JPH0992947A - Wiring board and manufacture thereof - Google Patents
Wiring board and manufacture thereofInfo
- Publication number
- JPH0992947A JPH0992947A JP24446995A JP24446995A JPH0992947A JP H0992947 A JPH0992947 A JP H0992947A JP 24446995 A JP24446995 A JP 24446995A JP 24446995 A JP24446995 A JP 24446995A JP H0992947 A JPH0992947 A JP H0992947A
- Authority
- JP
- Japan
- Prior art keywords
- melting point
- metal
- powder
- thermosetting resin
- precursor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48225—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
- H01L2224/48227—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0132—Binary Alloys
- H01L2924/01322—Eutectic Alloys, i.e. obtained by a liquid transforming into two solid phases
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1515—Shape
- H01L2924/15153—Shape the die mounting substrate comprising a recess for hosting the device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/161—Cap
- H01L2924/1615—Shape
- H01L2924/16195—Flat cap [not enclosing an internal cavity]
Landscapes
- Parts Printed On Printed Circuit Boards (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は半導体素子を収容す
るための半導体素子収納用パッケージや混成集積回路基
板等に用いられる配線基板に関するものである。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor device housing package for housing a semiconductor device and a wiring board used for a hybrid integrated circuit board.
【0002】[0002]
【従来の技術】従来、配線基板、例えば半導体素子収納
用パッケージを収容する半導体素子収納用パッケージに
使用される配線基板として比較的高密度の配線が可能な
積層セラミック配線基板が多用されている。この配線基
板は、酸化アルミニウム質焼結体等のセラミックスより
成り、その上面中央部に半導体素子を収容する凹部を有
する絶縁基体と、前記絶縁基体の凹部周辺から下面にか
けて導出されたタングステン、モリブデン等の高融点金
属粉末から成る配線導体とから構成されており、前記絶
縁基体の凹部底面に半導体素子をガラス、樹脂、ロウ材
等の接着剤を介して接着固定するとともに該半導体素子
の各電極を例えばボンディングワイヤ等の電気的接続手
段を介して配線導体に電気的に接続し、しかる後、前記
絶縁基体の上面に、金属やセラミックス等から成る蓋体
を絶縁基体の凹部を塞ぐようにしてガラス、樹脂、ロウ
材等の封止材を介して接合させ、絶縁基体の凹部内に半
導体素子を気密に収容することによって製品としての半
導体装置となる。2. Description of the Related Art Hitherto, as a wiring board used for a wiring board, for example, a semiconductor element housing package for housing a semiconductor element housing package, a laminated ceramic wiring board capable of relatively high-density wiring has been widely used. This wiring board is made of ceramics such as aluminum oxide sintered body, has an insulating base body having a recessed portion for accommodating a semiconductor element in the center of its upper surface, and tungsten, molybdenum, etc. led out from the periphery of the recessed portion of the insulating base material to the lower surface. And a wiring conductor made of a refractory metal powder, the semiconductor element is adhered and fixed to the bottom surface of the recess of the insulating substrate via an adhesive such as glass, resin, or brazing material, and each electrode of the semiconductor element is fixed. For example, it is electrically connected to a wiring conductor through an electrical connection means such as a bonding wire, and then a glass cover is formed on the upper surface of the insulating base so as to cover the recess of the insulating base. , A resin, a brazing material, and the like are bonded together, and the semiconductor element is hermetically housed in the concave portion of the insulating substrate. To become.
【0003】またこの従来の配線基板は、一般にセラミ
ックグリーンシート積層法によって製作され、具体的に
は、酸化アルミニウム、酸化珪素、酸化マグネシウム、
酸化カルシウム等のセラミック原料粉末に適当な有機バ
インダー、溶剤等を添加混合して泥漿状となすとともに
これを従来周知のドクターブレード法を採用しシート状
となすことによって複数のセラミックグリーンシートを
得、しかる後、前記セラミックグリーンシートに適当な
打ち抜き加工を施すとともに配線導体となる金属ペース
トを所定パターンに印刷塗布し、最後に前記セラミック
グリーンシートを所定の順に上下に積層してセラミック
生成形体となすとともに該セラミック生成形体を還元雰
囲気中、約1600℃の高温で焼成することによって製
作される。This conventional wiring board is generally manufactured by a ceramic green sheet laminating method. Specifically, aluminum oxide, silicon oxide, magnesium oxide,
A plurality of ceramic green sheets are obtained by adding a suitable organic binder, a solvent, etc. to a ceramic raw material powder such as calcium oxide to form a slurry and making it into a sheet shape by adopting a conventionally known doctor blade method. Thereafter, the ceramic green sheet is subjected to appropriate punching processing, a metal paste to be a wiring conductor is printed and applied in a predetermined pattern, and finally the ceramic green sheets are laminated vertically in a predetermined order to form a ceramic molded body. It is manufactured by firing the ceramic green body at a high temperature of about 1600 ° C. in a reducing atmosphere.
