JPH0779078A - Multilayer wiring board and manufacture thereof - Google Patents

Multilayer wiring board and manufacture thereof

Info

Publication number
JPH0779078A
JPH0779078A JP22341693A JP22341693A JPH0779078A JP H0779078 A JPH0779078 A JP H0779078A JP 22341693 A JP22341693 A JP 22341693A JP 22341693 A JP22341693 A JP 22341693A JP H0779078 A JPH0779078 A JP H0779078A
Authority
JP
Japan
Prior art keywords
layer
insulating resin
resin layer
metal
conductor pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22341693A
Other languages
Japanese (ja)
Inventor
Noboru Sakaguchi
登 坂口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shinko Electric Industries Co Ltd
Original Assignee
Shinko Electric Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinko Electric Industries Co Ltd filed Critical Shinko Electric Industries Co Ltd
Priority to JP22341693A priority Critical patent/JPH0779078A/en
Publication of JPH0779078A publication Critical patent/JPH0779078A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To prevent the separation of via sections from an insulating resin layer and the degradation in insulating performance of the insulating resin, by forming a close contact barrier layer on the underside of the via sections in contact with the insulating resin layer to improve the adhesion between the via sections and the insulating resin layer and prevent the diffusion of metal composing the via sections into the insulating resin layer. CONSTITUTION:A close contact barrier layer 22 is formed on the underside of via sections 20 in contact with an insulating resin layer 12. The close contact barrier layer 22 is for improving the adhesion between the insulating resin layer 12 and a metal layer 24 and for preventing metal forming the metal layer 24 from diffusing into the insulating resin layer 12. The close contact barrier layer 22 eliminates the degradation in insulating performance of the insulating resin 12 at the via sections 20. In addition the through holes for the via sections are tapered, and their diameter is smaller with the proximity to the bottom where the land sections 28 of a conductive pattern 17 formed on the underside of the insulating resin layer 12. Therefore, the close contact barrier layer 22, uniform in thickness, can be easily formed by sputtering, for example. When the tapered through holes are filled with metal by plating to form the via sections 22, the conductive pattern is formed simultaneously.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は多層配線基板及びその製
造方法に関し、更に詳細には絶縁性基板上に複数層の絶
縁性樹脂層が積層され、且つ前記絶縁性基板及び絶縁性
樹脂層の各々の表面側に形成された導体パターンと、互
いに異なる絶縁性樹脂層の表面側に形成された所定の導
体パターン同士を連結するように、前記絶縁性樹脂層を
貫いて形成された金属から成るビア部とを具備する多層
配線基板及びその製造方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a multilayer wiring board and a method for manufacturing the same, and more specifically, a plurality of insulating resin layers are laminated on an insulating board, and the insulating board and the insulating resin layer are A conductor pattern formed on each surface side and a metal formed by penetrating the insulating resin layer so as to connect predetermined conductor patterns formed on the surface sides of different insulating resin layers to each other. The present invention relates to a multilayer wiring board having a via part and a method for manufacturing the same.

【0002】[0002]

【従来の技術】半導体装置等の電子装置には、装置が高
集積化され複雑化していることに伴って、信号を伝送す
る導体パターンの高密度化が要求されている。しかし、
絶縁性基板の表面側に工業的に形成し得る導体パターン
の密度は、技術の進歩で年々高密度化しているものの限
界がある。このため、更に一層の高密度化した導体パタ
ーンを基板に形成すべく、導体パターンを多層化した多
層配線基板が採用されている。かかる多層配線基板にお
いては、図9に示す如く、導体パターン106・・及び
導体パターンの端部にランド部(以下、単にランド部と
称することがある)108が形成されたセラミック製の
絶縁性基板100上に、ポリイミド等の樹脂から成る絶
縁性樹脂層102、104が積層され、絶縁性樹脂層1
02、104の各表面側には導体パターン106・・及
びランド部108が形成されている。これら導体パター
ン106・・のうち、異なる絶縁性樹脂層の表面側に形
成された導体パターン106との連結は、ランド部10
8上に立設され且つ絶縁性樹脂層を貫いて略円筒状に形
成された金属層110から成るビア部によってなされ
る。
2. Description of the Related Art Electronic devices such as semiconductor devices are required to have high density of conductor patterns for transmitting signals as the devices are highly integrated and complicated. But,
There is a limit to the density of the conductor pattern that can be industrially formed on the surface side of the insulating substrate, although the density has been increasing year by year due to technological progress. Therefore, in order to form a conductor pattern having a higher density on the substrate, a multilayer wiring board in which conductor patterns are multilayered is used. In such a multilayer wiring board, as shown in FIG. 9, an insulating substrate made of ceramic in which a land portion (hereinafter, may be simply referred to as a land portion) 108 is formed at an end portion of the conductor pattern 106. Insulating resin layers 102 and 104 made of a resin such as polyimide are laminated on 100 to form an insulating resin layer 1.
Conductor patterns 106 ... And land portions 108 are formed on the respective surface sides of 02 and 104. Of the conductor patterns 106, ..., The connection with the conductor pattern 106 formed on the surface side of the different insulating resin layer is performed by the land portion 10
8 and is formed by a via portion formed of a metal layer 110 that is formed on the upper surface of the metal layer 110 and that has a substantially cylindrical shape and penetrates the insulating resin layer.

【0003】この図9に示す多層配線基板は、従来、図
10に示す方法で製造される。つまり、セラミック製の
絶縁性基板100の全表面に、メタライズ層112をス
パッタ等によって形成した後、メタライズ層112上に
所定厚さで塗布したレジスト層114に穿設した、メタ
ライズ層112が露出する略円筒状のビア部用貫通孔1
16に、電解めっきによってレジスト層114の高さ以
上に積層された銅金属から成る金属層110を形成する
〔図10(a)(b)〕。更に、レジスト層114を除
去してからメタライズ層112にパターニングを施し、
導体パターン106及びランド部108を形成した後
〔図10(c)〕、ポリイミド等の樹脂を塗布して形成
した金属層110を覆う所定厚さの絶縁性樹脂層102
の表面を研磨処理して金属層110の上端面を露出する
と共に、金属層110及び絶縁性樹脂層102を平坦化
する〔図10(d)(e)〕。次いで、金属層110の
露出面及び絶縁性樹脂層102の平坦面の全面にスパッ
タ等によって形成したメタライズ層118に、レジスト
層120を形成してパターニングを施し、上層の導体パ
ターン106・・及びランド部108を形成する〔図1
0(f)(g)(h)〕。以下、図10(h)の絶縁性
樹脂層102上に対し図10(a)からの工程を順次施
すことによって、絶縁性樹脂層が絶縁性基板100上に
複数層積層された多層配線基板を製造できる。
The multilayer wiring board shown in FIG. 9 is conventionally manufactured by the method shown in FIG. That is, after the metallized layer 112 is formed on the entire surface of the ceramic insulating substrate 100 by sputtering or the like, the metallized layer 112 is exposed by forming a resist layer 114 applied on the metallized layer 112 with a predetermined thickness. Substantially cylindrical through hole for via 1
16, a metal layer 110 made of copper metal is formed by electroplating so as to have a height equal to or higher than that of the resist layer 114 [FIGS. 10 (a) and 10 (b)]. Further, after removing the resist layer 114, the metallized layer 112 is patterned,
After forming the conductor pattern 106 and the land portion [FIG. 10 (c)], the insulating resin layer 102 having a predetermined thickness is formed to cover the metal layer 110 formed by applying a resin such as polyimide.
The upper surface of the metal layer 110 is exposed by polishing the surface of the metal layer 110 and the metal layer 110 and the insulating resin layer 102 are planarized (FIGS. 10D and 10E). Then, a resist layer 120 is formed and patterned on the metallized layer 118 formed by sputtering or the like on the entire exposed surface of the metal layer 110 and the flat surface of the insulating resin layer 102, and the upper conductive pattern 106 and the land are formed. To form the portion 108 [FIG.
0 (f) (g) (h)]. Hereinafter, by sequentially performing the steps from FIG. 10A on the insulating resin layer 102 of FIG. 10H, a multilayer wiring board in which a plurality of insulating resin layers are laminated on the insulating substrate 100 is obtained. Can be manufactured.

【0004】また、図11に示す如く、絶縁性基板10
0に予めビア部122が形成されている場合には、図1
0に示す工程よりも省略された工程で多層配線基板を製
造することができる。この工程では、先ず、絶縁性基板
100上に全面に亘って形成したメタライズ層にパター
ニングを施して形成した導体パターン106・・及びラ
ンド部108を覆うように、ポリイミド等の樹脂から成
る所定厚さの絶縁性樹脂層102に、ランド部108の
表面が底面に露出するビア部用貫通孔116を穿設する
〔図11(a)〕。かかるビア部用貫通孔116に、ビ
ア部122を通じて給電しつつ電解めっきによって金属
層110を形成する〔図11(b)〕。この金属層11
0の高さは、絶縁性樹脂層102の表面から先端が突出
しないようにする。次いで、金属層110の表面を含む
絶縁性樹脂層102の全面にスパッタ等によって形成し
たメタライズ層118に、レジスト層124を形成して
パターニングを施し導体パターン106及びランド部1
08を形成する〔図11(c)(d)(e)〕。以下、
図11(e)の絶縁性樹脂層102上に対し図11
(a)からの工程を順次施すことによって、絶縁性樹脂
層が絶縁性基板100上に複数層積層された多層配線基
板を製造できる。
Further, as shown in FIG. 11, the insulating substrate 10
If the via part 122 is formed in advance in 0,
The multilayer wiring board can be manufactured by a process omitted from the process shown in FIG. In this step, first, a predetermined thickness of resin such as polyimide is formed so as to cover the conductor pattern 106 formed by patterning the metallized layer formed over the entire surface of the insulating substrate 100 and the land portion 108. In the insulating resin layer 102, a through hole 116 for a via portion is formed in which the surface of the land portion 108 is exposed at the bottom surface (FIG. 11A). The metal layer 110 is formed in the through hole 116 for the via portion by electrolytic plating while supplying power through the via portion 122 [FIG. 11 (b)]. This metal layer 11
The height of 0 prevents the tip from protruding from the surface of the insulating resin layer 102. Then, a resist layer 124 is formed on the metallized layer 118 formed by sputtering or the like on the entire surface of the insulating resin layer 102 including the surface of the metal layer 110 and patterned to form the conductor pattern 106 and the land portion 1.
No. 08 is formed [FIG. 11 (c) (d) (e)]. Less than,
As shown in FIG. 11 on the insulating resin layer 102 of FIG.
By sequentially performing the steps from (a), it is possible to manufacture a multilayer wiring board in which a plurality of insulating resin layers are laminated on the insulating substrate 100.

