JPH09181419A - Manufacture of wiring board - Google Patents

Manufacture of wiring board

Info

Publication number
JPH09181419A
JPH09181419A JP33516795A JP33516795A JPH09181419A JP H09181419 A JPH09181419 A JP H09181419A JP 33516795 A JP33516795 A JP 33516795A JP 33516795 A JP33516795 A JP 33516795A JP H09181419 A JPH09181419 A JP H09181419A
Authority
JP
Japan
Prior art keywords
precursor
melting point
thermosetting resin
metal
wiring conductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP33516795A
Other languages
Japanese (ja)
Other versions
JP3297572B2 (en
Inventor
Naohiro Katori
直広 鹿取
Yoichi Sekioka
洋一 関岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP33516795A priority Critical patent/JP3297572B2/en
Priority to US08/717,119 priority patent/US5837356A/en
Publication of JPH09181419A publication Critical patent/JPH09181419A/en
Application granted granted Critical
Publication of JP3297572B2 publication Critical patent/JP3297572B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1515Shape
    • H01L2924/15153Shape the die mounting substrate comprising a recess for hosting the device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16195Flat cap [not enclosing an internal cavity]

Landscapes

  • Parts Printed On Printed Circuit Boards (AREA)
  • Manufacturing Of Printed Wiring (AREA)
  • Wire Bonding (AREA)

Abstract

PROBLEM TO BE SOLVED: To prevent chipping, crazing, cracks, etc., from being developed on an insulating base even when wiring boards strongly collide with one another or when a wiring board strongly collide with a part of the semiconductor device manufacturing automation line. SOLUTION: Precursor sheets 11a, 11b and 11c to be the insulating base mixed of thermosetting resin precursor and inorganic insulating powder are prepared. On the precursor sheets 11a, 11b and 11c, metal paste 12, which is to be the wiring conductor formed by mixing the thermosetting resin precursor and the metal powder and low melting point metal powder whose melting point is 300 deg.C or lower, is printed in a prescribed pattern. The precursor sheets 11a, 11b and 11c whereupon the metal paste 12 is printed are put in the inactive atmosphere at a prescribed temperature, the metal powder in the metal paste 12 is bonded with the low melting point metal powder, and the thermosetting resin precursor of the precursor sheets 1, 11b and 11c and the thermosetting resin precursor of the metal paste 12 are cured with heat.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、半導体素子を収容
するための半導体素子収納用パッケージや混成集積回路
基板等に用いられる配線基板に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring board used for a package for housing a semiconductor element for housing a semiconductor element or a hybrid integrated circuit board.

【0002】[0002]

【従来の技術】従来、配線基板、例えば半導体素子を収
容する半導体素子収納用パッケージに使用される配線基
板は、酸化アルミニウム質焼結体等のセラミックスより
成り、その上面中央部に半導体素子を収容する凹部を有
する絶縁基体と、前記絶縁基体の凹部周辺から下面にか
けて導出されたタングステン、モリブデン等の高融点金
属粉末から成る配線導体とから構成されており、前記絶
縁基体の凹部底面に半導体素子をガラス、樹脂、ロウ材
等の接着剤を介して接着固定するとともに半導体素子の
各電極を例えばボンディングワイヤ等の電気的接続手段
を介して配線導体に電気的に接続し、しかる後、前記絶
縁基体の上面に、金属やセラミックス等から成る蓋体を
絶縁基体の凹部を塞ぐようにしてガラス、樹脂、ロウ材
等の封止材を介して接合させ、絶縁基体の凹部内に半導
体素子を気密に収容することによって製品としての半導
体装置となり、配線導体の絶縁基体凹部底面に導出した
部位を外部電気回路基板の配線導体に接続することによ
って半導体素子の各電極が外部電気回路基板に電気的に
接続されることとなる。
2. Description of the Related Art Conventionally, a wiring board, for example, a wiring board used for a semiconductor element housing package for housing a semiconductor element, is made of ceramics such as an aluminum oxide sintered body, and the semiconductor element is housed in the center of its upper surface. And a wiring conductor made of a refractory metal powder such as tungsten or molybdenum, which is led out from the periphery of the recess of the insulating base to the lower surface, and a semiconductor element is formed on the bottom of the recess of the insulating base. The electrodes are bonded and fixed through an adhesive such as glass, resin, or a brazing material, and each electrode of the semiconductor element is electrically connected to a wiring conductor through an electrical connecting means such as a bonding wire. A lid made of metal, ceramics, or the like is placed on the upper surface of the so as to cover the concave portion of the insulating base with a sealing material such as glass, resin, or brazing material. A semiconductor device as a product is obtained by bonding and hermetically housing the semiconductor element in the recess of the insulating base. By connecting the portion of the wiring conductor led to the bottom of the insulating base recess to the wiring conductor of the external electric circuit board, the semiconductor Each electrode of the element is electrically connected to the external electric circuit board.

【0003】尚、前記配線基板は一般に、セラミックグ
リーンシート積層法によって製作されており、具体的に
は、酸化アルミニウム、酸化珪素、酸化マグネシウム、
酸化カルシウム等のセラミック原料粉末に適当な有機バ
インダー、溶剤等を添加混合して泥漿状となすとともに
これを従来周知のドクターブレード法を採用してシート
状とすることによって複数のセラミックグリーンシート
を得、しかる後、前記セラミックグリーンシートに適当
な打ち抜き加工を施すとともに配線導体となる金属ペー
ストを所定パターンに印刷塗布し、最後に前記セラミッ
クグリーンシートを所定の順に上下に積層して生セラミ
ック成形体となすとともに該セラミック生成形体を還元
雰囲気中約1600℃の高温で焼成することによって製
作される。
The wiring board is generally manufactured by a ceramic green sheet laminating method. Specifically, aluminum oxide, silicon oxide, magnesium oxide,
A plurality of ceramic green sheets are obtained by adding a suitable organic binder, solvent, etc. to a ceramic raw material powder such as calcium oxide and mixing it to form a slurry and forming it into a sheet shape by adopting the conventionally known doctor blade method. After that, a suitable punching process is applied to the ceramic green sheet and a metal paste to be a wiring conductor is printed and applied in a predetermined pattern, and finally the ceramic green sheet is laminated in a predetermined order on top and bottom to obtain a green ceramic molded body. It is produced by firing the ceramic green body at a high temperature of about 1600 ° C. in a reducing atmosphere.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、この従
来の配線基板においては、セラミック生成形体を焼成す
る際、セラミック生成形体に不均一な焼成収縮が発生
し、得られる配線基板に反り等の変形や寸法のばらつき
が発生し、その結果、半導体素子の各電極と配線導体と
を、或いは配線導体と外部電気回路基板の配線導体とを
正確、且つ確実に電気的に接続することが困難であると
いう欠点を有していた。
However, in this conventional wiring board, when the ceramic green body is fired, uneven firing shrinkage occurs in the ceramic green body, and the resulting wiring board is deformed such as warped or the like. Variations in dimensions occur, and as a result, it is difficult to electrically connect each electrode of the semiconductor element and the wiring conductor, or the wiring conductor and the wiring conductor of the external electric circuit board, accurately and reliably. It had drawbacks.

【0005】また得られる配線基板は、絶縁基体を構成
する酸化アルミニウム質焼結体等のセラミックスが硬く
て脆い性質を有するため、搬送工程や半導体装置製作の
自動ライン等において配線基板同士が、あるいは配線基
板と半導体装置製作自動ラインの一部とが激しく衝突す
ると絶縁基体に欠けや割れ、クラック等が発生し、その
結果、半導体素子を気密に収容することができず、半導
体素子を長期間にわたり正常、且つ安定に作動させるこ
とができなくなるという欠点も有していた。
Further, in the obtained wiring board, since the ceramics such as aluminum oxide sintered body which constitutes the insulating substrate has the property of being hard and brittle, the wiring boards may not be connected to each other in a carrying process or an automatic line for manufacturing a semiconductor device, or When the wiring board and a part of the semiconductor device manufacturing automatic line violently collide with each other, the insulating substrate is chipped, cracked, or cracked, and as a result, the semiconductor element cannot be housed in an airtight manner and the semiconductor element cannot be stored for a long time. It also has a drawback that it cannot operate normally and stably.

【0006】[0006]

【課題を解決するための手段】本発明の絶縁基体に所定
パターンの配線導体を被着させた配線基板の製造方法
は、熱硬化性樹脂前駆体と無機絶縁物粉末とを混合した
絶縁基体となる前駆体シートを準備する工程と、前記前
駆体シートに、熱硬化性樹脂前駆体と金属粉末と融点が
300℃以下の低融点金属粉末とを混合した配線導体と
なる金属ペーストを所定パターンに印刷する工程と、前
記金属ペーストが印刷塗布された前駆体シートを所定温
度の不活性雰囲気中に投入し、金属ペースト中の金属粉
末を低融点金属粉末で接合させるとともに前駆体シート
の熱硬化性樹脂前駆体と金属ペーストの熱硬化性樹脂前
駆体とを熱硬化させる工程と、から成ることを特徴とす
るものである。
A method for manufacturing a wiring board in which a wiring conductor having a predetermined pattern is adhered to an insulating base according to the present invention is an insulating base in which a thermosetting resin precursor and an inorganic insulating powder are mixed. And a metal paste to be a wiring conductor in which a thermosetting resin precursor, a metal powder, and a low melting point metal powder having a melting point of 300 ° C. or less are mixed in a predetermined pattern on the precursor sheet. The step of printing, and the precursor sheet on which the metal paste is printed and applied is placed in an inert atmosphere at a predetermined temperature, and the metal powder in the metal paste is bonded with a low melting point metal powder and the thermosetting property of the precursor sheet And a step of thermally curing the resin precursor and the thermosetting resin precursor of the metal paste.

【0007】また本発明の絶縁基体に所定パターンの配
線導体を被着させた配線基板の製造方法は、熱硬化性樹
脂前駆体と無機絶縁物粉末とを混合した絶縁基体となる
前駆体シートを準備する工程と、前記前駆体シートに、
熱硬化性樹脂前駆体と融点が300℃以下の低融点金属
粉末とを混合した配線導体となる金属ペーストを所定パ
ターンに印刷する工程と、前記金属ペーストが印刷塗布
された前駆体シートを所定温度の不活性雰囲気中に投入
し、金属ペースト中の低融点金属粉末同士を接合させる
とともに前駆体シートの熱硬化性樹脂前駆体と金属ペー
ストの熱硬化性樹脂前駆体とを熱硬化させる工程と、か
ら成ることを特徴とするものである。
Further, in the method of manufacturing a wiring board in which a wiring conductor having a predetermined pattern is adhered to the insulating base of the present invention, a precursor sheet which becomes an insulating base is prepared by mixing a thermosetting resin precursor and an inorganic insulating powder. In the step of preparing and the precursor sheet,
A step of printing a metal paste, which is a wiring conductor, in which a thermosetting resin precursor and a low melting point metal powder having a melting point of 300 ° C. or less are mixed, in a predetermined pattern, and a precursor sheet on which the metal paste is printed and applied is heated to a predetermined temperature. Of the thermosetting resin precursor of the precursor sheet and the thermosetting resin precursor of the metal paste together with the low melting point metal powder in the metal paste are bonded together in an inert atmosphere, It is characterized by consisting of.

【0008】更に本発明は、前記金属ペーストの熱硬化
性樹脂前駆体が導電性を有していることを特徴とするも
のである。
Further, the present invention is characterized in that the thermosetting resin precursor of the metal paste has conductivity.

【0009】本発明の配線基板の製造方法によれば、配
線導体が被着される絶縁基体を熱硬化性樹脂前駆体と無
機絶縁物粉末とを混合して成る前駆体シートを熱硬化さ
せることによって形成しており、絶縁基体を得る際に焼
成工程がないことから焼成に伴う不均一な収縮による変
形や寸法のばらつきが発生することはない。
According to the method for manufacturing a wiring board of the present invention, a precursor sheet formed by mixing a thermosetting resin precursor and an inorganic insulating powder on an insulating substrate on which a wiring conductor is adhered is thermally cured. Since there is no firing step when obtaining the insulating substrate, deformation and dimensional variation due to uneven shrinkage due to firing do not occur.