【0004】[0004]
【発明が解決しようとする課題】しかしながら、この従
来の配線基板は、絶縁基体を構成する酸化アルミニウム
質焼結体等のセラミックスが硬くて脆い性質を有するた
め、搬送工程や半導体装置製作の自動ライン等において
配線基板同士が、あるいは配線基板と半導体装置製作自
動ラインの一部とが激しく衝突すると絶縁基体に欠けや
割れ、クラック等が発生し、その結果、半導体素子を気
密に収容することができず、半導体素子を長期間わたり
正常、且つ安定に作動させることができなくなるという
欠点を有していた。However, in this conventional wiring board, since the ceramics such as the aluminum oxide sintered body forming the insulating substrate have the property of being hard and brittle, an automatic line for the carrying process and the semiconductor device manufacturing is provided. Etc., when the wiring boards collide with each other or between the wiring boards and a part of the semiconductor device manufacturing automatic line, a crack, crack, crack or the like occurs in the insulating substrate, and as a result, the semiconductor element can be housed in an airtight manner. Therefore, the semiconductor device has a drawback that it cannot operate normally and stably for a long period of time.
【0005】また前記配線基板の製造方法によれば、セ
ラミック生成形体を焼成する際、各セラミックグリーン
シートにおけるセラミック原料粉末の密度のバラツキに
起因してセラミック生成形体に不均一な焼成収縮が発生
して得られる配線基板に反り等の変形や寸法のバラツキ
が生じ、変形や寸法のバラツキが大きいと配線導体に断
線を招来するという欠点も有していた。Further, according to the method for manufacturing a wiring board, when firing the ceramic green body, uneven firing shrinkage occurs in the ceramic green body due to the variation in the density of the ceramic raw material powder in each ceramic green sheet. There is also a drawback that the resulting wiring board is deformed due to warpage or the like and the dimensions are varied, and if the deformation or the variations are large, the wiring conductor is broken.
【0006】[0006]
【課題を解決するための手段】本発明の配線基板は60
重量%乃至95重量%の無機絶縁物粉末と5重量%乃至
40重量%の熱硬化性樹脂とから成り、前記無機絶縁物
粉末を前記熱硬化性樹脂により結合した少なくとも1枚
の絶縁基板から成る絶縁基体に、金属粉末を融点が30
0℃以下の低融点金属で接合させて、あるいは融点が3
00℃以下の低融点金属粉末を相互に溶融接合させて形
成される金属部材と導電性で、且つ熱硬化性である樹脂
とから成る配線導体を被着させたことを特徴とするもの
である。A wiring board according to the present invention comprises 60
% To 95% by weight of inorganic insulating powder and 5% to 40% by weight of thermosetting resin, and at least one insulating substrate in which the inorganic insulating powder is bonded by the thermosetting resin. The melting point of the metal powder is 30 on the insulating substrate.
Bonded with a low melting point metal of 0 ° C or less, or with a melting point of 3
It is characterized in that a wiring conductor made of a metal member formed by melting and bonding low-melting-point metal powders of 00 ° C. or less to each other and a conductive and thermosetting resin is applied. .
【0007】また本発明の配線基板の製造方法は、熱硬
化性樹脂前駆体と無機絶縁物粉末とを混合して成る前駆
体シートを準備する工程と、前記前駆体シートに導電性
熱硬化性樹脂前駆体と、融点が300℃以下の低融点金
属粉末と金属粉末または融点が300℃以下の低融点金
属粉末とを混合して成る金属ペーストを所定パターンに
印刷する工程と、前記前駆体シート及び金属ペーストの
熱硬化性樹脂前駆体を加熱し、金属ペースト中の金属粉
末を融点が300℃以下の低融点金属粉末で接合させつ
つ、或いは融点が300℃以下の低融点金属粉末を相互
に接合させつつ前記前駆体シートの熱硬化性樹脂前駆体
及び金属ペーストの導電性熱硬化性樹脂前駆体を熱硬化
させる工程と、から成ることを特徴とするものである。Further, the method of manufacturing a wiring board of the present invention comprises a step of preparing a precursor sheet formed by mixing a thermosetting resin precursor and an inorganic insulating powder, and a conductive thermosetting resin for the precursor sheet. A step of printing a metal precursor formed by mixing a resin precursor, a low melting point metal powder having a melting point of 300 ° C. or lower and a metal powder or a low melting point metal powder having a melting point of 300 ° C. or lower in a predetermined pattern, and the precursor sheet And heating the thermosetting resin precursor of the metal paste to bond the metal powder in the metal paste with the low-melting metal powder having a melting point of 300 ° C. or lower, or the low-melting metal powder having a melting point of 300 ° C. or lower to each other. A step of thermally curing the thermosetting resin precursor of the precursor sheet and the conductive thermosetting resin precursor of the metal paste while bonding.
【0008】本発明の配線基板によれば、絶縁基体が無
機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合するこ
とによって形成されていることから配線基板同士あるい
は配線基板と半導体装置製作自動ラインの一部とが激し
く衝突しても絶縁基体に欠けや割れ、クラック等が発生
することはない。According to the wiring board of the present invention, since the insulating substrate is formed by bonding the inorganic insulating powder with the thermosetting resin having excellent toughness, the wiring boards are mutually connected or the wiring board and the semiconductor device manufacturing automatic line. Even if it collides violently with a part of the above, the insulating substrate will not be chipped, cracked, or cracked.