【0005】[0005]

【発明が解決しようとする課題】かかる図10及び図1
1に示す多層配線基板の製造方法によれば、複雑な導体
パターンが多層に形成された多層配線基板を製造するこ
とができる。しかしながら、図10に示す多層配線基板
の製造方法は、工程が長く複雑であるため、工程の短縮
化や簡略化等が要請されている。一方、図11に示す多
層配線基板の製造方法は、図10に示す製造方法に比較
して工程が簡略化されるが、絶縁性基板に予めビア部が
形成されていることが必要である。しかも、図11に示
す製造方法によって得られた多層配線基板には、ビア部
と絶縁性樹脂層との境界近傍に多少の段差部が形成され
易いため、かかる段差部上に形成された導体パターンや
ランド部に断線が発生する懸念も存在する。また、ビア
部の金属層110と絶縁性樹脂層との密着性が劣るた
め、ビア部と絶縁性樹脂層との剥離、或いは銅等の金属
が絶縁性樹脂層に拡散して絶縁性樹脂層の絶縁性能の低
下を惹起するおそれもある。そこで、本発明の目的は、
金属から成るビア部と絶縁性樹脂層との剥離や絶縁性樹
脂層の絶縁性能の低下等を解消し得る多層配線基板の提
供、及び多層配線基板の製造工程を簡略化することので
きる多層配線基板の製造方法を提供することにある。
10 and 1 described above.
According to the method of manufacturing a multilayer wiring board shown in 1, it is possible to manufacture a multilayer wiring board in which complicated conductor patterns are formed in multiple layers. However, in the method for manufacturing the multilayer wiring board shown in FIG. 10, since the steps are long and complicated, it is required to shorten or simplify the steps. On the other hand, in the method for manufacturing the multilayer wiring board shown in FIG. 11, the steps are simplified as compared with the manufacturing method shown in FIG. 10, but it is necessary to previously form a via portion in the insulating substrate. Moreover, in the multilayer wiring board obtained by the manufacturing method shown in FIG. 11, a slight step portion is likely to be formed in the vicinity of the boundary between the via portion and the insulating resin layer. Therefore, the conductor pattern formed on the step portion is formed. There is also a concern that wire breakage will occur in the land. In addition, since the adhesion between the metal layer 110 of the via part and the insulating resin layer is poor, the via part is separated from the insulating resin layer, or metal such as copper is diffused into the insulating resin layer and the insulating resin layer is formed. There is also a possibility of causing deterioration of the insulation performance. Therefore, the purpose of the present invention is to
Provided is a multilayer wiring board capable of eliminating peeling between a via part made of metal and an insulating resin layer and deterioration of insulation performance of the insulating resin layer, and a multilayer wiring capable of simplifying a manufacturing process of the multilayer wiring board. It is to provide a method for manufacturing a substrate.

【0006】[0006]

【課題を解決するための手段】本発明者は、前記目的を
達成すべく検討を重ねた結果、ビア部用貫通孔に電解め
っきによって金属を充填してビア部を形成する際に、ビ
ア部と導体パターンとを同時に形成することによって、
工程の短縮化や簡略化が可能となること、及び絶縁性樹
脂層と接触するビア部の裏面側に、絶縁性樹脂層とビア
部との密着性向上を図ると共に、ビア部を形成する金属
の絶縁性樹脂層への拡散防止を図り得る密着バリア層を
形成することによって、ビア部と絶縁性樹脂層との剥離
や絶縁性樹脂層の絶縁性能の低下等を解消し得ることを
見出し、本発明に到達した。すなわち、本発明は、絶縁
性基板上に複数層の絶縁性樹脂層が積層され、且つ前記
絶縁性基板及び絶縁性樹脂層の各々の表面側に形成され
た導体パターンと、互いに異なる絶縁性樹脂層の表面側
に形成された所定の導体パターン同士を連結するよう
に、前記絶縁性樹脂層を貫いて形成された金属から成る
ビア部とを具備する多層配線基板において、該ビア部
が、前記導体パターンが形成された絶縁性基板又は絶縁
性樹脂層の表面上に積層された次層の絶縁性樹脂層を貫
き、前記導体パターンのランド部が露出する底面側ほど
小径となるテーパー状貫通孔に、めっき充填されて形成
された金属層と、前記金属層から延出されて絶縁性樹脂
層の表面上に形成されたランド部とから成り、少なくと
も前記絶縁性樹脂層と接触するビア部の接触面に、絶縁
性樹脂層とビア部との密着性向上及びビア部を形成する
金属の絶縁性樹脂層への拡散防止を図る密着バリア層が
形成されていることを特徴とする多層配線基板にある。
かかる構成の多層配線基板において、ビア部を形成する
ランド部の全表面が、前記ビア部を形成する金属の絶縁
性樹脂層への拡散防止を図るバリア層で覆うことによっ
て、ランド部の表面から絶縁性樹脂層への金属の拡散を
防止できる。
As a result of repeated studies to achieve the above object, the present inventor has found that when forming a via part by filling a via part through hole with metal by electrolytic plating, the via part is formed. By simultaneously forming the conductor pattern and the conductor pattern,
The process can be shortened or simplified, and the adhesion between the insulating resin layer and the via portion is improved on the back surface side of the via portion that contacts the insulating resin layer, and the metal forming the via portion is also improved. By forming an adhesion barrier layer capable of preventing diffusion to the insulating resin layer, it was found that peeling between the via portion and the insulating resin layer and deterioration of the insulating performance of the insulating resin layer can be solved, The present invention has been reached. That is, according to the present invention, a plurality of insulating resin layers are laminated on an insulating substrate, and the conductive patterns formed on the respective surface sides of the insulating substrate and the insulating resin layer are different from each other. In a multilayer wiring board comprising a via part made of metal formed through the insulating resin layer so as to connect predetermined conductor patterns formed on the surface side of the layer, the via part is A tapered through hole that penetrates an insulating resin layer which is the next layer laminated on the surface of an insulating substrate or an insulating resin layer on which a conductor pattern is formed, and has a smaller diameter toward the bottom surface side where the land portion of the conductor pattern is exposed. A metal layer formed by plating and filling, and a land portion extending from the metal layer and formed on the surface of the insulating resin layer, and at least a via portion in contact with the insulating resin layer. On the contact surface, In the multilayer wiring board, wherein the edge resin layer and the adhesion-improving and adhesion barrier layer prevents diffusion of the metal of the insulating resin layer to form a via portion of the via portion is formed.
In the multilayer wiring board having such a structure, by covering the entire surface of the land portion forming the via portion with a barrier layer for preventing diffusion of the metal forming the via portion into the insulating resin layer, The metal can be prevented from diffusing into the insulating resin layer.

【0007】また、本発明は、絶縁性基板上に複数層の
絶縁性樹脂層が積層され、且つ前記絶縁性基板及び絶縁
性樹脂層の各々の表面側に形成された導体パターンと、
互いに異なる絶縁性樹脂層の表面側に形成された所定の
導体パターン同士を連結するように、前記絶縁性樹脂層
を貫いて形成された金属から成るビア部とを具備する多
層配線基板を製造する際に、該絶縁性基板又は絶縁性樹
脂層の表面に形成された導体パターンのランド部を覆う
次層の絶縁性樹脂層に、前記ランド部が露出して底面を
形成するように、底面側ほど小径となるテーパー状貫通
孔を穿設した後、前記テーパー状貫通孔の底面及び壁面
を含む前記絶縁性樹脂層の全表面に、絶縁性樹脂層と前
記ビア部との密着性向上及びビア部を形成する金属の絶
縁性樹脂層への拡散防止を図る密着バリア層を形成し、
次いで、前記密着バリア層上に形成された所定高さのレ
ジスト層にパターニングして得られた、導体パターン及
びビア部を形成する部分で且つ密着バリア層の露出部分
に、めっきにより前記レジスト層の高さ以上の金属層を
形成せしめ、その後、前記金属層に研磨処理を施して平
坦化した金属層面に、前記金属層を形成する金属の絶縁
性樹脂層への拡散防止を図るバリア層を形成した後、前
記レジスト層を除去することによって露出した、前記密
着バリア層の露出部分を除去して導体パターン及びビア
部を形成することを特徴とする多層配線基板の製造方法
でもある。
Further, according to the present invention, a plurality of insulating resin layers are laminated on an insulating substrate, and a conductor pattern formed on each surface side of the insulating substrate and the insulating resin layer,
A multi-layer wiring board having a via part made of metal formed through the insulating resin layer so as to connect predetermined conductor patterns formed on the surface sides of different insulating resin layers from each other is manufactured. At this time, the bottom surface side is formed so that the land portion is exposed and forms a bottom surface in the next-layer insulating resin layer that covers the land portion of the conductor pattern formed on the surface of the insulating substrate or the insulating resin layer. After forming a tapered through hole having a smaller diameter, the entire surface of the insulating resin layer including the bottom surface and the wall surface of the tapered through hole is improved in adhesiveness between the insulating resin layer and the via portion, and the via hole is formed. Forming an adhesion barrier layer for preventing diffusion of the metal forming the part to the insulating resin layer,
Next, by patterning the resist layer of a predetermined height formed on the adhesion barrier layer, the exposed portion of the adhesion barrier layer, which is a portion for forming a conductor pattern and a via portion, is plated to form the resist layer. A metal layer having a height or more is formed, and then a barrier layer for preventing diffusion of the metal forming the metal layer into the insulating resin layer is formed on the surface of the metal layer that has been planarized by polishing the metal layer. After that, the exposed portion of the adhesion barrier layer exposed by removing the resist layer is removed to form a conductor pattern and a via portion, which is also a method for manufacturing a multilayer wiring board.

