JPH0729638Y2 - 表面実装部品の検査用治具 - Google Patents

表面実装部品の検査用治具

Info

Publication number
JPH0729638Y2
JPH0729638Y2 JP1988134378U JP13437888U JPH0729638Y2 JP H0729638 Y2 JPH0729638 Y2 JP H0729638Y2 JP 1988134378 U JP1988134378 U JP 1988134378U JP 13437888 U JP13437888 U JP 13437888U JP H0729638 Y2 JPH0729638 Y2 JP H0729638Y2
Authority
JP
Japan
Prior art keywords
lead
inspection
surface mount
mount component
component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1988134378U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0255106U (US07902200-20110308-C00004.png
Inventor
博彦 中村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP1988134378U priority Critical patent/JPH0729638Y2/ja
Publication of JPH0255106U publication Critical patent/JPH0255106U/ja
Application granted granted Critical
Publication of JPH0729638Y2 publication Critical patent/JPH0729638Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1988134378U 1988-10-14 1988-10-14 表面実装部品の検査用治具 Expired - Lifetime JPH0729638Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988134378U JPH0729638Y2 (ja) 1988-10-14 1988-10-14 表面実装部品の検査用治具

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988134378U JPH0729638Y2 (ja) 1988-10-14 1988-10-14 表面実装部品の検査用治具

Publications (2)

Publication Number Publication Date
JPH0255106U JPH0255106U (US07902200-20110308-C00004.png) 1990-04-20
JPH0729638Y2 true JPH0729638Y2 (ja) 1995-07-05

Family

ID=31393083

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988134378U Expired - Lifetime JPH0729638Y2 (ja) 1988-10-14 1988-10-14 表面実装部品の検査用治具

Country Status (1)

Country Link
JP (1) JPH0729638Y2 (US07902200-20110308-C00004.png)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107328373A (zh) * 2017-08-18 2017-11-07 深圳市伙伴科技有限公司 引脚平整度检测系统及方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59176155U (ja) * 1983-05-12 1984-11-24 ロ−ム株式会社 電子部品の検査具
JPS6276529A (ja) * 1985-09-27 1987-04-08 Fuji Kikai Seizo Kk フラツトパツク型ｉｃのリ−ド線曲がり検出方法
JPS62274205A (ja) * 1986-05-23 1987-11-28 Hitachi Tokyo Electron Co Ltd リ−ド平坦度検査方法および装置

Also Published As

Publication number Publication date
JPH0255106U (US07902200-20110308-C00004.png) 1990-04-20

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