【0009】また本発明の配線基板によれば配線導体
を、金属粉末を融点が300℃以下の低融点金属で接合
させて、あるいは融点が300℃以下の低融点金属粉末
を相互に溶融接合させて形成される金属部材と導電性
で、且つ熱硬化性である樹脂とで形成したことから金属
粉末間あるいは融点が300℃以下の低融点金属粉末間
の電気的接続が確実となり、その結果、配線導体の電気
抵抗を低抵抗となすことができ、同時に配線導体の露出
する表面にメッキ金属層を良好に被着させ、配線導体の
表面をメッキ金属層で完全に被覆することができる。According to the wiring board of the present invention, the wiring conductor is formed by joining metal powders with a low melting point metal having a melting point of 300 ° C. or lower, or by melting low melting point metal powders having a melting point of 300 ° C. or lower with each other. Since it is formed of the metal member formed by the above and the resin which is conductive and thermosetting, the electric connection between the metal powders or the low melting point metal powders having a melting point of 300 ° C. or less is ensured, and as a result, The electric resistance of the wiring conductor can be made low, and at the same time, the exposed surface of the wiring conductor can be satisfactorily coated with the plated metal layer, and the surface of the wiring conductor can be completely covered with the plated metal layer.
【0010】更に本発明の配線基板は熱硬化性樹脂前駆
体と無機絶縁物粉末とを混合して成る前駆体シートを準
備する工程と、前記前駆体シートに導電性熱硬化性樹脂
前駆体と、融点が300℃以下の低融点金属粉末と金属
粉末または融点が300℃以下の低融点金属粉末とを混
合して成る金属ペーストを所定パターンに印刷する工程
と、前記前駆体シート及び金属ペーストの熱硬化性樹脂
前駆体を加熱し、金属ペースト中の金属粉末を融点が3
00℃以下の低融点金属粉末で接合させつつ、或いは融
点が300℃以下の低融点金属粉末を相互に接合させつ
つ前記前駆体シートの熱硬化性樹脂前駆体及び金属ペー
ストの導電性熱硬化性樹脂前駆体を熱硬化させる工程と
により配線基板を製作することから焼成に伴う不均一な
収縮による変形や寸法のばらつきが発生することはな
い。Further, the wiring board of the present invention comprises a step of preparing a precursor sheet formed by mixing a thermosetting resin precursor and an inorganic insulating powder, and a conductive thermosetting resin precursor on the precursor sheet. A step of printing a metal paste having a melting point of 300 ° C. or lower and a metal powder or a low melting point metal powder having a melting point of 300 ° C. or lower in a predetermined pattern, the precursor sheet and the metal paste. When the thermosetting resin precursor is heated, the melting point of the metal powder in the metal paste is 3
Conductive thermosetting of the thermosetting resin precursor of the precursor sheet and the metal paste while bonding with low melting point metal powder of 00 ° C. or lower or bonding of low melting point metal powder of 300 ° C. or lower with each other Since the wiring board is manufactured by the step of thermally curing the resin precursor, deformation and dimensional variation due to uneven shrinkage due to firing do not occur.
【0011】[0011]
【発明の実施の形態】次に本発明を添付図面に基づき詳
細に説明する。図1は本発明の配線基板を半導体素子を
収容する半導体素子収納用パッケージに適用した場合の
一実施例を示し、1は絶縁基体、2は配線導体である。
この配線導体2を絶縁基体1に被着させたものが配線基
板となる。DETAILED DESCRIPTION OF THE INVENTION The present invention will now be described in detail with reference to the accompanying drawings. FIG. 1 shows an embodiment in which the wiring board of the present invention is applied to a semiconductor element housing package for housing a semiconductor element, wherein 1 is an insulating substrate and 2 is a wiring conductor.
The wiring substrate is formed by attaching the wiring conductor 2 to the insulating substrate 1.
【0012】前記絶縁基体1は3枚の絶縁基板1a、1
b、1cを積層することによって形成されており、その
上面の中央部に半導体素子を収容するための凹部1dを
有し、該凹部1d底面には半導体素子3が樹脂等の接着
剤を介して接着固定される。The insulating substrate 1 comprises three insulating substrates 1a and 1a.
It is formed by laminating b and 1c, and has a recess 1d for accommodating a semiconductor element in the center of the upper surface thereof, and the semiconductor element 3 is provided on the bottom of the recess 1d via an adhesive such as resin. Adhesively fixed.
【0013】前記絶縁基体1を構成する3枚の絶縁基板
1a、1b、1cは例えば、酸化珪素、酸化アルミニウ
ム、窒化アルミニウム、炭化珪素、チタン酸バリウム、
チタン酸ストロンチウム、酸化チタン等の無機絶縁物粉
末をエポキシ樹脂、ポリイミド樹脂、ポリフェニレンエ
ーテル樹脂等の熱硬化性樹脂で結合することによって形
成されており、絶縁基体1を構成する3枚の絶縁基板1
a、1b、1cはその各々が無機絶縁物粉末を靱性に優
れる熱硬化性樹脂で結合することによって形成されてい
ることから絶縁基体1に外力が印加されても該外力によ
って絶縁基体1に欠けや割れ、クラック等が発生するこ
とはない。The three insulating substrates 1a, 1b, 1c constituting the insulating base 1 are, for example, silicon oxide, aluminum oxide, aluminum nitride, silicon carbide, barium titanate,
It is formed by bonding inorganic insulating material powders such as strontium titanate and titanium oxide with a thermosetting resin such as epoxy resin, polyimide resin, polyphenylene ether resin, etc.
Since each of a, 1b, and 1c is formed by binding an inorganic insulating powder with a thermosetting resin having excellent toughness, even if an external force is applied to the insulating base 1, the insulating base 1 is chipped by the external force. No cracks, cracks, etc. will occur.
【0014】尚、前記無機絶縁物粉末を熱硬化性樹脂で
結合して成る絶縁基体1を構成する3枚の絶縁基板1
a、1b、1cは無機絶縁物粉末の含有量が60重量%
未満であると絶縁基体1の熱膨張係数が半導体素子3の
熱膨張係数に対して大きく相違し、半導体素子3が作動
時に熱を発し、該熱が半導体素子3と絶縁基体1の両者
に印加されると両者間に両者の熱膨張係数の相違に起因
する大きな熱応力が発生し、この大きな熱応力によって
半導体素子3が絶縁基体1より剥離したり、半導体素子
3に割れや欠け等が発生してしまう。また95重量%を
越えると無機絶縁物粉末を熱硬化性樹脂で完全に結合さ
せることができず、所定の絶縁基板1a、1b、1cを
得ることができなくなる。従って、前記絶縁基体1を構
成する絶縁基板1a、1b、1cはその各々の内部に含
有される無機絶縁物粉末の量が60乃至95重量%の範
囲に特定される。In addition, three insulating substrates 1 constituting an insulating substrate 1 formed by bonding the inorganic insulating powders with a thermosetting resin.
a, 1b, and 1c each have a content of the inorganic insulating powder of 60% by weight.
When it is less than the above, the coefficient of thermal expansion of the insulating substrate 1 greatly differs from the coefficient of thermal expansion of the semiconductor element 3, the semiconductor element 3 emits heat during operation, and the heat is applied to both the semiconductor element 3 and the insulating substrate 1. Then, a large thermal stress is generated between them due to the difference in thermal expansion coefficient between the two, and the semiconductor element 3 is separated from the insulating substrate 1 due to the large thermal stress, or the semiconductor element 3 is cracked or chipped. Resulting in. If it exceeds 95% by weight, the inorganic insulating powder cannot be completely bonded with the thermosetting resin, and the predetermined insulating substrates 1a, 1b, and 1c cannot be obtained. Therefore, the insulating substrates 1a, 1b, 1c constituting the insulating base 1 are specified such that the amount of the inorganic insulating powder contained therein is in the range of 60 to 95% by weight.
【0015】また前記絶縁基体1はその凹部1d周辺か
ら下面にかけて配線導体2が被着形成されており、該配
線導体2は銅から成る金属粉末を融点が300℃以下の
錫から成る低融点金属で接合させて、或いは鉛ー錫の共
晶半田から成る融点が300℃以下の低融点金属粉末を
相互に溶融接合させて形成される金属部材と導電性で、
且つ熱硬化性である樹脂とで構成されている。A wiring conductor 2 is formed on the insulating substrate 1 from the periphery of the recess 1d to the lower surface thereof. The wiring conductor 2 is made of a metal powder made of copper and a low melting point metal made of tin having a melting point of 300 ° C. or less. And conductive with a metal member formed by joining or melting low melting point metal powders of lead-tin eutectic solder with melting points of 300 ° C. or less to each other,
It is also composed of a thermosetting resin.
【0016】前記配線導体2は半導体素子3の電極を外
部電気回路に接続する作用を為し、絶縁基体1の凹部1
d周辺部位に位置する配線導体2には半導体素子3の各
電極がボンディングワイヤ4を介して電気的に接続さ
れ、また絶縁基体1の下面に導出される部位は外部電気
回路に電気的に接続される。The wiring conductor 2 serves to connect the electrode of the semiconductor element 3 to an external electric circuit, and the recess 1 of the insulating substrate 1 is formed.
d Each electrode of the semiconductor element 3 is electrically connected to the wiring conductor 2 located in the peripheral portion via the bonding wire 4, and the portion led out to the lower surface of the insulating substrate 1 is electrically connected to the external electric circuit. To be done.
【0017】前記配線導体2はまた金属粉末を融点が3
00℃以下の低融点金属で接合させて、或いは融点が3
00℃以下の低融点金属粉末を相互に溶融接合させて形
成される金属部材と導電性で、且つ熱硬化性である樹脂
とで構成されているため各金属粉末間あるいは融点が3
00℃以下の低融点金属粉末間の電気的接続が確実とな
り、その結果、配線導体2の電気抵抗を低抵抗となすこ
とができる。The wiring conductor 2 also contains metal powder having a melting point of 3
Bonded with a low melting point metal of 00 ° C or less, or with a melting point of 3
Since it is composed of a metal member formed by melting and joining low-melting-point metal powders of 00 ° C. or less to each other and a resin that is conductive and thermosetting, the metal powders have melting points or melting points of 3 or less.
The electrical connection between the low-melting-point metal powders of 00 ° C. or less is ensured, and as a result, the electrical resistance of the wiring conductor 2 can be reduced.
