011】本発明の配線基板によれば、絶縁基体が無
機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合するこ
とによって形成されていることから配線基板同士あるい
は配線基板と半導体装置製作自動ラインの一部とが激し
く衝突しても絶縁基体に欠けや割れ、クラック等が発生
することはない。
According to the wiring board of the present invention, since the insulating base is formed by bonding the inorganic insulating powder with the thermosetting resin having excellent toughness, the wiring boards are mutually connected or the wiring board and the semiconductor device manufacturing automatic line. Even if a portion of the insulating base material collides violently, the insulating substrate will not be chipped, cracked or cracked.

【0012】また本発明の配線基板によれば、絶縁基体
の無機絶縁物粉末の含有量を60重量%乃至95重量%
の範囲としておくと、絶縁基体の機械的強度を強いもの
としつつ絶縁基体の熱膨脹係数を搭載される半導体素子
熱膨脹係数に近似させ、両者間に両者の熱膨脹係数の
に起因して発生する熱応力を小さくするとともに、
該熱応力によって半導体素子に割れや欠け等が発生する
のを有効に防止することができる。
Further, according to the wiring substrate of the present invention, the content of the inorganic insulating powder in the insulating base is set to 60% by weight to 95% by weight.
The semiconductor element mounted with the thermal expansion coefficient of the insulating base while increasing the mechanical strength of the insulating base.
Is approximated to the thermal expansion coefficient, as well as reduce the thermal stress generated due to <br/> phase differences of thermal expansion coefficients of both therebetween,
It is possible to effectively prevent the semiconductor element from being cracked or chipped due to the thermal stress.

【0013】更に本発明の配線基板によれば、配線導体
を形成する銅粉末の表面をニッケルもしくはアルミニウ
ムで0.01μm乃至10μmの厚みに被覆したことか
ら銅粉末の不要な酸化が防止されて配線導体の電気抵抗
を低抵抗のものとなすことができる。
Further, according to the wiring board of the present invention, since the surface of the copper powder forming the wiring conductor is coated with nickel or aluminum to a thickness of 0.01 μm to 10 μm, unnecessary oxidation of the copper powder is prevented, and the wiring is formed. The electric resistance of the conductor can be low.

【0014】また更に本発明の配線基板の製造方法によ
れば、熱硬化性樹脂前駆体と無機絶縁物粉末とを混合し
た絶縁基体と成る前駆体シートを準備する工程と、前記
前駆体シートに、表面がアルミニウムもしくはニッケル
で被覆された銅粉末と熱硬化性樹脂前駆体とを混合した
配線導体となる金属ペーストを所定パターンに印刷する
工程と、前記前駆体シートを加熱して半硬化させる工程
と、前記金属ペーストが印刷された半硬化の前記前駆体
シートを複数枚上下に積層するとともにこれを加熱して
前記前駆体シートの熱硬化性樹脂前駆体及び前記金属ペ
ーストの熱硬化性樹脂前駆体を熱硬化させる工程とで製
作され、焼成工程がないことから不均一な焼成収縮によ
る変形や寸法のばらつきが発生することもない。
Further, according to the method of manufacturing a wiring board of the present invention, there is provided a step of preparing a precursor sheet serving as an insulating base obtained by mixing a thermosetting resin precursor and an inorganic insulating powder; Printing a metal paste to be a wiring conductor obtained by mixing a copper powder coated with aluminum or nickel and a thermosetting resin precursor in a predetermined pattern, and heating the precursor sheet to semi-curing
And the semi-cured precursor on which the metal paste is printed
Fabricated a thermosetting resin precursor is heated to <br/> the precursor sheet of a thermosetting resin precursor and the metal paste it as well as laminated sheets on a plurality down in the step of thermal curing, Since there is no firing step, there is no deformation or dimensional variation due to uneven firing shrinkage.

【0015】[0015]

【発明の実施の形態】次に、本発明を添付図面に基づき
詳細に説明する。
Next, the present invention will be described in detail with reference to the accompanying drawings.