【0010】また本発明の配線基板の製造方法によれ
ば、金属ペーストが印刷塗布された前駆体シートを所定
温度の不活性雰囲気中に投入し、雰囲気温度によって金
属ペースト中の金属粉末を低融点金属で接合させる、或
いは低融点金属粉末同士を接合させることから金属粉末
間、或いは低融点金属粉末間の電気的接続が確実とな
り、これよって配線導体の電気抵抗を低抵抗となすこと
ができる。
Further, according to the method for manufacturing a wiring board of the present invention, the precursor sheet on which the metal paste is printed and applied is placed in an inert atmosphere at a predetermined temperature, and the metal powder in the metal paste has a low melting point depending on the ambient temperature. Since they are joined by metal or the low melting point metal powders are joined together, electrical connection between the metal powders or between the low melting point metal powders is ensured, whereby the electrical resistance of the wiring conductor can be made low.

【0011】更に本発明の配線基板の製造方法によれ
ば、配線導体となる金属ペーストの熱硬化性樹脂前駆体
を導電性を有する導電性熱硬化性前駆体としておけば金
属粉末間、或いは低融点金属粉末間の電気的接続がより
確実となり、これよって配線導体の電気抵抗をより低抵
抗となすことができる。
Further, according to the method of manufacturing a wiring board of the present invention, if the thermosetting resin precursor of the metal paste to be the wiring conductor is used as the conductive thermosetting precursor having conductivity, it may be reduced between metal powders or low. The electrical connection between the melting point metal powders becomes more reliable, so that the electrical resistance of the wiring conductor can be made lower.

【0012】また更に本発明の製造方法によって得られ
る配線基板は、絶縁基体が無機絶縁物粉末を靱性に優れ
る熱硬化性樹脂で結合することによって形成されている
ことから配線基板同士あるいは配線基板と半導体装置製
作自動ラインの一部とが激しく衝突しても絶縁基体に欠
けや割れ、クラック等を発生することもない。
Further, since the insulating substrate is formed by bonding the inorganic insulating powder with the thermosetting resin having excellent toughness, the wiring substrate obtained by the manufacturing method of the present invention can be connected to the wiring substrates or to each other. Even if a part of the automatic semiconductor device manufacturing line collides violently, the insulating substrate will not be chipped, cracked, or cracked.

【0013】[0013]

【発明の実施の形態】次に、本発明を添付図面に基づき
詳細に説明する。
Next, the present invention will be described in detail with reference to the accompanying drawings.

【0014】図1は、本発明の製造方法によって製作さ
れる配線基板を半導体素子を収容する半導体素子収納用
パッケージに適用した場合の一実施例を示し、1は絶縁
基体、2は配線導体である。
FIG. 1 shows an embodiment in which a wiring substrate manufactured by the manufacturing method of the present invention is applied to a semiconductor element housing package for housing a semiconductor element, 1 is an insulating substrate, and 2 is a wiring conductor. is there.

【0015】前記絶縁基体1は、三枚の絶縁基板1a、
1b、1cを積層することによって形成されており、そ
の上面中央部に半導体素子を収容するための凹部1dを
有し、該凹部1dの底面には半導体素子3が樹脂等の接
着剤を介して接着固定される。
The insulating substrate 1 comprises three insulating substrates 1a,
It is formed by laminating 1b and 1c, and has a recess 1d for accommodating a semiconductor element in the center of the upper surface thereof, and the semiconductor element 3 is provided on the bottom surface of the recess 1d via an adhesive such as resin. Adhesively fixed.

【0016】前記絶縁基体1を構成する絶縁基板1a、
1b、1cは、例えば酸化珪素、酸化アルミニウム、窒
化アルミニウム、炭化珪素、チタン酸バリウム、ゼオラ
イト等の無機絶縁物粉末をエポキシ樹脂、ポリイミド樹
脂,ポリフェニレンエーテル樹脂等の熱硬化性樹脂で結
合することによって形成されており、絶縁基体1を構成
する三枚の絶縁基板1a、1b、1cはその各々が無機
絶縁物粉末を靭性に優れる熱硬化性樹脂で結合すること
によって形成されていることから絶縁基体1に外力が印
加されても該外力によって絶縁基体1に欠けや割れ、ク
ラック等が発生することはない。
An insulating substrate 1a constituting the insulating base 1;
1b and 1c are obtained by bonding inorganic insulating powders such as silicon oxide, aluminum oxide, aluminum nitride, silicon carbide, barium titanate, and zeolite with a thermosetting resin such as epoxy resin, polyimide resin, polyphenylene ether resin. The three insulating substrates 1a, 1b, and 1c that form the insulating substrate 1 are formed by bonding the inorganic insulating powders with a thermosetting resin having excellent toughness. Even if an external force is applied to the insulating substrate 1, the insulating substrate 1 will not be chipped, cracked, or cracked.