【0018】更に前記配線導体2は金属粉末を融点が3
00℃以下の低融点金属で接合させて、或いは融点が3
00℃以下の低融点金属粉末を相互に溶融接合させて形
成される金属部材と導電性で、且つ熱硬化性である樹脂
とで構成されているため露出する表面に良導電性で、且
つロウ材と濡れ性が良いニッケル、金等の金属を電解メ
ッキ法により所定厚みに層着させることができ、これに
よって配線導体2とボンディングワイヤ4との接合を強
固とし、半導体素子3の各電極を配線導体2にボンディ
ングワイヤ4を介して確実、強固に電気的接続すること
ができる。Further, the wiring conductor 2 is made of metal powder and has a melting point of 3
Bonded with a low melting point metal of 00 ° C or less, or with a melting point of 3
Since it is composed of a metal member formed by melting and joining low-melting-point metal powders of 00 ° C. or less to each other and a resin that is conductive and thermosetting, the exposed surface has good conductivity and wax. A material such as nickel or gold having good wettability can be layered by electroplating to a predetermined thickness, thereby strengthening the bonding between the wiring conductor 2 and the bonding wire 4 and connecting each electrode of the semiconductor element 3 to each other. The wiring conductor 2 can be reliably and firmly electrically connected via the bonding wire 4.
【0019】尚、前記配線基板2の内部に含有される金
属粉末や融点が300℃以下の低融点金属粉末はその総
量が配線導体2の全重量に対し、70重量%未満となる
と低融点金属による金属粉末間の接合、或いは低融点金
属粉末同士の良好な接合が困難となって配線導体2の電
気抵抗が高くなってしまい、また95重量%を越えると
配線導体2を絶縁基体1に強固に被着させることが困難
となる傾向にある。従って、前記配線導体2に含有され
る金属粉末や融点が300℃以下の低融点金属粉末はそ
の総量が配線導体2の全重量に対し70重量%乃至95
重量%の範囲としておくことが好ましい。When the total amount of the metal powder contained in the wiring board 2 and the low melting point metal powder having a melting point of 300 ° C. or less is less than 70% by weight based on the total weight of the wiring conductor 2, the low melting point metal is formed. It becomes difficult to join the metal powders with each other or to join the low melting point metal powders well, and the electric resistance of the wiring conductor 2 becomes high, and when it exceeds 95% by weight, the wiring conductor 2 is firmly bonded to the insulating substrate 1. It tends to be difficult to apply to. Therefore, the total amount of the metal powder contained in the wiring conductor 2 and the low melting point metal powder having a melting point of 300 ° C. or less is 70% by weight to 95% with respect to the total weight of the wiring conductor 2.
It is preferable to set it in the range of weight%.
【0020】また前記配線導体2に含有される金属粉末
や融点が300℃以下の低融点金属粉末はその平均粒径
が0.1μm未満となると金属粉末や低融点金属粉末が
凝集して均一な分散が得られなくなり、また50μmを
越えると配線導体2の幅を一般的に要求される50μm
乃至200μmの範囲とするのが困難となる傾向にあ
る。従って、前記配線導体2に含有される金属粉末や融
点が300℃以下の低融点金属粉末はその平均粒径を
0.1μm乃至50μmの範囲としておくことが好まし
い。When the average particle diameter of the metal powder or the low melting point metal powder having a melting point of 300 ° C. or less contained in the wiring conductor 2 is less than 0.1 μm, the metal powder and the low melting point metal powder are aggregated and uniform. When the dispersion is not obtained and the width exceeds 50 μm, the width of the wiring conductor 2 is generally required to be 50 μm.
It tends to be difficult to set the thickness to the range of 200 to 200 μm. Therefore, it is preferable that the metal powder contained in the wiring conductor 2 and the low melting point metal powder having a melting point of 300 ° C. or less have an average particle size in the range of 0.1 μm to 50 μm.
【0021】更に前記配線導体2を構成する導電性で、
且つ熱硬化性である樹脂としてはエポキシ樹脂やフェノ
ール樹脂、ポリイミド樹脂等の熱硬化性樹脂にポリアセ
チレン系樹脂やポリフェニレン樹脂等の導電性を有する
樹脂を配合することによって得られる。In addition, the conductive material that constitutes the wiring conductor 2,
The thermosetting resin is obtained by blending a thermosetting resin such as an epoxy resin, a phenol resin, or a polyimide resin with a conductive resin such as a polyacetylene-based resin or a polyphenylene resin.
【0022】かくして上述の配線基板によれば、絶縁基
体1の凹部1d底面に半導体素子3を樹脂等の接着剤を
介して接着固定するとともに半導体素子3の各電極をボ
ンディングワイヤ4を介して配線導体2に電気的に接続
し、しかる後、絶縁基体1の上面に蓋体5を樹脂等から
成る封止材を介して接合させ、絶縁基体1と蓋体5とか
ら成る容器内部に半導体素子3を気密に収容することに
よって製品としての半導体装置が完成する。Thus, according to the above wiring board, the semiconductor element 3 is adhered and fixed to the bottom surface of the recess 1d of the insulating substrate 1 with an adhesive such as resin, and each electrode of the semiconductor element 3 is wired with the bonding wire 4. After electrically connecting to the conductor 2, the lid 5 is joined to the upper surface of the insulating base 1 via a sealing material made of resin or the like, and the semiconductor element is placed inside the container made up of the insulating base 1 and the lid 5. A semiconductor device as a product is completed by hermetically containing 3 therein.
【0023】次に前記半導体素子収納用パッケージに使
用される配線基板の製造方法について図2に基づき説明
する。Next, a method of manufacturing the wiring board used for the semiconductor element housing package will be described with reference to FIG.
【0024】まず図2(a)に示すように3枚の前駆体
シート11a、11b、11cを準備する。First, as shown in FIG. 2A, three precursor sheets 11a, 11b and 11c are prepared.