【0008】かかる構成の多層配線基板の製造方法にお
いて、めっきによりレジスト層の高さ以上の金属層を形
成せしめた後、前記金属層に研磨処理を施して平坦化
し、その後、前記レジスト層を除去して露出した密着バ
リア層の露出部分を除去して形成された導体パターン及
びビア部の表面に、前記導体パターン及びビア部を形成
する金属の絶縁性樹脂層への拡散防止を図るバリア層を
形成することによって、導体パターン及びビア部の露出
表面をバリア層で覆うことができる。また、導体パター
ン及びビア部が形成される部分の密着バリア層が残留す
るように、前記密着バリア層にパターニングを施した
後、前記導体パターンを形成する部分の密着バリア層と
ビア部を形成する部分の密着バリア層との間に、絶縁性
樹脂から成る所定高さの段差防止層を形成せしめ、その
後、密着バリア層が露出して導体パターン及びビア部を
形成する部分に、めっきによって前記段差防止層の高さ
以上の金属層を形成せしめた後、前記金属層に研磨処理
を施して平坦化することにより形成された導体パターン
及びビア部の表面に、前記導体パターン及びビア部を形
成する金属の絶縁性樹脂層への拡散防止を図るバリア層
を形成することによって、ランド部及び導体パターンが
厚くても多層配線基板の平坦性を確保できる。
In the method of manufacturing a multilayer wiring board having such a structure, after forming a metal layer having a height higher than that of the resist layer by plating, the metal layer is subjected to a polishing treatment to be planarized, and then the resist layer is removed. A barrier layer for preventing diffusion of the metal forming the conductor pattern and the via portion to the insulating resin layer is formed on the surface of the conductor pattern and the via portion formed by removing the exposed portion of the adhesion barrier layer exposed by By forming, the exposed surface of the conductor pattern and the via portion can be covered with the barrier layer. Further, after patterning the adhesion barrier layer so that the adhesion barrier layer in the part where the conductor pattern and the via part are formed remains, the adhesion barrier layer and the via part in the part where the conductor pattern is formed are formed. A step preventing layer made of an insulating resin and having a predetermined height is formed between the contact barrier layer and a part of the contact barrier layer, and then the step is formed by plating on the part where the contact barrier layer is exposed to form a conductor pattern and a via part. After forming a metal layer having a height equal to or higher than that of the prevention layer, the conductor pattern and the via portion are formed on the surface of the conductor pattern and the via portion formed by polishing the metal layer to flatten it. By forming the barrier layer for preventing the diffusion of the metal into the insulating resin layer, the flatness of the multilayer wiring board can be secured even if the land portion and the conductor pattern are thick.

【0009】更に、絶縁性基板又は絶縁性樹脂層の表面
に形成された導体パターンのランド部を覆う次層の絶縁
性樹脂層に、前記ランド部が露出して底面を形成するよ
うに、底面側ほど小径となるテーパー状貫通孔を穿設し
た後、前記導体パターンを形成する部分とビア部を形成
する部分との間に、絶縁性樹脂から成る所定高さの段差
防止層を形成し、次いで、前記テーパー状貫通孔の底面
及び壁面を含む前記絶縁性樹脂層と段差防止層との全表
面に亘って形成された、絶縁性樹脂層と前記ビア部との
密着性向上及びビア部を形成する金属の絶縁性樹脂層へ
の拡散防止を図る密着バリア層上に、めっきによって所
定厚さの金属層を形成せしめ、その後、前記金属層に研
磨処理を施し平坦化することによって露出した段差防止
層を介して形成された導体パターン及びビア部の表面
に、前記導体パターン及びビア部を形成する金属の絶縁
性樹脂層への拡散防止を図るバリア層を形成することに
よって、段差防止層の側壁に密着バリア層を形成でき、
且つ容易に多層配線基板を製造することができる。
Further, a bottom surface is formed so that the land portion is exposed and forms a bottom surface in the next layer of the insulating resin layer that covers the land portion of the conductor pattern formed on the surface of the insulating substrate or the insulating resin layer. After forming a tapered through hole having a smaller diameter toward the side, a step height preventing layer made of an insulating resin and having a predetermined height is formed between a portion forming the conductor pattern and a portion forming a via portion, Next, the adhesion between the insulating resin layer and the via portion is improved and the via portion is formed over the entire surface of the insulating resin layer including the bottom surface and the wall surface of the tapered through hole and the step prevention layer. A metal layer having a predetermined thickness is formed by plating on the adhesion barrier layer for preventing the diffusion of the metal to be formed into the insulating resin layer, and then the metal layer is subjected to a polishing treatment to be flattened to expose the step difference. Formed through the prevention layer By forming a barrier layer on the surface of the conductor pattern and the via portion to prevent the metal forming the conductor pattern and the via portion from diffusing into the insulating resin layer, an adhesion barrier layer is formed on the sidewall of the step prevention layer. You can
In addition, the multilayer wiring board can be easily manufactured.

【0010】[0010]

【作用】本発明によれば、絶縁性樹脂層と接触するビア
部の裏面側に形成された、絶縁性樹脂層と金属層との密
着性向上及び金属層を形成する金属の絶縁性樹脂層への
拡散防止を図る密着バリア層によって、ビア部と絶縁性
樹脂層との剥離及び絶縁性樹脂層の絶縁性低下を解消す
ることができる。また、ビア部用貫通孔が絶縁性樹脂層
の裏面側に形成された導体パターンのランド部が露出す
る底面側ほど小径となるテーパー状貫通孔であるため、
均一厚さの密着バリア層をスパッタ等によって容易に形
成することができる。更に、テーパー状貫通孔にめっき
によって金属を充填してビア部を形成する際に、同時に
導体パターンを形成することができ、ビア部を形成する
工程と導体パターンを形成する工程とが別工程である従
来の製造方法に比較して、工程を著しく簡略化すること
ができる。
According to the present invention, the adhesion between the insulating resin layer and the metal layer is improved and the metal insulating resin layer forming the metal layer is formed on the back surface side of the via portion that contacts the insulating resin layer. The adhesion barrier layer for preventing diffusion into the insulating layer can eliminate the peeling of the via portion from the insulating resin layer and the deterioration of the insulating property of the insulating resin layer. Further, since the through hole for the via portion is a tapered through hole having a smaller diameter on the bottom surface side where the land portion of the conductor pattern formed on the back surface side of the insulating resin layer is exposed,
The adhesion barrier layer having a uniform thickness can be easily formed by sputtering or the like. Furthermore, when forming the via part by filling the tapered through-hole with metal by plating, the conductor pattern can be formed at the same time, and the step of forming the via part and the step of forming the conductor pattern are separate steps. The process can be significantly simplified as compared with a conventional manufacturing method.

【0011】[0011]

【実施例】本発明を図面によって更に詳細に説明する。
図1は、本発明の一実施例を示す部分断面図であって、
窒化アルミからなるセラミック製の絶縁性基板10の上
面に導体パターン16及び導体パターンの端部にランド
部18が形成されている。これら導体パターン16及び
ランド部18は、絶縁性基板面からチタン(Ti)薄膜
層、モリブデン(Mo)薄膜層、及びニッケル(Ni)
薄膜層が順次積層されている。この導体パターン16及
びランド部18を形成するチタン(Ti)薄膜層は、窒
化アルミからなるセラミック製の絶縁性基板10と信号
を伝送するモリブデン(Mo)薄膜層との密着性の向上
を、ニッケル(Ni)薄膜層は、モリブデン(Mo)薄
膜層の絶縁性樹脂層への拡散防止を各々図るためのもの
である。かかる導体パターン16は所定厚さのポリイミ
ド樹脂から成る絶縁性樹脂層12によって覆われている
が、ランド部18は絶縁性樹脂層12を貫いて形成され
たビア部20の底面と接続されている。
The present invention will be described in more detail with reference to the drawings.
FIG. 1 is a partial sectional view showing an embodiment of the present invention,
A conductor pattern 16 is formed on the upper surface of a ceramic insulating substrate 10 made of aluminum nitride, and a land portion 18 is formed at an end of the conductor pattern. The conductor pattern 16 and the land portion 18 are formed from the surface of the insulating substrate such that a titanium (Ti) thin film layer, a molybdenum (Mo) thin film layer, and a nickel (Ni) thin film layer.
The thin film layers are sequentially stacked. The titanium (Ti) thin film layer that forms the conductor pattern 16 and the land portion 18 improves the adhesion between the ceramic insulating substrate 10 made of aluminum nitride and the molybdenum (Mo) thin film layer that transmits signals. The (Ni) thin film layer is for preventing diffusion of the molybdenum (Mo) thin film layer into the insulating resin layer. The conductor pattern 16 is covered with an insulating resin layer 12 made of a polyimide resin having a predetermined thickness, but the land portion 18 is connected to the bottom surface of a via portion 20 formed through the insulating resin layer 12. .

【0012】ビア部20は、銅金属から成り且つランド
部18側ほど小径となるテーパー状であって、絶縁性樹
脂層12に形成されたテーパー状貫通孔にめっき充填さ
れて形成された金属層24と、金属層24から延出され
て絶縁性樹脂層12の表面上に、テーパー状貫通孔の開
口部よりも広面積に形成されたランド部28とから成
る。かかる金属層24とランド部28との絶縁性樹脂層
12に接触する部分には、絶縁性樹脂層12と金属層2
4との密着性向上及び銅金属の絶縁性樹脂層12への拡
散防止を図る密着バリア層22が形成されている。密着
バリア層22は、テーパー状貫通孔の壁面側からクロム
(Cr)薄膜層及び銅(Cu)薄膜層が順次積層されて
形成されているものである。これら薄膜層のうち、クロ
ム(Cr)薄膜層は絶縁性樹脂層12との密着性向上と
銅金属の拡散防止を、及び銅(Cu)薄膜層は密着バリ
ア層22の電気抵抗値の低下を各々図るためである。こ
の密着バリア層22を構成する銅(Cu)薄膜層の層厚
は約0.2μm程度でよい。また、絶縁性樹脂層12の
上面に形成された、ランド部28と同一厚さの導体パタ
ーン17及びランド部28の各上面には、銅金属の絶縁
性樹脂層への拡散防止のため、バリア層26としてニッ
ケル(Ni)薄膜層が形成されている。尚、本実施例で
は、導体パターン17を形成する銅層25の下面側に
も、密着バリア層22が形成されている。
The via portion 20 is made of copper metal and has a taper shape having a smaller diameter on the side of the land portion 18 and is formed by plating and filling a tapered through hole formed in the insulating resin layer 12. 24, and a land portion 28 extended from the metal layer 24 and formed on the surface of the insulating resin layer 12 in a larger area than the opening of the tapered through hole. The insulating resin layer 12 and the metal layer 2 are provided at the portions of the metal layer 24 and the land portion 28 that contact the insulating resin layer 12.
4, an adhesion barrier layer 22 is formed to improve the adhesion with 4, and prevent the diffusion of copper metal into the insulating resin layer 12. The adhesion barrier layer 22 is formed by sequentially stacking a chromium (Cr) thin film layer and a copper (Cu) thin film layer from the wall surface side of the tapered through hole. Among these thin film layers, the chromium (Cr) thin film layer improves the adhesion to the insulating resin layer 12 and prevents the diffusion of copper metal, and the copper (Cu) thin film layer reduces the electric resistance value of the adhesion barrier layer 22. This is to plan each. The layer thickness of the copper (Cu) thin film layer forming the adhesion barrier layer 22 may be about 0.2 μm. In addition, a barrier is formed on each upper surface of the conductor pattern 17 and the land portion 28, which are formed on the upper surface of the insulating resin layer 12 and have the same thickness as the land portion 28, in order to prevent diffusion of copper metal into the insulating resin layer. A nickel (Ni) thin film layer is formed as the layer 26. In this example, the adhesion barrier layer 22 is also formed on the lower surface side of the copper layer 25 forming the conductor pattern 17.

【0013】図1に記載する多層配線基板は、絶縁性樹
脂層12上に絶縁性樹脂層14が積層され、下層の絶縁
性樹脂層12に形成されたビア部20のランド部28と
上層の絶縁性樹脂層14に形成されたビア部20とが接
続され、且つ絶縁性樹脂層14の上面に導体パターン1
7が形成されている。尚、上層の絶縁性樹脂層14に形
成されたビア部20と導体パターン17とは、下層の絶
縁性樹脂層12に形成されたビア部20と導体パターン
17と同一構造であるため、詳細説明を省略する。とこ
ろで、通常、多層配線基板においては、図9に示す如
く、ビア部を形成する金属層110の下端面積よりもラ
ンド部108の上端面積を大とする。金属層110とラ
ンド部108との中心位置が多少ズレても両者の接続を
確保するためである。この点、本実施例において、ビア
部20を形成する金属層24の部分が、テーパー状に形
成されているため、金属層24の上端面積を従来のビア
部を形成する金属層110の上端面積と等しくしても、
金属層24の下端面積を小面積にできる。このため、図
2に示す様に、ランド部28の中心と接続するビア部2
0の中心とが多少ズレても確実に両者の接続を確保でき
る。
In the multilayer wiring board shown in FIG. 1, the insulating resin layer 14 is laminated on the insulating resin layer 12, and the land portion 28 of the via portion 20 formed in the lower insulating resin layer 12 and the upper portion of the insulating resin layer 12 are formed. The conductor pattern 1 is connected to the via portion 20 formed in the insulating resin layer 14 and is formed on the upper surface of the insulating resin layer 14.
7 are formed. Since the via portion 20 and the conductor pattern 17 formed in the upper insulating resin layer 14 have the same structure as the via portion 20 and the conductor pattern 17 formed in the lower insulating resin layer 12, a detailed description will be given. Is omitted. By the way, generally, in a multilayer wiring board, as shown in FIG. 9, the upper end area of the land portion 108 is larger than the lower end area of the metal layer 110 forming the via portion. This is to secure the connection between the metal layer 110 and the land portion 108 even if the center position of the land portion 108 is slightly displaced. In this regard, in this embodiment, since the portion of the metal layer 24 forming the via portion 20 is formed in a tapered shape, the upper end area of the metal layer 24 is the upper end area of the metal layer 110 forming the conventional via portion. Equal to
The lower end area of the metal layer 24 can be made small. Therefore, as shown in FIG. 2, the via portion 2 connected to the center of the land portion 28 is formed.
Even if the center of 0 is slightly deviated, the connection between them can be surely secured.

【0014】また、図1〜図2に示す多層配線基板にお
いては、絶縁性樹脂層12、14の表面から突出するラ
ンド部28及び導体パターン17の側面は、銅金属が露
出している。このため、ランド部28及び導体パターン
17が厚い場合には、銅金属の絶縁性樹脂層への拡散防
止のため、図3に示す様に、ニッケル(Ni)薄膜層か
ら成るバリア層26を側面側にまで延長することが好ま
しい。更に、ランド部28及び導体パターン17が厚い
場合には、ランド部28と導体パターン17との間に段
差部が形成され易いため、図4に示す様に、ランド部2
8と導体パターン17との間に絶縁性樹脂から成る段差
防止層31、33を形成することによって、多層配線基
板の平坦性を保持できる。
In the multilayer wiring boards shown in FIGS. 1 and 2, copper metal is exposed on the side surfaces of the land portion 28 and the conductor pattern 17 protruding from the surfaces of the insulating resin layers 12 and 14. Therefore, when the land portion 28 and the conductor pattern 17 are thick, the barrier layer 26 made of a nickel (Ni) thin film layer is provided on the side surface as shown in FIG. 3 in order to prevent diffusion of copper metal into the insulating resin layer. It is preferable to extend to the side. Further, when the land portion 28 and the conductor pattern 17 are thick, a step portion is likely to be formed between the land portion 28 and the conductor pattern 17, so that the land portion 2 is formed as shown in FIG.
By forming the step preventing layers 31 and 33 made of an insulating resin between the wiring pattern 8 and the conductor pattern 17, the flatness of the multilayer wiring board can be maintained.

【0015】この様な図1〜4に示す多層配線基板のう
ち、図1に示す多層配線基板は、図5に示す製造方法に
よって製造することができる。図1において、先ず、窒
化アルミから成るセラミック製の絶縁性基板10上に形
成した導体パターン16及びランド部18を覆う所定厚
さのポリイミド樹脂から成る絶縁性樹脂層12を形成
し、ランド部18が露出して底面を形成するテーパー状
貫通孔30を絶縁性樹脂層12に穿設する〔図5
(a)〕。このテーパー状貫通孔30は、底面側ほど小
径となるテーパー状であって、等方性エッチングによっ
て形成できる。尚、導体パターン16及びランド部18
は、絶縁性基板10の全面に亘ってスパッタによって形
成したチタン(Ti)薄膜層、モリブデン(Mo)薄膜
層、及びニッケル(Ni)薄膜層から成るメタライズ層
に、パターニングして形成されたものである。かかるテ
ーパー状貫通孔30の壁面及びランド部18が露出した
底面を含む絶縁性樹脂層12の全面に亘って、クロム
(Cr)薄膜層及び銅(Cu)薄膜層から成るメタライ
ズ層32をスパッタによって形成し、導体パターン及び
ビア部を形成する部分のメタライズ層32が露出するよ
うに、メタライズ層32上に所定高さのレジスト層34
を形成する〔図5(b)(c)〕。ここで、テーパー状
貫通孔30が略円筒状貫通孔である場合、スパッタによ
って貫通孔の壁面に形成するメタライズ層32を均一厚
さにし難い。
Among the multilayer wiring boards shown in FIGS. 1 to 4, the multilayer wiring board shown in FIG. 1 can be manufactured by the manufacturing method shown in FIG. In FIG. 1, first, an insulating resin layer 12 made of polyimide resin having a predetermined thickness is formed to cover the conductor pattern 16 and the land portion 18 formed on the ceramic insulating substrate 10 made of aluminum nitride. The insulating resin layer 12 is provided with a tapered through hole 30 which is exposed to form a bottom surface [FIG.
(A)]. The tapered through hole 30 has a taper shape having a smaller diameter on the bottom surface side and can be formed by isotropic etching. Incidentally, the conductor pattern 16 and the land portion 18
Is formed by patterning a metallized layer including a titanium (Ti) thin film layer, a molybdenum (Mo) thin film layer, and a nickel (Ni) thin film layer formed by sputtering over the entire surface of the insulating substrate 10. is there. A metallized layer 32 made of a chromium (Cr) thin film layer and a copper (Cu) thin film layer is formed by sputtering over the entire surface of the insulating resin layer 12 including the wall surface of the tapered through hole 30 and the bottom surface where the land portion 18 is exposed. A resist layer 34 having a predetermined height is formed on the metallization layer 32 so that the metallization layer 32 in the portion where the conductor pattern and the via portion are formed is exposed.
Are formed (FIGS. 5B and 5C). Here, when the tapered through hole 30 is a substantially cylindrical through hole, it is difficult to make the metallized layer 32 formed on the wall surface of the through hole by sputtering to have a uniform thickness.