【0016】図1は、本発明の配線基板を半導体素子を
収容する半導体素子収納用パッケージに適用した場合の
一実施例を示し、1は絶縁基体、2は配線導体である。
FIG. 1 shows an embodiment in which the wiring board of the present invention is applied to a semiconductor element housing package for housing a semiconductor element, wherein 1 is an insulating base, and 2 is a wiring conductor.

【0017】前記絶縁基体1は、三枚の絶縁基板1a、
1b、1cを積層することによって形成されており、そ
の上面中央部に半導体素子を収容するための凹部1dを
有し、該凹部1dの底面には半導体素子3が樹脂等の接
着剤を介して接着固定される。
The insulating base 1 comprises three insulating substrates 1a,
The semiconductor device 3 is formed by laminating 1b and 1c, and has a concave portion 1d for accommodating a semiconductor element in the center of the upper surface, and the semiconductor element 3 is provided on the bottom surface of the concave portion 1d via an adhesive such as resin. Adhesively fixed.

【0018】前記絶縁基体1を構成する絶縁基板1a、
1b、1cは、例えば酸化珪素、酸化アルミニウム、窒
化アルミニウム、炭化珪素、チタン酸バリウム、ゼオラ
イト等の無機絶縁物粉末をエポキシ樹脂、ポリイミド樹
脂,ポリフェニレンエーテル樹脂等の熱硬化性樹脂で結
合することによって形成されており、絶縁基体1を構成
する三枚の絶縁基板1a、1b、1cはその各々が無機
絶縁物粉末を靭性に優れる熱硬化性樹脂で結合すること
によって形成されていることから絶縁基体1に外力が印
加されても該外力によって絶縁基体1に欠けや割れ、ク
ラック等が発生することはない。
An insulating substrate 1a constituting the insulating base 1;
1b and 1c are obtained by bonding an inorganic insulating powder such as silicon oxide, aluminum oxide, aluminum nitride, silicon carbide, barium titanate, and zeolite with a thermosetting resin such as an epoxy resin, a polyimide resin, and a polyphenylene ether resin. The three insulating substrates 1a, 1b, and 1c constituting the insulating substrate 1 are formed by bonding inorganic insulating powder with a thermosetting resin having excellent toughness. Even when an external force is applied to the insulating substrate 1, the external force does not cause chipping, cracking, cracking or the like in the insulating substrate 1.

【0019】尚、前記無機絶縁物粉末を熱硬化性樹脂で
結合して成る絶縁基体1を構成する三枚の絶縁基板1
a、1b、1cは、無機絶縁物粉末の含有量が60重量
%未満であると絶縁基体1の熱膨脹係数が半導体素子3
の熱膨脹係数に対して大きく相違し、半導体素子3が作
動時に熱を発し、該熱が半導体素子3と絶縁基体1の両
者に印加されると、両者間に両者の熱膨脹係数の相違に
起因する大きな熱応力が発生し、この大きな熱応力によ
って半導体素子3が絶縁基体1から剥離したり、半導体
素子3に割れや欠け等が発生する危険性がある。また9
5重量%をえると無機絶縁物粉末を熱硬化性樹脂で完
全に結合させることができず、機械的強度の強い所定の
絶縁基板1a、1b、1cを得ることができなくなる。
従って、前記絶縁基体1を構成する絶縁基板1a、1
b、1cは、その各々の内部に含有される無機絶縁物粉
末の量を60重量%乃至95重量%の範囲としておくこ
とが好ましい。
Incidentally, three insulating substrates 1 constituting an insulating base 1 formed by bonding the inorganic insulating powder with a thermosetting resin.
a, 1b, and 1c show that when the content of the inorganic insulating powder is less than 60% by weight, the thermal expansion coefficient of the insulating base 1 is lower than that of the semiconductor element 3.
When the semiconductor element 3 emits heat during operation and the heat is applied to both the semiconductor element 3 and the insulating substrate 1, the difference is caused by the difference in the thermal expansion coefficient between the two. A large thermal stress is generated, and there is a risk that the semiconductor element 3 may be separated from the insulating base 1 or the semiconductor element 3 may be cracked or chipped due to the large thermal stress. 9
5% by weight is exceeded and inorganic insulator powder can not be completely bound with a thermosetting resin, can not be obtained mechanical strength strong predetermined insulation substrate 1a, 1b, and 1c.
Therefore, the insulating substrates 1a, 1
It is preferable that the amount of the inorganic insulating powder contained in each of b and 1c is in the range of 60 % by weight to 95% by weight.

【0020】また前記絶縁基体1は、その凹部1d周辺
から下面にかけて配線導体2が被着形成されており、該
配線導体2は表面がアルミニウムもしくはニッケルで被
覆された銅粉末を熱硬化性樹脂を介し絶縁基体1に取着
させて形成されている。
The insulating base 1 is formed with a wiring conductor 2 attached from the periphery of the concave portion 1d to the lower surface. The wiring conductor 2 is made of a thermosetting resin made of copper powder whose surface is coated with aluminum or nickel. It is formed so as to be attached to the insulating base 1 via an interposition.

【0021】前記配線導体2は、内部に収容する半導体
素子3の各電極を外部電気回路に電気的に接続する作用
を為し、絶縁基体1の凹部1d周辺に位置する部位には
半導体素子3の各電極がボンディングワイヤ4を介して
電気的に接続され、また絶縁基体1の下面に導出された
部位は外部電気回路に電気的に接続される。
The wiring conductor 2 serves to electrically connect each electrode of the semiconductor element 3 housed therein to an external electric circuit. Are electrically connected via bonding wires 4, and a portion led out to the lower surface of the insulating base 1 is electrically connected to an external electric circuit.

【0022】前記配線導体2は銅粉末を熱硬化性樹脂に
より接合させることによって形成されており、該銅粉末
は良電導性であることから配線導体2の電気抵抗を低抵
抗となすことができる。
The wiring conductor 2 is formed by bonding copper powder with a thermosetting resin. Since the copper powder has good electrical conductivity, the electric resistance of the wiring conductor 2 can be reduced. .

【0023】また前記銅粉末から成る配線導体2はその
表面が耐蝕性に優れるアルミニウムもしくはニッケルで
被覆されており、該アルミニウムもしくはニッケルによ
って銅粉末の表面が酸化することは殆どなく、これによ
って配線導体2の電気抵抗をより低抵抗となすことがで
きる。
The surface of the wiring conductor 2 made of the copper powder is coated with aluminum or nickel having excellent corrosion resistance, and the surface of the copper powder is hardly oxidized by the aluminum or nickel. 2 can be made lower resistance.

【0024】尚、前記配線導体2となる表面がアルミニ
ウムもしくはニッケルで被覆された銅粉末はその含有
量が70重量%未満では配線導体2の電気抵抗値が高く
なる傾向にあり、また95重量%をえると銅粉末を熱
硬化性樹脂で強固に結合するのが困難となる傾向にあ
る。従って、前記配線導体2に含有される銅粉末はその
含有量を70重量乃至95重量%の範囲としておくこ
とが好ましい。
When the content of the copper powder whose surface to be the wiring conductor 2 is coated with aluminum or nickel is less than 70% by weight, the electric resistance value of the wiring conductor 2 tends to be high , and the content is 95% by weight. % certain ultra El and copper powder tends to be difficult to firmly bond a thermosetting resin. Therefore, it is preferable that the content of the copper powder contained in the wiring conductor 2 be in the range of 70 % by weight to 95% by weight.

【0025】また前記配線導体2となる表面がアルミ
ニウムもしくはニッケルで被覆された銅粉末は、その平
均粒径が0.1μm未満となると銅粉末が凝集して均一
な分散が得られなくなり、また50μmをえると配線
導体2の幅を一般的に要求される50μm〜200μm
の範囲に印刷形成するのが困難となる傾向にある。従っ
て、前記配線導体2に含有される銅粉末はその平均粒径
を0.1μm乃至50μmの範囲としておくことが好ま
しい。
Further, the wiring conductors 2 and made the surface copper powder coated with aluminum or nickel, copper powder is agglomerated longer uniform dispersion is obtained when the average particle diameter is less than 0.1 [mu] m, also 50μm the 50μm~200μm that are typically required the width of the wiring conductor 2 and is exceeded
Tends to be difficult to print in the range of. Therefore, it is preferable that the average particle diameter of the copper powder contained in the wiring conductor 2 be in the range of 0.1 μm to 50 μm.

【0026】更に前記配線導体2となる表面がアルミニ
ウムもしくはニッケルで被覆された銅粉末は、銅粉末の
表面を被覆するアルミニウムもしくはニッケルの厚みが
0.01μm未満であると銅粉末の表面をアルミニウム
もしくはニッケルで完全に被覆することができず銅粉末
の酸化を有効に防止するのが困難となり、また10μm
えると配線導体2の電気抵抗が大きなものとなる傾
向にある。従って、前記配線導体2となる銅粉末は、そ
の表面を被覆するアルミニウムもしくはニッケルの厚み
を0.01μm乃至10μmの範囲としておくことが好
ましい。
Further, in the case of the copper powder coated with aluminum or nickel on the surface serving as the wiring conductor 2, if the thickness of aluminum or nickel coating the surface of the copper powder is less than 0.01 μm, the surface of the copper powder is coated with aluminum or nickel. It cannot be completely covered with nickel, making it difficult to effectively prevent oxidation of copper powder.
The tend is exceeded and the electric resistance of the wiring conductor 2 becomes large. Therefore, it is preferable that the thickness of the aluminum or nickel coating the surface of the copper powder to be the wiring conductor 2 be in the range of 0.01 μm to 10 μm.

【0027】かくして本発明の配線基板によれば、絶縁
基体1の凹部1d底面に半導体素子3を樹脂等の接着剤
を介して接着固定するとともに半導体素子3の各電極を
ボンディングワイヤ4を介して配線導体2に電気的に接
続し、最後に前記絶縁基体1の上面に蓋体5を樹脂等か
ら成る封止材を介して接合させ、絶縁基体1と蓋体5と
から成る容器内部に半導体素子3を気密に収容すること
により製品としての半導体装置が完成する。
Thus, according to the wiring board of the present invention, the semiconductor element 3 is bonded and fixed to the bottom surface of the concave portion 1d of the insulating base 1 with an adhesive such as a resin, and each electrode of the semiconductor element 3 is bonded via the bonding wire 4. It is electrically connected to the wiring conductor 2, and finally, the lid 5 is joined to the upper surface of the insulating base 1 via a sealing material made of resin or the like, and the semiconductor is placed inside the container formed of the insulating base 1 and the lid 5. The semiconductor device as a product is completed by housing the element 3 in an airtight manner.

【0028】次に前記半導体素子収納用パッケージに使
用される配線基板の製造方法について図2に基づき説明
する。
Next, a method of manufacturing a wiring board used for the semiconductor element storage package will be described with reference to FIG.

【0029】先ず、図2(a)に示すように三枚の前駆
体シート11a、11b、11cを準備する。
First, as shown in FIG. 2A, three precursor sheets 11a, 11b and 11c are prepared.