【0025】前記3枚の前駆体シート11a、11b、
11cは無機絶縁物粉末を熱硬化性樹脂前駆体で結合す
ることによって形成されており、例えば粒径が0.1〜
100μmの酸化珪素粉末に、ビスフェノールA型エポ
キシ樹脂、ノボラック型エポキシ樹脂、グリシジルエス
テル型エポキシ樹脂等のエポキシ樹脂及びアミン系硬化
剤、イミダゾール系硬化剤、酸無水物系硬化剤等の硬化
剤を添加混合してペースト状となし、しかる後、このペ
ーストをシート状になすとともに約25〜100℃の温
度で1〜60分間加熱し、半硬化させることによって製
作される。The three precursor sheets 11a, 11b,
11c is formed by bonding inorganic insulating powder with a thermosetting resin precursor, and has a particle size of 0.1 to 0.1, for example.
Epoxy resin such as bisphenol A type epoxy resin, novolac type epoxy resin, glycidyl ester type epoxy resin, etc. and amine type curing agent, imidazole type curing agent, acid anhydride type curing agent, etc. are added to 100 μm silicon oxide powder. It is manufactured by mixing to form a paste, and then forming the paste into a sheet and heating at a temperature of about 25 to 100 ° C. for 1 to 60 minutes to semi-cure.
【0026】次に図2(b)に示すように前記3枚の前
駆体シート11a、11b、11cのうち2枚の前駆体
シート11a、11bに半導体素子3を収容する凹部1
dとなる開口A、A’を、2枚の前駆体シート11b、
11cに配線導体2を引き回すための貫通孔B、B’を
各々形成する。Next, as shown in FIG. 2B, the recess 1 for accommodating the semiconductor element 3 in the two precursor sheets 11a, 11b among the three precursor sheets 11a, 11b, 11c.
The openings A and A ′ to be the d are formed by the two precursor sheets 11b,
Through holes B and B'for routing the wiring conductor 2 are formed in 11c.
【0027】前記開口A、A’及び貫通孔B、B’は前
駆体シート11a、11b、11cに従来周知のパンチ
ング加工法を施し、前駆体シート11a、11b、11
cの各々に所定形状の孔を穿孔することによって形成さ
れる。The openings A, A'and the through holes B, B'are formed by subjecting the precursor sheets 11a, 11b, 11c to a well-known punching process to obtain the precursor sheets 11a, 11b, 11 '.
c is formed by piercing a hole of a predetermined shape in each of c.
【0028】次に図2(c)に示すように、前記前駆体
シート11b、11cの上下面及び貫通孔B、B’内に
配線導体2となる金属ペースト12を従来周知のスクリ
ーン印刷法により所定パターンに印刷塗布するとともに
これを約25〜100℃の温度で1〜60分間加熱し半
硬化させることによって製作される。Next, as shown in FIG. 2 (c), a metal paste 12 to be the wiring conductor 2 is formed on the upper and lower surfaces of the precursor sheets 11b and 11c and in the through holes B and B'by a conventionally known screen printing method. It is manufactured by applying a predetermined pattern by printing and heating it at a temperature of about 25 to 100 ° C. for 1 to 60 minutes to semi-cure it.
【0029】前記金属ペースト12としては例えば、金
属粉末として粒径が0.1μm〜20μm程度の銅粉末
に、粒径が0.1μm〜20μm程度の錫から成る低融
点金属粉末を、前記銅粉末と低融点金属粉末とが重量比
で95:5〜5:95の割合に混合されたもの、或いは
粒径が1μm〜50μm程度の鉛ー錫の共晶半田から成
る低融点金属粉末に、ビスフェノールA型エポキシ樹
脂、ノボラック型エポキシ樹脂、グリシジルエステル型
エポキシ樹脂等のエポキシ樹脂に導電性を有するポリア
セチレン系樹脂やポリフェニレン樹脂等を配合させると
ともにアミン系硬化剤、イミダゾール系硬化剤、酸無水
物系硬化剤等の硬化剤を添加した導電性熱硬化性樹脂前
駆体を混合させてペースト状となしたものが使用され
る。As the metal paste 12, for example, a copper powder having a particle size of about 0.1 μm to 20 μm as a metal powder, and a low melting point metal powder made of tin having a particle size of about 0.1 μm to 20 μm is used as the copper powder. And a low melting point metal powder mixed in a weight ratio of 95: 5 to 5:95, or a low melting point metal powder composed of lead-tin eutectic solder having a particle size of about 1 μm to 50 μm, and bisphenol. A type epoxy resin, novolac type epoxy resin, glycidyl ester type epoxy resin, or other epoxy resin is mixed with conductive polyacetylene type resin or polyphenylene resin, and an amine type curing agent, imidazole type curing agent, acid anhydride type curing agent A paste is prepared by mixing a conductive thermosetting resin precursor containing a curing agent such as a curing agent.