【0017】尚、前記無機絶縁物粉末を熱硬化性樹脂で
結合して成る絶縁基体1を構成する三枚の絶縁基板1
a、1b、1cは、無機絶縁物粉末の含有量が60重量
%未満であると絶縁基体1の熱膨張係数が半導体素子3
の熱膨張係数に対して大きく相違し、半導体素子3が作
動時に熱を発し、該熱が半導体素子3と絶縁基体1の両
者に印加されると、両者間に両者の熱膨張係数の相違に
起因する大きな熱応力が発生し、この大きな熱応力によ
って半導体素子3が絶縁基体1から剥離したり、半導体
素子3に割れや欠けが発生する危険性がある。また95
重量%を越えると無機絶縁物粉末を熱硬化性樹脂で完全
に結合させることができず、所定の絶縁基板1a、1
b、1cを得ることが困難となる。従って、前記絶縁基
体1を構成する絶縁基板1a、1b、1cは、その各々
の内部に含有される無機絶縁物粉末の量を60乃至95
重量%の範囲としておくことが好ましい。
In addition, three insulating substrates 1 constituting an insulating substrate 1 formed by bonding the inorganic insulating powders with a thermosetting resin.
When the content of the inorganic insulating powder is less than 60% by weight, the thermal expansion coefficient of the insulating substrate 1 is a, 1b, 1c.
When the semiconductor element 3 emits heat during operation, and the heat is applied to both the semiconductor element 3 and the insulating substrate 1, the difference in the thermal expansion coefficient between the two is caused. A large thermal stress is generated due to this, and there is a risk that the semiconductor element 3 may be separated from the insulating substrate 1 or the semiconductor element 3 may be cracked or chipped due to the large thermal stress. Also 95
If it exceeds 5% by weight, the inorganic insulating powder cannot be completely bonded with the thermosetting resin, and the predetermined insulating substrates 1a, 1
It is difficult to obtain b and 1c. Therefore, the insulating substrates 1a, 1b, 1c constituting the insulating base 1 have the amount of the inorganic insulating powder contained in each of 60 to 95.
It is preferable to set it in the range of weight%.

【0018】また前記絶縁基体1は、その凹部1d周辺
から下面にかけて配線導体2が被着形成されており、該
配線導体2は銅、銀、金等の金属粉末を融点が300℃
以下の低融点金属、具体的には半田を介し接合されたも
の、或いは融点が300℃以下の半田等の低融点金属同
士を接合させたものを熱硬化性樹脂を介し絶縁基体1に
取着させて形成されている。
A wiring conductor 2 is formed on the insulating substrate 1 from the periphery of the recess 1d to the lower surface thereof. The wiring conductor 2 is made of metal powder such as copper, silver and gold and has a melting point of 300.degree.
The following low-melting point metals, specifically those which are joined via solder, or those where low-melting point metals such as solder having a melting point of 300 ° C. or less are joined, are attached to the insulating substrate 1 via a thermosetting resin. Is formed.

【0019】前記配線導体2は、内部に収容する半導体
素子3の各電極を外部電気回路に電気的に接続する作用
を為し、絶縁基体1の凹部1d周辺に位置する部位には
半導体素子3の各電極がボンディングワイヤ4を介して
電気的に接続され、また絶縁基体1の下面に導出された
部位は外部電気回路に電気的に接続される。
The wiring conductor 2 has the function of electrically connecting the electrodes of the semiconductor element 3 housed therein to an external electric circuit, and the semiconductor element 3 is provided at a portion located around the recess 1d of the insulating substrate 1. Are electrically connected to each other via the bonding wire 4, and the portion led out to the lower surface of the insulating substrate 1 is electrically connected to an external electric circuit.

【0020】前記配線導体2はまた銅、銀、金等の金属
粉末を融点が300℃以下の低融点金属で接合すること
によって、或いは融点が300℃以下の半田等の低融点
金属同士を接合させることによって形成されているた
め、金属粉末間、或いは低融点金属同士の電気的接続を
確実として配線導体2の電気抵抗を低抵抗のものとなす
ことができる。
The wiring conductor 2 is also formed by joining metal powders such as copper, silver and gold with a low melting point metal having a melting point of 300 ° C. or less, or joining low melting point metals such as solder having a melting point of 300 ° C. or less. Since the wiring conductor 2 is formed by the above, the electric resistance of the wiring conductor 2 can be made low by ensuring the electrical connection between the metal powders or between the low melting point metals.

【0021】更に前記配線導体2は金属粉末等を絶縁基
体1取着させる熱硬化性樹脂を導電性ポリピロール樹脂
やポリパラフェニレン樹脂、ポリアニリン樹脂等の導電
性樹脂で形成しておくと配線導体2の金属粉末間や低融
点金属同士の電気的接続がより確実となり、配線導体2
の電気抵抗をより低抵抗のものとなすことができる。
Further, if the wiring conductor 2 is made of a conductive resin such as a conductive polypyrrole resin, a polyparaphenylene resin, or a polyaniline resin, a thermosetting resin for attaching the metal powder or the like to the insulating substrate 1 is formed. The electrical connection between the metal powders of the above and the low melting point metals becomes more reliable and the wiring conductor 2
The electric resistance of can be made lower.

【0022】尚、前記配線導体2はそれが金属粉末と融
点が300℃以下の低融点金属と熱硬化性樹脂とから成
る場合、金属粉末と融点が300℃以下の低融点金属の
合計重量が配線導体2の全重量に対し、70重量%未満
となると金属粉末と低融点金属との接合が不完全とな
り、また95重量%を越えると熱硬化性樹脂で配線導体
2を絶縁基体1に強固に被着させるのが困難になるとと
もに配線導体2が脆弱となる傾向にある。従って、前記
配線導体2に含有される金属粉末と融点が300℃以下
の低融点金属はその合計重量を配線導体2の全重量に対
して70重量%乃至95重量%の範囲としておくことが
好ましい。
When the wiring conductor 2 is composed of a metal powder, a low melting point metal having a melting point of 300 ° C. or lower, and a thermosetting resin, the total weight of the metal powder and the low melting point metal having a melting point of 300 ° C. or lower is When the amount is less than 70% by weight based on the total weight of the wiring conductor 2, the bonding between the metal powder and the low melting point metal is incomplete, and when it exceeds 95% by weight, the wiring conductor 2 is firmly bonded to the insulating substrate 1 by the thermosetting resin. The wiring conductor 2 tends to be weakened. Therefore, it is preferable that the total weight of the metal powder contained in the wiring conductor 2 and the low melting point metal having a melting point of 300 ° C. or less is set in the range of 70% by weight to 95% by weight with respect to the total weight of the wiring conductor 2. .

【0023】また前記配線導体2が300℃以下の融点
を有する低融点金属と熱硬化性樹脂とから成る場合、融
点が300℃以下の低融点金属の重量が配線導体2の全
重量に対し、70重量%未満となると低融点金属同士の
接合が不完全となり、また95重量%を越えると熱硬化
性樹脂で配線導体2を絶縁基体1に強固に被着させるの
が困難になるとともに配線導体2が脆弱となる傾向にあ
る。従って、前記配線導体2に含有される融点が300
℃以下の低融点金属はその重量を配線導体2の全重量に
対して70重量%乃至95重量%の範囲としておくこと
が好ましい。
When the wiring conductor 2 is made of a low melting point metal having a melting point of 300 ° C. or lower and a thermosetting resin, the weight of the low melting point metal having a melting point of 300 ° C. or lower is relative to the total weight of the wiring conductor 2. If it is less than 70% by weight, the joining of the low melting point metals becomes incomplete, and if it exceeds 95% by weight, it becomes difficult to firmly adhere the wiring conductor 2 to the insulating substrate 1 with a thermosetting resin, and the wiring conductor becomes difficult. 2 tends to be fragile. Therefore, the melting point contained in the wiring conductor 2 is 300.
It is preferable that the weight of the low-melting-point metal having a temperature of not more than 0 ° C. be 70% to 95% by weight based on the total weight of the wiring conductor 2.

【0024】更に前記配線導体2はそれが金属粉末と融
点が300℃以下の低融点金属と熱硬化性樹脂とから成
る場合、金属粉末の量が該金属粉末と融点が300℃以
下の低融点金属の合計重量に対し20重量%未満となる
と金属粉末に対して低融点金属の量が多くなり、低融点
金属同士が溶融し合って金属粉末を取り込んだ一体化が
困難となって配線導体2の電気抵抗が高くなる傾向にあ
り、また80重量%を越えると金属粉末を接合させる低
融点金属の量が相対的に少なくなり、金属粉末を完全に
接合させることができず、配線導体2の電気抵抗が高く
なってしまう傾向にある。従って、前記配線導体2はそ
れが金属粉末と融点が300℃以下の低融点金属と熱硬
化性樹脂とから成る場合、金属粉末の量を該金属粉末と
融点が300℃以下の低融点金属の合計重量に対し20
重量乃至80重量%の範囲としておくことが好ましい。
Further, when the wiring conductor 2 is composed of a metal powder, a low melting point metal having a melting point of 300 ° C. or lower and a thermosetting resin, the amount of the metal powder is low and the melting point of the melting point is 300 ° C. or lower. If it is less than 20% by weight with respect to the total weight of the metals, the amount of the low melting point metal becomes large with respect to the metal powder, and the low melting point metals are melted to each other, making it difficult to integrate the metal powders into the wiring conductor 2 The electric resistance of the wiring conductor 2 tends to increase, and when it exceeds 80% by weight, the amount of the low melting point metal for joining the metal powder is relatively small, and the metal powder cannot be completely joined. Electric resistance tends to increase. Therefore, when the wiring conductor 2 is composed of a metal powder, a low melting point metal having a melting point of 300 ° C. or lower, and a thermosetting resin, the amount of the metal powder is set to the metal powder and the low melting point metal having a melting point of 300 ° C. or lower. 20 for total weight
It is preferable to set it in the range of 80 to 80% by weight.

【0025】また更に前記配線導体2に含有される金属
粉末や融点が300℃以下の低融点金属は、その平均粒
径が0.1μm未満となると金属粉末や融点が300℃
以下の低融点金属が凝集して均一な分散が得られなくな
り、また50μmを越えると配線導体2の幅を一般的に
要求される50μm〜200μmの範囲に印刷形成する
のが困難となる傾向にある。従って、前記配線導体2に
含有される金属粉末や融点が300℃以下の低融点金属
はその平均粒径を0.1μm乃至50μmの範囲として
おくことが好ましい。
Further, the metal powder and the low melting point metal having a melting point of 300 ° C. or less contained in the wiring conductor 2 have a metal powder and a melting point of 300 ° C. when the average particle diameter is less than 0.1 μm.
The following low-melting-point metals agglomerate and a uniform dispersion cannot be obtained, and when it exceeds 50 μm, it tends to be difficult to print and form the width of the wiring conductor 2 in a range of 50 μm to 200 μm which is generally required. is there. Therefore, it is preferable that the metal powder contained in the wiring conductor 2 and the low melting point metal having a melting point of 300 ° C. or less have an average particle size of 0.1 μm to 50 μm.

【0026】かくして本発明の製造方法によって製作さ
れた上述の配線基板によれば、絶縁基体1の凹部1d底
面に半導体素子3を樹脂等の接着剤を介して接着固定す
るとともに半導体素子3の各電極をボンディングワイヤ
4を介して配線導体2に電気的に接続し、最後に前記絶
縁基体1の上面に蓋体5を樹脂等から成る封止材を介し
て接合させ、絶縁基体1と蓋体5とから成る容器内部に
半導体素子3を気密に収容することにより製品としての
半導体装置が完成する。
Thus, according to the above-described wiring board manufactured by the manufacturing method of the present invention, the semiconductor element 3 is adhered and fixed to the bottom surface of the recess 1d of the insulating substrate 1 via an adhesive such as a resin, and each of the semiconductor elements 3 is formed. The electrodes are electrically connected to the wiring conductors 2 via the bonding wires 4, and finally the lid 5 is joined to the upper surface of the insulating base 1 via a sealing material made of resin or the like to form the insulating base 1 and the lid. A semiconductor device as a product is completed by hermetically accommodating the semiconductor element 3 in a container composed of 5 and 5.

【0027】次に前記半導体素子収納用パッケージに使
用される配線基板の製造方法について図2に基づき説明
する。
Next, a method of manufacturing the wiring board used for the semiconductor element housing package will be described with reference to FIG.

【0028】先ず、図2(a)に示すように三枚の前駆
体シート11a、11b、11cを準備する。
First, as shown in FIG. 2A, three precursor sheets 11a, 11b and 11c are prepared.

【0029】前記三枚の前駆体シート11a、11b、
11cは、無機絶縁物粉末を熱硬化性樹脂前駆体で結合
することによって形成されており、例えば、粒径が0.
1μm〜100μm程度の酸化珪素粉末にビスフェノー
ルA型エポキシ樹脂、ノボララック型エポキシ樹脂、グ
リシジルエステル型エポキシ樹脂等のエポキシ樹脂及び
アミン系硬化剤、イミダゾール系硬化剤、酸無水物系硬
化剤等の硬化剤を添加混合してペースト状となし、しか
る後、このペーストをシート状に成形すことによって形
成される。
The three precursor sheets 11a, 11b,
11c is formed by binding an inorganic insulating powder with a thermosetting resin precursor, and has a particle size of, for example, 0.
Silicon oxide powder of about 1 μm to 100 μm and epoxy resin such as bisphenol A type epoxy resin, novolac type epoxy resin, glycidyl ester type epoxy resin, etc. and curing agent such as amine type curing agent, imidazole type curing agent, acid anhydride type curing agent, etc. Is added and mixed to form a paste, and then the paste is formed into a sheet.

【0030】次に図2(b)に示すように前記三枚の前
駆体シート11a、11b、11cのうち二枚の前駆体
シート11a、11bに半導体素子3を収容する凹部1
dとなる開口A、A’を、二枚の前駆体シート11b、
11cに配線導体2を引き回すための貫通孔B、B’を
各々形成する。
Next, as shown in FIG. 2B, the recess 1 for accommodating the semiconductor element 3 in the two precursor sheets 11a, 11b among the three precursor sheets 11a, 11b, 11c.
The openings A and A ′ to be d are formed by the two precursor sheets 11b,
Through holes B and B'for routing the wiring conductor 2 are formed in 11c.

【0031】前記開口A、A’及び貫通孔B、B’は、
前駆体シート11a、11b、11cに従来周知のパン
チング加工法を施し、前駆体シート11a、11b、1
1cの各々に所定形状の孔を穿孔することによって形成
される。
The openings A and A'and the through holes B and B'are
The precursor sheets 11a, 11b, and 11c are subjected to a conventionally known punching method, and the precursor sheets 11a, 11b, and 1c are subjected to punching.
1c is formed by piercing a hole of a predetermined shape.

【0032】次に図2(c)に示すように、前記前駆体
シート11b、11cの上下面及び貫通孔B、B’内に
配線導体2となる金属ペースト12を従来周知のスクリ
ーン印刷法及び充填法を採用して所定パターンに印刷塗
布する。
Next, as shown in FIG. 2 (c), the metal paste 12 to be the wiring conductor 2 is formed on the upper and lower surfaces of the precursor sheets 11b and 11c and in the through holes B and B'by the conventionally known screen printing method and A filling method is adopted to print and apply a predetermined pattern.

【0033】前記配線導体2となる金属ペースト12と
しては、例えば粒径が0.1〜20μm程度の銅等の金
属粉末に、融点が300℃以下の半田等から成る低融点
金属粉末と、ビスフェノールA型エポキシ樹脂、ノボラ
ラック型エポキシ樹脂、グリシジルエステル型エポキシ
樹脂等のエポキシ樹脂及びアミン系硬化剤、イミダゾー
ル系硬化剤、酸無水物系硬化剤等の硬化剤を添加混合し
てペースト状となしたものが使用される。
The metal paste 12 to be the wiring conductor 2 is, for example, a metal powder such as copper having a particle size of about 0.1 to 20 μm, a low melting point metal powder made of solder having a melting point of 300 ° C. or less, and bisphenol. Epoxy resin such as A type epoxy resin, novolac type epoxy resin, glycidyl ester type epoxy resin and the like, and amine type curing agent, imidazole type curing agent, curing agent such as acid anhydride type curing agent are added and mixed to form a paste. Stuff used.

【0034】また前記配線導体2となる金属ペースト1
2はビスフェノールA型エポキシ樹脂等に替えて導電性
ポリピロール樹脂やポリパラフェニレン樹脂、ポリアニ
リン樹脂等の導電性樹脂を使用すると後述する金属ペー
スト12を所定パターンに印刷塗布した三枚の前駆体シ
ート11a、11b、11cを熱硬化させて配線導体2
を有する絶縁基体1となす際、配線導体2の金属粉末
間、或いは低融点金属同士の電気的接続がより確実とな
り、配線導体2の電気抵抗をより低抵抗のものとなすこ
とができる。従って、前記配線導体2となる金属ペース
ト12はそれに使用されてる熱硬化性樹脂として導電性
ポリピロール樹脂やポリパラフェニレン樹脂、ポリアニ
リン樹脂等の導電性樹脂を使用することが好ましい。
Further, a metal paste 1 to be the wiring conductor 2
When a conductive resin such as a conductive polypyrrole resin, a polyparaphenylene resin, or a polyaniline resin is used instead of the bisphenol A type epoxy resin or the like 2, three precursor sheets 11a are formed by printing and applying a metal paste 12 described later in a predetermined pattern. , 11b, 11c are thermally cured to form the wiring conductor 2
When the insulating base 1 having the above is formed, the electrical connection between the metal powders of the wiring conductor 2 or between the low melting point metals becomes more reliable, and the electric resistance of the wiring conductor 2 can be made lower. Therefore, it is preferable to use a conductive resin such as conductive polypyrrole resin, polyparaphenylene resin, or polyaniline resin as the thermosetting resin used for the metal paste 12 that becomes the wiring conductor 2.