【0016】次いで、メタライズ層32から給電しつつ
電解めっきによって、メタライズ層32の露出部分に銅
金属を積層して銅金属層36、37を形成する。電解め
っきは、銅金属層36、37の最も低い部分がレジスト
層34の表面以上の高さとなるまで継続する〔図5
(d)〕。この銅金属層36、37は、研磨処理によっ
て平坦化されると共に、厚さが調整され、導体パターン
17(図1)を形成する銅層25及びビア部20(図
1)を形成する金属層24とランド部28となる〔図5
(e)〕。更に、図5(e)に示す銅層25及びランド
部28の表面には、銅金属の拡散防止を図るため、バリ
ア層26としてニッケル(Ni)薄膜層を電解めっきに
よって形成した後、レジスト層34を除去してからメタ
ライズ層32の露出部分をエッチング等で除去すること
によって絶縁性樹脂層12上に導体パターン17と、絶
縁性基板10上に形成されたランド部18と接続された
ビア部20とを同時に形成できる〔図5(f)
(g)〕。尚、バリア層26としてのニッケル(Ni)
薄膜層を電解めっきによって形成できない場合には、無
電解めっきによって形成してもよい。以下、図5(g)
の絶縁性樹脂層12上に対し図5(a)からの工程を順
次施すことによって、絶縁性樹脂層が絶縁性基板10上
に複数層積層された多層配線基板を製造できる。
Next, copper metal is laminated on the exposed portion of the metallized layer 32 by electrolytic plating while supplying power from the metallized layer 32 to form copper metal layers 36 and 37. Electrolytic plating is continued until the lowest portion of the copper metal layers 36, 37 is higher than the surface of the resist layer 34 [FIG.
(D)]. The copper metal layers 36 and 37 are flattened by a polishing process and the thickness thereof is adjusted, and the copper layer 25 forming the conductor pattern 17 (FIG. 1) and the metal layer forming the via portion 20 (FIG. 1). 24 and the land portion 28 [FIG.
(E)]. Further, on the surfaces of the copper layer 25 and the land portion 28 shown in FIG. 5E, a nickel (Ni) thin film layer is formed as a barrier layer 26 by electrolytic plating in order to prevent diffusion of copper metal, and then a resist layer is formed. After removing 34, the exposed portion of the metallized layer 32 is removed by etching or the like to form a via portion connected to the conductor pattern 17 on the insulating resin layer 12 and the land portion 18 formed on the insulating substrate 10. 20 and 20 can be formed at the same time [Fig. 5 (f)]
(G)]. Incidentally, nickel (Ni) as the barrier layer 26
If the thin film layer cannot be formed by electrolytic plating, it may be formed by electroless plating. Below, FIG. 5 (g)
By sequentially performing the process from FIG. 5A on the insulating resin layer 12 of FIG. 5, a multilayer wiring board in which a plurality of insulating resin layers are laminated on the insulating substrate 10 can be manufactured.

【0017】また、図3に示す多層配線基板を製造せん
とする場合、図6に示す方法によって製造できる。この
方法は、図5(e)の工程まで図5に示す工程と同一工
程を通過するため、図5(e)に示す基板と同一基板を
図6(a)に示した。図6(a)に示す基板に対し、レ
ジスト層34を除去して露出したメタライズ層32をエ
ッチング等で除去する。このため、絶縁性樹脂層12上
に導体パターン17を形成する銅層25と、絶縁性基板
10上に形成されたランド部18と接続された、金属層
24及びランド部28から成るビア部20とが同時に形
成される〔図6(b)(c)〕。次いで、銅層25及び
ランド部28の全表面に、バリア層26としてのニッケ
ル(Ni)薄膜層を無電解めっきによって形成する〔図
6(d)〕。以下、図6(d)の絶縁性樹脂層12上に
対し、図5(a)から図5(e)の工程、及び図6
(a)から図6(d)の工程を順次施すことによって、
絶縁性樹脂層が絶縁性基板10上に複数層積層された多
層配線基板を製造できる。
When the multilayer wiring board shown in FIG. 3 is to be manufactured, it can be manufactured by the method shown in FIG. In this method, the same steps as those shown in FIG. 5 are performed up to the step of FIG. 5E, so the same substrate as that shown in FIG. 5E is shown in FIG. 6A. On the substrate shown in FIG. 6A, the resist layer 34 is removed and the exposed metallization layer 32 is removed by etching or the like. Therefore, the via portion 20 including the metal layer 24 and the land portion 28 connected to the copper layer 25 forming the conductor pattern 17 on the insulating resin layer 12 and the land portion 18 formed on the insulating substrate 10. And are simultaneously formed (FIGS. 6B and 6C). Then, a nickel (Ni) thin film layer as the barrier layer 26 is formed on the entire surfaces of the copper layer 25 and the land portion 28 by electroless plating [FIG. 6 (d)]. Hereinafter, the steps of FIGS. 5A to 5E and FIG. 6A to FIG. 6D are performed on the insulating resin layer 12.
By sequentially performing the steps of (a) to FIG. 6 (d),
It is possible to manufacture a multilayer wiring board in which a plurality of insulating resin layers are laminated on the insulating substrate 10.

【0018】更に、図4に示す多層配線基板は、図7に
示す方法によって製造することができる。この方法は、
図5(b)の工程まで図5に示す工程と同一工程を通過
するため、図5(b)に示す基板と同一基板を図7
(a)に示した。図7(a)に示す基板に対し、導体パ
ターン17(図4)及びビア部20(図4)を形成する
部分にレジスト層34を形成した後、メタライズ層32
の露出部分をエッチング等によって除去して密着バリア
層22、22を形成する〔図7(b)(c)〕。次い
で、絶縁性樹脂層12の全表面に、所定厚さの絶縁性樹
脂層を塗布した後、密着バリア層22、22の部分が露
出するように絶縁性樹脂層を部分的に除去して段差防止
層31を形成する〔図7(d)〕。この絶縁性樹脂層の
部分的除去は、所定厚さの絶縁性樹脂層を形成した後、
絶縁性樹脂層上にパターニング用レジスト層を形成して
パターニングし、エッチング処理を施すことによって行
ってもよく、絶縁性樹脂層を感光性樹脂によって形成
し、絶縁性樹脂層自身を露光・現像してパターニングを
施すことによって行ってもよい。更に、密着バリア層2
2、22から給電しつつ電解めっきによって、密着バリ
ア層22、22に銅金属を積層して銅金属層36、37
を形成する。電解めっきは、銅金属層36、37の最も
低い部分が段差防止層31の表面以上の高さとなるまで
継続する〔図7(e)〕。
Further, the multilayer wiring board shown in FIG. 4 can be manufactured by the method shown in FIG. This method
Since the same steps as those shown in FIG. 5 are performed up to the step shown in FIG. 5B, the same substrate as that shown in FIG.
It is shown in (a). After forming a resist layer 34 on the portion where the conductor pattern 17 (FIG. 4) and the via portion 20 (FIG. 4) are formed on the substrate shown in FIG. 7A, the metallization layer 32 is formed.
The exposed portions are removed by etching or the like to form the adhesion barrier layers 22 and 22 (FIGS. 7B and 7C). Next, an insulating resin layer having a predetermined thickness is applied to the entire surface of the insulating resin layer 12, and then the insulating resin layer is partially removed so that the adhesion barrier layers 22 and 22 are exposed. The prevention layer 31 is formed [FIG.7 (d)]. This partial removal of the insulating resin layer is performed after forming an insulating resin layer having a predetermined thickness,
It may be performed by forming a patterning resist layer on the insulating resin layer, patterning it, and then performing an etching treatment. Alternatively, the insulating resin layer is formed of a photosensitive resin, and the insulating resin layer itself is exposed and developed. Alternatively, patterning may be performed. Furthermore, the adhesion barrier layer 2
Copper metal is laminated on the adhesion barrier layers 22 and 22 by electrolytic plating while supplying power from 2 and 22 to form copper metal layers 36 and 37.
To form. Electrolytic plating is continued until the lowest part of the copper metal layers 36, 37 is higher than the surface of the step prevention layer 31 [FIG. 7 (e)].

【0019】この銅金属層36、37は、研磨処理によ
って平坦化されると共に、厚さが調整され、導体パター
ン17(図4)を構成する銅層25と、ビア部20(図
4)を構成する金属層24及びランド部28とを形成す
る〔図7(f)〕。更に、図7(f)に示す銅層25及
びランド部28の表面には、銅金属の拡散防止を図るた
め、バリア層26としてニッケル(Ni)薄膜層を電解
めっきによって形成することによって、絶縁性樹脂層1
2上に導体パターン17と、絶縁性基板10上に形成さ
れたランド部18に接続されたビア部20とを同時に形
成できる〔図7(g)〕。尚、図7に示す方法における
めっきは、電解めっきを施したが、給電ができない場合
には、無電解めっきであってもよい。以下、図7(g)
の段差防止層31上に、図5(a)から図5(b)の工
程、及び図7(a)から図7(g)の工程を順次施すこ
とによって、絶縁性樹脂層が絶縁性基板10上に複数層
積層された多層配線基板を製造できる。
The copper metal layers 36 and 37 are flattened by a polishing process and have their thicknesses adjusted so that the copper layer 25 forming the conductor pattern 17 (FIG. 4) and the via portion 20 (FIG. 4) are formed. The constituent metal layer 24 and the land portion 28 are formed [FIG. 7 (f)]. Further, on the surfaces of the copper layer 25 and the land portion 28 shown in FIG. 7 (f), a nickel (Ni) thin film layer is formed as a barrier layer 26 by electrolytic plating in order to prevent diffusion of copper metal. Resin layer 1
The conductor pattern 17 and the via portion 20 connected to the land portion 18 formed on the insulating substrate 10 can be simultaneously formed on the wiring 2 (FIG. 7G). Although the plating in the method shown in FIG. 7 is electrolytic plating, electroless plating may be used when power cannot be supplied. Below, FIG. 7 (g)
The step of FIG. 5A to FIG. 5B and the step of FIG. 7A to FIG. 7G are sequentially performed on the step prevention layer 31 of FIG. It is possible to manufacture a multilayer wiring board in which a plurality of layers are stacked on the substrate 10.