【0030】前記三枚の前駆体シート11a、11b、
11cは、無機絶縁物粉末を熱硬化性樹脂前駆体で結合
することによって形成されており、例えば、粒径が0.
1μm〜100μm程度の酸化珪素粉末にビスフェノー
ルA型エポキシ樹脂、ノボラック型エポキシ樹脂、グリ
シジルエステル型エポキシ樹脂等のエポキシ樹脂及びア
ミン系硬化剤、イミダゾール系硬化剤、酸無水物系硬化
剤等の硬化剤を添加混合してペースト状となし、しかる
後、このペーストをシート状になすとともに約25〜1
00℃の温度で1〜60分間加熱し、半硬化させること
によって製作される。
The three precursor sheets 11a, 11b,
11c is formed by bonding an inorganic insulating powder with a thermosetting resin precursor, and for example, has a particle size of 0.1.
1μm~100μm about silicon oxide powder of bisphenol A type epoxy resins, novolac rack type epoxy resin, epoxy resin and amine curing agent such as glycidyl ester type epoxy resin, imidazole curing agent, such as an acid anhydride curing agent A hardener is added and mixed to form a paste, and thereafter, the paste is formed into a sheet and about 25 to 1
It is manufactured by heating at a temperature of 00 ° C. for 1 to 60 minutes and semi-curing.

【0031】次に図2(b)に示すように前記三枚の前
駆体シート11a、11b、11cのうち二枚の前駆体
シート11a、11bに半導体素子3を収容する凹部1
dとなる開口A、A’を、二枚の前駆体シート11b、
11cに配線導体2を引き回すための貫通孔B、B’を
各々形成する。
Next, as shown in FIG. 2 (b), two of the three precursor sheets 11a, 11b, 11c have the recess 1 for accommodating the semiconductor element 3 in the two precursor sheets 11a, 11b.
The openings A and A ′ to be d are formed by two precursor sheets 11b,
11c, through holes B and B 'for routing the wiring conductor 2 are respectively formed.

【0032】前記開口A、A’及び貫通孔B、B’は、
前駆体シート11a、11b、11cに従来周知のパン
チング加工法を施し、前駆体シート11a、11b、1
1cの各々に所定形状の孔を穿孔することによって形成
される。
The openings A and A 'and the through holes B and B'
The precursor sheets 11a, 11b, and 11c are subjected to a conventionally known punching method, and the precursor sheets 11a, 11b, and 1c are subjected to punching.
1c is formed by piercing a hole of a predetermined shape.

【0033】次に図2(c)に示すように、前記前駆体
シート11b、11cの上下面及び貫通孔B、B’内に
配線導体2となる金属ペースト12を従来周知のスクリ
ーン印刷法及び充填法を採用して所定パターンに印刷塗
布するとともにこれを所定温度で熱処理し、半硬化させ
る。
Next, as shown in FIG. 2C, a metal paste 12 to be the wiring conductor 2 is formed on the upper and lower surfaces of the precursor sheets 11b and 11c and in the through holes B and B 'by a screen printing method known in the art. A predetermined pattern is printed and applied by using a filling method, and this is heat-treated at a predetermined temperature to be semi-cured.

【0034】前記配線導体2となる金属ペースト12と
しては、例えば、表面が厚さ0.01μm乃至10μm
のアルミニウムもしくはニッケルで被覆された粒径が
0.1〜20μm程度の銅粉末に、ビスフェノールA型
エポキシ樹脂、ノボラック型エポキシ樹脂、グリシジル
エステル型エポキシ樹脂等のエポキシ樹脂及びアミン系
硬化剤、イミダゾール系硬化剤、酸無水物系硬化剤等の
硬化剤を添加混合してペースト状となしたものが使用さ
れる。
The metal paste 12 serving as the wiring conductor 2 has, for example, a surface thickness of 0.01 μm to 10 μm.
Copper powder coated with aluminum or nickel and having a particle size of about 0.1 to 20 μm, epoxy resin such as bisphenol A type epoxy resin, novolak type epoxy resin, glycidyl ester type epoxy resin, amine type curing agent, imidazole type A paste obtained by adding and mixing a curing agent such as a curing agent and an acid anhydride-based curing agent is used.

【0035】そして最後に前記三枚の半硬化された前駆
体シート11a、11b、11cを上下に積層するとと
もにこれを約80〜300℃の温度で約10秒〜24時
間加熱し、前記前駆体シート11a、11b、11cの
熱硬化性樹脂前駆体と前駆体シート11b、11cに所
定パターンに印刷塗布された金属ペースト12の熱硬化
性樹脂前駆体とを完全に熱硬化させることによって図1
に示すような絶縁基体1に配線導体2を被着させた配線
基板が完成する。この場合、前記前駆体シート11a、
11b、11c及び金属ペースト12は、熱硬化時に収
縮することは殆どなく、従って、得られる配線基板に変
形や寸法にばらつきを発生させることも殆どない。
Finally, the three semi-cured precursor sheets 11a, 11b, and 11c are vertically stacked and heated at a temperature of about 80 to 300 ° C. for about 10 seconds to 24 hours. By completely thermosetting the thermosetting resin precursor of the sheets 11a, 11b and 11c and the thermosetting resin precursor of the metal paste 12 printed and applied in a predetermined pattern on the precursor sheets 11b and 11c, FIG.
A wiring board in which a wiring conductor 2 is adhered to an insulating base 1 as shown in FIG. In this case, the precursor sheet 11a,
11b, 11c and the metal paste 12 hardly shrink during thermosetting, and therefore hardly cause deformation or dimensional variation in the obtained wiring board.

【0036】かくして、本発明の配線基板の製造方法よ
れば、絶縁基体1に変形や寸法にばらつきのない配線基
板を提供することが可能となる。
Thus, according to the method for manufacturing a wiring board of the present invention, it is possible to provide a wiring board in which the insulating base 1 has no deformation or variation in dimensions.

【0037】尚、本発明は、上述の実施例に限定される
ものではなく、本発明の要旨を逸脱しない範囲であれ
ば、種々の変更は可能であり、例えば上述の実施例で
は、本発明の配線基板を半導体素子を収容する半導体素
子収納用パッケージに適用した場合を例に採って説明し
たが、例えば混成集積回路等他の用途に使用される配線
基板に適用してもよい。
It should be noted that the present invention is not limited to the above-described embodiment, and various changes can be made without departing from the scope of the present invention. Although the description has been given by taking as an example the case where the wiring board is applied to a semiconductor element housing package for housing a semiconductor element, the wiring board may be applied to a wiring board used for other purposes such as a hybrid integrated circuit.

【0038】また、上述の実施例では、三枚の前駆体シ
ートを積層することによって配線基板を製作したが、一
枚や二枚、あるいは四枚以上の前駆体シートを使用して
配線基板を製作してもよい。
In the above-described embodiment, the wiring board is manufactured by laminating three precursor sheets. However, the wiring board is formed by using one, two, or four or more precursor sheets. May be manufactured.

【0039】[0039]

【発明の効果】本発明の配線基板によれば、絶縁基体が
無機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合する
ことによって形成されていることから配線基板同士ある
いは配線基板と半導体装置製作自動ラインの一部とが激
しく衝突しても絶縁基体に欠けや割れ、クラック等が発
生することはない。
According to the wiring board of the present invention, since the insulating base is formed by bonding the inorganic insulating powder with a thermosetting resin having excellent toughness, the wiring boards are mutually connected or the wiring board and the semiconductor device are manufactured. Even if a part of the automatic line collides violently, the insulating substrate will not be chipped, cracked or cracked.

【0040】また本発明の配線基板によれば、絶縁基体
の無機絶縁物粉末の含有量を60重量%乃至95重量%
の範囲としておくと、絶縁基体の機械的強度を強いもの
としつつ絶縁基体の熱膨脹係数を搭載される半導体素子
熱膨脹係数に近似させ、熱膨脹係数応力によって半導
体素子に割れや欠け等が発生するのを有効に防止するこ
とができる。
Further, according to the wiring substrate of the present invention, the content of the inorganic insulating powder in the insulating base is set to 60% by weight to 95% by weight.
The semiconductor element mounted with the thermal expansion coefficient of the insulating base while increasing the mechanical strength of the insulating base.
, And it is possible to effectively prevent the semiconductor element from being cracked or chipped due to the thermal expansion coefficient stress.