【0035】そして最後に前記三枚の前駆体シート11
a、11b、11cを上下に積層するとともにこれを8
0〜300℃の不活性雰囲気中に投入し、雰囲気温度で
金属ペースト中の金属粉末を低融点金属粉末で接合させ
る、或いは低融点金属同士を接合させ、同時に三枚の前
駆体シート11a、11b、11cの熱硬化性樹脂前駆
体と金属ペースト12の熱硬化性樹脂前駆体とを熱硬化
させることによって図1に示すような絶縁基体1に配線
導体2を被着させた配線基板が完成する。この場合、前
記前駆体シート11a、11b、11c及び金属ペース
ト12は、熱硬化時に収縮することは殆どなく、従っ
て、得られる配線基板に変形や寸法にばらつきが発生せ
ず、配線導体に断線が招来することはなく、配線導体を
介して半導体素子等の電極を外部電気回路に確実に電気
的接続することが可能となる。
And finally, the three precursor sheets 11
a, 11b, 11c are stacked on top of each other and
It is put into an inert atmosphere of 0 to 300 ° C., and the metal powder in the metal paste is joined with the low melting point metal powder at the ambient temperature, or the low melting point metals are joined together, and at the same time, three precursor sheets 11a, 11b are joined. , 11c and the thermosetting resin precursor of the metal paste 12 are heat-cured to complete the wiring substrate in which the wiring conductor 2 is adhered to the insulating substrate 1 as shown in FIG. . In this case, the precursor sheets 11a, 11b, 11c and the metal paste 12 hardly shrink during thermosetting, so that the obtained wiring board does not deform or vary in size, and the wiring conductor is not broken. In this case, the electrodes of the semiconductor element or the like can be surely electrically connected to the external electric circuit through the wiring conductor.

【0036】また前記金属ペースト12を所定パターン
に印刷塗布した三枚の前駆体シート11a、11b、1
1cが投入される温度が80〜300℃の不活性雰囲気
は、例えばガルデン(伊国 アウジモント社の商品名)
と称されている不活性溶液をヒーターにより加熱し、そ
の蒸気相を使用することによって形成され、該不活性溶
液の蒸気相を使用した不活性雰囲気は温度のコントロー
ルが容易であることから雰囲気の温度を所定の温度とし
て金属ペースト12の金属粉末間を低融点金属で確実に
接合させつつ、或いは低融点金属同士を確実に接合させ
つつ三枚の前駆体シート11a、11b、11cの熱硬
化性樹脂前駆体と金属ペースト12の熱硬化性樹脂前駆
体とを熱硬化させることができる。
Further, the three precursor sheets 11a, 11b, 1 on which the metal paste 12 is applied by printing in a predetermined pattern.
An inert atmosphere in which 1c is charged at a temperature of 80 to 300 ° C. is, for example, Galden (trade name of Ausimont Co., Ltd., Italy).
It is formed by heating an inert solution called a heater with a heater and using its vapor phase. The inert atmosphere using the vapor phase of the inert solution is easy to control the temperature, so Thermosetting of the three precursor sheets 11a, 11b, 11c while surely joining the metal powders of the metal paste 12 with a low melting point metal or securely joining the low melting point metals to each other at a predetermined temperature. The resin precursor and the thermosetting resin precursor of the metal paste 12 can be thermoset.

【0037】尚、本発明は、上述の実施例に限定される
ものではなく、本発明の要旨を逸脱しない範囲であれ
ば、種々の変更は可能であり、例えば上述の実施例で
は、本発明の配線基板を半導体素子を収容する半導体素
子収納用パッケージに適用した場合を例に採って説明し
たが、例えば混成集積回路等他の用途に使用される配線
基板に適用してもよい。
It should be noted that the present invention is not limited to the above-described embodiments, and various modifications can be made without departing from the gist of the present invention. For example, in the above-mentioned embodiments, the present invention is possible. The case of applying the wiring board of 1 to a semiconductor element housing package for housing a semiconductor element has been described as an example, but the wiring board may be applied to a wiring board used for other purposes such as a hybrid integrated circuit.

【0038】また、上述の実施例では、三枚の前駆体シ
ートを積層することによって配線基板を製作したが、一
枚や二枚、あるいは四枚以上の前駆体シートを使用して
配線基板を製作してもよい。
In the above-mentioned embodiment, the wiring board is manufactured by laminating the three precursor sheets. However, the wiring board is manufactured by using one, two, or four or more precursor sheets. May be made.

【0039】[0039]

【発明の効果】本発明の配線基板の製造方法によれば、
配線導体が被着される絶縁基体を熱硬化性樹脂前駆体と
無機絶縁物粉末とを混合して成る前駆体シートを熱硬化
させることによって形成しており、絶縁基体を得る際に
焼成工程がないことから焼成に伴う不均一な収縮による
変形や寸法のばらつきが発生することはない。
According to the method of manufacturing a wiring board of the present invention,
The insulating substrate on which the wiring conductor is adhered is formed by heat-curing a precursor sheet formed by mixing a thermosetting resin precursor and an inorganic insulating powder, and the firing step is performed when obtaining the insulating substrate. Since it does not exist, deformation or dimensional variation due to uneven shrinkage due to firing does not occur.

【0040】また本発明の配線基板の製造方法によれ
ば、金属ペーストが印刷塗布された前駆体シートを所定
温度の不活性雰囲気中に投入し、雰囲気温度によって金
属ペースト中の金属粉末を低融点金属で接合させる、或
いは低融点金属粉末同士を接合させることから金属粉末
間、或いは低融点金属粉末間の電気的接続が確実とな
り、これよって配線導体の電気抵抗を低抵抗となすこと
ができる。
According to the method for manufacturing a wiring board of the present invention, the precursor sheet on which the metal paste is printed and applied is placed in an inert atmosphere at a predetermined temperature, and the metal powder in the metal paste has a low melting point depending on the ambient temperature. Since they are joined by metal or the low melting point metal powders are joined together, electrical connection between the metal powders or between the low melting point metal powders is ensured, whereby the electrical resistance of the wiring conductor can be made low.

【0041】更に本発明の配線基板の製造方法によれ
ば、配線導体となる金属ペーストの熱硬化性樹脂前駆体
を導電性を有する導電性熱硬化性前駆体としておけば金
属粉末間、或いは低融点金属粉末間の電気的接続がより
確実となり、これよって配線導体の電気抵抗をより低抵
抗となすことができる。
Further, according to the method for manufacturing a wiring board of the present invention, if the thermosetting resin precursor of the metal paste to be the wiring conductor is used as the conductive thermosetting precursor having conductivity, it may be reduced between metal powders or low. The electrical connection between the melting point metal powders becomes more reliable, so that the electrical resistance of the wiring conductor can be made lower.