【0020】図7に示す多層配線基板の製造方法におい
ては、メタライズ層32にパターニングを施した後に、
めっきによって銅金属層36、37を形成するため、形
成予定の一の導体パターンが他の導体パターンから独立
した独立パターンである場合、独立パターンを形成する
部分に密着バリア層22から給電することができず、電
解めっきに代えて無電解めっきを採用しなければならな
い。この点、図8に示す製造方法によれば、形成予定の
導体パターンが独立パターンであっても、電解めっきに
よって銅金属層を形成することができる。つまり、図5
(a)に示す、窒化アルミから成るセラミック製の絶縁
性基板10上に形成した導体パターン16を覆い、且つ
ランド部18が露出して底面を形成するテーパー状貫通
孔30が穿設された絶縁性樹脂層12上に、段差防止層
31を形成する〔図8(a)〕。この段差防止層31
は、絶縁性樹脂層12の全表面に、所定厚さの絶縁性樹
脂層を形成した後、形成予定の導体パターン17及びビ
ア部20の部分が露出するように絶縁性樹脂層を部分的
に除去することによって形成する。絶縁性樹脂層の部分
的除去は、所定厚さの絶縁性樹脂層を形成した後、絶縁
性樹脂層上にパターニング用レジスト層を塗布してパタ
ーニングし、エッチング処理を施すことによって行って
もよく、絶縁性樹脂層を感光性樹脂によって形成し、絶
縁性樹脂層自身を露光・現像してパターニングを施すこ
とによって行ってもよい。
In the method of manufacturing a multilayer wiring board shown in FIG. 7, after patterning the metallization layer 32,
Since the copper metal layers 36 and 37 are formed by plating, when one conductor pattern to be formed is an independent pattern independent of the other conductor pattern, power can be supplied from the adhesion barrier layer 22 to the portion where the independent pattern is formed. However, electroless plating must be adopted instead of electrolytic plating. In this respect, according to the manufacturing method shown in FIG. 8, even if the conductor pattern to be formed is an independent pattern, the copper metal layer can be formed by electrolytic plating. That is, FIG.
(A) Insulation covering the conductor pattern 16 formed on the ceramic insulating substrate 10 made of aluminum nitride and having a tapered through hole 30 that exposes the land portion 18 and forms the bottom surface. The step prevention layer 31 is formed on the functional resin layer 12 [FIG. 8 (a)]. This step prevention layer 31
After forming the insulating resin layer having a predetermined thickness on the entire surface of the insulating resin layer 12, the insulating resin layer is partially formed so that the conductor pattern 17 and the via portion 20 to be formed are exposed. It is formed by removing. Partial removal of the insulating resin layer may be performed by forming an insulating resin layer having a predetermined thickness, applying a patterning resist layer on the insulating resin layer to perform patterning, and then performing an etching treatment. Alternatively, the insulating resin layer may be formed of a photosensitive resin, and the insulating resin layer itself may be exposed and developed to perform patterning.

【0021】次いで、テーパー状貫通孔30の壁面及び
ランド部18が露出した底面を含む絶縁性樹脂層12と
段差防止層31との全表面に亘って、クロム(Cr)薄
膜層及び銅(Cu)薄膜層から成るメタライズ層32を
形成する〔図8(b)〕。更に、メタライズ層32から
給電する電解めっきによって、メタライズ層32の全面
に亘って所定厚さの銅金属層38を形成する〔図8
(c)〕。このため、形成する導体パターンの一つが独
立パターンであっても、常に、電解めっきによって銅金
属層38を形成できる。形成された銅金属層38には研
磨処理が施されて平坦化と厚さ調整とが行われ、露出し
た段差防止層31によって導体パターンを形成する銅層
25とビア部を形成する銅層24及びランド部28とが
分離される〔図8(d)〕。その後、図8(d)に示す
銅層25及びランド部28の表面には、銅金属の拡散防
止を図るため、バリア層26としてニッケル(Ni)薄
膜層を電解めっき又は無電解めっきによって形成する
〔図8(e)〕。以下、図8(e)の段差防止層31上
に、図5(a)の工程、及び図8(a)から図8(e)
の工程を順次施すことによって、絶縁性樹脂層が絶縁性
基板10上に複数層積層された多層配線基板を製造でき
る。
Then, over the entire surface of the insulating resin layer 12 including the wall surface of the tapered through hole 30 and the bottom surface where the land portion 18 is exposed and the step prevention layer 31, a chromium (Cr) thin film layer and copper (Cu) are formed. ) A metallized layer 32 composed of a thin film layer is formed [FIG. 8 (b)]. Further, a copper metal layer 38 having a predetermined thickness is formed over the entire surface of the metallized layer 32 by electrolytic plating that supplies power from the metallized layer 32 [FIG. 8].
(C)]. Therefore, even if one of the conductor patterns to be formed is an independent pattern, the copper metal layer 38 can always be formed by electrolytic plating. The formed copper metal layer 38 is subjected to polishing treatment for flattening and thickness adjustment, and the exposed step prevention layer 31 forms a copper layer 25 forming a conductor pattern and a copper layer 24 forming a via portion. And the land part 28 is separated [FIG.8 (d)]. Thereafter, on the surfaces of the copper layer 25 and the land portion 28 shown in FIG. 8D, a nickel (Ni) thin film layer is formed as a barrier layer 26 by electrolytic plating or electroless plating in order to prevent diffusion of copper metal. [FIG.8 (e)]. Hereinafter, the step of FIG. 5A and the steps of FIG. 8A to FIG. 8E are formed on the step prevention layer 31 of FIG.
By sequentially performing the above steps, it is possible to manufacture a multilayer wiring board in which a plurality of insulating resin layers are laminated on the insulating substrate 10.

【0022】かかる図8に示す工程によって得られた多
層配線基板においては、銅層25が密着バリア層22及
びバリア層26によって囲まれた導体パターン17、及
び銅層24及びランド部28が密着バリア層22及びバ
リア層26によって囲まれたビア部20を形成すること
ができる。このため、銅層24、25を形成する銅金属
の拡散を充分に防止できる。また、その製造工程におい
ても、電解めっきによって銅金属層38を形成でき、且
つメタライズ層32のパターンニング工程を不要とする
ことができるため、容易に多層配線基板を製造できる。
In the multilayer wiring board obtained by the process shown in FIG. 8, the conductor pattern 17 in which the copper layer 25 is surrounded by the adhesion barrier layer 22 and the barrier layer 26, and the copper layer 24 and the land portion 28 are the adhesion barrier. The via portion 20 surrounded by the layer 22 and the barrier layer 26 can be formed. Therefore, the diffusion of the copper metal forming the copper layers 24 and 25 can be sufficiently prevented. Also in the manufacturing process, the copper metal layer 38 can be formed by electrolytic plating, and the patterning process of the metallized layer 32 can be omitted, so that the multilayer wiring board can be easily manufactured.

【0023】[0023]

【発明の効果】本発明によれば、ビア部を構成する金属
層と絶縁性樹脂層との剥離防止、及び金属層を形成する
金属の絶縁性樹脂層への拡散防止を図ることができ、多
層配線基板の信頼性を向上することができる。また、ビ
ア部と導体パターンとを同時に形成できるため、多層配
線基板の製造工程を簡略化することができ、得られる多
層配線基板の製造コストの低減を図ることも可能であ
る。
According to the present invention, it is possible to prevent the metal layer forming the via part from being separated from the insulating resin layer, and to prevent the metal forming the metal layer from diffusing into the insulating resin layer. The reliability of the multilayer wiring board can be improved. Further, since the via portion and the conductor pattern can be formed at the same time, the manufacturing process of the multilayer wiring board can be simplified, and the manufacturing cost of the obtained multilayer wiring board can be reduced.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の多層配線基板の一実施例を示す部分断
面図である。
FIG. 1 is a partial cross-sectional view showing an embodiment of a multilayer wiring board of the present invention.

【図2】図1に示すランド部の効果を説明する説明図で
ある。
FIG. 2 is an explanatory diagram illustrating an effect of a land portion shown in FIG.

【図3】本発明の他の実施例を示す部分断面図である。FIG. 3 is a partial sectional view showing another embodiment of the present invention.

【図4】本発明の他の実施例を示す部分断面図である。FIG. 4 is a partial cross-sectional view showing another embodiment of the present invention.

【図5】図1の多層配線基板の製造工程を説明する工程
図である。
5A to 5C are process diagrams illustrating a manufacturing process of the multilayer wiring board of FIG.

【図6】図3の多層配線基板の製造工程を説明する工程
図である。
6A to 6C are process diagrams illustrating a manufacturing process of the multilayer wiring board of FIG.

【図7】図4の多層配線基板の製造工程を説明する工程
図である。
7A to 7C are process diagrams illustrating a manufacturing process of the multilayer wiring board of FIG.

【図8】図7に示す多層配線基板の製造方法の改良方法
を説明する工程図である。
8A to 8D are process diagrams illustrating a method for improving the method for manufacturing the multilayer wiring board shown in FIG.

【図9】従来の多層配線基板を示す部分断面図である。FIG. 9 is a partial cross-sectional view showing a conventional multilayer wiring board.