【0041】更に本発明の配線基板によれば、配線導体
を形成する銅粉末の表面をニッケルもしくはアルミニウ
ムで0.01μm乃至10μmの厚みに被覆したことか
ら銅粉末の不要な酸化が防止されて配線導体の電気抵抗
を低抵抗のものとなすことができる。
Further, according to the wiring board of the present invention, since the surface of the copper powder forming the wiring conductor is coated with nickel or aluminum to a thickness of 0.01 to 10 μm, unnecessary oxidation of the copper powder is prevented, and The electric resistance of the conductor can be low.

【0042】また更に本発明の配線基板の製造方法によ
れば、熱硬化性樹脂前駆体と無機絶縁物粉末とを混合し
た絶縁基体と成る前駆体シートを準備する工程と、前記
前駆体シートに、表面がアルミニウムもしくはニッケル
で被覆された銅粉末と熱硬化性樹脂前駆体とを混合した
配線導体となる金属ペーストを所定パターンに印刷する
工程と、前記前駆体シートを加熱して半硬化させる工程
と、前記金属ペーストが印刷された半硬化の前記前駆体
シートを複数枚上下に積層するとともにこれを加熱して
前記前駆体シートの熱硬化性樹脂前駆体及び前記金属ペ
ーストの熱硬化性樹脂前駆体を熱硬化させる工程とで製
作され、焼成工程がないことから不均一な焼成収縮によ
る変形や寸法のばらつきが発生することもない。
Further, according to the method for manufacturing a wiring board of the present invention, a step of preparing a precursor sheet serving as an insulating base obtained by mixing a thermosetting resin precursor and an inorganic insulating powder; Printing a metal paste to be a wiring conductor obtained by mixing a copper powder coated with aluminum or nickel and a thermosetting resin precursor in a predetermined pattern, and heating the precursor sheet to semi-curing
And the semi-cured precursor on which the metal paste is printed
Fabricated a thermosetting resin precursor is heated to <br/> the precursor sheet of a thermosetting resin precursor and the metal paste it as well as laminated sheets on a plurality down in the step of thermal curing, Since there is no firing step, there is no deformation or dimensional variation due to uneven firing shrinkage.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の配線基板を半導体素子収納用パッケー
ジに適用した場合の一実施例を示す断面図である。
FIG. 1 is a sectional view showing an embodiment in which a wiring board of the present invention is applied to a package for housing a semiconductor element.

【図2】本発明の配線基板の製造方法を説明するための
工程毎の断面図である。
FIG. 2 is a cross-sectional view of each process for explaining the method for manufacturing a wiring board of the present invention.

【符号の説明】[Explanation of symbols]

1・・・絶縁基体 2・・・配線導体 11・・・前駆体シート 12・・・金属ペースト DESCRIPTION OF SYMBOLS 1 ... Insulating base 2 ... Wiring conductor 11 ... Precursor sheet 12 ... Metal paste

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) H05K 1/02,1/03,1/09 H05K 3/12,3/46 H01L 23/12,23/14 H01B 1/00 - 1/24 ────────────────────────────────────────────────── ─── Continued on the front page (58) Field surveyed (Int.Cl. 7 , DB name) H05K 1 / 02,1 / 03,1 / 09 H05K 3 / 12,3 / 46 H01L 23 / 12,23 / 14 H01B 1/00-1/24

Claims (5)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】無機絶縁物粉末を熱硬化性樹脂により結合
して成り、前記無機絶縁物粉末を前記熱硬化性樹脂の前
駆体で結合して成る前駆体シートを半硬化させてその複
数枚を積層して熱硬化させた、前記無機絶縁物粉末を前
記熱硬化性樹脂により結合した複数枚の絶縁基板を積層
して成る絶縁基体の前記絶縁基板に、半硬化の前記前駆
体シートとともに熱硬化させた、表面がアルミニウムも
しくはニッケルで被覆された銅粉末を熱硬化性樹脂で結
合して成る配線導体を被着させて成ることを特徴とする
配線基板。
An inorganic insulating powder is bonded by a thermosetting resin , and said inorganic insulating powder is bonded to said thermosetting resin in front of said thermosetting resin.
The precursor sheet, which is bonded by the precursor, is semi-cured and
The above-mentioned inorganic insulating powder, which is obtained by laminating several sheets and thermally curing, is
Laminate multiple insulating substrates bonded by thermosetting resin
The semi-cured precursor is provided on the insulating substrate of the insulating substrate
A wiring board with the body sheet was thermally cured, the surface is characterized in that the copper powder coated with aluminum or nickel made by depositing a wiring conductor formed by combining a thermosetting resin.
【請求項2】前記絶縁基体に含有される前記無機絶縁物
粉末の量が前記絶縁基体の全重量に対し60重量%乃至
95重量%であることを特徴とする請求項1に記載の配
線基板。
2. A wiring board according to claim 1 wherein the amount of said inorganic insulator powder contained in the insulating substrate is the a total weight 60% to 95% by weight relative to the insulating substrate .
【請求項3】前記表面がアルミニウムもしくはニッケル
で被覆された銅粉末の粒径が0.1μm乃至50μmで
あることを特徴とする請求項1に記載の配線基板。
3. The wiring substrate according to claim 1, wherein said copper powder having a surface coated with aluminum or nickel has a particle size of 0.1 μm to 50 μm.
【請求項4】前記銅粉末の表面を被覆するアルミニウム
もしくはニッケルの厚みが0.01μm乃至10μmで
あることを特徴とする請求項1に記載の配線基板。
4. The wiring board according to claim 1, wherein the thickness of aluminum or nickel covering the surface of the copper powder is 0.01 μm to 10 μm.
【請求項5】熱硬化性樹脂前駆体と無機絶縁物粉末とを
混合した絶縁基体と成る前駆体シートを準備する工程
と、前記前駆体シートに、表面がアルミニウムもしくは
ニッケルで被覆された銅粉末と熱硬化性樹脂前駆体とを
混合した配線導体となる金属ペーストを所定パターンに
印刷する工程と、前記前駆体シートを加熱して半硬化さ
せる工程と、前記金属ペーストが印刷された半硬化の前
記前駆体シートを複数枚上下に積層するとともにこれを
加熱して前記前駆体シートの熱硬化性樹脂前駆体及び
金属ペーストの熱硬化性樹脂前駆体を熱硬化させる工
程と、から成ることを特徴とする配線基板の製造方法。
5. A step of preparing a precursor sheet serving as an insulating substrate in which a thermosetting resin precursor and an inorganic insulator powder are mixed, and a copper powder whose surface is coated with aluminum or nickel on the precursor sheet. Printing a metal paste to be a wiring conductor mixed with a thermosetting resin precursor in a predetermined pattern, and heating the precursor sheet to be semi-cured.
And before the semi-curing on which the metal paste is printed
The precursor sheets are stacked one above the other and
Heating said precursor thermosetting resin precursor and the previous sheet
Method for manufacturing a wiring substrate, characterized by comprising a thermosetting resin precursor serial metal paste from the step of heat curing.
JP33516995A 1995-09-22 1995-12-22 Wiring board and method of manufacturing the same Expired - Fee Related JP3297574B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP33516995A JP3297574B2 (en) 1995-12-22 1995-12-22 Wiring board and method of manufacturing the same
US08/717,119 US5837356A (en) 1995-09-22 1996-09-20 Wiring board and method for manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33516995A JP3297574B2 (en) 1995-12-22 1995-12-22 Wiring board and method of manufacturing the same

Publications (2)

Publication Number Publication Date
JPH09181213A JPH09181213A (en) 1997-07-11
JP3297574B2 true JP3297574B2 (en) 2002-07-02

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101009176B1 (en) * 2008-03-18 2011-01-18 삼성전기주식회사 A fabricating method of multilayer printed circuit board

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