【0030】そして最後に前記3枚の前駆体シート11
a、11b、11cを上下に積層するとともにこれを約
300℃の温度で約10秒〜24時間加熱し、前記金属
ペースト中の銅粉末を低融点金属粉末で接合させつつ、
或いは錫から成る低融点金属粉末を相互に接合させつつ
前駆体シート11a、11b、11cの熱硬化性樹等市
前駆体と、前駆体シート11b、11cに所定パターン
に印刷塗布された金属ペースト12の導電性熱硬化性樹
脂前駆体とを完全に熱硬化させることによって図1に示
すような絶縁基体1に配線導体2を被着させた半導体素
子収納用パッケージに使用される配線基板が完成する。
この場合、前記前駆体シート11a、11b、11c及
び金属ペースト12は熱硬化時に収縮することは殆どな
く、従って、得られる配線基板に変形や寸法にバラツキ
が発生せず、配線導体2に断線が招来するこはなく、配
線導体2を介して半導体素子3等の電極を外部電気回路
に確実に電気的接続することが可能となる。Finally, the three precursor sheets 11
While stacking a, 11b, and 11c on top of each other and heating them at a temperature of about 300 ° C. for about 10 seconds to 24 hours, while bonding the copper powder in the metal paste with the low melting point metal powder,
Alternatively, the thermosetting resin precursors of the precursor sheets 11a, 11b, 11c and the metal paste 12 printed and applied in a predetermined pattern on the precursor sheets 11b, 11c while bonding low melting point metal powders made of tin to each other. By completely thermosetting the conductive thermosetting resin precursor of (1), the wiring substrate used for the package for housing the semiconductor element in which the wiring conductor 2 is adhered to the insulating substrate 1 as shown in FIG. 1 is completed. .
In this case, the precursor sheets 11a, 11b, 11c and the metal paste 12 are hardly contracted at the time of thermosetting, so that the obtained wiring board is not deformed or the dimension is not varied, and the wiring conductor 2 is not broken. It is possible to reliably electrically connect the electrodes of the semiconductor element 3 and the like to the external electric circuit through the wiring conductor 2 without causing any trouble.
【0031】尚、本発明は上述の実施例に限定されるも
のではなく、本発明の要旨を逸脱しない範囲であれば種
々の変更は可能であり、例えば上述の実施例では本発明
の配線基板を半導体素子を収容する半導体素子収納用パ
ッケージに適用した場合を例に採って説明したが、これ
を混成集積回路基板に適用してもよい。The present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the gist of the present invention. For example, in the above-described embodiments, the wiring board of the present invention is used. In the above description, the case where the above is applied to a semiconductor element housing package that houses a semiconductor element has been described as an example, but this may be applied to a hybrid integrated circuit board.
【0032】また上述の実施例では3枚の前駆体シート
を積層することによって配線基板を製作したが、1枚や
2枚、あるいは4枚以上の前駆体シートを使用して配線
基板を製作してもよい。In the above-mentioned embodiment, the wiring board is manufactured by laminating the three precursor sheets. However, the wiring board is manufactured by using one, two, or four or more precursor sheets. May be.
【0033】[0033]
【発明の効果】本発明の配線基板によれば、絶縁基体が
無機絶縁物粉末を靱性に優れる熱硬化性樹脂で結合する
ことによって形成されていることから配線基板同士ある
いは配線基板と半導体装置製作自動ラインの一部とが激
しく衝突しても絶縁基体に欠けや割れ、クチック等が発
生することはない。According to the wiring board of the present invention, since the insulating substrate is formed by bonding the inorganic insulating powder with the thermosetting resin having excellent toughness, the wiring boards are manufactured together or the wiring board and the semiconductor device are manufactured. Even if a part of the automatic line collides violently, the insulating substrate will not be chipped, cracked, or clicked.
【0034】また本発明の配線基板によれば配線導体
を、金属粉末を融点が300℃以下の低融点金属で接合
させて、あるいは融点が300℃以下の低融点金属粉末
を相互に溶融接合させて形成される金属部材と導電性
で、且つ熱硬化性である樹脂とで形成したことから金属
粉末間あるいは融点が300℃以下の低融点金属粉末間
の電気的接続が確実となり、その結果、配線導体の電気
抵抗を低抵抗となすことができ、同時に配線導体の露出
する表面にメッキ金属層を良好に被着させ、配線導体の
表面をメッキ金属層で完全に被覆することができる。Further, according to the wiring board of the present invention, the wiring conductor is formed by joining metal powders with a low melting point metal having a melting point of 300 ° C. or lower, or by melting and joining low melting point metal powders having a melting point of 300 ° C. or lower with each other. Since it is formed of the metal member formed by the above and the resin which is conductive and thermosetting, the electric connection between the metal powders or the low melting point metal powders having a melting point of 300 ° C. or less is ensured, and as a result, The electric resistance of the wiring conductor can be made low, and at the same time, the exposed surface of the wiring conductor can be satisfactorily coated with the plated metal layer, and the surface of the wiring conductor can be completely covered with the plated metal layer.