【図10】図9の多層配線基板の製造工程を説明する工
程図である。
FIG. 10 is a process drawing for explaining a manufacturing process of the multilayer wiring board shown in FIG.

【図11】図10の製造工程よりも簡略化された従来の
多層配線基板の製造工程を説明する工程図である。
FIG. 11 is a process diagram illustrating a manufacturing process of a conventional multilayer wiring board which is more simplified than the manufacturing process of FIG.

【符号の説明】[Explanation of symbols]

10 絶縁性基板 12、14 絶縁性樹脂層 16 絶縁性基板10上に形成された導体パターン 17 導体パターン 18 絶縁性基板10上に形成されたランド部 20 ビア部 22 密着バリア層 24、25 金属層 26 バリア層 28 ランド部 10 Insulating Substrate 12, 14 Insulating Resin Layer 16 Conductor Pattern 17 Formed on Insulating Substrate 10 Conductor Pattern 18 Land Part 20 Formed on Insulating Substrate 20 Via Part 22 Adhesion Barrier Layer 24, 25 Metal Layer 26 Barrier layer 28 Land part

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】 絶縁性基板上に複数層の絶縁性樹脂層が
積層され、且つ前記絶縁性基板及び絶縁性樹脂層の各々
の表面側に形成された導体パターンと、互いに異なる絶
縁性樹脂層の表面側に形成された所定の導体パターン同
士を連結するように、前記絶縁性樹脂層を貫いて形成さ
れた金属から成るビア部とを具備する多層配線基板にお
いて、 該ビア部が、前記導体パターンが形成された絶縁性基板
又は絶縁性樹脂層の表面上に積層された次層の絶縁性樹
脂層を貫き、前記導体パターンのランド部が露出する底
面側ほど小径となるテーパー状貫通孔に、めっき充填さ
れて形成された金属層と、前記金属層から延出されて絶
縁性樹脂層の表面上に形成されたランド部とから成り、 少なくとも前記絶縁性樹脂層と接触するビア部の接触面
に、絶縁性樹脂層とビア部との密着性向上及びビア部を
形成する金属の絶縁性樹脂層への拡散防止を図る密着バ
リア層が形成されていることを特徴とする多層配線基
板。
1. An insulating resin layer in which a plurality of insulating resin layers are laminated on an insulating substrate, and conductor patterns formed on respective surface sides of the insulating substrate and the insulating resin layer are different from each other. A multilayer wiring board having a via portion made of a metal formed through the insulating resin layer so as to connect predetermined conductor patterns formed on the front surface side of the conductor layer to the conductor layer. A tapered through hole that penetrates through the insulating resin layer of the next layer laminated on the surface of the insulating substrate or the insulating resin layer on which the pattern is formed, and has a smaller diameter toward the bottom surface side where the land portion of the conductor pattern is exposed. A metal layer formed by plating and filling, and a land portion extending from the metal layer and formed on the surface of the insulating resin layer, at least the contact of the via portion contacting the insulating resin layer Surface, insulating Multi-layer wiring board, wherein a fat layer and the adhesion barrier layer to improve the adhesion and improving the diffusion prevention in the insulating resin layer of the metal forming the via portion of the via portion is formed.
【請求項2】 ビア部を形成するランド部の全表面が、
前記ビア部を形成する金属の絶縁性樹脂層への拡散防止
を図るバリア層によって覆われている請求項1記載の多
層配線基板。
2. The entire surface of the land portion forming the via portion,
The multilayer wiring board according to claim 1, wherein the multilayer wiring board is covered with a barrier layer for preventing diffusion of a metal forming the via portion into the insulating resin layer.
【請求項3】 絶縁性樹脂層の同一表面に形成された導
体パターンとビア部を構成するランド部との間に、絶縁
性樹脂から成る段差防止層が形成されている請求項1記
載の多層配線基板。
3. The multi-layer according to claim 1, wherein a step prevention layer made of an insulating resin is formed between the conductor pattern formed on the same surface of the insulating resin layer and the land portion forming the via portion. Wiring board.
【請求項4】 絶縁性基板上に複数層の絶縁性樹脂層が
積層され、且つ前記絶縁性基板及び絶縁性樹脂層の各々
の表面側に形成された導体パターンと、互いに異なる絶
縁性樹脂層の表面側に形成された所定の導体パターン同
士を連結するように、前記絶縁性樹脂層を貫いて形成さ
れた金属から成るビア部とを具備する多層配線基板を製
造する際に、 該絶縁性基板又は絶縁性樹脂層の表面に形成された導体
パターンのランド部を覆う次層の絶縁性樹脂層に、前記
ランド部が露出して底面を形成するように、底面側ほど
小径となるテーパー状貫通孔を穿設した後、前記テーパ
ー状貫通孔の底面及び壁面を含む前記絶縁性樹脂層の全
表面に、絶縁性樹脂層と前記ビア部との密着性向上及び
ビア部を形成する金属の絶縁性樹脂層への拡散防止を図
る密着バリア層を形成し、 次いで、前記密着バリア層上に形成された所定高さのレ
ジスト層にパターニングして得られた、導体パターン及
びビア部を形成する部分で且つ密着バリア層の露出部分
に、めっきにより前記レジスト層の高さ以上の金属層を
形成せしめ、 その後、前記金属層に研磨処理を施して平坦化した金属
層面に、前記金属層を形成する金属の絶縁性樹脂層への
拡散防止を図るバリア層を形成した後、前記レジスト層
を除去することによって露出した、前記密着バリア層の
露出部分を除去して導体パターン及びビア部を形成する
ことを特徴とする多層配線基板の製造方法。
4. An insulating resin layer in which a plurality of insulating resin layers are laminated on an insulating substrate, and conductor patterns formed on the respective surface sides of the insulating substrate and the insulating resin layer are different from each other. When manufacturing a multilayer wiring board including a via part made of metal formed through the insulating resin layer so as to connect predetermined conductor patterns formed on the front surface side of the A taper shape having a smaller diameter toward the bottom surface side so that the land portion is exposed and forms a bottom surface in the insulating resin layer of the next layer that covers the land portion of the conductor pattern formed on the surface of the substrate or the insulating resin layer. After forming the through hole, on the entire surface of the insulating resin layer including the bottom surface and the wall surface of the tapered through hole, the adhesion between the insulating resin layer and the via portion is improved, and the metal forming the via portion is formed. Dense to prevent diffusion to the insulating resin layer A barrier layer is formed, and then obtained by patterning on a resist layer having a predetermined height formed on the adhesion barrier layer, which is a portion for forming a conductor pattern and a via portion and an exposed portion of the adhesion barrier layer, A metal layer having a height equal to or higher than that of the resist layer is formed by plating, and then the metal layer forming the metal layer is prevented from diffusing into the insulating resin layer on the flattened metal layer surface by polishing the metal layer. After forming a barrier layer for achieving the above, the exposed portion of the adhesion barrier layer exposed by removing the resist layer is removed to form a conductor pattern and a via portion, and a method for manufacturing a multilayer wiring board. .
【請求項5】 絶縁性基板上に複数層の絶縁性樹脂層が
積層され、且つ前記絶縁性基板及び絶縁性樹脂層の各々
の表面側に形成された導体パターンと、互いに異なる絶
縁性樹脂層の表面側に形成された所定の導体パターン同
士を連結するように、前記絶縁性樹脂層を貫いて形成さ
れた金属から成るビア部とを具備する多層配線基板を製
造する際に、 該絶縁性基板又は絶縁性樹脂層の表面に形成された導体
パターンのランド部を覆う次層の絶縁性樹脂層に、前記
ランド部が露出して底面を形成するように、底面側ほど
小径となるテーパー状貫通孔を穿設した後、前記テーパ
ー状貫通孔の底面及び壁面を含む前記絶縁性樹脂層の全
表面に、絶縁性樹脂層と前記ビア部との密着性向上及び
ビア部を形成する金属の絶縁性樹脂層への拡散防止を図
る密着バリア層を形成し、 次いで、前記密着バリア層上に形成された所定高さのレ
ジスト層にパターニングして得られた、導体パターン及
びビア部を形成する部分で且つ密着バリア層の露出部分
に、めっきにより前記レジスト層の高さ以上の金属層を
形成せしめ、 その後、前記金属層に研磨処理を施して平坦化した後、
前記レジスト層を除去して露出した前記密着バリア層の
露出部分を除去して形成された導体パターン及びビア部
の表面に、前記導体パターン及びビア部を形成する金属
の絶縁性樹脂層への拡散防止を図るバリア層を形成する
ことを特徴とする多層配線基板の製造方法。
5. An insulating resin layer in which a plurality of insulating resin layers are laminated on an insulating substrate, and the conductor patterns formed on the respective surface sides of the insulating substrate and the insulating resin layer are different from each other. When manufacturing a multilayer wiring board including a via part made of metal formed through the insulating resin layer so as to connect predetermined conductor patterns formed on the front surface side of the A taper shape having a smaller diameter toward the bottom surface side so that the land portion is exposed and forms a bottom surface in the insulating resin layer of the next layer that covers the land portion of the conductor pattern formed on the surface of the substrate or the insulating resin layer. After forming the through hole, on the entire surface of the insulating resin layer including the bottom surface and the wall surface of the tapered through hole, the adhesion between the insulating resin layer and the via portion is improved, and the metal forming the via portion is formed. Dense to prevent diffusion to the insulating resin layer A barrier layer is formed, and then obtained by patterning on a resist layer having a predetermined height formed on the adhesion barrier layer, which is a portion for forming a conductor pattern and a via portion and an exposed portion of the adhesion barrier layer, A metal layer having a height equal to or higher than that of the resist layer is formed by plating, and then, the metal layer is subjected to polishing treatment to be flattened,
Diffusion of the metal forming the conductor pattern and the via portion into the insulating resin layer on the surface of the conductor pattern and the via portion formed by removing the exposed portion of the adhesion barrier layer exposed by removing the resist layer A method of manufacturing a multilayer wiring board, comprising forming a barrier layer for prevention.
【請求項6】 絶縁性基板上に複数層の絶縁性樹脂層が
積層され、且つ前記絶縁性基板及び絶縁性樹脂層の各々
の表面側に形成された導体パターンと、互いに異なる絶
縁性樹脂層の表面側に形成された所定の導体パターン同
士を連結するように、前記絶縁性樹脂層を貫いて形成さ
れた金属から成るビア部とを具備する多層配線基板を製
造する際に、 該絶縁性基板又は絶縁性樹脂層の表面に形成された導体
パターンのランド部を覆う次層の絶縁性樹脂層に、前記
ランド部が露出して底面を形成するように、底面側ほど
小径となるテーパー状貫通孔を穿設した後、前記テーパ
ー状貫通孔の底面及び壁面を含む前記絶縁性樹脂層の全
表面に、絶縁性樹脂層と前記ビア部との密着性向上及び
ビア部を形成する金属の絶縁性樹脂層への拡散防止を図
る密着バリア層を形成し、 次いで、前記導体パターン及びビア部が形成される部分
の密着バリア層が残留するように、前記密着バリア層に
パターニングを施した後、前記導体パターンを形成する
部分の密着バリア層とビア部を形成する部分の密着バリ
ア層との間に、絶縁性樹脂から成る所定高さの段差防止
層を形成せしめ、 その後、密着バリア層が露出して導体パターン及びビア
部を形成する部分に、めっきによって形成した前記段差
防止層の高さ以上の金属層に、研磨処理を施して平坦化
することにより形成された導体パターン及びビア部の表
面に、前記導体パターン及びビア部を形成する金属の絶
縁性樹脂層への拡散防止を図るバリア層を形成すること
を特徴とする多層配線基板の製造方法。
6. An insulating resin layer in which a plurality of insulating resin layers are laminated on an insulating substrate and conductor patterns formed on the respective surface sides of the insulating substrate and the insulating resin layer are different from each other. When manufacturing a multilayer wiring board including a via part made of metal formed through the insulating resin layer so as to connect predetermined conductor patterns formed on the front surface side of the A taper shape having a smaller diameter toward the bottom surface side so that the land portion is exposed and forms a bottom surface in the insulating resin layer of the next layer that covers the land portion of the conductor pattern formed on the surface of the substrate or the insulating resin layer. After forming the through hole, on the entire surface of the insulating resin layer including the bottom surface and the wall surface of the tapered through hole, the adhesion between the insulating resin layer and the via portion is improved, and the metal forming the via portion is formed. Dense to prevent diffusion to the insulating resin layer After forming a barrier layer, and then patterning the adhesion barrier layer so that the adhesion barrier layer in the portion where the conductor pattern and the via portion are formed remains, the adhesion barrier in the portion where the conductor pattern is formed A step preventing layer made of an insulating resin and having a predetermined height is formed between the layer and the adhesion barrier layer in the portion forming the via portion, and then the adhesion barrier layer is exposed to form a conductor pattern and a via portion. The conductor pattern and the via portion are formed on the surface of the conductor pattern and the via portion, which are formed by polishing a metal layer having a height equal to or higher than that of the step prevention layer formed by plating and planarizing the portion. A method of manufacturing a multilayer wiring board, comprising forming a barrier layer for preventing the diffusion of the metal to the insulating resin layer.
【請求項7】 絶縁性基板上に複数層の絶縁性樹脂層が
積層され、且つ前記絶縁性基板及び絶縁性樹脂層の各々
の表面側に形成された導体パターンと、互いに異なる絶
縁性樹脂層の表面側に形成された所定の導体パターン同
士を連結するように、前記絶縁性樹脂層を貫いて形成さ
れた金属から成るビア部とを具備する多層配線基板を製
造する際に、 該絶縁性基板又は絶縁性樹脂層の表面に形成された導体
パターンのランド部を覆う次層の絶縁性樹脂層に、前記
ランド部が露出して底面を形成するように、底面側ほど
小径となるテーパー状貫通孔を穿設した後、前記導体パ
ターンを形成する部分とビア部を形成する部分との間
に、絶縁性樹脂から成る所定高さの段差防止層を形成
し、 次いで、前記テーパー状貫通孔の底面及び壁面を含む前
記絶縁性樹脂層と段差防止層との全表面に亘って形成さ
れた、絶縁性樹脂層と前記ビア部との密着性向上及びビ
ア部を形成する金属の絶縁性樹脂層への拡散防止を図る
密着バリア層上に、めっきによって所定厚さの金属層を
形成せしめ、 その後、前記金属層に研磨処理を施し平坦化することに
よって露出した段差防止層を介して形成された導体パタ
ーン及びビア部の表面に、前記導体パターン及びビア部
を形成する金属の絶縁性樹脂層への拡散防止を図るバリ
ア層を形成することを特徴とする多層配線基板の製造方
法。
7. An insulating resin layer in which a plurality of insulating resin layers are laminated on an insulating substrate, and conductor patterns formed on respective surface sides of the insulating substrate and the insulating resin layer are different from each other. When manufacturing a multilayer wiring board including a via part made of metal formed through the insulating resin layer so as to connect predetermined conductor patterns formed on the front surface side of the A taper shape having a smaller diameter toward the bottom surface side so that the land portion is exposed and forms a bottom surface in the insulating resin layer of the next layer that covers the land portion of the conductor pattern formed on the surface of the substrate or the insulating resin layer. After forming the through hole, a step preventing layer made of an insulating resin and having a predetermined height is formed between the portion where the conductor pattern is formed and the portion where the via portion is formed, and then the tapered through hole is formed. Including the bottom and wall of Adhesion formed over the entire surface of the insulating resin layer and the step prevention layer to improve the adhesiveness between the insulating resin layer and the via portion and prevent diffusion of the metal forming the via portion into the insulating resin layer A metal layer having a predetermined thickness is formed on the barrier layer by plating, and then the metal layer is subjected to a polishing treatment to be flattened and the conductor pattern and the surface of the via portion formed through the step prevention layer exposed by the planarization. And a barrier layer for preventing the diffusion of the metal forming the conductor pattern and the via into the insulating resin layer.
JP22341693A 1993-09-08 1993-09-08 Multilayer wiring board and manufacture thereof Pending JPH0779078A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22341693A JPH0779078A (en) 1993-09-08 1993-09-08 Multilayer wiring board and manufacture thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22341693A JPH0779078A (en) 1993-09-08 1993-09-08 Multilayer wiring board and manufacture thereof