【0042】また更に本発明の製造方法によって得られ
る配線基板は、絶縁基体が無機絶縁物粉末を靱性に優れ
る熱硬化性樹脂で結合することによって形成されている
ことから配線基板同士あるいは配線基板と半導体装置製
作自動ラインの一部とが激しく衝突しても絶縁基体に欠
けや割れ、クラック等を発生することもない。
Furthermore, since the wiring substrate obtained by the manufacturing method of the present invention is formed by bonding the inorganic insulating powder with the thermosetting resin having excellent toughness, the wiring substrates are connected with each other or with the wiring substrate. Even if a part of the automatic semiconductor device manufacturing line collides violently, the insulating substrate will not be chipped, cracked, or cracked.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の配線基板を半導体素子収納用パッケー
ジに適用した場合の一実施例を示す断面図である。
FIG. 1 is a sectional view showing an embodiment in which a wiring board of the present invention is applied to a package for housing a semiconductor element.

【図2】本発明の配線基板の製造方法を説明するための
工程毎の断面図である。
FIG. 2 is a cross-sectional view of each process for explaining the method for manufacturing a wiring board of the present invention.

【符号の説明】[Explanation of symbols]

1・・・絶縁基体 2・・・配線導体 11・・・前駆体シート 12・・・金属ペースト DESCRIPTION OF SYMBOLS 1 ... Insulating base 2 ... Wiring conductor 11 ... Precursor sheet 12 ... Metal paste

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】熱硬化性樹脂前駆体と無機絶縁物粉末とを
混合した絶縁基体となる前駆体シートを準備する工程
と、前記前駆体シートに、熱硬化性樹脂前駆体と金属粉
末と融点が300℃以下の低融点金属粉末とを混合した
配線導体となる金属ペーストを所定パターンに印刷する
工程と、前記金属ペーストが印刷塗布された前駆体シー
トを所定温度の不活性雰囲気中に投入し、金属ペースト
中の金属粉末を低融点金属粉末で接合させるとともに前
駆体シートの熱硬化性樹脂前駆体と金属ペーストの熱硬
化性樹脂前駆体とを熱硬化させる工程と、から成る絶縁
基体に所定パターンの配線導体を被着させた配線基板の
製造方法。
1. A step of preparing a precursor sheet to be an insulating substrate in which a thermosetting resin precursor and an inorganic insulating powder are mixed, and the thermosetting resin precursor, metal powder, and melting point in the precursor sheet. A step of printing a metal paste, which is a wiring conductor mixed with a low-melting-point metal powder having a temperature of 300 ° C. or less, in a predetermined pattern, and the precursor sheet on which the metal paste is printed and applied is placed in an inert atmosphere at a predetermined temperature. A step of bonding the metal powder in the metal paste with a low melting point metal powder and thermosetting the thermosetting resin precursor of the precursor sheet and the thermosetting resin precursor of the metal paste to a predetermined insulating substrate. A method for manufacturing a wiring board on which a wiring conductor having a pattern is applied.
【請求項2】熱硬化性樹脂前駆体と無機絶縁物粉末とを
混合した絶縁基体となる前駆体シートを準備する工程
と、前記前駆体シートに、熱硬化性樹脂前駆体と融点が
300℃以下の低融点金属粉末とを混合した配線導体と
なる金属ペーストを所定パターンに印刷する工程と、前
記金属ペーストが印刷塗布された前駆体シートを所定温
度の不活性雰囲気中に投入し、金属ペースト中の低融点
金属粉末同士を接合させるとともに前駆体シートの熱硬
化性樹脂前駆体と金属ペーストの熱硬化性樹脂前駆体と
を熱硬化させる工程と、から成る絶縁基体に所定パター
ンの配線導体を被着させた配線基板の製造方法。
2. A step of preparing a precursor sheet to be an insulating substrate in which a thermosetting resin precursor and an inorganic insulating powder are mixed, and the thermosetting resin precursor and a melting point of 300 ° C. in the precursor sheet. A step of printing a metal paste to be a wiring conductor mixed with the following low melting point metal powder in a predetermined pattern, and the precursor sheet on which the metal paste is printed and applied is placed in an inert atmosphere at a predetermined temperature, and the metal paste is added. A step of bonding the low-melting-point metal powders to each other and thermosetting the thermosetting resin precursor of the precursor sheet and the thermosetting resin precursor of the metal paste, and forming a wiring conductor of a predetermined pattern on the insulating substrate. A method of manufacturing a deposited wiring board.
【請求項3】前記金属ペーストの熱硬化性樹脂前駆体が
導電性を有していることを特徴とする請求項1もしくは
請求項2に記載の配線基板の製造方法。
3. The method for manufacturing a wiring board according to claim 1, wherein the thermosetting resin precursor of the metal paste has conductivity.
JP33516795A 1995-09-22 1995-12-22 Manufacturing method of wiring board Expired - Fee Related JP3297572B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP33516795A JP3297572B2 (en) 1995-12-22 1995-12-22 Manufacturing method of wiring board
US08/717,119 US5837356A (en) 1995-09-22 1996-09-20 Wiring board and method for manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33516795A JP3297572B2 (en) 1995-12-22 1995-12-22 Manufacturing method of wiring board

Publications (2)

Publication Number Publication Date
JPH09181419A true JPH09181419A (en) 1997-07-11
JP3297572B2 JP3297572B2 (en) 2002-07-02

Family

ID=18285512

Family Applications (1)

Application Number Title Priority Date Filing Date
JP33516795A Expired - Fee Related JP3297572B2 (en) 1995-09-22 1995-12-22 Manufacturing method of wiring board

Country Status (1)

Country Link
JP (1) JP3297572B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6982398B2 (en) 2004-06-01 2006-01-03 Illinois Tool Works Inc. Fuel saving engine driven welding-type device and method of use
JP7147302B2 (en) 2018-07-09 2022-10-05 株式会社ダイヘン Thermal processing system and thermal processing torch

Also Published As

Publication number Publication date
JP3297572B2 (en) 2002-07-02

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