【0035】更に本発明の配線基板は熱硬化性樹脂前駆
体と無機絶縁物粉末とを混合して成る前駆体シートを準
備する工程と、前記前駆体シートに導電性熱硬化性樹脂
前駆体と、融点が300℃以下の低融点金属粉末と金属
粉末または融点が300℃以下の低融点金属粉末とを混
合して成る金属ペーストを所定パターンに印刷する工程
と、前記前駆体シート及び金属ペーストの熱硬化性樹脂
前駆体を加熱し、金属ペースト中の金属粉末を融点が3
00℃以下の低融点金属粉末で接合させつつ、或いは融
点が300℃以下の低融点金属粉末を相互に接合させつ
つ前記前駆体シートの熱硬化性樹脂前駆体及び金属ペー
ストの導電性熱硬化性樹脂前駆体を熱硬化させる工程と
により配線基板を製作することから焼成に伴う不均一な
収縮による変形や寸法のばらつきが発生することはな
い。Further, the wiring board of the present invention comprises a step of preparing a precursor sheet formed by mixing a thermosetting resin precursor and an inorganic insulating powder, and a conductive thermosetting resin precursor on the precursor sheet. A step of printing a metal paste having a melting point of 300 ° C. or lower and a metal powder or a low melting point metal powder having a melting point of 300 ° C. or lower in a predetermined pattern, the precursor sheet and the metal paste. When the thermosetting resin precursor is heated, the melting point of the metal powder in the metal paste is 3
Conductive thermosetting of the thermosetting resin precursor of the precursor sheet and the metal paste while bonding with low melting point metal powder of 00 ° C. or lower or bonding of low melting point metal powder of 300 ° C. or lower with each other Since the wiring board is manufactured by the step of thermally curing the resin precursor, deformation and dimensional variation due to uneven shrinkage due to firing do not occur.
【図1】本発明の配線基板を半導体素子収納用パッケー
ジに適用した場合の一実施例を示す断面図である。FIG. 1 is a cross-sectional view showing an embodiment in which a wiring board of the present invention is applied to a semiconductor element housing package.
【図2】(a)乃至(c)は本発明の配線基板の製造方
法を説明するための各工程毎の断面図である。2A to 2C are cross-sectional views for each step for explaining the method for manufacturing a wiring board according to the present invention.
1・・・・・・・・・・・・・絶縁基体 1a、1b、1c・・・・・・絶縁基板 2・・・・・・・・・・・・・配線導体 11a、11b、11c・・・前駆体シート 12・・・・・・・・・・・・金属ペースト Insulation bases 1a, 1b, 1c ... Insulation substrate 2 ... Wiring conductors 11a, 11b, 11c・ ・ ・ Precursor sheet 12 ・ ・ ・ ・ ・ ・ ・ ・ ・ Metal paste
Claims (2)
末と5重量%乃至40重量%の熱硬化性樹脂とから成
り、前記無機絶縁物粉末を前記熱硬化性樹脂により結合
した少なくとも1枚の絶縁基板から成る絶縁基体に、金
属粉末を融点が300℃以下の低融点金属で接合させ
て、あるいは融点が300℃以下の低融点金属粉末を相
互に溶融接合させて形成される金属部材と導電性で、且
つ熱硬化性である樹脂とから成る配線導体を被着させた
配線基板。1. At least 1 comprising 60% by weight to 95% by weight of an inorganic insulating powder and 5% by weight to 40% by weight of a thermosetting resin, said inorganic insulating powder being bound by said thermosetting resin. A metal member formed by bonding metal powder with a low-melting point metal having a melting point of 300 ° C. or lower, or by melting and bonding low-melting point metal powder having a melting point of 300 ° C. or lower to an insulating substrate composed of a single insulating substrate. A wiring board on which a wiring conductor made of a resin that is electrically conductive and thermosetting is adhered.
混合して成る前駆体シートを準備する工程と、前記前駆
体シートに導電性熱硬化性樹脂前駆体と、融点が300
℃以下の低融点金属粉末と金属粉末または融点が300
℃以下の低融点金属粉末とを混合して成る金属ペースト
を所定パターンに印刷する工程と、前記前駆体シート及
び金属ペーストの熱硬化性樹脂前駆体を加熱し、金属ペ
ースト中の金属粉末を融点が300℃以下の低融点金属
粉末で接合させつつ、或いは融点が300℃以下の低融
点金属粉末を相互に接合させつつ前記前駆体シートの熱
硬化性樹脂前駆体及び金属ペーストの導電性熱硬化性樹
脂前駆体を熱硬化させる工程と、から成ることを特徴と
する配線基板の製造方法。2. A step of preparing a precursor sheet formed by mixing a thermosetting resin precursor and an inorganic insulating powder, a conductive thermosetting resin precursor in the precursor sheet, and a melting point of 300.
Low melting point metal powder below ℃ and metal powder or melting point 300
A step of printing a metal paste formed by mixing a low melting point metal powder of ℃ or less with a predetermined pattern, heating the precursor sheet and the thermosetting resin precursor of the metal paste, and melting the metal powder in the metal paste Of the thermosetting resin precursor of the precursor sheet and the conductive thermosetting of the metal paste while bonding with a low melting point metal powder having a melting point of 300 ° C. or lower or bonding the low melting point metal powders having a melting point of 300 ° C. or lower with each other. And a step of thermally curing the resinous resin precursor.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24446995A JP3145619B2 (en) | 1995-09-22 | 1995-09-22 | Wiring board and manufacturing method thereof |
US08/717,119 US5837356A (en) | 1995-09-22 | 1996-09-20 | Wiring board and method for manufacturing the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24446995A JP3145619B2 (en) | 1995-09-22 | 1995-09-22 | Wiring board and manufacturing method thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0992947A true JPH0992947A (en) | 1997-04-04 |
JP3145619B2 JP3145619B2 (en) | 2001-03-12 |
Family
ID=17119124
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP24446995A Expired - Fee Related JP3145619B2 (en) | 1995-09-22 | 1995-09-22 | Wiring board and manufacturing method thereof |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3145619B2 (en) |
-
1995
- 1995-09-22 JP JP24446995A patent/JP3145619B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP3145619B2 (en) | 2001-03-12 |
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