Publications (1)

Publication Number Publication Date
JPH0779078A true JPH0779078A (en) 1995-03-20

Family

ID=16797804

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22341693A Pending JPH0779078A (en) 1993-09-08 1993-09-08 Multilayer wiring board and manufacture thereof

Country Status (1)

Country Link
JP (1) JPH0779078A (en)

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EP0727926A2 (en) * 1995-02-17 1996-08-21 International Business Machines Corporation Multilayer printed writing board and method of manufacturing such a board
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US6054652A (en) * 1997-04-18 2000-04-25 Fujitsu Limited Thin-film multi-layer substrate and electronic device
USRE40947E1 (en) 1997-10-14 2009-10-27 Ibiden Co., Ltd. Multilayer printed wiring board and its manufacturing method, and resin composition for filling through-hole
WO1999034654A1 (en) * 1997-12-29 1999-07-08 Ibiden Co., Ltd. Multilayer printed wiring board
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US7390974B2 (en) 1998-02-26 2008-06-24 Ibiden Co., Ltd. Multilayer printed wiring board with filled viahole structure
US8987603B2 (en) 1998-02-26 2015-03-24 Ibiden Co,. Ltd. Multilayer printed wiring board with filled viahole structure
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US7622183B2 (en) 1998-02-26 2009-11-24 Ibiden Co., Ltd. Multilayer printed wiring board with filled viahole structure
US7071424B1 (en) 1998-02-26 2006-07-04 Ibiden Co., Ltd. Multilayer printed wiring board having filled-via structure
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US7446263B2 (en) 1999-08-06 2008-11-04 Ibiden Co., Ltd. Multilayer printed circuit board
EP1207730A1 (en) * 1999-08-06 2002-05-22 Ibiden Co., Ltd. Electroplating solution, method for fabricating multilayer printed wiring board using the solution, and multilayer printed wiring board
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US7993510B2 (en) 1999-08-06 2011-08-09 Ibiden Co., Ltd. Electroplating solution, method for manufacturing multilayer printed circuit board using the same solution, and multilayer printed circuit board
US7812262B2 (en) 1999-08-06 2010-10-12 Ibiden Co., Ltd. Multilayer printed circuit board
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JP2009016857A (en) * 2000-06-23 2009-01-22 Ibiden Co Ltd Multilayer printed wiring board, and manufacturing method thereof
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US6689641B2 (en) 2000-10-24 2004-02-10 Ngk Spark Plug Co., Ltd. Wiring board and method of producing wiring board
JP2006216713A (en) * 2005-02-02 2006-08-17 Ibiden Co Ltd Multilayer printed wiring board
JP2007201509A (en) * 2007-05-01 2007-08-09 Ibiden Co Ltd Multilayer printed wiring board
JP2008085373A (en) * 2007-12-19 2008-04-10 Ibiden Co Ltd Printed circuit board and its manufacturing method
JP2008263222A (en) * 2008-06-23 2008-10-30 Ibiden Co Ltd Multilayer printed wiring board
JP2011071358A (en) * 2009-09-27 2011-04-07 Kyocer Slc Technologies Corp Method of manufacturing wiring board
JP2011135106A (en) * 2011-04-04 2011-07-07 Ibiden Co Ltd Method of manufacturing multilayer printed wiring board with filled via structure
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