JPH0742150Y2 - テストパタン発生器 - Google Patents
テストパタン発生器Info
- Publication number
- JPH0742150Y2 JPH0742150Y2 JP14284489U JP14284489U JPH0742150Y2 JP H0742150 Y2 JPH0742150 Y2 JP H0742150Y2 JP 14284489 U JP14284489 U JP 14284489U JP 14284489 U JP14284489 U JP 14284489U JP H0742150 Y2 JPH0742150 Y2 JP H0742150Y2
- Authority
- JP
- Japan
- Prior art keywords
- address
- output
- multiplexer
- control information
- test pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000006870 function Effects 0.000 claims description 11
- 238000010586 diagram Methods 0.000 description 2
- 239000013065 commercial product Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14284489U JPH0742150Y2 (ja) | 1989-12-11 | 1989-12-11 | テストパタン発生器 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14284489U JPH0742150Y2 (ja) | 1989-12-11 | 1989-12-11 | テストパタン発生器 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0381575U JPH0381575U (en, 2012) | 1991-08-20 |
JPH0742150Y2 true JPH0742150Y2 (ja) | 1995-09-27 |
Family
ID=31689653
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14284489U Expired - Fee Related JPH0742150Y2 (ja) | 1989-12-11 | 1989-12-11 | テストパタン発生器 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0742150Y2 (en, 2012) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008126747A1 (ja) * | 2007-04-09 | 2008-10-23 | Advantest Corporation | 試験装置、試験方法、および電子デバイス |
-
1989
- 1989-12-11 JP JP14284489U patent/JPH0742150Y2/ja not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008126747A1 (ja) * | 2007-04-09 | 2008-10-23 | Advantest Corporation | 試験装置、試験方法、および電子デバイス |
JP5175840B2 (ja) * | 2007-04-09 | 2013-04-03 | 株式会社アドバンテスト | 試験装置、試験方法、および電子デバイス |
Also Published As
Publication number | Publication date |
---|---|
JPH0381575U (en, 2012) | 1991-08-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5633879A (en) | Method for integrated circuit design and test | |
JPH0742150Y2 (ja) | テストパタン発生器 | |
US4222339A (en) | Automatic compound pattern generation type sewing machine | |
JPH0542031B2 (en, 2012) | ||
JPH10172283A (ja) | 半導体記憶装置及びシステム | |
KR970705758A (ko) | 시험 패턴 발생기(test pattern generator) | |
JPS6057593B2 (ja) | 文字パタ−ン処理方式 | |
JPS6096023A (ja) | タイミング信号発生器 | |
JP2616082B2 (ja) | 半導体試験装置 | |
JPH04147069A (ja) | テスト波形生成器 | |
JPH01167683A (ja) | 波形発生装置 | |
JPH0717027Y2 (ja) | タイミング発生装置 | |
JPH04106793A (ja) | メモリインタフェース回路 | |
JPS6319027B2 (en, 2012) | ||
JP2660688B2 (ja) | 論理波形発生装置 | |
JPH036578U (en, 2012) | ||
JPH06347519A (ja) | タイミング発生方法及びタイミング発生装置 | |
JPS63217282A (ja) | Lsiテスタのフオ−マツトコントロ−ラ | |
JPS59204782A (ja) | 試験パタ−ン発生装置 | |
JPS6011398B2 (ja) | メモリ試験用パタ−ン書込み装置 | |
JPH05126912A (ja) | パターンアドレス発生装置 | |
JPS5860789A (ja) | パタン拡大方式 | |
JPS62277699A (ja) | メモリテスタ | |
JPS62228179A (ja) | 入力ベクトル列駆動方式 | |
JPH0562875U (ja) | Icテスタ用波形出力装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |